This standard applies to high voltage ceramic capacitors with high dielectric constant (Class 2 dielectric) used in electronic equipment. The purpose of this standard is to specify the preferred ratings and characteristics for this type of capacitor, and to select applicable quality assessment procedures, test and measurement methods from GB 2693-86 and to give general characteristic requirements. The severity and requirements specified in the detailed specification shall have the same or higher performance level as this sub-specification, and shall not be allowed to be lower than the performance level of this sub-specification. GB/T 9322-1988 Fixed capacitors for electronic equipment Part 9 (1): Sub-specification Class 2 high voltage ceramic capacitors (available for certification) GB/T9322-1988 standard download decompression password: www.bzxz.net

National Standard of the People's Republic of China
Fixed capacitors for use jn electronic equipment: Part 9 (1): Sectional specification; Flxed class 2 high voltage ceramic dielectric capacitors (available for certification)
1 General
1.7 Scope
GB9322-88
This standard applies to high voltage ceramic dielectric capacitors with high dielectric constant (class 2 dielectric) used in electronic equipment. 1.2 Purpose
The purpose of this standard is to specify the preferred ratings and characteristics for this type of capacitors, select the applicable quality assessment procedures, test and measurement methods from GB2693-86, and give general characteristic requirements. The severity and requirements specified in the detailed specification shall have the same or higher performance level as this sub-specification, and shall not be lower than the performance level of this sub-specification. 1.3 Related documents
GB 2691 Marking content and marking method for resistors and capacitors GB 2471
Nominal resistance series of resistors for electronic equipment and nominal capacitance series and allowable deviation series of fixed capacitors GB2421
GB 2423
Basic environmental testing procedures for electric and electronic products GB2424
/EC384-1
GB2693
TQC300000
Interval capacitors for electronic equipment Part 1: General specification GB2828 (IEC410) Batch inspection counting sampling procedures and sampling tables (applicable to inspection of continuous batches) IECQ001001 (1981) [EC electronic component quality assessment system (IECQ Basic Regulations IFCQ001002 (1981) EC electronic component quality assessment system TFCQ) Procedure rules GB321 Priority number and priority number system
1.4 Contents to be given in detailed specifications
Detailed specifications should be formulated in accordance with relevant blank detailed specifications. Detailed specifications should not specify requirements lower than those specified in general specifications, sub-specifications or blank detailed specifications. When more stringent requirements are included, they shall be listed in 1.9 of the detailed specification and shall be indicated in the test schedule, for example by a "". Note that for convenience, the content of 1.4.1 may be presented in tabular form. The following shall be specified in each detailed specification and the quoted values ​​shall be selected in preference to the values ​​given in the corresponding clauses of this specification. 1.4.1 Appearance drawing and dimensions
There shall be an outline drawing of the capacitor as an aid to easy identification and comparison with other capacitors. Dimensions affecting interchangeability and installation and their permissible deviations shall be given in the detailed specification. All dimensions shall be marked in millimeters. The length, width and height of the capacitor body and the spacing of the leads shall generally be given. If cylindrical, the diameter and length of the capacitor body shall be given, and the values ​​of the diameter and length of the capacitor lead terminals shall be given. When necessary, for example, when the detailed specification includes more than one value (capacitance/voltage range), the dimensions and permissible deviations shall be listed in a table below the figure. When the shape is not as described above, the detailed specification shall give dimensional data sufficient to describe the capacitor. When the capacitor is not designed for printed circuit boards, the detailed specification shall clearly state this. 1.4.2 Installation
The detailed specification shall specify the mounting method used in normal use and vibration and collision (or shock) tests. The capacitor shall be installed in its normal manner. The design of a certain capacitor may require special mounting parts in use. In this case, the detailed specification shall give a drawing describing such mounting parts, and such mounting parts shall be used in vibration and collision (or shock) tests. 1.4.3 Ratings and characteristics
The ratings and characteristics shall comply with the relevant provisions of this sub-specification and shall also comply with the following provisions. 1.4.3.1 Nominal capacitance range
See item 2.2.4.1.
