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SJ 20646-1997 Test methods for hybrid integrated circuit DC/DC converters

Basic Information

Standard ID: SJ 20646-1997

Standard Name: Test methods for hybrid integrated circuit DC/DC converters

Chinese Name: 混合集成电路DC/DC变换器测试方法

Standard category:Electronic Industry Standard (SJ)

state:in force

Date of Release1997-06-17

Date of Implementation:1997-10-01

standard classification number

Standard Classification Number:>>>>L5962

associated standards

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other information

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SJ 20646-1997 Hybrid integrated circuit DC/DC converter test method SJ20646-1997 standard download decompression password: www.bzxz.net

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Military Standard of the Electronic Industry of the People's Republic of China FL5962
SJ20646-97
Test Methods of Hybrid Integrated Circuit DC/DC
Converter
The measuring methods of DC/DCconverters for hybrid integrated circuits1997-06-17 Issued
Implemented on October 1, 1997
Approved by the Ministry of Electronics Industry of the People's Republic of China Military Standard of the Electronic Industry of the People's Republic of China Hybrid Integrated Circuit DC/DC Converter
Test Methods
The measuring methods of DC/DC converters for hybrid integrated circuits1 Scope
1.1 Subject Content
SJ 20646-97
This standard specifies the test methods for the main energy parameters of hybrid integrated circuit DC/DC (direct current/direct current) converters. 1.2 Scope of Application
This standard is applicable to the parameter test of hybrid integrated circuit DC/DC converters in various types of military electronic equipment. 2 References
No clauses in this chapter
3 Definitions
No clauses in this chapter.
4 General requirements
In the test of each parameter, the following general test conditions should be met. 4.1 Standard atmospheric conditions for test
If there are no other provisions, the standard atmospheric conditions for the test are: temperature: 25#;
Relative humidity: 45%~80%;
Air pressure: 86~-106kPa.
4.2 During the test, the following matters should be noted. The influence of external interference on the test accuracy should be avoided; a.
b. The test error caused by the test equipment should meet the accuracy requirements of the measured parameters; the internal resistance of the power supply applied to the device under test (DLIT) should be basically zero:
d. When the DUT is connected or disconnected from the test system, the use limit conditions of the DUT should not be exceeded; unless otherwise specified, the DUT should be tested after reaching a stable output under rated conditions, and the test equipment, instruments, etc. should be preheated according to the use requirements of the equipment and instruments. 5 Detailed requirements
The Ministry of Electronics Industry of the People's Republic of China issued on June 17, 1997 and implemented on October 1, 1997
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5.1 Output voltage Vo
5.1.1 Due to
SJ 20646-97
Under the specified conditions, test the voltage between the output terminals of the DC/DC converter. 5.1.2 Test schematic
The test schematic of the output voltage is shown in Figure 1. Oscilloscope
Secret voltage power supply
Digital voltmeter
5.1.3 Test conditions
During the test, the following test conditions should be specified: a. Ambient temperature Ta:
b Input voltage Vi:
c. Output current o.
5.1.4 Test procedure
5.1.4.1 Connect the DUT to the test system at the specified ambient temperature. 2
5.1.4.2 Set the switch S shown in Figure 1 to position \1-2\, S1 to the open position, S2 to the closed position, so that the specified DC input voltage V is applied to the input terminal of the DUT. Adjust RL to obtain the output current Io. 5.1.4.3 Set the switch S shown in Figure 1 to position \3-4\, and record the output voltage Vo45 of the DUT. 1.5 Notes
a. The influence of temperature drift on the test results should be avoided as much as possible: b. During the retrospective test, the input voltage shall not exceed the limit value of the DUT. 5.2 Output current Ig
5.2.1 The current flowing from the output end of the DC/DC converter to the load is tested under the specified conditions, usually referring to the rated value at full load.
5.2.2 Test source schematic
The test schematic diagram of the output current is shown in Figure 1. 5.2.3 Test conditions
During the test, the following test conditions should be specified: a. Ambient temperature TA!
b. Input voltage Vi
c. Output voltage Vo:
d. Load R (full load).
5.2.4 Test Procedure
SJ 20646—97
5.2.4.1 Connect the DUT to the test system at the specified ambient temperature. 5.2.4.2 Set the switch S shown in Figure 1 to position \1-2\, S1 to the open position, S2 to the closed position, so that 1) the specified DC input voltage VI is at the input end of the UT
5.2.4.3 Under the condition of ensuring the output voltage V., Ioc can be directly read from the ammeter connected to the load end. 5.2.5 Notes
a. The influence of temperature drift on the test results should be avoided as much as possible; h. During the test, the input voltage shall not exceed the limit value of the DUT. 5.3 Output Ripple Voltage VRIP
5.3.1 Purpose
Under specified conditions, test the AC peak-to-peak value contained in the DC output voltage of the DC/DC converter when it is fully loaded. 5.3.2 Test Schematic Diagram
The test schematic diagram of output ripple voltage is shown in Figure 1. 5.3.3 Test Conditions
During the test, the following test conditions should be specified: a. Ambient temperature Ta:
b. Input voltage Viri
c. Full load output current Ig:
d. Test bandwidth.
