This standard applies to cavity-encapsulated reverse blocking triode thyristors with a case-rated current of 1250A, 1600A, 2000A and 2500A. JB/T 5838-1991 KP series reverse blocking triode thyristors with a case-rated current of 1000A or more JB/T5838-1991 Standard download decompression password: www.bzxz.net

Mechanical Industry Standard of the People's Republic of China
KP Series 1000A or More Case Rated Reverse Blocking Triode Thyristor 1 Subject Content and Scope of Application
JB5838-91
This standard applies to case rated cavity package reverse blocking triode thyristor (hereinafter referred to as device) with on-state average current of 1250A, 1600A, 2000A and 2500A.
2 Reference Standards
GB4024 Test Methods for Reverse Blocking Triode Thyristor of Semiconductor Devices GB4937 Mechanical and Climate Test Methods for Discrete Semiconductor Devices GB4938 Acceptance and Reliability of Discrete Semiconductor Devices ZBK46003 Case for Power Semiconductor Devices 3
Technical Requirements
3.1 Appearance
According to ZBK46003, the appearance is shown in Table 1. The appearance drawing is according to Figure 3 of ZBK46003. Table 1
Part number
KP1250KP1600KP2000KP2500
Limiting values ​​(absolute maximum ratings)
Limiting values ​​are shown in Table 2.
Case temperature
Storage temperature
Equivalent junction temperature
Reverse repetitive peak voltage
New state repetitive peak voltage
Approved by the Ministry of Machinery and Electronics Industry in 1991-1024
Case model
KT100aKT100cKT100d
Value (maximum value)
KP1250
KP1600
-40～65
—40～140
100~30001)
100~30001)
KP2000
KP250 0
1992-10--01 implementation
Reverse non-repetitive peak voltage
Off-state non-repetitive peak voltage
On-state average current
On-state (non-repetitive) surge current
On-state current critical rise rate
It (sine wave)
Gate forward peak voltage
Gate reverse peak voltage
Gate forward peak current
Gate peak power
Gate average power
Turn-off time
Turn-on time
Recovery charge
Installation force
Note: 1) See 3.4 for level classification.
2) See 3.5 for level classification.
3 Electrical characteristics
Electrical characteristics are shown in Table 3.
Characteristics and conditions
Tease=25℃
On-state peak voltage
Reverse repetitive peak current
At junction temperature 25℃ and 125℃
Maximum value of reverse
peak current at rated voltage VRRM
Ia(AV)
PG(AV)
JB5838-91
Continued Table 2
KP1250
KP1250
Value (maximum value)
KP1600
KP2000
VRRM=0.9VRSM
VDRM=0.9VDSM
50~5002)
Value (maximum value)
KP1600
2.6(3000A)
KP2000
KP2500
2.8(5000A)
KP2500
Characteristics and Conditions
Tease=25
Off-state repetitive peak current
At junction temperature 25℃ and 125℃
Maximum value of off-state peak current at rated voltage VRRM
Holding current
Holding current
Gate trigger current
Gate trigger voltage
Gate non-trigger voltage
Critical rate of rise of off-state voltage
Junction-to-case thermal resistance
Note: 1) See 3.6 for level classification, the same below. Unit
Continued Table 3
KP1250
Value (maximum value)
KP1600
KP2000
20~600
50~20001)
The levels of off-state repetitive peak voltage VDRM and reverse repetitive peak voltage VRRM shall be as specified in Table 4. Table 4
3.5The levels of critical rate of rise di/dt of on-state current shall be as specified in Table 5. Table 5
The levels of critical rate of rise dv/dt of off-state voltage shall be as specified in Table 6. 600
KP2500
Characteristic curve (not for inspection)
The following curves shall be given in the product manual: on-state volt-ampere characteristic curve;
Transient thermal resistance and time relationship curve;
c. I2t characteristic curve;
JB5838-91
Relationship curve between maximum on-state power consumption and on-state average current (conduction angle as parameter): e
Gate trigger range characteristic curve;
f. Relationship curve between tube case temperature and forward average current derating; Inspection rules
Batch-by-batch (Group A) inspection
All Group A inspections are non-destructive. Group A inspections are shown in Table 7. Table 7
External visual inspection
Not working
On-state peak
Reverse repetition
Peak current
Off-state repetition
Peak current
Gate trigger
Gate trigger
GB4024
GB4024
GB4024
Off-state voltage
GB4024
Critical rise
Gate does not touch
Tese=25℃
(Unless otherwise specified)
Normal lighting and normal
Normal vision
Junction temperature 25℃ and
125℃
Junction temperature 25℃
Off-state voltage:
DC 12V| |tt||Junction temperature 15℃
Junction temperature 125℃
KP1250
KP1600
KP2000
(maximum value)
KP2500
No surface damage:
Marking is complete and clear,
No coating falling off
>26(3000A)|| tt||>1.5×10>2.0×104
2.6(3000A)
>28(5000A)
>2.0×104
1>3.0×104
2.8(5000A)
50~2000
Note: ① The actual junction temperature of 125 is 125_\℃, the same below. JB5838-91
If the first inspection of Group A fails, it can be strictly inspected according to Appendix A, and the inspection level is one level stricter. ②
4.2-cycle (Group B) test
The test of Group B is shown in Table 8.
