This part of GB/T 1129 specifies the test method for wavefront distortion of laser rods. This standard applies to laser rod crystals that can transmit light waves with a wavelength of 632.8nm. GB/T 11297.1-2002 Test method for wavefront distortion of laser rods GB/T11297.1-2002 Standard download decompression password: www.bzxz.net

ICS 31.260
National Standard of the People's Republic of ChinawwW.bzxz.Net
GB/T11297.1—2002
GB/T11297.-1989
Test method for wavefront distortion of laser rods2002-12-04 Issued
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
2003-05-01 Implementation
GB/T112H7 standard is divided into the following parts: Preface
/T! 291 Measurement method for wavefront distortion of laser rods GB/T1297.2 Measurement method of scattering coefficient of optical transmission line: GB/T11297.3 Measurement method of extinction ratio of light-emitting diodes GB/T11297.1—2002
GB/11297.4 Measurement method of long pulse optical transmission line and slope efficiency: GB/T11397,5 Measurement method of dislocation efficiency, slope efficiency and transmission efficiency of single crystal of dislocation-free steel: GB/T 11297.6
GH/ 11297. 7
Test method for resistance and thermal conductivity of single product of foreign chain: GH/T11397.8 Test method for thermal conductivity of pyroelectric materials; G/T11207.5 Test method for dielectric loss of pyroelectric materials 1:n6: Test method for thermal conductivity of pyroelectric materials; G/T11297.16
GB/T1127, [1 Test method for thermal conductivity of pyroelectric materials GE:T 11397. 12
Method for measuring the extinction ratio of electro-optical products of lithium ion, spherical acid and bacteric acid. This part replaces GB/T 11297.1-15H. This part mainly compares with GB/T 11297.11S8S. The main difference is that the test results are recorded by using a CCD (charge quantization device) camera. The test results are analyzed by a clock test method instead of the manual calculation method. The following experimental results show that this method is effective and applicable.
This part is a normative annex.
and parts thereof are approved by the Ministry of Information Industry of the People's Republic of China and the China Electronics Technology Standardization Research Institute (C ESI export. This part of the unit, industry Beiyang Optical Equipment Technology Research Institute, this part of the main person: Engineering Zhixue, Yao Guangtao, Ying: 1 Scope
Measurement method of laser wavefront distortion
B, T11297 specifies the test method for laser wavefront distortion. This part is applicable to the optical filter product with S of 62.8. 2 Normative references
GB/T1129/.12002
The following documents are considered as normative clauses of this part through reference to this part of GB1297. For any referenced documents with a specified period, all subsequent amendments (excluding errata) or revisions are not applicable This part shall not apply, however, any later versions of these documents may be used in conjunction with this part. For materials not specified in this document, the latest version shall apply. 3. Terms and definitions The following terms and definitions established in CB/T 11233 and 11/T 11297 apply to this part: 3.1 Wavefront The surface formed by the same mean points. 3.2 Interferumeler The surface formed by the same mean points. t||Instrument for measuring the difference in optical intensity or other optical quantities by means of light: 3.3
interfurumeterordopblepasytyp interferometer 34
interferencefringe
the fringe pattern produced by the interference of light waves 3.5
fringe spacing
the distance between two equal fringe patterns on a graph or the distance between two equal fringe patterns 3.6
referencesurface
the reference surface set by the wavefront. 3.7
peak-to-valleydevlationpeak-tn-valleydevlationthe sum of the amplification deviations of the two states of the wave under test and the difference in the valley values. GB/T 11297.1:2002 4 Requirements 4.1 Test specifications 4.1.1 The test shall be carried out under the following normal atmospheric conditions: relative humidity: 45.%.~70.5% (beta-16ka): 4.1.2 The test environment shall be free from visible air, smoke and dust, and shall not affect the test results. 4.2 Test principle The optical quality of the laser sample can be characterized by the deviation of the wavefront deformation after the plane wavefront passes through the sample. The wavefront deformation is measured by the dry cooling method. By analyzing and calculating the peak-to-peak value of the wavefront distortion and comparing it with the expected value, we can get the wavefront distortion value expressed in terms of the effect, or convert it into the full-wavelength distortion expressed in terms of the number of wavelengths. 4.3 Test system
