SJ 2674-1986 Detailed specification for electronic devices Low power non-wirewound fixed resistors RJ16 type metal film fixed resistors Assessment level E SJ2674-1986 standard download decompression password: www.bzxz.net

Ministry of Electronics Industry of the People's Republic of China Standard SJ2674-86
Detailed Specification for Electronic Components
Low Power Non-Wirewound Fixed Resistors
RJ16 Metal Film Fixed Resistors
Assessment Level E
Published on 1986-02-18
Ministry of Electronics Industry of the People's Republic of China
Implemented on 1986-10-01
Ministry of Electronics Industry of the People's Republic of China Standard Detailed Specification for Electronic Components
Low Power Non-Wirewound Fixed Resistors
RJ16 Metal Film Fixed Resistors
Assessment Level E
China Electronics Technology Standardization Institute
According to The electronic components for quality assessment of BC5729-85 are as follows:1EC11E-
Appearance drawing: (see Table 1)
(First angle view)
·Lead root trace layer length
SJ2674-86
GB5731-85
IEC115-2-1
Low power non-wirewound fixed resistor
(RJ16 type metal film resistor)
Insulation type
Assessment level: E
Stability grade: 2%
SJ2674-86
The valid information of the components qualified according to this detailed specification is given in the list of qualified products. Chapter 1 General Data
1 General Data
1.1 Recommended Installation Method
Resistors should be installed in a normal manner.
During the vibration test, the distance between the resistor body and the mounting point should be 6±1mm1.2 Dimensions, Ratings and Characteristics
Promulgated by the Ministry of Electronics Industry 193602-18
Implementation on October 1, 1986
70℃ Rated
Temperature Coefficient
(10-*/℃)
All dimensions are in millimeters.
Resistance range*
Nominal resistance tolerance
Climate category
Low pressure
Stability grade
Resistance change limit:
Long-term test
Short-term test
Temperature coefficient
1.2 Reduced power consumption
SJ2674-86
Component limit voltage
(DC or AC
effective value)
Insulation voltage
(DC or AC
peak value)
10% to 10MQ
±2 %,±5%
55/125/56
8.5kPa(85mbar)
±（2%R+0.19）
Maximum size
±（0.5%R+0.052）
α;±250×10-*/℃
The resistors covered by this specification have power reduction as follows: Percentage of specified rate
|Recommended working area
-55℃
1.3 Related documents
GB5729-85
·The priority value is the E series of IEC63.
125℃
Soil temperature
Fixed resistors for electronic equipment
dNominal:
Tolerance:
BG5730-85
1.4 Marking
SJ2674-86
Part 1: General specification
Fixed resistors for electronic equipment
Part 2: Sectional specification:
Low-power non-wirewound fixed resistors
The markings on components and packaging shall comply with the requirements of Article 2.4 of the general specification BG5729-85. The minimum marking content on the resistor is:
a. Nominal resistance;
b. Permissible deviation of nominal resistance;
c. Year, month (or week) of manufacturing.
Contents of the markings on the resistor packaging:
a. Nominal resistance value;
b. Permissible deviation of the nominal resistance value;
c. Year, month (or week) of manufacture;
d. Detailed specification number and variety mark
e. Name and trademark of the manufacturer;
f. Quantity in the package;
g. Name and code of the packing personnel;
h. Seal of the inspection department.
1.5 Ordering information
Orders for resistors of this specification shall list the following minimum contents in general text or code form: a. Nominal resistance value:
b. Permissible deviation of the nominal resistance value;
c. Detailed specification number and version number and variety mark. 1.6 Release batch certification record
When this record is required, it should be negotiated with the manufacturer. 1.7 Additional content (not inspected)
The weight of the resistor should not exceed 2g/piece.
1.8 For the provisions of the general specification and (or) sectional specification, there is no provision for the increased or improved severity and requirements.
Chapter 2 Inspection requirements
2 Inspection requirements
2.1 Procedure
2.1.1 The identification and approval procedure shall comply with the provisions of Article 3.2 of the sectional specification GB5730-853
SJ2674-86
2.1.2 For quality consistency inspection, the test list (Table 2) includes sampling, cycle, severity and requirements. Article 3.3.1 of the sectional specification stipulates the composition of the inspection batch. Note: When drying is required, Procedure I of Article 4,3 of the general specification GB5729-85 should be adopted. Table 2
Note: ①Except that the resistance change requirement shall be determined from Table 1 and Table 2 of the sub-specification GB5729-85, the clause numbers of the test items and performance requirements are quoted from the general specification GB5729-85.