5.3.4 Test Procedure
5. 3.4. 1 Connect the DUT to the test system at the specified ambient temperature. 5.3.4.2 Set the switch S shown in Figure 1 to position \1-2\, S1 to the open position, S2 to the closed position, so that the specified DC input voltage Vi is applied to the input terminal of the DUT. 5.3.4.3 Set the switch S shown in Figure 1 to position 3-4\, and adjust Rl so that the current flowing through R reaches the specified full load output current In.
5.3.4.4 Read the peak-to-peak value VRrPc of the AC component of the output voltage from the oscilloscope 5.3.5 Notes
a. During the test, the temperature should be kept constant: h. During the test, the output current should be kept constant; c. Care should be taken to avoid the influence of external interference on the ripple measurement. For example, the wiring between the oscilloscope ground terminal and the DUT ground terminal should be as short as possible, generally not exceeding 10cm, or an equivalent method of external circuit compensation should be adopted. 5.4 Voltage Regulation Sv
5.4.1 Purpose
Under specified conditions, test the relative change in output voltage caused by the change in input voltage when the output current I of the DC/DC converter and the ambient temperature remain unchanged. —3
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5.4.2 Test Schematic Diagram
SJ 20646-97
The test schematic diagram of voltage regulation is shown in Figure 1. 5.4.3 Test conditions;
During the test, the following test conditions shall be specified: a. Ambient vortex TAi
b. Input voltage V, and its maximum and minimum input Vimax, Vimintc, full load output current Iog
5.4.4 Test procedure
5.4.4.1 Connect the DUT to the test system at the specified ambient temperature. 5.4.4.2 Set the switch S shown in Figure 1 to position \1-2\, S1 to the open position, and S2 to the closed position, so that the specified DC input voltage V10 is applied to the DUT input terminal. 5.4.4.3 Set the switch S shown in Figure 1 to position \3-4\, and measure the voltage at the DUT output terminal to be Vo0. 5.4.4.4 Repeat 5.4.4.2 and 5.4.4.3, adjust the DUT input voltage to Vimx and Vimim respectively, and measure the output voltage at different input voltages, which are recorded as Vo1 and Vo20 respectively. 5.4.4.5 Calculate the voltage regulation rate according to formula (1): Sy
Where: 2V is |Voi"Ve.
5.4.5 Notes
. During the test period, the temperature should be kept constant; 1. During the test period, the load should be kept constant; 5.5 Current regulation rate S,
5.5.1
Under the specified conditions, test the relative change of the output voltage caused by the change of the output current when the input voltage V of the DC/DC converter and the ambient temperature remain unchanged. 5.5.2 Test schematic
The test schematic of the current regulation rate is shown in Figure 1. 5.5.3 Test conditions
During the test, the following test conditions shall be specified: Ambient temperature Tai
h. Input voltage Vi
C. Rated output current Ia and Iomina
5.5.4 Test procedure
5.5.4.1 Under the specified ambient temperature, place the DUT into the test system. 5.5.4.2 Place the switch S shown in Figure 1 in position *1-2\, S1 in the open position, S2 in the closed position, and apply the specified DC input voltage Vic to the DUT input terminal. 5.5.4.3 Place the switch S shown in Figure 1 in position \3-4\, adjust RL so that the output current is I, and measure the output voltage Vme at this time
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5.5.4.4 Adjust RL again so that the output current is Iomi, and measure the output voltage Vo2 at this time. 5.5.4.5 Calculate the current regulation rate according to formula (2): Sr=
Where: 4V, Vo1- Vo2
5.5.5 Notes
a. During the test, the temperature should be kept constant; b. During the test, the input voltage should be kept constant. 5.6 Cross Regulation
5.6.1 Purpose
X 100%
Under specified conditions, test the DC/DC converter with dual outputs. When one output is at the specified minimum power, the relative change in output voltage when the other output power changes from the specified minimum power to the specified maximum power. 5.6.2 Test Schematic
The cross-dual regulation test diagram is shown in Figure
5.6.3 Test Conditions
During the test, the following test conditions shall be specified a. Ambient temperature Ta:
b. Rated input voltage Vr
Rated output voltage Vo+, Va-;
d, positive minimum output power Po1+, positive maximum output power Po2+; negative minimum output power Pn1-, negative maximum output power Pr?- 35.6.4 Test procedure
5.6.4.1 At the specified ambient temperature, connect the DUT to the test system. 5.6.4.2 Add the specified rated input voltage Vrc8
Voltmeter
Voltmeter
5.6.4.3 Adjust the positive load RL. Make the positive output power the specified Pu+. Adjust the negative load Rla so that the negative output power is the specified Pal-. At this time, the positive output voltage Vou can be measured from the DC digital voltmeter. Continue to adjust Ri2 so that its output power changes to the specified Po2-, and then measure the positive output voltage Vo2. 5.6.4.4 Calculate the cross-regulation rate of the positive output voltage according to the following formula: Vct
IYoz - Va.l × 100%
+(3)
TYKAOIKAca-
SJ 20646—97
5.6.4.5 Repeat 5.6.4.3, and exchange the RL and RL load conditions. The cross-regulation rate Vc- of the negative output voltage can also be measured.
