title>JB/T 5841-1991 ZH series 200A and above tube-shell rated high voltage rectifier diodes - JB/T 5841-1991 - Chinese standardNet - bzxz.net
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JB/T 5841-1991 ZH series 200A and above tube-shell rated high voltage rectifier diodes

Basic Information

Standard ID: JB/T 5841-1991

Standard Name: ZH series 200A and above tube-shell rated high voltage rectifier diodes

Chinese Name: ZH系列200A以上管壳额定高压整流二极管

Standard category:Machinery Industry Standard (JB)

state:in force

Date of Release1991-10-24

Date of Implementation:1992-10-01

standard classification number

Standard Classification Number:Electrical Engineering>>Power Transmission and Transformation Equipment>>K46 Power Semiconductor Devices and Components

associated standards

Publication information

publishing house:Mechanical Industry Press

Publication date:1992-09-01

other information

Focal point unit:Xi'an Power Electronics Technology Research Institute

Publishing department:Ministry of Machinery and Electronics Industry of the People's Republic of China

Introduction to standards:

This standard specifies the limit values, characteristic values ​​and inspection rules and basis of tube-case rated high voltage rectifier diodes. JB/T 5841-1991 ZH series 200A and above tube-case rated high voltage rectifier diodes JB/T5841-1991 Standard download decompression password: www.bzxz.net

Some standard content:

