SJ 2675-1986 Detailed specification for electronic devices Low power non-wirewound fixed resistors RJ17 type metal film fixed resistors Assessment level E SJ2675-1986 standard download decompression password: www.bzxz.net

Ministry of Electronics Industry of the People's Republic of China Standard SJ2675-86
Detailed Specification for Electronic Components
Low Power Non-Wirewound Fixed Resistors
RJ17 Metal Film Fixed Resistors
Assessment Level E
Published on February 18, 1986
Implemented on October 1, 1986
Approved by the Ministry of Electronics Industry of the People's Republic of China Ministry of Electronics Industry Standard Detailed Specification for Electronic Components
Low Power Non-Wirewound Fixed Resistors
RJ17 Metal Film Fixed Resistors
Assessment Level E
China Electronic Technology Standard Institute of Standardization
Appearance of electronic components for quality assessment according to IBET8-1: (see Table 1) (first angle view) · Lead root coating length
SJ2675-86
SJ2675-86
GB5731-85
IEC115-2-1
Low power non-wirewound fixed resistor
(RJ17 metal film resistor)
Insulation type
Assessment level: E
Stability grade: 2%
The valid data of components qualified according to this detailed specification are given in the list of qualified products. Chapter 1 General data
General data
1.1 Recommended installation method
Resistors should be installed in the normal way.
During the vibration test, the distance between the resistor body and the mounting point should be 6±1mm1.2 Dimensions, ratings and characteristics
Issued on 1986-02-18
Implementation on 1986-10-01
Rated at 70℃
Temperature coefficient
(10-%/℃)
All dimensions are in millimeters.
Resistance range*
Nominal resistance tolerance
Gas category
Low pressure
Stability grade
Resistance change limit:
Long-term test
Short-term testbzxz.net
Temperature coefficient
1.2.1 Reduced power consumption
SJ2675-86
Component limit voltage (DC or
AC effective value)
Resistors covered by this specification shall be derated according to the following curve
Percentage of rated power
Recommended operating area
-55℃
1.3 Related documents
GB5729-85
·E series with priority value of IEC63
Insulation voltage
(DC or AC
derating)
Maximum size|| tt||125℃
102 to 10MQ
±2%,±5%
dNominal:
Tolerance:
55/125/56
8.5kPa（85mbar）
±（2%R+0.12）
±（0.5%R+0.052）
α：±250×10-*/℃
Thickness of bowl| |tt||Fixed resistors for electronic equipment
Part 1: General specification
GB5730-85
1.4 Marking
SJ2675-86
Fixed resistors for electronic equipment
Part 2: Sectional specification:
Low-power non-wirewound fixed resistors
The markings on components and packaging shall comply with the requirements of Article 2.4 of the general specification GB5729-85. Contents of the markings on the resistors:
a. Nominal resistance:
b. Permissible deviation of nominal resistance:
c. Year, month (or week) of manufacture:
d. Variety mark;
e. Manufacturer's trademark.
Contents of marking on resistor packaging:
a. Nominal resistance:
b. Permissible deviation of nominal resistance:
c. Year, month (or week) of manufacture:
d. Detailed specification number and variety mark;
e. Name and trademark of the manufacturer;
f. Quantity in the package;
g. Name or code of the packing person;
h. Seal of the inspection department.
1.5 Ordering information
Orders for resistors of this specification should list the following minimum information in general text or code form: a. Nominal resistance;
b. Permissible deviation of nominal resistance:
c. Detailed specification number and version number and variety mark. 1.6 Release batch certification record
When this record is required, it should be negotiated with the manufacturer. 1. Additional content (not inspected)
The weight of the resistor shall not exceed 3.5g/piece. 1.8 For the provisions of the general specification and (or) sectional specification, there is no provision for the increased or enhanced severity and requirements.
Chapter 2 Inspection Requirements
2 Inspection Requirements
2.1 Procedure
2.1.1 The identification and approval procedure shall comply with the provisions of Article 3.2 of the sectional specification GB5730-85 and 3
SJ2675-86
2.1.2 For quality consistency inspection, the test list (Table 2) includes sampling, cycle, severity and requirements. Articles 3 and 3.1 of the sectional specification stipulate the composition of the inspection batch. Note: When drying is required, Procedure I of Article 4.3 of the general specification GB5729-85 shall be adopted. Table 2
Note: ①Except that the resistance change requirement should be selected from Table 1 and Table 2 of the sectional specification GB5730-85, the clause numbers of the test items and performance requirements are quoted from the general specification GB5729-85.
Inspection level (IL) and qualified quality level (AQL) are selected from IEC410: Count inspection single sample plan and procedure. ?In the table:
P-cycle, month,
V-sample size,
C-qualified number (allowable number of unqualified products) D-destructive,
ND-non-destructive,
IL-inspection level
AQL-qualified quality level
Clause number and test items
(See Note ①)
Group A inspection
(Batch by batch)
A1 grouping
4.4. 1 Appearance inspection
A2 grouping
4.4.2 Dimensions (gauge inspection)
4.5 Resistance value
B group inspection
(batch by batch)
B1 dividend
4.7 Withstand voltage
IEC410
Test conditions
(see Note ①)
1/20mm disc should be used
Method: V-block method, add
peak AC voltage and insulate|| tt||1.42 times of the insulation voltage value
(See Note?)
Performance requirements
(See Note①)
According to 4.4.1
Marking and compliance with this specification
Cut 1, 4 provisions
According to Table 1 of this specification
According to 4.5, 2
No breakdown or arcing
Clause number and test items
(See Note①)
B2 group
4. 17 Solderability
4.13 Overload
Clause number and test items
(Note ①)
Group C inspection
(cycle)
CtA group
(half of the C1 group sample)
4.16 Terminal strength
SJZ675-86
Test conditions
(See Note@)
Aging requirements: temperature 155℃,
time 4h.
