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GB/T 6427-1999 Measurement method for frequency temperature stability of piezoelectric ceramic oscillators

Basic Information

Standard ID: GB/T 6427-1999

Standard Name: Measurement method for frequency temperature stability of piezoelectric ceramic oscillators

Chinese Name: 压电陶瓷振子频率温度稳性的测量方法

Standard category:National Standard (GB)

state:in force

Date of Release1999-05-19

Date of Implementation:1999-12-01

standard classification number

Standard ICS number:31.030

Standard Classification Number:Electronic Components and Information Technology>>Special Materials, Parts, and Structural Components for Electronic Equipment>>Special Materials for L90 Electronic Technology

associated standards

alternative situation:GB/T 6427-1986

Publication information

publishing house:China Standards Press

ISBN:155066.1-16170

Publication date:2004-08-22

other information

Release date:1986-05-27

Review date:2004-10-14

Drafting unit:Wuxi Radio Components Factory No.2

Focal point unit:National Technical Committee for Standardization of Marine Vessels

Publishing department:State Administration of Quality and Technical Supervision

competent authority:China State Shipbuilding Corporation

Introduction to standards:

This standard specifies the test method for the temperature stability of the frequency of piezoelectric ceramic oscillators. This standard is applicable to the temperature stability of the series resonant frequency and parallel resonant frequency of piezoelectric ceramic oscillators in the radial extension vibration mode of discs and the transverse extension vibration mode of strips. GB/T 6427-1999 Test method for the temperature stability of the frequency of piezoelectric ceramic oscillators GB/T6427-1999 Standard download decompression password: www.bzxz.net

Some standard content:

Ics 31. 030
National Standard of the People's Republic of China
GB/T 64271999
Test method for frequency temperature stabilityof piezoelectric ceramic vibrator1999-05-19 Issued
1999-12-01 Implementation
Issued by the State Administration of Quality and Technical Supervision
W.GB/T6427—1999
This standard is based on the revision of GB/T6427—1998 Piezoelectric ceramic frequency stability test method. Compared with GB/T6427—1986, this standard has the following revisions: a) Delete the symbol table in the original standard; b) According to GB/T 1993 Unit 1: Drafting and presentation of standards Part 1: Basic specifications for the preparation of standards, the previous part is added, and the "test method" is used as a separate standard content and its sequence is unified: c) "Electromagnetic correction method" is added to the test method; d) Test environment conditions are deleted: a) Except for the test of free capacitance C, distributed capacitance Ca and parallel connection frequency, etc., this standard replaces GB/T6427-1986 from the implementation of the second phase. This standard is proposed by the Ministry of Information Industry of the People's Republic of China. This standard is under the jurisdiction of the National Technical Committee for Standardization of Ferroelectric Ceramic Materials. The drafting units of this standard are: Municipal State Electric Technology Standardization Research Institute, State-owned 21 Industry. The main drafters of this standard are: Yu Gong. Shao
This standard was first issued in May 1986. 1 Scope
National Standard of the People's Republic of China
Test method for frequency stability of piezoelectric ceramic vibrators
Test meihod for Irequeney lemperalurestability of piezoelectric ceramic vibrators under temperature
Test meihod for Irequeney lemperalurestability of piezoelectric ceramic vibrators under temperature This standard specifies the test method for frequency stability of piezoelectric ceramic vibrators under temperature. GB/T 6427 1999
Generation GB/T6127 1986
This standard is applicable to the temperature stability of the parallel resonance frequency and parallel resonance frequency (hereinafter referred to as frequency) of piezoelectric ceramic vibrators under the radial expansion and contraction vibration mode of discs and the transverse expansion and contraction vibration mode of strips. 2 Reference standards
The provisions contained in the following standards constitute the provisions of this standard through non-use in this standard. When this standard is published, the versions shown are valid. All standards will be revised. All parties using this standard shall discuss the possibility of using the latest versions of the following standards. GB/T 2114.1-1998 Test method for properties of piezoelectric ceramic materials - Inter-diameter contraction vibration mode GB/T 2414.2-1998 Test method for properties of piezoelectric ceramic materials - Inter-diameter contraction vibration mode GB/T 3389.1-1996 3 Definitions and symbols Vocabulary of ferroelectric and piezoelectric ceramics Definitions and symbols used in this standard are in accordance with the provisions of GB/T3389.1. 4 Test principle 4.1 Temperature stability refers to the property that the performance of piezoelectric ceramics changes with temperature. The frequency temperature stability is the property that the frequency changes with temperature. Generally, the frequency temperature coefficient or the maximum frequency drift can be used to describe the ratio of the frequency value change to the frequency value at a certain temperature when the temperature changes by 1, which is called the frequency temperature coefficient. The coefficient T can be expressed by formula (1):
Where T,: Www.bzxZ.net
Frequency temperature coefficient, ()) l;
f——frequency of a certain temperature F, Hz;
-rate of change of frequency with temperature, Hz/C
The frequency of the piezoelectric ceramic vibrator changes nonlinearly with temperature, and its vorticity coefficient is a function of temperature.....(1)
In addition, the maximum relative frequency drift is usually used to characterize the frequency temperature stability of the piezoelectric ceramic vibrator, which can be expressed by formulas (2) and (3): (8f)= Lf(8)
f(25C)
f(25r)
Approved by D519 of the State Administration of Quality and Technical Supervision in 1999.(2)
Implemented on December 1, 1999
WWuzhong(af)μ--
f(0p)m
GB/T 6427-—1999
Maximum relative frequency screw shift at positive temperature, %:
Maximum relative frequency at negative temperature, %:
IF()..- f(25 C):
In the positive temperature range (such as 25℃:--85℃:>The maximum value of the frequency when the frequency deviates from the normal temperature of 25'C + Hz In the negative temperature range (such as -65C--25C) The maximum value of the frequency when the frequency deviates from the normal temperature of 25C, Hz; (30
The frequency value at 25℃, Hz.
f(25 C)-
4.2 This standard uses the transmission network to measure the maximum transmission frequency of the sample a1, the minimum transmission frequency ., and the impedance analyzer to measure the maximum admittance frequency f of the sample, the minimum admittance frequency f., or the resonance frequency F., and the inverse spectrum frequency f. (under the first order approximation, f., f., f.-f. J...
Place the sample in the positive and negative temperature environment test equipment, measure the corresponding frequency at different temperature points within the specified temperature range, and you can get the relationship curve between frequency and temperature, so as to obtain the frequency overflow case number or the maximum relative frequency drift. 5 Test conditions
5.1 Sample size and requirements
The test piece sample shall comply with the provisions of GB/T 2414.1, and the long strip sample shall comply with the provisions of GB/T 2414.2. The test sample should be kept clean and dry. The insulation time before each temperature point test is generally 1 1. According to the thermal conductivity of the sample box, the material and the size of the sample, the temperature time can be appropriately increased or decreased. 5.2 Test signal requirements
Electric field strength E≤30 mV/mm at test frequency.6 Test method
6.1 Test of series resonant frequency f and parallel harmonic frequency f. 5.1.1 Transmission line method
6.1.1.1 Test circuit
The test circuit is shown in Figure 1 and Figure 2.