5.6.5 Notes
a: During the test, the temperature should be kept constant; b, during the test, the rated input voltage should be kept constant. 5.7 Input current I
5.7.1 Purpose
To test the DC/DC converter when the input voltage V, and the ambient temperature remain unchanged, the output is unloaded, the inhibit terminal is open (or the inhibit terminal is connected to the negative input terminal), the input current flowing through the input is also: 5.7.2 Test schematic
The test schematic diagram of the input current is shown in Figure 1. 5.7.3 Test conditions
During the test period, the following test conditions should be specified: a. Ambient temperature TA;
h. Rated input voltage Vsi
c. Output is unloaded
d. The inhibit terminal is connected.
5.7.4 Test procedure
Under the specified ambient temperature, the DUT Connect to the test system. 5.7.4.2 Place the switch S shown in Figure 1 in the vacant position, disconnect switch S2, and read the input currents ILI and IL2 when switch S1 is opened and closed from the input ammeter respectively. 5.7.5 Notes
During the test, the temperature should be kept constant:
b. During the test, the rated input voltage should be kept constant. 5.8 Output voltage temperature coefficient ST
5.8.1 Purpose
To test the relative change in output voltage per unit temperature caused by temperature changes when the input voltage V1 and the output current I2 remain unchanged within the specified temperature range of the DC/TXC converter. 5.8.2 Test schematic
The test schematic diagram of the output positive temperature coefficient is shown in Figure 1. 5.8.3 Test conditions
During the test period, the following test conditions shall be specified: a. Ambient temperature TA:
b. Maximum operating temperature Ta and minimum operating temperature TA2 c. Input voltage Vi;
d. Rated output current Io
5.8. 4 Test procedure
5.8.4.1 Under the specified ambient temperature Ta, connect the DUT to the test system. 5.8.4.2 Set the switch S shown in Figure 1 to position \1-2\. S1 to the open position. S2 to the closed position. Apply the specified DC input voltage V to the DUT input terminal. Then set the switch S to position \3-4\. Adjust R1 to make the output current I. to the rated value. Measure the output voltage Vm.
5.8.4.3 Place the DUT in a constant temperature box and keep it constant at the minimum operating temperature Ta for 30 minutes. After that, the output voltage is measured and recorded as Vo20
After adjusting the temperature of the constant temperature box to the minimum operating temperature T, the output voltage is measured after the constant temperature is kept for 30 minutes and recorded as Voo
Calculate the output voltage temperature coefficient according to formula (4): 5.8.4.53
Va Vozi
St = vl X(ta-Ia)×100%
5.8.5 Notes
%: During the test, the temperature should not exceed the limit value of DUT; b. During the test, the input voltage V and output current I should be kept unchanged; 5.9 Efficiency
5.9.1 Purpose
Test the percentage of output power and input power of DC/DC converter. 5.9.2 Test Schematic Diagram
The test schematic diagram of efficiency is shown in Figure 1
5.9.3 Test Conditions
During the test, the following test conditions shall be specified: Strong: Ambient temperature TA:
b, Input voltage Vi
: Rated output current Ig
5.9.4 Test Procedure
5.9.4.1 At the specified ambient temperature TA, connect the DUT to the test system. (4)
5.9.4.2 Set the switch S shown in Figure 1 to position 1-2\, S1 to the open position, S2 to the closed position, so that the specified DC input voltage V1 is applied to the input terminal of the TUT, and the input voltage V and input current I (read from the ammeter) are recorded. 5.9.4.3 Set the switch S to position \3-4\. Adjust R so that the output current is, reaches the rated value, record the output voltage Vao
Calculate the efficiency 7 according to formula (5):
Vox Ig
x ​​100%
Vrx Ir
5.9.5 Notes
8, during the test, it is necessary to prevent the power limit from being exceeded; b. The output voltage V is generally the rated value.
5.10 Insulation resistance
5.10.1 Purpose
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SI20646-97
Test the insulation resistance between the input and output terminals of the DC/DC converter or any lead terminal not connected to the casing and the external environment. 5.10.2 Test conditions
During the test, the following test conditions should be specified: Ambient temperature T. and relative humidity:
h. Applied direct wave test voltage Vpc;
c: the shortest time t for applying voltage.
