SJ/T 1145-1993 Test methods for electrical properties of organic thin films for capacitors SJ/T1145-1993 Standard download decompression password: www.bzxz.net

Electronic Industry Standard of the People's Republic of China
SI/T 1145~-114893
Test methods tor eleclrical perforrancesnf nrgani: film for use in capacitors1993-12-17 Issued
1994-06-01Implementation
Published by the Ministry of Electronics Industry of the People's Republic of China Electronic Industry Standard of the People's Republic of China
General rules or test methods For elecirical performancesel nrg nfe rilm for use In capacitors1 Subject content and scope of application
1.1 Question content
$.IT 1145 -93
Code[:45
This standard specifies the general rules for sample requirements, test conditions, thickness determination and test records in the test method for the electrical properties of organic films for capacitors.
1.2 Application rangebzxZ.net
This standard applies to the test of the electrical properties of organic films for capacitors. 2 Sample requirements
2.1 Take the required number of samples and remove at least the test layer on the surface. 2.2 The sampling environment must be kept clean. When sampling, cutting samples or testing, it is not allowed to touch the sample with the test system. 2.3 The test must be smooth and there must be no damage, folds, holes, etc. on the surface. There must be no contamination on the surface. 2.4 The collected samples should be treated for 2 hours under the environmental conditions of 3.1; when the tested film is stored in the environment and the requirements of 3.1, no pretreatment is required.
3 Test resistance
3. Unless otherwise specified, the test shall be carried out under the following environmental conditions: Temperature
level: set
level, that is, no change in each side
3.2 higher than the test parts (prohibited from changing) specified by the product standard, when the test product changes to the test temperature, at the specified temperature, the test is carried out at a fixed point u of [0mm, the test cavity thickness error does not exceed the main 2T4 thickness test requirements
4. Note: The upper measuring surface should be a flat surface. The main measurement is a transmission rate of 1mr. Approved by the Ministry of Electronics Industry of the People's Republic of China on December 17, 1993 1916 Implementation
SI/T 1145-93
The measuring surface should be smooth, the diameter of the upper measuring rod should not be less than 5mm, the contact pressure is 2575P, 4.2 The small graduation for the measurement of the maximum value is 0.2m for m and less than 5m, and .5m for m and less than 1(m) is 1m
5 Inspection record
Test record includes:
Specimen name, model, specification, production number and production unit, factory date, test material name and test method Standard number! Test environment and pre-treatment conditions, test device:
Dimensions and parameters of the test sample;
Test results and calculated values:
Test piece
Tester
Note:
This standard is prepared by the Chemical Research Institute of the Ministry of Electronics Industry of Shandong Province. This standard was drafted by the General Research Institute of Membrane Electrode of Yabo City. The main drafters of this standard are Zhang Xiaohong, Ye Lixin and Zhou An. This standard was first issued in January 2017 and first subscribed in January 2018.
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