Mechanical Industry Standard of the People's Republic of China
ZH Series 200A and Above Case Rated High Voltage Rectifier Diode Subject Content and Scope of Application
This standard specifies the limit values, characteristic values ​​and inspection rules and basis of case rated high voltage rectifier diodes. This standard applies to ZH200, ZH500, ZH800 and ZH1000 cavity packaged high voltage rectifier diodes. Reference standards
GB2900.32 Electrician name adjustment terminology Power semiconductor devices GB4937
GB4938
ZBK46003
GB4024
3 Technical requirements
3.1 Dimensions
Mechanical and climatic test methods for discrete semiconductor devices Acceptance and reliability of discrete semiconductor devices
Shells for power semiconductor devices
Test methods for reverse blocking triode thyristors of semiconductor devices Dimensions shall be in accordance with ZL and ZT types in ZBK46003. 3.2 Limit values ​​(absolute maximum ratings)
3.2.1 Limit values ​​shall be in accordance with Table 1.
Limit value
Case temperature
Storage temperature
Equivalent junction temperature
Reverse repetitive peak voltage
Reverse non-repetitive peak voltage
Forward average current
Single-phase sine
wave 180° conduction angle, resistive load
Forward (non-repetitive) surge current
IF(AV)
Approval form of the Ministry of Machinery and Electronics Industry on October 24, 1991
-40~116
-40~160| |tt||3200~6000
VRRM+200V(VRRM≤4200V),
VRRM+800V(VARM≥4600V)
JB584191
ZHI000
1992-10—01 implementation
Limit value
Installation force
Installation torque
JB5841--91
Continued Table 1
Reverse repetitive peak voltage VRRM is graded according to Table 2. 3200
Electrical characteristics
Electrical characteristics are as specified in Table 3.
Characteristics and conditions
Tcase=25℃
(Unless otherwise specified)
Forward peak voltage
Reverse repetitive peak current
Junction temperature=25℃ and 150℃
Junction-to-case thermal resistance
14.4~21.6
2.4 or 2.5
Note: ④ In the following groups of inspections or tests, the junction temperature of 150℃ is actually 150_℃. 60
(Maximum value)
ZH1000
25.6~38.4
ZH1000
2.6 or 2.8
②Electrical characteristics Reverse recovery charge is not given in this standard. The device equivalent to this standard is tested according to GB4033, and the reverse recovery charge value is about 10mq.
?Two values ​​of forward peak voltage, the smaller one corresponds to VRRM≤4200V, and the larger one corresponds to VRRM>4200V, the same below. Characteristic curve (not for inspection)
The following characteristic curves should be given in the product manual: a.
Case temperature and forward average current derating curve, forward volt-ampere characteristic curve:
Transient thermal impedance and time curve; surge current and frequency curve and [t characteristic curve; maximum forward dissipation power and forward average current (conduction negative as parameter) function curve. Inspection rules
Batch-by-batch (Group A) inspection
Group A inspection is as specified in Table 4, and all inspections are non-destructive. 130
Not working
A2b forward peak
reverse complex
peak current
see B1 in Appendix
see B2 in Appendix
JB5841—91
Tcase=25℃
(unless otherwise specified)
normal lighting and
normal vision
according to A2b
According to A2b
Junction temperature = 25℃ and 1150℃
Inspection requirements
(maximum value)
ZH1000
No peeling of coating
Marking is complete and clear, surface is not damaged,
Polarity is reversed
>24 or>26
2.4 or 2.6
Note: ①The sampling of AQL (H) in the inspection requirements column can be found in A1 in Appendix A. ②When required, the forward peak voltage can also be inspected at a junction temperature of 150 60
>26 or>28
2.6 or 2.8
If Group A fails the first inspection, it can be resubmitted for inspection according to A2 in Appendix A with one level of strictness, but it can only be resubmitted once. 4.2
Cycle (Group B) Inspection
Group B inspection shall be in accordance with the provisions of Table 5. For standard products produced normally, at least one batch of Group B inspection shall be carried out every year. Table 5
Temperature change
Final test
(leakage)
Forward peak
Reverse repetition
Flame value current
K46003
Tcase=25℃
(Unless otherwise specified)
GB4937
Two-box method,
-40, 160℃
Cycle 5 times, Each cycle
High and low temperature are set
1h, transfer time
3~4min
GB4937
Pressure fluorine oil leak detection
According to A2b
According to A2b
Inspection requirements (maximum value)
Maximum shape and installation dimensions meet the requirements
2.4 or 2.6
ZH1000
2.6 or 2.8
Electrical durability
Finally measured
Forward peak
Reverse repetition
Peak currentWww.bzxZ.net
CRRL release certificate
Record
GB4938
Tcase=25℃
(Unless otherwise specified)
High temperature reverse bias
Junction temperature=150℃ forward||tt ||Sine wave 50Hz,
70%VRRM,
According to A2b
According to A2b
JB5841—91
Continued Table 5
Inspection requirements (maximum value)
2.6 or 2.9
2.9 or 3.1
Briefly draw the attribute data of B5 and B8, the VM and IRRM values ​​before and after the inspection, and the inspection conclusion. Note: n and c in the inspection requirements column are the sampling number and the qualified judgment number respectively, the same below. ZH10cO
Unit nc
If the first inspection of group B fails, additional sampling can be carried out according to A2 in Appendix A for another inspection, but each inspection group can only be supplemented once, and the additional samples should undergo all the inspections of the group. 4.3 Cycle (Group C) Inspection