5.10.3 Test procedure
5.10.3.1 Connect the DUT to the test system at the specified ambient temperature TA and relative humidity. 5.10.3.2 Apply a direct current test layer VDc between the input terminal Vi+ or V- and the output terminal Vo- or Vo- of the DUT, or between any lead-out terminal not connected to the housing and the housing, for a time of t. 5.10.3.3 After the time for applying Vuc is reached, use a megohmmeter to measure its resistance. 5.10.4 Notes
a: During the test, the DUT is in a non-working state. 5.11 Start-up overshoot Vo
5.11.1
Test the maximum change in the instantaneous value of the output voltage of the DC/DC converter after a step input voltage is applied. 5.11.2 Test Schematic Diagram
The test schematic diagram of the start-up overshoot is shown in Figure 3.
5.11.3 Test Conditions
During the test, the following test conditions should be specified: a. Ambient temperature TAi
b. Input voltage Vr:
c. Output current "o
5.11.4 Test procedure
5.11.4.1 Connect the DUT to the test system at the specified ambient temperature TA. 5.11.4.2 Disconnect the switch S shown in Figure 3 and set the pedal to the no-load state. Close the switch S2. Make the step input voltage applied to the DUT V. At this time, the startup overshoot Vio when no-load can be measured from the storage oscilloscope. DC
Armored voltage power supply
Storage oscilloscope
SJ20646-97
5.11.4.3 Connect the switch S shown in Figure 3 Close the switches S1 and S2 in the circuit, and adjust R1 so that the current on the output ammeter is the specified Is. That is, the circuit is fully loaded. At this time, disconnect S2, and then reclose S2, so that the step input voltage applied to the DUT is Vu. At this time, the startup overshoot Vim at full load can be measured from the storage oscilloscope. 5.11.5 Notes
. Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time: b. The bandwidth of the storage oscilloscope should be no less than 10MHz. 5.12 Startup delay trR
5. 12.1 Purpose
To test the time it takes for the output voltage of a DC/TC converter to reach 90% of its rated voltage after a step input voltage is applied.
5.12.2 Test Schematic
The test schematic diagram for the start-up delay is shown in Figure 3. 5.12.3 Test Conditions
During the test, the following test conditions should be specified: a. Ambient temperature TA;
b, input voltage V:
c. Rated output voltage Vo
d. Output current Ioo
5.12.4 Test Procedure
5.12.4.1 At the specified ambient temperature T, connect the DUT to the test system. 5.12.4.2 When no-load, open the switch S1 shown in Figure 3, set the circuit to no-load state, close S2, and make the step input voltage applied to the DUT V. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output When the voltage change stabilizes to 90% of its rated output voltage V, the startup delay tTR at no load can be measured. 5.12.4.3 Close switches S1 and S2 in Figure 3, adjust RL, so that the current on the output ammeter is the specified Is, that is, the circuit is fully loaded. At this time, disconnect S2, and then reclose S2 to make the step input voltage applied to DU VI. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage change stabilizes to 90% of its rated output voltage V, the startup delay tTR at full load can be measured. 5.12.4 Notes
Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.13 Output response VvaR when the input voltage changes 5.13.1 Purpose
Test the maximum change of the input voltage when the input voltage of the DC/DC converter jumps between the maximum and minimum values. 5.13.2 Test Schematic Diagram
The output response test diagram when the input voltage jumps is shown in Figure 4.91
HTTKAONTKAca-
Smart Power Supply
5.13.3 Test Conditions
SJ20646-97
Step||During the test, the following test conditions should be specified: H: Ambient temperature TA; b Input voltage range VniVi2i
Small wrinkle
Output current I. (The load can be either no-load or full-load). c
5.13.4 Test Procedure
5.13.4.1 At the specified ambient temperature T., connect the DUIT to the test system.
5.13.4.2 Under certain load conditions, the input voltage jumps from V-→>Vz and V11→Vr through the voltage jump device.
5.13.4.3 When the input voltage changes in parallel, the difference between the maximum output voltage V. and the minimum output voltage Vo measured on the storage oscilloscope is the output response VvOR.
5.13.5 Notes
a. Note that the input voltage opening and rising time should be short enough, generally less than 1/10 of the specified recovery time; b. Different loads have a great impact on the test results. Generally, the values ​​at no load and full load should be measured. 5.14 Recovery time when input voltage changes in parallel 1voRa5.14.1 The time required for the output voltage to return to within 1% of its stable value when the input voltage of the DC/DC converter jumps between the maximum and minimum values ​​is tested.
5.14.2 Test Schematic Diagram
Recovery Time Test Schematic Diagram for Voltage Jump is shown in Figure 4. 5.14.3 Test Conditions
During the test, the following test conditions shall be specified: Ambient temperature TA:
Input voltage range Vu~V2
Output voltage Va:
Required output current Ig.