Note: When the product approved according to the detailed specification has a different range, the following statement should be added: "The range of various values ​​within each voltage range is given in the list of qualified products". 1.4.3.2 Special characteristics
When it is considered necessary to specify special characteristics for components appropriately for design and application purposes, they can be listed as additional characteristics. 1.4.3.3 Welding
For solderability and soldering heat resistance tests, the detailed specification shall specify the applicable test methods, severity and requirements. 1.4.4 Marking
The detailed specification shall specify the content of marking on capacitors and packaging. Differences from Article 1.6 of this sub-specification shall be specifically stated. 1.5 Terminology
In addition to the applicable terms and definitions of GB2693, the following definitions are also used. 1.5.12 Class high-voltage ceramic capacitors
A capacitor with a high dielectric constant U ≥ 0.63kV, which is used as a high-voltage bypass capacitor. Circuit and coupling. This type of ceramic dielectric (see Table 2 of Section 2.2.5) is characterized by a nonlinear change in capacitance within the category temperature range. 1.5.2 Class
The class is determined by the maximum allowable change in capacitance relative to the capacitance at 20C within the category temperature range. The class can be represented in the form of a code (see Table 2 of Section 2.2.5). : 1.5.3 Rated voltage (UR)
The rated voltage is the maximum DC voltage that can be continuously applied between the terminals of the capacitor at the rated temperature. Note that the sum of the DC voltage and the peak AC voltage applied by the capacitor should not exceed the rated voltage. The peak value of the AC voltage should not exceed the value determined by the allowable reactive power.
1.6 Marking
GB2 693 Article 2.4 and the following instructions.
1.6.1 The content given in the mark is usually selected from the following items. The relative importance of each item is indicated by its position in the item-month sequence.
Nominal capacitance:
Rated voltage,
(DC voltage can be represented by the symbol one or one) Allowable deviation of nominal capacitance:
Dielectric grade (see Table 2 of Article 2.2.5);
Manufacture year and month (or week):
Manufacturer name or trademark;
..com.
Climate category:
Product model name;
Detailed specifications based on.
CB9322-8B
1. 6.2 Item 1.6.1a and other necessary items shall be clearly marked on the capacitor. Any duplication of content shall be avoided in the marking on the capacitor.
1.6.3 The packaging of the capacitor shall be clearly marked with all the items listed in Item 1.6.1. 1.6.4 Any additional marking that does not cause confusion is permitted. 2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values ​​given in the detailed specification shall be selected from the following values ​​in priority. 2.1.1 Preferred climate category
The capacitors included in this specification are classified into climate categories in accordance with the general provisions of GB2421 (1EC68-1). The lower and upper category temperatures and the duration of the steady-state damp heat test shall be selected from the following values. Lower category temperature: -55, -40℃, -25℃ and -10℃. Upper category temperature: +85℃, +100℃. +125℃. Duration of steady-state damp heat test: 4, 10, 21 and 56d. The severity of cold and dry heat tests is the lower and upper category temperature respectively. 2.2 Preferred Rated Values
2.2.1 Rated Temperature
The rated temperature of capacitors included in this specification is equal to the upper category temperature. 2.2.2 Rated Voltage (Uc)
The preferred value of rated voltage is the value of R5 series in GB321. If other values ​​are required, they should be selected from R10 series. 2.2.3 Category Voltage (Uc)
As defined in Section 2.2.17 of GB2693, because the rated temperature is specified as the upper category temperature, the category voltage is equal to the rated voltage. 2.2.4 Preferred Values ​​and Permissible Deviations of Nominal Capacitance 2.2.4.1 Preferred Values ​​of Nominal Capacitance
The nominal capacitance should be selected from E6.E12 and E24 series in GB2471. 2.2.4.2 Preferred allowable deviations of nominal capacitance Table 1
Preferred series
E6 and E12
Allowed deviation, %
—20/+80
20/+50
Letter code
2.2.5 Capacitance overflow characteristics
Table 2 indicates the capacitance temperature characteristics priority value when DC voltage is applied and not applied, and also gives the method of grade code. For example: When the temperature range is from -55 to +125℃ and DC voltage is not applied, the medium with a relative change of ±20% is called 2C1 grade medium. Grade letter code
Maximum change in capacitance measured relative to +20℃ within the category temperature range with and without application of direct current
No application of direct current voltage
+20/30
+22/ —56
+30/-80
Applied rated direct current voltage
+10/-15
+20/:-30
+20/—40
+22/—70
+30/—90
+15/-40
+15/-25
Note, 1) Not applicable to capacitors with U=1kV.
