HG/T 2348-1992 Measurement of surface roughness of polyester film for magnetic tape - Stylus method
Some standard content:
Chemical Industry Standard of the People's Republic of China
Measurement of Surface Roughness of Polyester Film for Magnetic Tapes
Stylus Method
HG/T2348-92
This standard adopts the international standard ISO4288-1985 "Rules and methods for measuring surface roughness by stylus instruments" 1 Subject content and scope of application
This standard specifies the method for measuring the surface roughness Ra, Rz and Ry (Rt) of polyester film for magnetic tapes using stylus instruments with contour sequence conversion and stylus instruments with computer measurement systems. This standard applies to the measurement of surface roughness of polyester films used for videotapes, audiotapes and floppy disks. 2 Referenced standards
GB1031 Surface roughness parameters and their values GB3505 Surface roughness terminology Surface and its parameters GB6061 Instrument terminology for measuring surface roughness by contour method GB6062 Profile method - Stylus surface roughness measuring instruments - Profile recorders and center-line profilers GB7220 Surface roughness terminology - Parameter measurement - Rules and methods for measuring surface roughness by stylus instruments GB10610
3 Terms and definitions
This standard adopts the relevant terms and definitions given in the above-mentioned referenced standards. 4. Measurement principle
When the stylus scans along the surface of the film to be measured, due to the microscopic unevenness of the film surface, the stylus will make mechanical movement perpendicular to the measured surface. This mechanical movement signal is converted by the instrument, amplified, filtered and automatically calculated, and then becomes the result, which is displayed on the instrument, or printed and drawn on the recording paper. 5. Measuring instruments and devices
5.1 Stylus instruments
This standard adopts the profile sequence conversion stylus instruments and stylus instruments with electronic computers that conform to the above-mentioned reference standards. 5.2 Cut-off wavelength (cutofm) c
The cut-off wavelength 1c should be equal to the sampling length value selected according to Table 1 and Table 2. 5.3 Stylus tip curvature radius
Preferably, 2um is selected, and less than or equal to 5um can be selected. When less than or equal to 5um is selected, it should be noted. 5.4 Specimen Support Glass or Metal
The surface roughness Ra of the glass or metal supporting the test specimen shall be less than or equal to 0.003 um. Approved by the Ministry of Chemical Industry of the People's Republic of China on June 1, 1992. Implementation on March 1, 1993.
6 Measurement conditions
6.1 Evaluation length and sampling length
HG/T2348-92
To evaluate the roughness of the measured surface, a set of measured values of a roughness parameter must be used, each of which is determined on a number of sampling lengths that constitute an evaluation length. Using these measured values, the average value R of the surface roughness parameter is calculated according to formula (1): -(Ri)
ki-,(n
Where: k is the number of evaluation lengths, that is, the number of measurements along the measured surface; Ri is the surface roughness parameter value determined within a sampling length; -1 is the number of sampling lengths within an evaluation length. (1)
The reliability of the measurement results obtained from the same measured surface and the accuracy of the average value of the surface roughness parameters will depend on the number of sampling lengths within the evaluation length and the number of evaluation lengths. In order to ensure reliability and accuracy, n>5
=5 must be made, that is, the evaluation length consisting of 5 consecutive sampling lengths is the standard evaluation length, sampling length l: The values given in Table 1 and Table 2 should be used to measure Ra, Rz and Ry (Rt) parameters. Table 1 Sampling length for measuring Ra value
0.008~0.020
>0.020~0.100
0.025~0.100
>0.100~0.500
Sampling length!