4.3.1 This test system uses a double-pass T-type tester, and the composition of the test system is shown in Figure 1. The CCDI has a material medium and a control system. The test instrument includes a reflector and a beam expander with a length of 132 mm. The reflector is a computer processing system. To ensure the measurement accuracy of the optical wave, the optical path is unchanged and the wavefront distortion of the image under test should not be 0(4.3.3 The laser sample to be corrected is placed on a V-shaped potential (or platform with two grids): 4.3.4 Anisotropic laser rod, a polarized light source is required. 4.4 The laser sample to be tested is placed on a V-shaped potential (or platform with two grids): 4.3.5 The laser sample to be tested is a polarized light source. Laser cutting processing technical requirements
In addition to special requirements, laser cutting should meet the following requirements a) The surface of the belt is greater than or equal to 10 (afraid of facing the mixing shaft! The result is better than or equal to 5: b)
The end return plane is within the full diameter 9% of the diameter range. The domestic diameter should be changed to C.1 yuan 3
GB/I11297.1-2002
) The surface point diameter ((4mm0.1mm, the total number of products is less than), (D is the laser rod diameter) The micro feeling is 0.004ur-0.1nm. The total length is less than
4.5 Test preparation
Unless otherwise specified, the test should be prepared according to the following requirements: According to the requirements of 4.1 Prepare the test object;
The test system meets the requirements of 4.3 and 4.4.
5 Test steps
5.1 Turn on the power switch of the service part according to the operation order to put the system in standby state. 5.2 Push the camera to the V-shaped mold (or flat mold) to make the test beam return along the axis of the laser. 5.4 Adjust the V-shaped mold to make the test beam return along the axis of the laser. 5.5 Test the direction of the mirror to adjust the monitoring effect and orientation: rotate the object to make the distortion of the object under the money field large. 5.6| |tt||5.7 After the image is fixed, the CCD camera takes two steps and processes the image correctly. The test results will be displayed. Note: If the image is not processed by the CCD camera, the relevant figure can be calculated and reduced by the specified figure in the method A. 6 Test report content
The test report should include the following contents:
Inspection unit
Environmental conditions:
Name of the manufacturer:
Test date:
Number and size of the laser detector:
) Ten:
Test results;
The following figure:
Wavefront distortion figure.
B/T11297.1—2002
A. 1 Test method
(Normative appendix:
Interference fringe diagram and wavefront change method
A.1.1 Clean the surface of the palm of the hand to reduce the source of light, and be careful not to damage the end surface, A.1.2. Place the laser to be tested gently in the V phase, in the test optical path in front of the measuring reflector, 13. Adjust the V phase to check the horizontal and vertical. Make the laser axially aligned with the test optical path. At this time, the laser sample end face should be combined into a mouse,
A.1. The test reflector is positioned in the same position, so as to adjust the image of the instrument in the field of view to obtain the maximum change in the characteristic fringe in the sample. Note: The effective fringe in the sample is determined by the size of the change in the sample. In order to make more: the glass is installed in front of the small, the number of items in the field of view is 1, the optical quality is light, the light source is relatively large, and the average value is 5-7.
A.1.5 After the system is determined, the camera is under the cabinet. 4.2 Analysis and calculation of interference pattern
A.2.1 Wavefront flattening Two phase light waves are formed in the interference pattern, one is the plane wave and the other is the half wave. The refractive index of the sample material is averaged, and the residual virtual force is used to reduce the flatness of the two surfaces, resulting in the distortion of the interference product wavefront.
4.2.2 Add a stripe of the interference agent to the end of the cabinet, and compare the residual effect of the interference pattern with the line group of the test product.