Group C inspection shall be in accordance with Table 6. For the standardized products produced normally, at least one batch of group C tests shall be carried out every year. The tests marked with (D) are destructive.
Forward non-repetitive surge current
Finally measured
Forward peak
value voltage
Reverse repetitive
peak value current
C2d junction-to-case thermal resistance
See Appendix
Tcase=25℃
(Unless otherwise specified)
Junction temperature=150℃,
|B3 in B
One wave, 20 times
According to A2b
According to A2b
See Appendix
B4 in B
Inspection requirements (maximum value)
All dimensions meet the requirements
According to the two levels of L and H in 3.2.1
2.6 or 2.9
ZH1000
2.9 or 3.1
Electrical durability
Final test
Forward peak
Value voltage
Reverse repetitive
Peak current
High temperature storage
Final test
Forward peak
Value voltage
Reverse repetitive
Value current
CRRL approval
Record
Tcase=25℃
(Unless otherwise specified)
GB4938|High temperature reverse bias
Junction temperature=150℃, positive
Sine wave 50Hz, 76%
100-8 h
According to A2b
According to A2b
Ta=160_g℃
GB4937
10006h
According to A2b
According to A2b
JB5841—91
Continued Table 6
Inspection requirements (maximum value)
2.6 or 2.9
2.6 or 2.9
2.9 or 3.1
2.9 or 3.1
ZH1000
Briefly give the property data of C8 and C9, the VM and IRRM values ​​before and after the inspection, and the inspection conclusions. Note: If the first submission test of Group C does not meet the requirements, it can be treated as the first submission test failure of Group B, and the identification and approval (Group D) test
Group D test shall be in accordance with Table 7. IVD is the initial value of each device. Table 7
Thermal cycle
Final test
Forward peak
Value voltage
Reverse repetition
Peak current
See appendix
Tcase=25℃
(Unless otherwise specified)
Number of cycles:
B5 crimping device in B 5000 times
Welding device 1000 times
According to A2b
According to A2b
Inspection requirements (maximum value)
ZH1000
Unit nc
Constant addition
Final test
Forward peak
Value voltage
Reverse repetition
Peak current
Marking and ordering information
Device Marking on the component
Tcase=25c
(unless otherwise specified)
Two different main axes, each
GB4937
Two directions of the axis
According to A2b
According to A2b
Device model and quality category:
Terminal identification:
Use the graphic symbol of the diode "·一斗
JB5841-91
Continued Table 7
Inspection requirement (maximum value)
2.1 or 2.6
ZH1009
2.6 or 2.8
Unit nc
", the arrow points to the cathode terminal; or a red dot is painted to indicate the cathode terminal, and a blue (or black) dot or no color is painted on the anode terminal. c: Manufacturer’s name, code or trademark;
d. Inspection batch identification code.
5.2 Marking of device packaging box (box)
a. All markings on the device except terminal markings; b. Moisture-proof and rain-proof markings;
C. Standard number.
5.3 Ordering information
To order a device, at least the following information is required: a. Accurate model;
b Standard number;
Quality assessment Class I;
Others.
A1AQL sampling
AQL sampling according to Table A1
Batch range
16—25
51--90
91-150
151-280
291-500
501-1200
120132c0
3201-10000
10001—35000||t t||35001—150000
Sample size
JB5841-91
Appendix A
Sampling plan
(supplement).,
Note; ①This table belongs to the inspection level (IL) H; ③The arm head indicates that the second sampling plan should be used. If the sample size at the corresponding point pointed by the arrow is equal to or greater than the batch, the batch should be inspected by percentage②c: qualified judgment number, I: unqualified judgment number; 100%.
Additional sampling
Additional sampling according to Table A2
Initial sampling
Additional sampling
Additional number
Sample size
Qualified judgment number
B1Forward peak voltage (Vpz)
This test uses the pulse method.
B1.1 Principle circuit and requirements
The principle circuit is shown in Figure B1.
—Device under test; Rs
JB5841-91
Appendix B
Inspection and testing of limit values ​​and electrical characteristics
(Supplement)
Resistors that have been calibrated to measure current; L, C-(A)
—Inductors and capacitors that generate forward current pulses
; S-—Switching device that controls current pulses, which generates pulses when turned on and should be disconnected immediately after the pulse current ends; Vp, Ap--Peak voltmeter, peak ammeter or oscilloscope. The peak voltmeter should be able to display the voltage value when the forward current reaches the peak value, GB1.2 Test conditions
Adjustable pulse AC power supply.
a. Junction temperature: 25℃ for batch tests, 25℃ and T(v) when required; b.
Forward peak current: times of rated forward average current (3 is acceptable) or as specified in product standards; current pulse width: selected based on whether the carriers of the device under test can fully reach equilibrium during the measurement period; c.
Current pulse: can be a single pulse or a low repetition frequency pulse where heat generation can be ignored; e.
Measurement point position: as specified in Figure B2,
The tightening pressure or torque between the device under test and the fixture: as specified in product standards. Public pressure plate
All metal pressure plate
Reverse repetitive peak current (IRRM)