GB 9322—88
Category temperature range and corresponding numeric code 55/+125
55/+85
40/-+ 85
The definition of the temperature range for the temperature characteristics of the dielectric is the same as the category temperature range. 3 Quality Assessment Procedure
3.1 Initial Manufacturing Stage
The initial manufacturing stage is the formation of the dielectric metallization electrode. 3.2 Structurally Similar Components
— 25/+ 85
—10/+85
Capacitors manufactured with similar processes and materials, although they may be different in size and value, can be considered to be structurally similar capacitors.
3.3 Release Batch Certification Record
When specified in the detailed specification and required by the user, it should be carried out in accordance with the requirements of GB2693 Section 3.5.1. The requirements for variable parameter data after the endurance test are capacitance change, tangent of dissipation angle and insulation resistance. 3.4 Approval
The procedure for approval batch testing is specified in 3.4 of the general specification of GB 2693. The list of approval tests based on batch and periodic testing is specified in 3.5 of this specification. The procedure using a fixed sample size list is specified in the following 3.4.1 and 3.4.2. 3.4.1 Sampling of the approval procedure based on fixed sample size:
The procedure for fixed sample size is specified in 3.4.2 (b) of GB 2693. The sample should be sufficient to represent the range of capacitors for which approval is sought. This may or may not be the full range covered by the detailed specification. The sample should consist of samples of the lowest and highest voltages and the smallest and largest capacitances at these voltages. When the rated voltage is more than four values, one of the intermediate voltages should also be tested. Thus, approval of a range requires testing of either four or six values ​​of each temperature characteristic. When the range of the composition is less than four values, the test samples shall be tested according to the requirements of the four values. The use of backup samples is permitted in accordance with the following circumstances: One of each value can be used to replace the sample that is allowed to fail in the "0" group; A
GB 932288
b. One of each value can be used to replace the sample that fails due to non-manufacturing reasons. The number of samples specified in the "0" group is the sum of the number of samples used in all test groups. If this is not the case, the number of samples may be appropriately reduced.
When a test group is added to the list of qualification approval tests, the number of samples required for the "0" group test shall be increased by the number of samples required for the added test group.
The number of samples required for each group or group of qualification approval tests and the number of permitted failures are specified in Table 3. 3.4.2 Tests
For the approval of capacitors included in a detail specification, all the tests specified in Tables 3 and 4 are necessary. The tests of each group shall be carried out in the specified order.
All samples shall be tested in group "0" before being assigned to other groups. Samples found to be unqualified in group "0" shall not be used in other groups. A capacitor that fails to meet all or part of the tests in a test group is counted as "one unqualified product". When the number of unqualified products does not exceed the specified allowable number of unqualified products for each group or group and the total allowable number of unqualified products, it shall be approved.
Note that Tables 3 and 4 together constitute a table for fixed sample size tests. Table 3 includes sampling details and allowable number of unqualified products for different tests or test groups, while Table 4, together with the test details included in Chapter 4, gives a complete summary of the test conditions and performance requirements, and indicates the test methods and test conditions selected in the detailed specification.|| tt||The test conditions and performance requirements for the fixed sample size test schedule shall be consistent with those specified in the detailed group specification for quality consistency inspection.
