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JB/T 5843-1991 Connectors for power semiconductor devices

Basic Information

Standard ID: JB/T 5843-1991

Standard Name: Connectors for power semiconductor devices

Chinese Name: 电力半导体器件用接插件

Standard category:Machinery Industry Standard (JB)

state:Abolished

Date of Release1991-10-24

Date of Implementation:1992-10-01

Date of Expiration:2005-09-01

standard classification number

Standard Classification Number:Electrical Engineering>>Power Transmission and Transformation Equipment>>K46 Power Semiconductor Devices and Components

associated standards

alternative situation:Replaced by JB/T 5843-2005

Publication information

other information

Introduction to standards:

Replaced by JB/T 5843-2005 JB/T 5843-1991 Connectors for power semiconductor devices JB/T5843-1991 Standard download decompression password: www.bzxz.net

Some standard content:

Mechanical Industry Standard of the People's Republic of China
JB/T 5843-1991
Connectors for Power Semiconductor Devices
Published on October 24, 1991
Implementation by the Ministry of Machinery and Electronics Industry of the People's Republic of China on October 1, 1992
Mechanical Industry Standard of the People's Republic of China
Connectors for Power Semiconductor Devices
Topic Content and Scope of Application
JB/T 58431991
This standard specifies the dimensions, models, technical requirements and inspection rules for connectors for power semiconductor devices. This standard applies to connectors for auxiliary cathodes and gates of power semiconductor devices. 2
Cited standards
GB2423.10
GB2423.22
JB/Z296
3Model
Test Fe: Vibration (sinusoidal) test method Basic environmental test regulations for electrical and electronic products Basic environmental test regulations for electrical and electronic products Test N: Temperature change test method Power semiconductor device shell structure and selection guide Basic test regulations and measurement of electromechanical components for electronic equipment Contact resistance test
Basic test regulations and test panels for electromechanical components for electronic equipment Basic test methods for low-voltage electrical appliances
Number×Number
(one letter)
Dimensions and allowable deviations
Mechanical tests on connectors, contacts and terminals Indicates the width×thickness of the inner side dimensions of a rectangular socket, or the inner diameter×depth of a circular socket
J, represents a rectangular (gate and long pole) socket Y, represents a circular (gate) socket.
The dimensions and allowable deviations of connectors for power semiconductor devices shall comply with the provisions of Figures 1-2 and Table 1, and the detailed structural drawings shall comply with the recommended drawings of B/Z296.
Approved by the Ministry of Machinery and Electronics Industry on October 24, 1991 and implemented on October 1, 1992
CY1.5×4.0
CY2.0x4.0
CJa.8×o.6
CJ3.4×0.4
CJ4.8×0.4
CJ6.3×0.5
Technical requirements
Dimension code
JB/T5843-1991
C Y-type connector
Figure 2CJ type connector
Corresponding socket size
Width or diameter
41.47±0.025
91,97±0,025
2.3-8.059
3.4.8-021
4.8-8:8
28:82
Alcohol content or
Wire cutting area
Metal parts have uniform coating, without defects such as shedding and scratches. The surface of the terminal and the plug sleeve is smooth and burr-free. 5.2 Rated current
The steady-state current is 1A, and the peak current is shown in Table 1. 5.3 Working voltage
The gate-to-gate working peak voltage is 20V. Contact resistance
Current value
The contact resistance of the connector is less than 5m2.
Tensile strength and separation force
JB/T 58431991
The tensile strength and separation force of the connector meet the requirements of Table 2. Insulation resistance
The insulation resistance between the gate and the pole is not less than 1m2, and the withstand voltage is 1000V. 5.7 Material
The socket is made of tin bronze, and the terminal is made of copper H62 minus H68. Table 2
CY1.5x4.0
CY2.0X4.0
CJ2.8×0.8
CJ3.4x-0.4
CJ4.8x0.4
CJ6.3×0.5
Inspection Specifications
First Time
Separation Force
Sixth Time
Tensile Strength
The inspection of connectors for power semiconductor devices is divided into two categories: quality consistency inspection and identification inspection. 6.1
Quality Consistency Inspection
6.1.1 Group A Inspection (Batch by Batch)
Each batch of connectors must be inspected according to the items specified in Table 3. 3