5.14.4 Test Procedure
At the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the input voltage jump from V一→Vi2 and the jump of Vz\)V through the voltage embedding device.
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5.14.4.3 When the input voltage jumps, the change of the output voltage measured on the storage oscilloscope recovers to its stable value V. The time required to be within the range of ±1% tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no load, half load and full load. 5.15.2 Test schematic
The test schematic diagram of the output response when the load jumps is shown in Figure 5. DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a: Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load, half-load, or full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 At the specified input voltage V, use the load step device to achieve a back-and-forth step change of the load from no-load to half-load to full-load, and no-load to full-load. Use a storage oscilloscope to record the output voltage transient process. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load Step Recovery Time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load, and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test Schematic Diagram
The recovery time test diagram during load jump is shown in Figure 5. 5.16.3 Test Conditions
During the test, the following test conditions should be specified: Ambient temperature TA;
b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-Make the step input voltage applied to the DUT V, then the startup overshoot Vim at no load can be measured from the storage oscilloscope. DC
Armored voltage power supply
Storage oscilloscope
SJ20646-97
5.11.4.3 Close the switches S1 and S2 in Figure 3 and adjust R1 so that the current on the output ammeter is the specified Is. That is, the circuit is fully loaded. At this time, disconnect S2, and then close S2 again, so that the step input voltage applied to the DUT is Vu, then the startup overshoot Vim at full load can be measured from the storage oscilloscope. 5.11.5 Notes
. Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified recovery time: b. The bandwidth of the storage oscilloscope should not be less than 10MHz. 5.12 Start-up delay trR
5. 12.1 Purpose
Test the time it takes for the output voltage of a DC/TC converter to reach 90% of its rated voltage after a step input voltage is applied.
5.12.2 Test schematic
The test schematic of the start-up delay is shown in Figure 3. 5.12.3 Test conditions
During the test, the following test conditions should be specified: a. Ambient temperature TA;
b, input voltage V:
c. Rated output voltage Vo
d. Output current Ioo
5.12.4 Test procedure
5.12.4.1 Connect the DUT to the test system at the specified ambient temperature T. 5.12.4.2 When no-load, disconnect the switch S1 shown in Figure 3, set the circuit to no-load state, close S2, and make the step input voltage applied to DUT V. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to 90% of its rated output voltage V., the startup delay tTRo when no-load can be measured. 5.12.4.3 Close the switches S1 and S2 in Figure 3, adjust RL, so that the current on the output ammeter is the specified Is, that is, the circuit is fully loaded. At this time, disconnect S2, and then reclose S2, so that the step input voltage applied to DU is VI. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to its rated output voltage V. When the input voltage rise time is 90%, the start-up delay tTR4 at full load can be measured. 5.12.4 Notes
Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.13 Output response VvaR when the input voltage changes 5.13.1 Purpose
Test the maximum change in the input voltage when the input voltage of the DC/DC converter jumps between the maximum and minimum values. 5.13.2 Test Schematic Diagram
The output response test diagram when the input voltage jumps is shown in Figure 4.91
HTTKAONTKAca-
Smart Power Supply
5.13.3 Test Conditions
SJ20646-97
Step||During the test, the following test conditions should be specified: H: Ambient temperature TA; b Input voltage range VniVi2i
Small wrinkle
Output current I. (The load can be either no-load or full-load). c
5.13.4 Test Procedure
5.13.4.1 At the specified ambient temperature T., connect the DUIT to the test system.
5.13.4.2 Under certain load conditions, the input voltage jumps from V-→>Vz and V11→Vr through the voltage jump device.
5.13.4.3 When the input voltage changes in parallel, the difference between the maximum output voltage V. and the minimum output voltage Vo measured on the storage oscilloscope is the output response VvOR.
5.13.5 Notes
a. Note that the input voltage opening and rising time should be short enough, generally less than 1/10 of the specified recovery time; b. Different loads have a great impact on the test results. Generally, the values ​​at no load and full load should be measured. 5.14 Recovery time when input voltage changes in parallel 1voRa5.14.1 The time required for the output voltage to return to within 1% of its stable value when the input voltage of the DC/DC converter jumps between the maximum and minimum values ​​is tested.
5.14.2 Test Schematic Diagram
Recovery Time Test Schematic Diagram for Voltage Jump is shown in Figure 4. 5.14.3 Test Conditions
During the test, the following test conditions shall be specified: Ambient temperature TA:
Input voltage range Vu~V2
Output voltage Va:
Required output current Ig.
5.14.4 Test Procedure
At the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the input voltage jump from V一→Vi2 and the jump of Vz\)V through the voltage embedding device.