Table 3 Sampling plan and allowable number of nonconforming products for qualification approval test Number of samples (n) and allowable number of nonconforming products (pd)) Test group
Visual inspection
Capacitance
Loss tangent
Insulation resistance
Withstand voltage
Backup sample
Terminal surface
Resistance to soldering heat
Solderability
Rapid temperature change
Under collision or impact
Climate sequence
Clause of this specification
Each value
According to four values ​​or less than four values
Total pd
According to six values ​​Test
Test group
Steady-state damp heat
Durability
Capacitance overflow characteristics
Charge and discharge test
Clause of this specification
Note: ①According to the requirements in the detailed specification,
Each value
GB 9322—88
Continued Table 3
Number of samples (n) and number of permissible nonconforming products (pd) are based on four values ​​or less than four values
② No more than one nonconforming product is allowed in any one value. ③Capacitance/voltage combination, see 3.4.1, i) For capacitors with V2tokV, this test is carried out: 4 for capacitors with UR<10kV, 6 for capacitors with UR10kV.
Table 4 List of certification and approval tests
Note, ()) The clause numbers of the test and performance requirements are quoted from Chapter 4 Test and Measurement Procedures. ② In the table: D--destructive, ND-
Clause number and test items
(see note)
4.2 Appearance inspection
4.2 Dimensions (detailed)
4.3.1 Capacitance
4.3.2 Loss tangent
4;3.3 Insulation resistance
4.3.4 Withstand voltage
4.5 Lead reinforcement seat
4.6 Resistance to soldering heat
4.6.2 Initial measurement
4.6.4 Final measurement
Non-destructive.
Number of samples (n)
Test conditions
(see note 0)
Test frequency·
Measurement voltage:
Test frequency and measurement voltage are the same as those in 4.3. 1 phase
Method see detailed specification
Method see detailed specification
Appearance inspection
Method removal (1A or 1B) see detailed specification
Special pretreatment: connect 4.1
Capacitance
Recovery, 24±1 h
Appearance inspection
Capacitance
and allowable nonconformity
see Table 3
see Table 3
according to six values\test
performance requirements
(see note)
according to 4.2, clear marking and according to the provisions of detailed specifications
see detailed specifications
within the specified tolerance range
according to 4.3.2.2
according to 4.3.3.2
no breakdown or flying isolated
no visible damage
no visible damage, clear marking
AC/Caccording to 4.6.4
clause number and test items
(see note (i))
4.7 Solderability
4. 8 Rapid temperature changes
4.8.2 Initial measurement
4.9 Vibration
4.9.2 Post-inspection
4.10 Bump (or shock see 4.11)
4.11 Shock (or shock see 4.10)
or final measurement
4.12 Climate sequence
4.12.1.1 Initial measurement
4.12.2 Dry heat
4. 12, 3 Cyclic damp heat, test Db,
First cycle
GB9322--88
Continued Table 4
Test conditions
(See ①)
Method See detailed specification
Special pretreatment: According to 4.1
Capacitor plate
Lower category temperature
——Upper category leakage
Five cycles
Duration ~ = 30 min
Recovery: 24±1h
Appearance inspection
Installation method See detailed specification
Procedure B4
Frequency range:
Amplitude: 0.75mm or acceleration
98 m/g (the lesser severity)
Total duration: 6 h
Appearance inspection
Installation method, see detailed specification
Number of magnetic collisions:
Acceleration:
Pulse duration:
Installation method, see detailed specification
Acceleration:
Pulse duration:
Appearance inspection
Capacitor plate
Special pretreatment, according to 4.1
Capacitor plate
Temperature, upper category temperature
Duration, 16h
Number of samples (n)
and allowable nonconformity
see Table 3
see Cap 3
Performance requirements
(see Note)
As applicable, solder on the lead terminals
moves freely or solder is
closed to indicate good packaging
No visible damage
No visible damage
No visible damage, clear markings