Inspection items
Dimensions
Inspection method
Measure with a vernier caliper
Fix one end of the connector and apply the tension specified in Table 2 to the other end
Qualification criteria
Comply with Article 5.1
Comply with Chapter 1
Continuous
Lead color
Red when used as cathode lead, white when used as gate lead
Sampling plan AQI, inspection level II
Note: See Appendix A for the specific sampling plan for AQL. For batch inspection, if the initial submission is unqualified, it can be resubmitted for re-inspection according to the method of strict first-level inspection, but it can only be submitted once.
Group C inspection (cycle)
The connectors produced in finalized form must be inspected every six months according to the items specified in Table 4. 6.2
Identification test
Test items
Contact resistance
Separation force
Absolute strength
JB/T 5843—1991
Test method
GB5035,8
Qualification criteria
Meet 5, 4
Meet the provisions of Table 2
Meet 5.6bzxZ.net
Sampling plan
The purpose of identification test is to determine whether the manufacturer is capable of producing products that meet the requirements of the standard. When the design, process, material changes or the production is resumed after suspension, the identification test should be carried out. For connectors that have been finalized and are produced in normal batches, at least one batch of identification tests should be carried out every three years. The items of identification test shall be carried out according to the items specified in 6.1 and Table 5. 5
Test items
Temperature test
Vibration (sinusoidal) test
Test method
GB2425.22 (N)-40℃
+1502g30minTransfer time
2~3minThree cycles
CB223.30 (Fc)
Membrane working state, 100
z, 20g
Qualified criterion
Meet Articles 5.1 and 5.6
Meet Articles 5.2 and 5.3
Sampling plan
Note: In the sampling plan, n and c are the number of samples and qualified judgment integers respectively. If the first sampling test fails, it can be inspected again by adding sampling according to the cumulative method, but only once. 7
Packaging, transportation, storage, labeling
Connectors should be packaged after they have passed the inspection and obtained the certificate of conformity. When packaging, first put the connectors into the plastic bag and seal it, then put it into the paper box or wooden box and nail it.
7.2 Transportation
During transportation, connectors should be strictly prevented from violent vibration and collision to avoid damage. 7.3 Purchase and storage
Connectors should be stored in a dry, ventilated place without acid or acid gas corrosion. 7.4 Labeling
The following marks should be marked in a conspicuous place outside the packaging bag, packaging carton or packaging wooden box: a. Product name;
b. Product model and specifications:
c. Manufacturer name;
d. Date of manufacture or batch number
The purchaser shall conduct acceptance inspection within three months after receiving the connector. If any problem is found, it shall be promptly reported to the supplier for joint processing by both parties. 4
JB/T5843-1991
Attachment A
AQL (acceptable quality level) sampling
(Supplement)
AIAQL (acceptable quality level) sampling is shown in Table A1Batch range
16—25
26--50
151 -2 No. 0
281500
501--1200
Additional sampling see Table BI
Initial sampling n1
Additional sampling n2
Additional sampling (n2-n1)
Sample size
Xie Zui B
Additional sampling table
(Supplement)
Sample size
Additional notes:
This standard was proposed and managed by the Xi'an Power Electronics Technology Research Institute of the Ministry of Machinery and Electronics Industry. This standard was drafted by the Xi'an Power Electronics Technology Research Institute and the North China Rectifier Device Factory. The main drafters of this standard are Du Jimei and Mo Xizhen. 1.0
Number of qualified judgments Ac
People's Republic of China
Mechanical Industry Standard
Connectors for power semiconductor devices
JB/T 58431991
Published and issued by the Mechanical Science Research Institute
Printed by the Mechanical Science Research Institute
(No. 2 Shouti South Road, Beijing
Postal Code 100044)
Number of words XXX,XXX
Format 880×1230
Sheet X/X
Edition X, XX, 19XX
Printing X, XX, 19XX
Number of prints 1-XXX
Price XXX.XX Yuan
XX-XXX
Mechanical Industry Standard Service Network: http://www.JB.ac.cn1661_8
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