SJ2064697
5.14.4.3 When the input voltage jumps, the change of the output voltage measured on the storage oscilloscope recovers to its stable value V. The time required to be within the range of ±1% tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no load, half load and full load. 5.15.2 Test schematic
The test schematic diagram of the output response when the load jumps is shown in Figure 5. DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a: Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load, half-load, or full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 At the specified input voltage V, use the load step device to achieve a back-and-forth step change of the load from no-load to half-load to full-load, and no-load to full-load. Use a storage oscilloscope to record the output voltage transient process. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load Step Recovery Time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load, and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test Schematic Diagram
The recovery time test diagram during load jump is shown in Figure 5. 5.16.3 Test Conditions
During the test, the following test conditions should be specified: Ambient temperature TA;
b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-Make the step input voltage applied to the DUT V, then the startup overshoot Vim at no load can be measured from the storage oscilloscope. DC
Armored voltage power supply
Storage oscilloscope
SJ20646-97
5.11.4.3 Close the switches S1 and S2 in Figure 3 and adjust R1 so that the current on the output ammeter is the specified Is. That is, the circuit is fully loaded. At this time, disconnect S2, and then close S2 again, so that the step input voltage applied to the DUT is Vu, then the startup overshoot Vim at full load can be measured from the storage oscilloscope. 5.11.5 Notes
. Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified recovery time: b. The bandwidth of the storage oscilloscope should not be less than 10MHz. 5.12 Start-up delay trR
5. 12.1 Purpose
Test the time it takes for the output voltage of a DC/TC converter to reach 90% of its rated voltage after a step input voltage is applied.
5.12.2 Test schematic
The test schematic of the start-up delay is shown in Figure 3. 5.12.3 Test conditions
During the test, the following test conditions should be specified: a. Ambient temperature TA;
b, input voltage V:
c. Rated output voltage Vo
d. Output current Ioo
5.12.4 Test procedure
5.12.4.1 Connect the DUT to the test system at the specified ambient temperature T. 5.12.4.2 When no-load, disconnect the switch S1 shown in Figure 3, set the circuit to no-load state, close S2, and make the step input voltage applied to DUT V. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to 90% of its rated output voltage V., the startup delay tTRo when no-load can be measured. 5.12.4.3 Close the switches S1 and S2 in Figure 3, adjust RL, so that the current on the output ammeter is the specified Is, that is, the circuit is fully loaded. At this time, disconnect S2, and then reclose S2, so that the step input voltage applied to DU is VI. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to its rated output voltage V. When the input voltage rise time is 90%, the start-up delay tTR4 at full load can be measured. 5.12.4 Notes
Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.13 Output response VvaR when the input voltage changes 5.13.1 Purpose
Test the maximum change in the input voltage when the input voltage of the DC/DC converter jumps between the maximum and minimum values. 5.13.2 Test Schematic Diagram
The output response test diagram when the input voltage jumps is shown in Figure 4.91
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5.13.3 Test Conditions
SJ20646-97
Step||During the test, the following test conditions should be specified: H: Ambient temperature TA; b Input voltage range VniVi2i
Small wrinkle
Output current I. (The load can be either no-load or full-load). c
5.13.4 Test Procedure
5.13.4.1 At the specified ambient temperature T., connect the DUIT to the test system.
5.13.4.2 Under certain load conditions, the input voltage jumps from V-→>Vz and V11→Vr through the voltage jump device.
5.13.4.3 When the input voltage changes in parallel, the difference between the maximum output voltage V. and the minimum output voltage Vo measured on the storage oscilloscope is the output response VvOR.
5.13.5 Notes
a. Note that the input voltage opening and rising time should be short enough, generally less than 1/10 of the specified recovery time; b. Different loads have a great impact on the test results. Generally, the values ​​at no load and full load should be measured. 5.14 Recovery time when input voltage changes in parallel 1voRa5.14.1 The time required for the output voltage to return to within 1% of its stable value when the input voltage of the DC/DC converter jumps between the maximum and minimum values ​​is tested.
5.14.2 Test Schematic Diagram
Recovery Time Test Schematic Diagram for Voltage Jump is shown in Figure 4. 5.14.3 Test Conditions
During the test, the following test conditions shall be specified: Ambient temperature TA:
Input voltage range Vu~V2
Output voltage Va:
Required output current Ig.
5.14.4 Test Procedure
At the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the input voltage jump from V一→Vi2 and the jump of Vz\)V through the voltage embedding device.