Method Ball welding method, the temperature of the equipment should be adjusted and maintained at 235
±2℃
Duration
The applied voltage should be 2.5
rated voltage or 2 times the component limit voltage, whichever is lower
Appearance inspection
Test conditions
(See Note)
Tensile force: 2 0N
Bending (Number of lead-out terminals
(See Note?)
Qi Bentian Xiaohe
Qualified judgment number
(Wide note)
Continued capsule 2
Performance requirements
(See Note ①)
Solder should flow within 2s
No visible damage, clear marking
AR≤+(0.5%R+0.052)
Continued 2
Performance requirements
(See Note)
Clause number and test items
(See Note ④)
4.18 Resistance to soldering heat
C1B group
(Another sample of C1 group-
4.19 Rapid temperature change
SJ2675-86
Test conditions
(See Note ①)
Twist (Another
half of the number of terminals)
Appearance inspection
Method: 1A, slot temperature 2 60±
5c, immersion time 10±1s,
immersion depth, distance from the main body of the component
Appearance inspection
0=-55℃
6=+125
Appearance inspection
Installation method: See this specification
Procedure: B4
Rated frequency range: 10Hz to
Amplitude: 0.75mm or acceleration
98m/s (whichever is smaller)
Total duration; 6h
Appearance inspection
Sample size and
Qualified judgment number
(See Note ③)
Relief wrap 2
Performance requirements
(See Note ①)
No visible damage
△R<±(0.5%R+0.05Q)
No visible damage, clear marking
AR≤±(0.5%R+0.05Q)
No visible damage
AR±(0.5%R+0.050)
No visible damage
AR<±(0.5%R+0.05Q)
Clause number and test items| |tt||(See Note)
C1 Group
(Combined sample of C1A and CiB Group samples)
4.23 Climate sequence
One cycle damp heat, test
Db, first cycle
Low pressure
Cyclic damp heat, test
Db, remaining cycles
DC load
C2 Group
4.25.170℃ durability
SJ2675-86
Test conditions
(See Note ④ ）
8.5kPa(85mbar)
Appearance inspection
Insulation resistance
Duration, 1000h
Inspect at 48h, 500h and 1000h: Appearance inspection
Inspect at 1000h,
Insulation resistance
It is recommended that the manufacturer extend the
quarterly test to 8000h
Inspect at 2000h, 4000h and 8000h
:
Sample size and||tt ||Number of qualified judgments
(See Note ③
Continued Table 2
Performance requirements
(See Note ④)
No visible damage, clear marking
△R±(2%R+0.10)
R≥100MQ
No visible damage
△R<±(2%R+0.12)
R≥IGQ
AR≤±(5%R+0.5)
(The results are for reference only)
Clause number and test items
(See Note ①)||tt ||C3 Group
4.8 Resistance value changes with temperature
D Group Test
(Cycle)
D1 Group
4.24 Steady state damp heat
D2 Group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ2675-86
Test conditions
(See Note ④)
-55/20℃
20℃/+125℃
4 .24.2.2 Article
1st group of 10 samples
2nd group of 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
At 48h, 50h and 1000h
Inspection:
Appearance inspection
Inspect at 1000h
Insulation resistance
1. This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. 2. This standard was drafted by the State-owned No. 718 Factory and other units. 3. The main drafters of this standard are Man Kailai and He Delong. 8
Sample size and
Qualified judgment number
See note?
Edge 2
Performance requirements
(See note)
c±250×10-/℃
《±250×10~*/℃
No visible damage, clear marking
△R<±(2%R+0.10)
R≥100MO
Conform to the provisions of Table 1 of this specification
No visible damage
AR<(2%R+0.12)5)
(The results are for reference only)
Clause number and test items
(See Note ①)
C3 group
4.8 Resistance value changes with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
Additional notes:
SJ2675-86
Test conditions
(See Note ④)
-55/20 ℃
20℃/+125℃
4.24.2.2
10 samples in the first group
10 samples in the second group
Appearance inspection
Insulation resistance
Duration: 1000h
At 48h, 50ch and 1000h
Inspection:
Appearance inspection
Inspection at 1000h
Insulation resistance
1. This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. 2. This standard was drafted by the State-owned No. 718 Factory and other units. 3. The main drafters of this standard are Man Kailai and He Delong. 8
Sample size and
Qualified judgment number
See note?
Edge 2
Performance requirements
(See note)
c±250×10-/℃
《±250×10~*/℃
No visible damage, clear marking
△R<±(2%R+0.10)
R≥100MO
Conform to the provisions of Table 1 of this specification
No visible damage
AR<(2%R+0.12)5)
(The results are for reference only)
Clause number and test items
(See Note ①)
C3 group
4.8 Resistance value changes with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
Additional notes:
SJ2675-86
Test conditions
(See Note ④)
-55/20 ℃
20℃/+125℃
4.24.2.2
10 samples in the first group
10 samples in the second group
Appearance inspection
Insulation resistance
Duration: 1000h
At 48h, 50ch and 1000h
Inspection:
Appearance inspection
Inspection at 1000h
Insulation resistance
1. This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. 2. This standard was drafted by the State-owned No. 718 Factory and other units. 3. The main drafters of this standard are Man Kailai and He Delong. 8
Sample size and
Qualified judgment number
See note?
Edge 2
Performance requirements
(See note)
c±250×10-/℃
《±250×10~*/℃
No visible damage, clear marking
△R<±(2%R+0.10)
R≥100MO
Conform to the provisions of Table 1 of this specification
No visible damage
AR<(2%R+0.12)
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