②Inspection level (IL) and acceptable quality level (AQL) are selected from IEC410: Sampling plan and procedure for inspection by counting. ?In the table:
p-cycle, month,
nsample size:
C-qualification effect (allowable number of unqualified products)D-destructive;
ND-non-destructive,
IL-inspection level
AQL-qualified quality level
Clause number and test items
(See Note ①)
Group A inspection
(Batch by batch)
Group A1
4.4.1 Visual inspection
Group A2||tt ||4.4.2 Dimensions (gauge inspection)
4.5 Resistance value
B test
(approval)
B1 group
4.7 Withstand voltage
IEC410.
Test conditions
(see Note@)
1/:0mm gauge should be used
Method: V-block method,
Apply peak AC voltage and 1.42 times the insulation voltage value
(see Note?)
Performance requirements||t t||(See note)
According to 4.4.1
The marking is clear and complies with the provisions of 1.4
of this specification
According to Table 1 of this specification
According to 4.5.2
No striking wear-through
Clause number and test items
(See note)
B2 group
4.17 Weldability
4.13 Overload
Clause number and test items
(See note ①)
C group inspection
(cycle)
C1A group
(half of the sample of C1 group)
4.16 Terminal Strength
SJ2674-86
Test Conditions
(See Note ④)
Required aging: temperature 155
C, time 4h, method: ball welding method, the temperature of the equipment
should be adjusted and maintained
at 235±2℃
Special Base Fermentation Male Cream
The voltage applied should be
2.5 times rated voltage or 2 times component limiting voltage, whichever is lower. Appearance inspection Test conditions (see note ①) Pull force: 10N (see note ?) Sample size and qualified judgment number (see note ③) Bending (half of the number of terminals) Twisting (the other half of the number of terminals) Table 2 continued Performance requirements (see note @) Solder should flow within 2S No visible damage, clear markings AR<±（0.5%R+0.05Q）
Continued Table 2
Performance requirements
(See Note)
Clause number and test items
(See Note ①)
4.18 Resistance to soldering heat
C1B group
(The other half of the C1 group sample)
4.19 Rapid temperature change
4,22 Report
C1 group
(The other half of the C1 group sample)
SJ2674-86
Test conditions
(See Note ①)
Appearance inspection
Method: 1A, slot temperature 260±50,
Immersion time: 10±1s
Immersion depth: from component body
Appearance inspection
e--55℃
Q: =+125℃
Appearance inspection
Installation method: See this specification
Procedure: B4
Rated frequency range: 10Hz to 500Hz
Amplitude: 0.75mm or acceleration
98ms/2 (whichever is smaller
Total duration: 6h
Appearance inspection
Sample size and
Qualified number
(See Note ③)
Continued 2
Performance requirements
(See Note@)
No visible damage
AR<≤±（0.5%R+0.052）
No visible damage, clear marking
△R<±（0.5%R+0.05）
No visible damage
△R<±（0.5%R+0.05Q)
No visible damage
AR≤±（0.5%R+0.05Q）
Clause number and test items
(See Note①)
Combined sample)
4.23 Climate sequence
Cyclic damp heat, test||t t||Db, first cycle
- low pressure
cycle damp heat, test
Db, the remaining cycles
- DC load
C2 group
4.25.170 It durability
SJ2674-86
Test conditions
(See Note ①)
8.5kPa (85mbar)
Visual inspection
Insulation resistance
Duration: 1000h
At 48h, 500h and 1000b
Inspection:
Visual inspection
At 100 Inspection at 0h:
Insulation resistance
It is recommended that the manufacturer extend the
quarterly test to 8000h every year
Inspect at 2000h, 4000h and
8000h:
Size and
Qualified judgment number
See Note ③)
Continued 2
Performance requirements
(See Note ④)
No visible damage, clear markings
△R≤±（2%R+0.12)
R≥100M2
No visible damage
AR≤±（2%R+0.19）||tt ||R≥IGQ
△R<±（5%R+0.59)
(The results are for reference only)
Clause number and test items
(See Note?)