Principle circuit and requirements
The principle circuit is shown in Figure B3,
-Device under test;
D, Da
JB5841-91
-Diode that provides negative half-cycle voltage, so that only the reverse characteristics of D are measured; 1-Current limiting protection resistor. When D breaks down, the current passing through D is limited: G-Adjustable AC voltage source; R
-Resistor that has been calibrated to measure current; AP, VrRs
Value ammeter displays the current value when the reverse voltage reaches the peak value. B2.2 Test conditions
Junction temperature: 25℃ and T(1),
Reverse voltage: VRR3)
AC voltage frequency: 50Hz
Forward (non-repetitive) surge current (IPS) Principle circuit and requirements
The principle circuit is shown in Figure B4.
D---Device under test; Ap, Vp
Peak current meter, peak current meter or oscilloscope. 50H
-Peak current meter, peak voltage meter or oscilloscope (long afterglow time); -Diode that blocks the forward voltage generated by transformer T; R. Resistor that adjusts the surge current; Di
-During the forward surge half cycle, the minimum protective limiter, S mechanical electrical or electronic switch with a conduction angle of 180° for the normal operation of the circuit; T1-Low-voltage high-current transformer that provides the forward half-cycle surge current through S. This current waveform should be basically a sine half-wave with a duration of approximately 10ⅡS and a repetition frequency of approximately 50 pulses per second. T. is a high-voltage low-current transformer that provides a reverse half-cycle voltage through a rectifier diode D. If the transformer is fed by a separate power supply, T: and T: should be fed on the same phase of the power grid. Its voltage waveform should be basically a sine half-wave. 137
B3.2 Test conditions
Junction temperature before surge: T(n)
Surge current peak: as specified in the product standard Reverse half-cycle voltage: 80%VRRM$
JB584191
Number of cycles for each surge: one cycle, the conduction angle is between 160° and 180°; number of surges: 20 times.
Junction-to-case thermal resistance (Rie)
B4.1 Principle
The diode under test is passed through a heating current to generate power loss P. When thermally balanced, the junction-to-case thermal temperature R1c is calculated by the measured equivalent junction temperature T (I) and the tube case temperature Te according to formula (B1):
Ri. T(o)-T.
The two-time method can also be used, that is, applying two different heating powers P1 and P2 to the device under test, and adjusting the cooling conditions to make the two junction temperatures equal (monitored by thermistor voltage), and measuring the corresponding tube case temperatures Tci and Tc2, then the junction-to-case thermal resistance can be calculated according to formula (B2): Ri=
B4.2 Principle circuit and requirements
The principle circuit is shown in Figure B5.
Tcu-Tco
D——Device under test; E—Power supply for providing heating current I:, heating current can be DC or AC current: I.
In a short time after the heating current is interrupted periodically, the DC thermistor current flowing through the device under test to monitor its junction temperature, S. The electronic switch that periodically interrupts the heating current I; S—-The electronic switch that closes when the heating current is interrupted; V
Thermistor voltage detection unit, W
-A power meter that indicates the power loss generated by the current in the junction of the device under test. Ammeter and voltmeter can also be used. The power is determined by current and voltage calculation. B4.3 Test conditions
a, the size of the heating current I: Using the formula B1 method, the power generated by I should make the junction temperature close to or reach the equivalent junction temperature, usually the rated current. Use formula (B2) to adjust the heating current and cooling conditions twice to make the difference between the two measured shell temperatures as large as possible to ensure the measurement accuracy;
b. Thermistor current I=1%~10%I(as
c, the requirements for measuring Tc shall be in accordance with 1.6.1 and 2.1.1 of GB4024; 138
JB5841-91
Thermistor voltage shall be measured during 0.51ms after the heating current is interrupted: e. The tightening pressure or torque of the device under test shall be in accordance with the product standard. Thermal cycle load
B5.1 Principle circuit and requirements
The principle circuit is shown in Figure B6.
D Device under test;
Low voltage and high current transformer providing heating current T
R——Resistor for adjusting heating current; S—Switch that is periodically turned on and off controlled by a time relay or temperature relay. The junction temperature of the diode under test can be indirectly monitored by the case temperature: A
DC ammeter.
The relationship between the heating current waveform and the junction temperature change waveform of the test circuit is shown in Figure B7. lp
Heating pair
B5.2 Test conditions
Cold welcome protection
One cycle
a. Heating current: The waveform is a rated sine wave, and the value is the rated forward average current (the error is -10%~0), b, Junction temperature range: The highest temperature during heating is T(vi)-%℃, if the device under test is tested in series, it can be T(vi)-℃, cooling 139
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