SJ2064697
5.14.4.3 When the input voltage jumps, the change of the output voltage measured on the storage oscilloscope recovers to its stable value V. The time required to be within the range of ±1% tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no load, half load and full load. 5.15.2 Test schematic
The test schematic diagram of the output response when the load jumps is shown in Figure 5. DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a: Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load, half-load, or full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 At the specified input voltage V, use the load step device to achieve a back-and-forth step change of the load from no-load to half-load to full-load, and no-load to full-load. Use a storage oscilloscope to record the output voltage transient process. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load Step Recovery Time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load, and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test Schematic Diagram
The recovery time test diagram during load jump is shown in Figure 5. 5.16.3 Test ConditionswwW.bzxz.Net
During the test, the following test conditions should be specified: Ambient temperature TA;
b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-2 When no-load, disconnect the switch S1 shown in Figure 3, set the circuit to no-load state, close S2, and make the step input voltage applied to the DUT V. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to 90% of its rated output voltage V., the startup delay tTRo when no-load can be measured. 5.12.4.3 Close the switches S1 and S2 in Figure 3, adjust RL, and make the current on the output ammeter to the specified Is, that is, the circuit is fully loaded. At this time, disconnect S2, and then reclose S2, so that the step input voltage applied to the DU is VI. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to its rated output voltage V. When the input voltage rise time is 90%, the start-up delay tTR4 at full load can be measured. 5.12.4 Notes
Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.13 Output response VvaR when the input voltage changes 5.13.1 Purpose
Test the maximum change in the input voltage when the input voltage of the DC/DC converter jumps between the maximum and minimum values. 5.13.2 Test Schematic Diagram
The output response test diagram when the input voltage jumps is shown in Figure 4.91
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Smart Power Supply
5.13.3 Test Conditions
SJ20646-97
Step||During the test, the following test conditions should be specified: H: Ambient temperature TA; b Input voltage range VniVi2i
Small wrinkle
Output current I. (The load can be either no-load or full-load). c
5.13.4 Test Procedure
5.13.4.1 At the specified ambient temperature T., connect the DUIT to the test system.
5.13.4.2 Under certain load conditions, the input voltage jumps from V-→>Vz and V11→Vr through the voltage jump device.
5.13.4.3 When the input voltage changes in parallel, the difference between the maximum output voltage V. and the minimum output voltage Vo measured on the storage oscilloscope is the output response VvOR.
5.13.5 Notes
a. Note that the input voltage opening and rising time should be short enough, generally less than 1/10 of the specified recovery time; b. Different loads have a great impact on the test results. Generally, the values ​​at no load and full load should be measured. 5.14 Recovery time when input voltage changes in parallel 1voRa5.14.1 The time required for the output voltage to return to within 1% of its stable value when the input voltage of the DC/DC converter jumps between the maximum and minimum values ​​is tested.
5.14.2 Test Schematic Diagram
Recovery Time Test Schematic Diagram for Voltage Jump is shown in Figure 4. 5.14.3 Test Conditions
During the test, the following test conditions shall be specified: Ambient temperature TA:
Input voltage range Vu~V2
Output voltage Va:
Required output current Ig.
5.14.4 Test Procedure
At the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the input voltage jump from V一→Vi2 and the jump of Vz\)V through the voltage embedding device.
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5.14.4.3 When the input voltage jumps, the change of the output voltage measured on the storage oscilloscope recovers to its stable value V. The time required to be within the range of ±1% tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no load, half load and full load. 5.15.2 Test schematic
The test schematic diagram of the output response when the load jumps is shown in Figure 5. DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a: Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load, half-load, or full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 At the specified input voltage V, use the load step device to achieve a back-and-forth step change of the load from no-load to half-load to full-load, and no-load to full-load. Use a storage oscilloscope to record the output voltage transient process. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load Step Recovery Time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load, and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test Schematic Diagram
The recovery time test diagram during load jump is shown in Figure 5. 5.16.3 Test Conditions
During the test, the following test conditions should be specified: Ambient temperature TA;
b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-2 When no-load, disconnect the switch S1 shown in Figure 3, set the circuit to no-load state, close S2, and make the step input voltage applied to the DUT V. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to 90% of its rated output voltage V., the startup delay tTRo when no-load can be measured. 5.12.4.3 Close the switches S1 and S2 in Figure 3, adjust RL, and make the current on the output ammeter to the specified Is, that is, the circuit is fully loaded. At this time, disconnect S2, and then reclose S2, so that the step input voltage applied to the DU is VI. At this time, compare the input and output voltage establishment waveforms on the storage oscilloscope. When the output voltage changes stabilize to its rated output voltage V. When the input voltage rise time is 90%, the start-up delay tTR4 at full load can be measured. 5.12.4 Notes
Note that the rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.13 Output response VvaR when the input voltage changes 5.13.1 Purpose
Test the maximum change in the input voltage when the input voltage of the DC/DC converter jumps between the maximum and minimum values. 5.13.2 Test Schematic Diagram
The output response test diagram when the input voltage jumps is shown in Figure 4.91
HTTKAONTKAca-
Smart Power Supply
5.13.3 Test Conditions
SJ20646-97
Step||During the test, the following test conditions should be specified: H: Ambient temperature TA; b Input voltage range VniVi2i
Small wrinkle
Output current I. (The load can be either no-load or full-load). c
5.13.4 Test Procedure
5.13.4.1 At the specified ambient temperature T., connect the DUIT to the test system.
5.13.4.2 Under certain load conditions, the input voltage jumps from V-→>Vz and V11→Vr through the voltage jump device.
5.13.4.3 When the input voltage changes in parallel, the difference between the maximum output voltage V. and the minimum output voltage Vo measured on the storage oscilloscope is the output response VvOR.
