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Technical data of Type DW-217 electronic glass

Basic Information

Standard ID: SJ/T 10586.3-1994

Standard Name:Technical data of Type DW-217 electronic glass

Chinese Name: DW-217型电子玻璃技术数据

Standard category:Electronic Industry Standard (SJ)

state:Abolished

Date of Release1994-08-08

Date of Implementation:1994-12-01

Date of Expiration:2008-01-20

standard classification number

Standard Classification Number:General>>Standardization Management and General Provisions>>A01 Technical Management

associated standards

alternative situation:SJ 670-83

Publication information

other information

Introduction to standards:

SJ/T 10586.3-1994 DW-217 electronic glass technical data SJ/T10586.3-1994 standard download decompression password: www.bzxz.net



Some standard content:

Electronic Industry Standard of the People's Republic of China
Technical dataoftypeDW-217electronicglassSubject content and scope of applicationbZxz.net
This standard specifies the chemical composition and physical and chemical performance indicators of DW-217 electronic glass. This standard applies to glass materials used in electronic devices such as counter tubes and voltage regulator tubes. Reference standards
GB9000 Standard method for chemical analysis of electronic glass GB9622 Test method for physical and chemical properties of electronic glass 3 Technical requirements
Chemical composition is shown in Table 1.
Chemical composition
Weight percentage
73.0±1.0
Note: 1) Al, O., Fe.O, as impurity control, are not included in the percentage composition. 3.2 Physical and chemical performance indicators are shown in Table 2.
1994-08-08 Ministry of Electronics Industry of the People's Republic of China approved SJ/T10586.3-94
Replaced SJ670-83
Test method
GB9000.10
GB9000.12
GB9000.14
Implemented on 1994-12-01
Indicator name
SJ/T10586.3-94|| tt||Average linear thermal expansion coefficient in the range of 0~300℃CaDensity
Softening point
Annealing point
Strain point
Dielectric loss tangent value tg8×10 at frequency 6MHz and temperature 20℃Temperature (Tx-100) when volume resistivity is 100M0·cmThermal stability
Water resistanceChemical stability level
Additional instructions:
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. 1/℃
This standard was drafted by the Standardization Institute of the Ministry of Electronics Industry and the 772 Factory. The main drafters of this standard are Liu Chengjun and Wang Yongmei. This standard was first issued in 1973 and revised for the second time in August 1994. 2
(37.0±1.0)X10-7
2.350±0.015
745±10
525±10
480±10
≥290
≥250
Test method
GB9622:9
GB9622.11
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