AC/C as per 4. 11.3 Subclause No. and test items (see note) 4.12.4 Test conditions 4.12.5 Low pressure (if required by the detailed specification) 4.12.5.3 Intermediate measurements 4.12.6 Cyclic damp heat, test Db, remaining cycles 4.12.6.3 Final measurement 4.13 Steady-state damp heat 4.13.2 Initial measurement Final measurement 4.14 Durability 4.14.2 Initial measurement Final measurement 4.4 Capacitance temperature characteristics Capacitance (applicable to Ur ≥ 10 kV) 4.14.1 Intermediate measurement GB9322—88 Continued Table 4 Test conditions (see note) Temperature: lower limit category temperature Duration: 2 h Appearance inspection Air pressure: Appearance inspection Recovery: 24 ± 2 h Appearance inspection Loss tangent Insulation resistance Special pretreatment, according to 4. 1
Capacitance
Recovery, 24±2 h
Appearance inspection
Capacitance
Loss tangent
Insulation resistance
Special pretreatment according to 4.1
Duration: 1000b
Recovery: 24±1 h
Appearance inspection
Capacitance
Loss tangent
Insulation resistance
Special pretreatment, according to 4.1
Capacitance
Condition: 50 Hz.3 kVrms AC
So the charge
Number of samples ()
And allowable failure
See attenuation 3
See Table 3
See Table 3
See Table 3
Performance requirements
(See Note)
No visible damage
No breakdown or arcing
No visible damage, clear markings
AC/C According to 4. 12. 6. 3 items
According to item 4.12.6.3
According to item 4.12.6.3
No visible damage, the markings shall be clear
MC/CAccording to item 4.13.5
According to item 4.13.5
According to item 4.13.5
No visible damage, the markings shall be clear
AC/CAccording to item 4.14.5
According to item 4.14.5
According to item 4.14.5
AC/CAccording to item 4.4. 3.
According to 4.14.1
Clause number and test item date
(see note@)
4.15 Charge and discharge test (for
Uk=okV)
4.15.1 Initial measurement
4.15.4 Final measurement
3.5 Quality consistency inspection
3.5.1 Composition of inspection batch
Group A and Group B inspection
GB 9322-88
Continued Table 4
Test conditions
《See Note?）
Conditions: Rated voltage
Effective number of charges: 10000 times
Special pretreatment, according to 4.1
Capacitance
Recovery: 8±1h
Capacitance
Loss tangent
Insulation resistance
Withstand voltage
These tests shall be carried out on a batch-by-batch basis. Number of products (a)
And permitted nonconformities.
See Table 3
The manufacturer may group the products currently in production into one inspection lot in accordance with the following provisions. (1) The inspection lot shall consist of capacitors of similar construction (see 3.2). (2a) The samples for group A tests shall consist of each size and each value included in the inspection lot. The sample size shall be determined based on the size of the lot. At least 5 of any value.
Samples for group B2 shall include representatives of each temperature characteristic capacitor in the batch. Performance requirements
(See Note ()
AC/C according to 4. 15. 4
According to 1.15.4
According to 4.15.4
According to 4.15.4
(2b) If any value in the sample is less than 5, the sample size shall be agreed upon by the manufacturer and the national supervision and inspection agency. b Group C inspection
These inspections shall be carried out on the basis of periodic inspections. The samples shall be capacitors currently produced during the specified period and shall be divided into representative products of large, medium and small capacitor discs. In order to cover the entire range, tests of different rated voltages and capacitances produced in subsequent periods shall be carried out. 3.5.2 Test schedule
The schedule of batch and periodic tests for quality consistency inspection is given in GB9323 Part 9 (1), Blank Detail Specification for Fixed Capacitors for Electronic Equipment Class 2 High Voltage Ceramic Capacitors Assessment Level E Chapter 2. 3.5.3 Delayed delivery
When in accordance with GB When retesting according to the procedures of Clauses 3 and 5.2 of 2693, the solderability and the amount of electrical penetration shall be inspected according to the provisions of Group A and Group B. 3.5.4 Assessment Levels
The assessment levels given in the blank detailed specifications shall be selected from Table 5A and Table 5B in priority. Test Grouping\
IL in the table - Inspection Yongping;
Qualified quality level.
Inspection Grouping"
Cycle (month).
Sample size.
Number of non-conforming products allowed.