5.13.5 Notes
a. Note that the input voltage opening and rising time should be short enough, generally less than 1/10 of the specified recovery time; b. Different loads have a great impact on the test results. Generally, the values ​​at no load and full load should be measured. 5.14 Recovery time when input voltage changes in parallel 1voRa5.14.1 The time required for the output voltage to return to within 1% of its stable value when the input voltage of the DC/DC converter jumps between the maximum and minimum values ​​is tested.
5.14.2 Test Schematic Diagram
Recovery Time Test Schematic Diagram for Voltage Jump is shown in Figure 4. 5.14.3 Test Conditions
During the test, the following test conditions shall be specified: Ambient temperature TA:
Input voltage range Vu~V2
Output voltage Va:
Required output current Ig.
5.14.4 Test Procedure
At the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the input voltage jump from V一→Vi2 and the jump of Vz\)V through the voltage embedding device.
SJ2064697
5.14.4.3 When the input voltage jumps, the change of the output voltage measured on the storage oscilloscope recovers to its stable value V. The time required to be within the range of ±1% tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no load, half load and full load. 5.15.2 Test schematic
The test schematic diagram of the output response when the load jumps is shown in Figure 5. DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a: Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load, half-load, or full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 At the specified input voltage V, use the load step device to achieve a back-and-forth step change of the load from no-load to half-load to full-load, and no-load to full-load. Use a storage oscilloscope to record the output voltage transient process. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load Step Recovery Time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load, and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test Schematic Diagram
The recovery time test diagram during load jump is shown in Figure 5. 5.16.3 Test Conditions
During the test, the following test conditions should be specified: Ambient temperature TA;
b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-
Required output current Ig.
5.14.4 Test procedure
Under the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the jump of input voltage from V1→Vi2 and Vz\)V through the voltage embedding device.
SJ2064697
5.14.4.3 When the input voltage jumps, the time required for the output voltage change to recover to its stable value V. within the range of ±1% measured by the storage oscilloscope tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no-load, half-load and full-load. 5.15.2 Test Schematic Diagram
The test schematic diagram of the output response during load jump is shown in Figure 5.
DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a. Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load ~ half-load ~ full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 Under the specified input voltage V, the load step device is used to realize the back-and-forth step change of the load from no-load to half-load to full-load and no-load to full-load. The output voltage transient process is recorded with a storage oscilloscope. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load step recovery time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test principle diagram
The load step recovery time test diagram is shown in Figure 5. 5.16.3 Test conditions
During the test, the following test conditions shall be specified: a. Ambient temperature TA; b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-
Required output current Ig.
5.14.4 Test procedure
Under the specified ambient temperature T., connect the DUT to the test system. Under the specified load conditions, realize the jump of input voltage from V1→Vi2 and Vz\)V through the voltage embedding device.
SJ2064697
5.14.4.3 When the input voltage jumps, the time required for the output voltage change to recover to its stable value V. within the range of ±1% measured by the storage oscilloscope tvearo
5.14.5 Notes
a. The rising edge time of the input voltage should be short enough, generally less than 1/10 of the specified value of the recovery time. 5.15 Output response VLOR when the load is changed 5.15.1 Purpose
Test the maximum change of the output voltage when the load of the DC/DC converter jumps between no-load, half-load and full-load. 5.15.2 Test Schematic Diagram
The test schematic diagram of the output response during load jump is shown in Figure 5.
DC regulated voltage power supply
Test conditions
During the test, the following test conditions should be specified; a. Ambient temperature TA; h. Input voltage Vts
Storage oscilloscope!
Load cascade
Output current 1. Range (i.e., output current when the load is no-load ~ half-load ~ full-load) c.
5.15.4 Test Procedure
5.15.4.1 At the specified ambient temperature TA, connect the DUT to the test system. 5.15.4.2 Under the specified input voltage V, the load step device is used to realize the back-and-forth step change of the load from no-load to half-load to full-load and no-load to full-load. The output voltage transient process is recorded with a storage oscilloscope. The maximum change is the output response when the load step changes.
5.15.5 Notes
The load step time should be less than 1/10 of the output voltage recovery time, generally within 10s. 5.16 Load step recovery time LROI 5.16.1 Purpose
When the load of the DC/DC converter changes between no-load, half-load and full-load, the time required for the output voltage to return to within 1% of its stable value.
5.16.2 Test principle diagram
The load step recovery time test diagram is shown in Figure 5. 5.16.3 Test conditions
During the test, the following test conditions shall be specified: a. Ambient temperature TA; b. Input voltage Vri
c. Output voltage Vi
ITKAONKAca-
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