A, 2.3 According to the cooling method
A.2.3.1 Increase the interference pattern effect to m\-, A.2.32 Place the lower effect on the vertical flash force at the stripe effect. A.2.3.3 Take the magnified and cropped drawings in sequence and give them the wavefront distortion calculation section: from square to right, number the sections in sequence from 1 to 2: The selection of the sections should be 70% of the calculated aperture: see Figure A1. A.2.3.4 Calculate along each axis from the top to the bottom center of the network, using the line numbered 1 to the line numbered 1, see Figure A2.4. The return center should be the same as the phase line u/1:11297.1—2002. A.2.3.5 In the calculation of the diameter, use a straight line to make it intersect with the line 1. The distance between the upper and lower horizontal lines and the intersection of the center of the element 1 is recorded with a ruler of 1m. The value and position are also mm,
.2 .3.7 The average spacing of the stripes is calculated using the following formula: f
Where:
The average spacing of the coefficients is in meters (mm) 2 (m-1)
1 The distance between the intersection of the half line and the center line of the system, in meters (m) E
The distance between the intersection of the lower horizontal line 1-line 1. The distance between the center line of the stripes: in meters (rm), center (. Calculate the average blood age of the system, that is, the actual blood age of the system, CA.1)
A.2.3. The same number of stripes in the same figure (such as A.3) and the water half load, I! Customer point H, 1 standard information line figure A. 3
A.2.3.9 The total aperture is calculated by drawing parallel lines with equal spacing from each other. The parallel line groups are equal to the spacing between each other.
A.2.4 Calculation of peak-to-valley values ​​of wavefront time variation GB/T11297.1—2002
A.2.4.1 In meters, the difference between each stripe and the corresponding straight line in the staggered line group (peak value) is taken, and the maximum peak value is taken. See Figure A, 4 Figure 4.4
The difference between the stripe and the corresponding straight line in the staggered line group is taken. The unit of deviation between the effective line and the corresponding line in the system is millimeters (unit: afi.
is the average distance between an effective line and the corresponding line in the system, unit: afi.) 4.2.4.2 Measure and record the peak deviation of each line with the corresponding line in millimeters (valley deviation). Peak deviation: See section A.4,
4.2.4.3 The sum of the peak error and the peak deviation of the measured light sample fringe is the peak deviation of the wavefront distortion. See the following formula:
afru=afi. uaf
W - the maximum valley value deviation, the unit is millimeter (mm); Afarax
the maximum peak value deviation, the unit is meter (mm), 4.2.5 Use 7 to calculate the wavefront variation
4.2.5.1 Take the number of interference strips as the unit: calculate the maximum value deviation corresponding to the number of interference strips NA
or the number of patterns;
x ​​- the recorded peak-to-valley value deviation, the unit is millimeter (m); take the average distance of a sensitive strip, the unit is meter (mm); A2.52 Take the number of wavelengths as the unit: 1 calculate the unrecorded maximum peak-to-valley value deviation corresponding to the previously checked (W,). WEDI, N.]
Wavefront distortion:
N--Number of changes:
The effect of the measured beam passing through the depth measurement optical array. For the double-pass type, =,-4.2
A.2.5.3, because the intrinsic wavelength of the laser beam is different from the wavelength of the light source used for measurement, the corresponding wavefront distortion can be converted by the following formula 6
;
Where:
-The wavefront distortion corresponding to the intrinsic wavelength of the laser beam 1" (WFI)...
Wavefront distortion value:
-The wavelength of the measured light source, in nanometers (nm) = 632.3FCB/T 11297.1—2002
: - The intrinsic length of the micro-light rod, in nanometers (nm). If you need to express the peak-to-valley deviation of the wavefront with the number of 25.1num fringes N, you can use the following formula to convert it: 25.4.N
The number of interference fringes expressed in 25.4mm:
"-Measure the laser length, in hexagons (.
Cardiointerference coefficient number.
(A)9 The total aperture is designed to be filled with parallel lines with equal spacing, and the parallel line groups are equal to the spacing between them.
A.2.4 Calculation of peak-to-valley values ​​of wavefront time variation GB/T11297.1—2002
A.2.4.1 In meters, the difference between each stripe and the corresponding straight line in the group (peak value) on the right is taken, and the maximum peak value is taken. The value of shrinkage ≥ f is shown in Figure A.4. Figure 4.4
is the distance between the stripe and the corresponding straight line in the staggered line group. The unit is millimeters (the deviation between the effective stripe and the corresponding straight line in the staggered line group is in meters...: afi.