Note: 1) Assessment levels D, F, G are under consideration, AQL
GB932288
2) The contents of the inspection grouping are described in Chapter 2 of the relevant blank detailed specifications. 4 Test and measurement procedures
This chapter supplements the contents specified in Chapter 4 of GB2693. 4.1 Special preconditioning
Unless otherwise specified in the detailed specification, when specified before the test and test sequence in this specification, special preconditioning shall be carried out under the following conditions: placed at the maximum temperature or at a higher temperature as may be specified in the detailed specification for 1 h, followed by a recovery period of 24 h under the standard atmospheric conditions of the test,
Note: The capacitance of Class 2 ceramic capacitors decreases continuously with time according to a logarithmic law (this is called aging). If the capacitor is heated to a temperature above the Curie point of its dielectric, "de-aging" occurs, that is, the capacitance reduced by "aging" is restored, and "aging" starts again when the capacitor is cooled again. The purpose of the special pretreatment is to bring the capacitor to a certain state that is independent of its previous history (for details, see A4 of Appendix A (Supplement) 1.
4.2 Appearance and dimensional inspection
GB2693 Article 4.1.
4.3. Electrical test
4.3.1 Capacitance|
GB2693 Article 4.7 and the following instructions.
GB 9322—88
Note: 1) When measurements are made before and after the test, the measurement conditions shall be the same in each case. 4.3.1.1 Measurement conditions
Measurement voltage: 1±0.2V*arbitration voltage; 1±0.02V; frequency: For C≤100pF, the frequency is specified in the detailed specification! For CR>100PF, the measurement frequency: f=1kHz±20%; arbitration frequency: f=1kHz.
4. 3. 1. 2 Requirements
The capacitance shall conform to the nominal value and take into account the specified allowable deviation. For arbitration measurements, the capacitance shall be extrapolated to the value at an aging time of 1000h (see Appendix A for instructions). 4.3.2 Loss tangent (tan)
GB 2693 Article 4, 8 and the following instructions.
4.3.2.1 Measurement conditions are the same as Article 4.3.1. Accuracy, the accuracy of the measurement or instrument should make the measurement error not exceed 0.001. 4.3.2.2 Requirements
The loss tangent should not exceed 0.020. 2F group should not exceed 0.035. 4.3.3 Insulation resistance (R.)
GB2693 Article 4.5 and the following instructions.
4.3.3.1 Measurement conditions
GB2693 Article 4.5.2 and the following instructions: ||tt| |For Jz≤10kV: the measuring voltage is 500V; for U≥10kV, the measuring voltage is specified in the detailed specification. For the identification and approval test and periodic inspection (Group C), the voltage should be directly added to the specified value for a duration of 1min±5s. For batch inspection (Group A), the test can be completed in a shorter time if the insulation resistance reaches the required value. Unless otherwise specified in the detailed specification, the product of the internal resistance of the measuring device and the nominal capacitance of the capacitor should not exceed 19. The charging current should not exceed 0.05A.
The insulation resistance (R,) should be within 1 min time. 4.3.3.2 Requirements
The insulation resistance shall be equal to or greater than the requirements listed in Table 6. Table 6
Ck25 nF
Insulated type
Non-insulated type
4.3.4 Withstand voltage
Measurement points
la and le
Article 4.6 of GB2693 and the following instructions.
4.3.4.1 Test conditions
The applied voltage is specified in Table 7.
4000MO
CR >25 nF
Rated voltage
For insulated type test points: 1a and 1c.
The test voltage of the lc test point shall not be less than 1 500 V. For non-insulated type test point: 1a.
Time of voltage application:
For identification and periodic inspection, 1 min.
For batch inspection, up to 2 8.
GB 932288
The internal resistance () of the power supply voltage shall satisfy ·CR≤18. The charging current shall not exceed 0.05 A.
4.3.4.2 Requirements
There shall be no breakdown or arcing of the capacitor during the test period. 4.4 Capacitance temperature characteristics
4.4.1 Special pretreatmentbzxz.net
See 4.1.