Voltmeter; 2 Frequency; 3 Vibration tooth difference; 4--Screen point-call line: 6--Sample box; A positive and negative temperature environment test equipment Figure 1 Test circuit 1
WGB/T 6427-1999
1-Voltmeter: 2-Rated rate meter +3 Vibration sensor, 4-Screen panel: 5-Lead wire 6-Sample 17-Positive and negative temperature environment test equipment Figure 2 Test circuit
In Figure 1 and Figure 2, the resistance value of the matching resistor R matches the output impedance of the signal generator. The current limiting resistor R is 20)α--2ka. The distributed capacitance C at the end of the sample is much smaller than the free capacitance C of the test connection. 6. 1. 1. 2 Test equipment and requirements: 1) Signal generator: good frequency stability, good accuracy of the frequency to be tested, output waveform is smooth, harmonic distortion suppression is 3t: dB, 2) Frequency meter: resolution better than 1Hz, input impedance is much larger than the output impedance of the signal generator; 3) Input impedance is greater than 1Mn, input capacitance is not more than 40pF, and the frequency range should meet the test requirements: 4) Positive and negative temperature environment test equipment: can provide temperature balance within the required temperature range (such as -65~85C), continuous and reversible positive and negative temperature environment, and the control source deviation is not more than 2t. 5) Screen box: good grounding. The screen box and each instrument connection wire are connected with short shielded wires and use radio frequency connectors; 6) Sample box and lead: The sample box should be made of good thermal conductive material. The clamping force of the bracket in the basin should be small, and the test sample should be used as the pusher. And ensure that the clamp is in good contact with the test electrode. The diameter of the clamp contacting the sample is generally 0.3mm-1~1.0mm, and the center is at the sample node: the sample should be folded and sealed as much as possible. The relative temperature in the box is less than 75 degrees, and the leads between the sample box and the screen box should be as close as possible.
6. 1. 1.3 Test procedure
a) Test of room temperature frequency
Put the sample into the test box, seal it, and place it in the positive and negative temperature environment test box. The temperature measurement point should be close to the sample to truly reflect the temperature at the sample. According to the test circuit in Figure |, measure the series resonant frequency, 1. The method is to adjust the frequency of the signal generator to minimize the voltage. At this time, the frequency is the quasi-parallel resonance frequency, and then measure the parallel resonance frequency f according to the test circuit in Figure 2. The method is to adjust the signal generator frequency.b) Test of positive and negative temperature numbers
Room temperature frequency test The temperature of the positive and negative temperature reading environmental test box is changed, and the rate of rise and fall is not more than 3 (/min-. Keep it at the selected temperature point for a certain time (generally 1 h). Then repeat the method of 6.1.1.3a) to measure the harmonic frequency 1 of the test point. The parallel connection frequency f. Test at the origin in the entire temperature range (no less than 10 temperature points) to obtain the frequency temperature characteristic line,
The test method is as follows: from the positive temperature to the lowest point of the negative temperature, and from this point, test the desired temperature decay point by point, and the positive temperature is the highest point.
W6.1.2 Bridge method
6.1.2.1 Test circuit
As shown in Figure 3,
6. 1. 2. 2 Test equipment and requirements
GB/T 64271999
Figure 3 Test circuit of electric extrusion method
a) Bridge: frequency accuracy is better than 10; impedance resolution is better than 0.05α; b) Positive and negative temperature environment test equipment: d 6.1.1.2d); c) Sample box and lead wire: same as %.1. 1.2f) requirements, 6.1.2.3 Test procedures
a) Test of air temperature frequency
Positive and negative temperature environment test box
Method
Put the sample into the sample box, cover it and place it in the positive and negative temperature environment test box. The temperature measurement point should be close to the sample box to truly reflect the temperature of the sample in the box. According to the test circuit in Figure 3, adjust the frequency of the bridge to minimize the impedance of the sample. At this time, the maximum admittance frequency f.; or make the sample phase 100, and the frequency is the spectrum frequency 110. Increase the bridge frequency to maximize the impedance of the sample. At this time, the frequency is the minimum admittance frequency or make the sample phase 100, and the frequency is the anti-resonance frequency b) Test of positive and negative temperature frequency
Except for measuring the frequency of each temperature point according to the method specified in 6.1.2.3e), the rest of the test procedures shall be carried out according to the provisions of 6.1.1.3b). 6.2 Calculation of parameter performance
6.2.1 Calculation of frequency temperature coefficient
From the temperature characteristic curve of the measured parallel resonance frequency and the parallel resonance frequency f, the frequency temperature coefficient Tr at any temperature can be calculated according to formula (1). When the frequency and temperature in a certain temperature range can be approximately regarded as a linear relationship, the frequency temperature coefficient at any temperature 8 can be calculated using formula (4).
f.(8)(0, -0)
f(8,).fe(8)
,(8)(82 0,)
Wherein: T
series resonant frequency temperature coefficient. C-
parallel resonant frequency temperature coefficient, C-
the temperature at which frequency and temperature are linearly related, the parallel resonant frequency at temperature, Hzt
. (4)
W.GB/T6427-1999
(62)—parallel resonant frequency at temperature 82, Hz; ()—parallel resonant frequency at temperature 8, HzF)—parallel resonant frequency at temperature 8, Hz6.2.2 Calculation of the maximum relative drift
obtain the measured frequency-temperature characteristic curve and use 25 As the reference value, the maximum relative frequency drift under positive temperature and the minimum relative frequency drift under negative temperature are calculated according to formula (2) and formula (3).
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