Temperature change
Followed by:
Final test
On-state value
Reverse repetition
Peak current
Off-state repetition
Peak current
Electrical durability
Final test
On-state peak value
Reverse repetition
Peak current
Off-state repetition
Peak current
Release certificate
Record
K46003
GB4937
Tcase=25℃
(Unless otherwise specified)
Two-box method, -40℃,
140℃ cycle 5 times,
High and low temperature in each cycle
Exposure for 1h each, transfer
time 3~4min;
Pressure fluorine oil leak detection method
or other equivalent leak detection
according to A2b
according to A2b
according to A2b
1681gh125c
GB4938
50Hz, 70%
VRRM and 70%
according to A2b
according to A2b
according to A2b
KP1250
Inspection requirements (maximum value)
KP1600
KP2000
KP2500
The maximum shape and installation dimensions meet the requirements
Leakage rate 0.
2.6(3000A)
2.9(3000A)
2.8(5000A)
3.1(5000A)
Briefly give the property data of B5 and B8, the VTM, TRRM and IDRM values ​​before and after the test, and the test conclusion 9
Note: ① If the first inspection of Group B fails, it can be inspected again by additional sampling according to Appendix B, but each inspection group can only be additional times, and the additional samples should undergo all the tests of the group. ② For the standardized products in normal production, at least one batch of periodic (Group B) inspection shall be carried out every year, and the same shall apply to Group C below. 4.3 Periodic (Group C) Inspection
JB-5838-91
The inspection marked with (D) is destructive. The inspection of Group C is shown in Table 9. Table 9
Holding current
Holding current
Reverse repetition
Peak current
Off-state repetition
Peak current
On-state non-repetition
Recurrent surge current
On-state current
Critical rise
Final test
On-state peak
Reverse repetition
Peak current
Off-state repetition
Peak Value current
C2d Junction-to-case thermal resistance
K46003
GB4024
IGB4024
LGB4024
Teasem25℃
(Unless otherwise specified)
Junction temperature 25°C and 125
Off-state voltage: DC
Junction temperature 25°C, Off-state
Voltage: DC 12V
Junction temperature 25°C, and
125℃, gate cut-off
junction temperature 125 before surge
reverse bias voltage is 80%
VRRM-cycle
KP1250
inspection requirements
(maximum value)
KP1600
KP2000
all sizes meet the requirements
20~600
conduction angle is 16 0~2.3×104
Junction temperature before on-state current is 125\C, off-state voltage before turn-on
VDM=VDRM
According to A2b
According to A2b
According to A2b
GB4024
Thermistor current should be large enough to make the entire junction area conduct
2,5×10*
13.6×104
2.9(3000A)
KP2500
3.1(5000A)
Electrical durability
Final test
On-state peak value
Reverse repetition
Peak current
New state repetition
Peak current
High temperature storage
Final test
On-state peak value
Reverse Repeat
Peak current
Repeat
Peak current
Release certificate
Record
GB4938
JB5838-91
Continued Table 9
Tease=25°℃
(Unless otherwise specified)
50Hz;10003h
125℃C,
AC blocking is 70 %
VRRM and 70%
according to A2b
according to A2b
according to A2b
GB4937,
10003h,
T++g=140°℃
according to A2b
according to A2b
according to A2b
KP1250
Inspection requirements
(maximum value)
KP1 600
2.9(3000A)
2.9(3000A)
KP2000
KP2500
3.1(5000A)
3.1(5000A)
Briefly give the relevant information of C8 and C9, the VTM, IRRM and IDRM values ​​before and after the inspection, and the inspection conclusion. Note: ① If the C group inspection fails the first time, the same as the B group note ①. 4.4 Identification (D group) test
IVD is the initial value of each device. The D group test is shown in Table 10. 5 Marking and ordering information
5.1 Marking on the device
a. Device model and quality category,
b. The terminal identification mark is indicated by a bucket (with the arrow pointing to the cathode terminal), or by red, blue anode, gate terminals, or only red to indicate the cathode terminal; c. Manufacturer's name, code or trademark
Hot cycle negative
Final test
On-state peak
Reverse repetition
Peak current
Off-state repetition
Peak current
Constant acceleration
Final test
On-state peak
Reverse repetition
Peak current
Off-state repetition
Peak current
GB4024
GB4937
5.2 Marking of packaging box
Model and quality category,
JB.5838—91
Tease=25°C
(Unless otherwise specified)
Cycle 5000 times Maximum
Temperature 125-2. ℃℃
Minimum temperature 40℃wwW.bzxz.Net
According to A2b
According to A2b
According to A2b
According to A2b
Each of the three main axes
Two directions
1min acceleration
According to A2b
According to A2b
Manufacturer's name, code or trademark
Inspection batch identification code;
Moisture-proof and rain-proof mark,
Number of this specification.
5.3 Ordering information
At least the following information is required to order a device: accurate model,
b. Number of this standard;
Quality assessment Class I;
Others.
KP1250
Inspection requirements (maximum value)
KP1600
KP2000
2.6(3000A)
KP2500
2.8(5000A)
AQL sampling
AQL sampling table see Table A1
Batch range
51~90
91~150
151~280
281~500
501~1200
Sample size
JB5838—91
Appendix A
AQL sampling table
(Supplement)
AQL (I)
Note: ①c: qualified judgment number; I: unqualified judgment number, ②The arrow indicates that the first sampling plan pointed to should be used. If the sample size at the corresponding point pointed to by the head is equal to or greater than the batch, the batch should be inspected 100%.
Appendix B
Additional sampling
Additional sampling
See Table B1 for the additional sampling table
Initial sampling
Additional sampling
Additional number
Additional notes:
(Supplementary)
This standard is proposed and managed by the Xi'an Power Electronics Research Institute of the Ministry of Machinery and Electronics Industry. This standard is drafted by the Xi'an Power Electronics Technology Research Institute of the Ministry of Machinery and Electronics Industry. The main drafter of this standard is Shi Jianxin
Qualified judgment number
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.