4.4.2 Measurement conditions
Instructions listed in 4.24.1.2, 4.24.1.3 and Table 8 of GB2693. Table 8
Temperature, ℃
±3
Lower category temperature;
Upper category temperature.
Note: ①--- indicates that no DC voltage is applied. X indicates that DC voltage is applied.
Temperature mark
The measurement should be carried out at the intermediate temperature to ensure compliance with the requirements of 2.2.5. ②) The reference capacitance is measured at point \d\. Test voltage
1. 5 Ur +500 V
Apply DC voltage U
④ Because of the effects described in the note to 4.1, the capacitance measured at points \f\, "g" and \b\ under DC voltage is related to time. This time relationship is contained within the limits given for capacitance change. The capacitance change between the first and last measurements at point "a\" under temperature mark is related to the magnitude of aging. In the event of a dispute over the results of the DC voltage measurement, a fixed time interval shall be agreed between the measurements at points \{\ and \\ under temperature mark. 4.4.31a and 1c.
The test voltage of the lc test point shall not be less than 1 500 V. For non-insulated test points: 1a.
Time of voltage application:
For identification and periodic inspection, 1 min.
For batch inspection, up to 2 8.
GB 932288
The internal resistance () of the power supply voltage shall satisfy ·CR≤18. The charging current shall not exceed 0.05 A.
4.3.4.2 Requirements
During the test period, the capacitor shall not have breakdown or arcing. 4.4 Capacitance temperature characteristics
4.4.1 Special pretreatment
See 4.1.
4.4.2 Measurement conditions
Instructions listed in 4.24.1.2, 4.24.1.3 and Table 8 of GB2693. Table 8
Temperature, ℃
±3
Lower category temperature;
Upper category temperature.
Note: ①--- indicates no DC voltage is applied. X indicates DC voltage is applied.
Temperature marking
Measurement should be carried out at the middle temperature to ensure compliance with the requirements of 2.2.5. ②) The reference capacitance is measured at point \d\. Test voltage
1. 5 Ur +500 V
Applied DC voltage U
④ Because of the effect described in the note to 4.1, the capacitance measured at the temperature marks \f\, "g" and \b\ and under the applied DC voltage is related to time. This time relationship is contained within the limits given for the capacitance change. The capacitance change between the first measurement and the last measurement at the temperature mark "a\" is related to the magnitude of aging. In the event of a dispute over the results of the applied DC voltage measurement, a fixed time interval shall be agreed between the measurements at the temperature marks \{\ and \\ points. 4.4.31a and 1c.
The test voltage of the lc test point shall not be less than 1 500 V. For non-insulated test points: 1a.
Time of voltage application:
For identification and periodic inspection, 1 min.
For batch inspection, up to 2 8.
GB 932288
The internal resistance () of the power supply voltage shall satisfy ·CR≤18. The charging current shall not exceed 0.05 A.
4.3.4.2 Requirements
During the test period, the capacitor shall not have breakdown or arcing. 4.4 Capacitance temperature characteristics
4.4.1 Special pretreatment
See 4.1.
4.4.2 Measurement conditions
Instructions listed in 4.24.1.2, 4.24.1.3 and Table 8 of GB2693. Table 8
Temperature, ℃
±3
Lower category temperature;
Upper category temperature.
Note: ①--- indicates no DC voltage is applied. X indicates DC voltage is applied.
Temperature marking
Measurement should be carried out at the middle temperature to ensure compliance with the requirements of 2.2.5. ②) The reference capacitance is measured at point \d\. Test voltage
1. 5 Ur +500 V
Applied DC voltage U
④ Because of the effect described in the note to 4.1, the capacitance measured at the temperature marks \f\, "g" and \b\ and under the applied DC voltage is related to time. This time relationship is contained within the limits given for the capacitance change. The capacitance change between the first measurement and the last measurement at the temperature mark "a\" is related to the magnitude of aging. In the event of a dispute over the results of the applied DC voltage measurement, a fixed time interval shall be agreed between the measurements at the temperature marks \{\ and \\ points. 4.4.3
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