GB/T 15136-1994 Basic principles of semiconductor integrated circuit quartz clock circuit test methods

Basic Information

Standard ID: GB/T 15136-1994

Standard Name: Basic principles of semiconductor integrated circuit quartz clock circuit test methods

Chinese Name: 半导体集成电路石英钟表电路测试方法的基本原理

Standard category:National Standard (GB)

state:in force

Date of Release1994-06-16

Date of Implementation:1995-02-01

standard classification number

Standard ICS number:Electronics>>31.200 Integrated Circuits, Microelectronics

Standard Classification Number:Electronic Components and Information Technology>>Microcircuits>>L56 Semiconductor Integrated Circuits

associated standards

alternative situation:void;

Publication information

publishing house:China Standards Press

other information

Release date:1994-06-16

Review date:2004-10-14

Drafting unit:Shanghai Radio Factory No. 19

Focal point unit:National Semiconductor Device Standardization Technical Committee

Publishing department:State Bureau of Technical Supervision

competent authority:Ministry of Information Industry (Electronics)

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Introduction to standards:

This standard specifies the basic principles of the test methods for the electrical parameters of semiconductor integrated circuit quartz watch circuits. This standard applies to the electrical parameter test of semiconductor integrated circuits for quartz watches with pointer and digital ordinary timing functions. GB/T 15136-1994 Basic principles of test methods for semiconductor integrated circuit quartz watch circuits GB/T15136-1994 Standard download decompression password: www.bzxz.net