Table 2 Sampling length for measuring Rz and Ry (Rt) values Sampling length 1
Evaluation length In
Evaluation length In
If Ra is less than 0.020μm when measuring Ra with a cutoff wavelength of 0.08mm, and Ra is greater than 0.020um when measuring with a cutoff wavelength of 0.25mm, then, in this case, the 0.08mm cutoff wavelength should be used for measurement. Rz and Ry are similar. When measuring the three parameters Ra, Rz, and Ry (Rt) at the same time, measure according to the value 1 given in Table 1. In order to determine the cutoff wavelength value used for the first measurement, you can first make a visual comparison, or analyze it according to the sample conditions. 6.2 Measurement direction
Measurement should be carried out along the transverse direction (TD) of the film roll. In special cases, measurement can be carried out along other directions. In this case, it should be noted in the technical documents that in case of dispute, measurement should be carried out along the direction that produces the maximum value of the surface roughness parameter. 6.3 Sample state adjustment and standard environment for measurement The sample should be adjusted in a clean environment with a temperature of 23±2℃ and a relative humidity of 50%±5%. The adjustment time shall be not less than 4h. 5
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The measurement is carried out in the same environment as the state adjustment. 7 Test specimens
7.1 Sample size and quantity
Randomly cut 2 samples with a size of 120mm×60mm from different parts of each tested sample, so that their long sides are parallel to the longitudinal direction (MD) of the film roll. Measure at different parts of the two samples, so that the total number of measurements k is not less than 17.7.2 Test surface
The tested surface of the sample should be free of dust, wrinkles, scratches and lint, and no foreign impurities that may change the measurement results are allowed to exist.
If necessary, use a non-linting fiber ball, fabric or lens paper dipped in analytical pure anhydrous ethanol or acetone to gently wipe the measured surface to remove dust and other foreign matter, but be careful not to damage the surface. 8 Measurement steps
8.1 Calibration test
Use a single-line standard block or a multi-line standard block and a roughness standard block to calibrate the instrument. The interval between two calibration tests should not exceed 3 months.
8.2 Fixing the sample
Before fixing the sample, clean the glass or metal surface supporting the sample with anhydrous ethanol or acetone.! Fix the sample to be tested on the film fixing device. There should be no bubbles or gaps between the sample and the supporting glass or metal surface. 8.3 Input or set measurement conditions
Input or set the specified measurement conditions through the instrument's buttons or knobs. 8.4 Measurement
Start the instrument to measure
9 Result calculation and judgment
9.1 Mean
Calculate the arithmetic mean values Ra, Rz and Ry (Rt) of Ra, Rz and Ry (Rt) according to formula (1). 9.2 Standard Deviation
According to formula (2), calculate the standard deviation s of the corresponding parameters respectively.[2 Ri? -
Where Ri-the i-th measurement value i=1, 2, 3
kThe number of measurements along the surface.
9.3 Result Judgment
If the number of all measured values of the surface roughness parameters Ra and Rz that exceeds the standard value is less than 16% of the total, the surface is qualified. (That is, only one out-of-tolerance is allowed in 7 measured values), before judging it as unqualified, double the number of samples should be taken for no less than 13 measurements. If the number of values exceeding the standard value is still no less than 16% of the total, the surface is judged to be unqualified. When the maximum value of the surface roughness parameter Ry (Rt) is given, during the surface roughness measurement process, all roughness parameter measurement values of the entire measured surface should not exceed the standard value. 6
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Measurement report
The measurement report includes the following contents:
HG/T2348-92bzxz.net
Sample name, batch (code) number, variety specification, source; measuring instrument;
Measurement method (standard number);
Measurement conditions (conditions required by the standard); measurement results: arithmetic mean, standard deviation, maximum value, number of measurements and number of measurements exceeding the standard value of Ra, Rz, Ry (Rt) and the cut-off wavelength used; f. Result judgment: judge whether it is qualified or unqualified according to Article 9.3 and the standard value; g.
Measurement date, measurer and reviewer.
Additional instructions:
This standard is proposed by the Science and Technology Department of the Ministry of Chemical Industry of the People's Republic of China. This standard is under the jurisdiction of the First Film Factory of the Ministry of Chemical Industry. This standard was jointly drafted by Hangzhou Magnetic Tape Factory, the First Film Factory of the Ministry of Chemical Industry, and Foshan Polyester Film Company. The main drafters of this standard are Zhai Qiongzong, Wang Ying, Han Fang, and Li Yizhuang. This standard refers to the West German standard DIN4768-1990 "Basic concepts and measurement conditions for electronic contact (stylus) instruments to measure surface roughness RaRz, Rmax". Standard loss net product n.cm Free download of various relevant standard industry data
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