is the distance between the effective stripe and the corresponding straight line in the staggered line group. The unit is in meters.) 4.2.4.2 Measure and record the maximum peak deviation f of each stripe and the corresponding straight line in the staggered line group in meters (valley deviation). Maximum peak deviation: See Figure A.4,
4.2.4.3 The sum of the peak error and the apparent deviation of the measured light sample stripe is the peak deviation of the wavefront distortion. See the following formula:
afru=a uaf
W:
The maximum valley value deviation is in millimeters (mm); Afarax
The maximum peak value deviation is in meters (mm). 4.2.5 Use 7 to calculate wavefront variation
4.2.5.1 Take the number of interference strips as the unit: calculate the maximum value deviation corresponding to the number of interference strips NA
or:
the number of strips;
x-recorded peak-to-valley value deviation, in millimeters (m); the average distance of a sensitive strip, in meters (mm) A2.52 Take the number of wavelengths as the unit: calculate the maximum peak-to-valley value deviation corresponding to the unrecorded The wavefront distortion value is:
N--the number of changes in the depth measurement beam:
The effect of the measured beam passing through the depth measurement optical array. For the double-pass type, =,-4.2
A.2.5.3, because the intrinsic wavelength of the laser beam is different from the wavelength of the light source used for measurement, the corresponding wavefront distortion value can be converted using the following formula 6
;
Where:
-the wavefront distortion value corresponding to the intrinsic wavelength of the laser beam 1"! (WFI)...
Wavefront distortion value:
-the wavelength of the measured light source, in nanometers (nm) = 632.3FCB/T 11297.1—2002
: - The intrinsic length of the micro-light rod, in nanometers (nm). If you need to express the peak-to-valley deviation of the wavefront with the number of 25.1num fringes N, you can use the following formula to convert it: 25.4.N
The number of interference fringes expressed in 25.4mm:
"-Measure the laser length, in hexagons (.
Cardiointerference coefficient number.
(A)9 The total aperture is designed to be filled with parallel lines with equal spacing, and the parallel line groups are equal to the spacing between them.
A.2.4 Calculation of peak-to-valley values ​​of wavefront time variation GB/T11297.1—2002
A.2.4.1 In meters, the difference between each stripe and the corresponding straight line in the group (peak value) on the right is taken, and the maximum peak value is taken. The value of shrinkage ≥ f is shown in Figure A.4. Figure 4.4
is the distance between the stripe and the corresponding straight line in the staggered line group. The unit is millimeters (the deviation between the effective stripe and the corresponding straight line in the staggered line group is in meters...: afi.
is the distance between the effective stripe and the corresponding straight line in the staggered line group. The unit is in meters.) 4.2.4.2 Measure and record the maximum peak deviation f of each stripe and the corresponding straight line in the staggered line group in meters (valley deviation). Maximum peak deviation: See Figure A.4,
4.2.4.3 The sum of the peak error and the apparent deviation of the measured light sample stripe is the peak deviation of the wavefront distortion. See the following formula:
afru=a uaf
W:
The maximum valley value deviation is in millimeters (mm); Afarax
The maximum peak value deviation is in meters (mm). 4.2.5 Use 7 to calculate wavefront variation
4.2.5.1 Take the number of interference strips as the unit: calculate the maximum value deviation corresponding to the number of interference strips NA
or:
the number of strips;
x-recorded peak-to-valley value deviation, in millimeters (m); the average distance of a sensitive strip, in meters (mm) A2.52 Take the number of wavelengths as the unit: calculate the maximum peak-to-valley value deviation corresponding to the unrecorded The wavefront distortion value is:
N--the number of changes in the depth measurement beam:
The effect of the measured beam passing through the depth measurement optical array. For the double-pass type, =,-4.2
A.2.5.3, because the intrinsic wavelength of the laser beam is different from the wavelength of the light source used for measurement, the corresponding wavefront distortion value can be converted using the following formula 6
;
Where:
-the wavefront distortion value corresponding to the intrinsic wavelength of the laser beam 1"! (WFI)...
Wavefront distortion value:
-the wavelength of the measured light source, in nanometers (nm) = 632.3FCB/T 11297.1—2002
: - The intrinsic length of the micro-light rod, in nanometers (nm). If you need to express the peak-to-valley deviation of the wavefront with the number of 25.1num fringes N, you can use the following formula to convert it: 25.4.N
The number of interference fringes expressed in 25.4mm:
"-Measure the laser length, in hexagons (.
Cardiointerference coefficient number.
(A)
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