C3 group
4.8 Resistance change with temperature
D group test
(Cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperaturebZxz.net
Durability
Additional instructions:
SJ2674-86
Test conditions| |tt||(See Note ①)
-55℃/20℃
20/+125℃
4, 24.2.2
10 samples in the first group
10 samples in the second group
Appearance inspection
Insulation resistance
Duration: 1000 five
Inspection at 48h, 500h and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
1. This standard is provided by the Standardization Institute of the Ministry of Electronics Industry. 2. This standard was drafted by the State-owned No. 718 Factory and other units. 3. The main drafters of this standard are Man Kailai and He Delong. 8
Sample size and
Qualified judgment number
(See Note ③)
Performance requirements
(See Note?)
α±250×10-5/℃
α±250×10-a/
No visible damage, clear marking
△R<±（2%R+0.12)
R≥100MQ
Comply with the requirements of Table 1 of this specification
No visible damage
△R<±（2%R+0.1)5kPa (85mbar)
Appearance inspection
Insulation resistance
Duration: 1000h
Inspect at 48h, 500h and 1000h:
Appearance inspection
Inspect at 1000h:
Insulation resistance
It is recommended that manufacturers extend the
quarterly test to 8000h each year
Inspect at 2000h, 4000h and
8000h:
Xiangben size and||t t||Qualified judgment number
See Note ③)
Continued 2
Performance requirements
(See Note ④)
No visible damage, clear marking
△R≤±（2%R+0.12)
R≥100M2
No visible damage
AR≤±（2%R+0.19）
R≥IGQ
△R<±（5%R+0.59)
(The results are for reference only)
Clause number and test items
(See Note?)
C3 group
4.8 Resistance change with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ2674-86
Test conditions
(See Note ①)
-55℃/20℃
20 /+125℃
4,24.2.2
10 samples in the first group
10 samples in the second group
Appearance inspection
Insulation resistance
Duration: 1000Five
Inspection at 48h, 500h and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
1. This standard is provided by the Standardization Institute of the Ministry of Electronics Industry. 2. This standard was drafted by the State-owned No. 718 Factory and other units. 3. The main drafters of this standard are Man Kailai and He Delong. 8
Sample size and
Qualified judgment number
(See Note ③)
Performance requirements
(See Note?)
α±250×10-5/℃
α±250×10-a/
No visible damage, clear marking
△R<±（2%R+0.12)
R≥100MQ
Comply with the requirements of Table 1 of this specification
No visible damage
△R<±（2%R+0.1)5kPa (85mbar)
Appearance inspection
Insulation resistance
Duration: 1000h
Inspect at 48h, 500h and 1000h:
Appearance inspection
Inspect at 1000h:
Insulation resistance
It is recommended that manufacturers extend the
quarterly test to 8000h each year
Inspect at 2000h, 4000h and
8000h:
Xiangben size and||t t||Qualified judgment number
See Note ③)
Continued 2
Performance requirements
(See Note ④)
No visible damage, clear marking
△R≤±（2%R+0.12)
R≥100M2
No visible damage
AR≤±（2%R+0.19）
R≥IGQ
△R<±（5%R+0.59)
(The results are for reference only)
Clause number and test items
(See Note?)
C3 group
4.8 Resistance change with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ2674-86
Test conditions
(See Note ①)
-55℃/20℃
20 /+125℃
4,24.2.2
10 samples in the first group
10 samples in the second group
Appearance inspection
Insulation resistance
Duration: 1000Five
Inspection at 48h, 500h and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
1. This standard is provided by the Standardization Institute of the Ministry of Electronics Industry. 2. This standard was drafted by the State-owned No. 718 Factory and other units. 3. The main drafters of this standard are Man Kailai and He Delong. 8
Sample size and
Qualified judgment number
(See Note ③)
Performance requirements
(See Note?)
α±250×10-5/℃
α±250×10-a/
No visible damage, clear marking
△R<±（2%R+0.12)
R≥100MQ
Comply with the requirements of Table 1 of this specification
No visible damage
△R<±（2%R+0.1)
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