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GB/T 9090-1988 Standard capacitors

Basic Information

Standard ID: GB/T 9090-1988

Standard Name: Standard capacitors

Chinese Name: 标准电容器

Standard category:National Standard (GB)

state:in force

Date of Release1988-04-02

Date of Implementation:1989-01-01

standard classification number

Standard ICS number:Electronics >> 31.060 Capacitors

Standard Classification Number:Instruments and meters>>Electrical instruments and meters>>N25 AC and tributary current electrical instrument recording instrument

associated standards

Procurement status:≈ISO 5466-80

Publication information

other information

Release date:1988-04-25

Review date:2004-10-14

Drafting unit:Shanghai Instrument Research Institute

Focal point unit:National Technical Committee for Standardization of Electrical Instruments

Publishing department:China Machinery Industry Federation

competent authority:China Machinery Industry Federation

Introduction to standards:

GB/T 9090-1988 Standard Capacitor GB/T9090-1988 Standard Download Decompression Password: www.bzxz.net

Some standard content:

UUC 621.319.4
National Standard of the People's Republic of China
GB99-88
Standard capacitors
198%04:25 Issued
National Bureau of Standards Issued
1989101 Implementation
Scope of application
National Standard of the People's Republic of China
Standard capacitors
Standard capacitors
UDC621.319.4
GE 9090—88
This standard applies to single-value standard capacitors (hereinafter referred to as capacitors) with AC frequencies ranging from 20Hz to 1MHz and capacitance values ​​ranging from 104 to 10pF.
This standard does not apply to core containers, which are included in instruments, devices and containers. 2 Product varieties and classifications
21 All capacitors that meet the requirements of this standard should be made into single-value (color-fixed capacitance) type. 2.2 The accurate discharge level of the capacitor is shown in Table 1, 1
1x10 +
2×10~4
1x laa
2×10-
Note: The grade of capacitors can be expressed in percentage: or b. In parts per million (ppm): in ohms, expressed in programmable meters, the nominal value of 23 capacitors (in PF) should meet the following series: 1×10: 2×10; 3×10%, 4×10: 5×10: 9×10; 10×10 where n is: -4, -3, -2, -1, 0, 4, 2,3, 4, 5, 6, 7, 8, 9, 10, 11.24 The maximum AC voltage (effectively expressed as V) applied to the capacitor shall conform to the following sequence: 1×10, 2×10, 3×10, 5×10, 7×10, which are: 2, 1, 0, -1, 2, 3.
3 Technical requirements
3.1 Basic error limit of capacitors
The allowable basic error limit of capacitors shall be expressed as a percentage of the nominal value of the capacity and expressed as 5:8=±&
Where: * is the accuracy grade index of the capacitor expressed as a percentage. 3.1 Conditions for determining the basic error
3. 2.1 The relevant conditions and supplementary information of the influencing disk are shown in Figure 2. The National Machinery Industry and Industry Commission approved 15 on April 6, 1988, and implemented 1989-101. The measurement of the ring friction is relatively high. The atmospheric force can be deformed. The test frequency is external magnetic field. The test frequency is positive. The strong breaking force is 1000F2. The positioning quantity does not exist. CB 9090-88. The test conditions and supplementary information of the influencing period are as follows: The pilot frequency starts to take effect. 0.02, 0.05, 0.1,0.2
all groups
all numbers
all levels
all complexes
all spots
all grades
all loads
tolerances for single critical values
large field values
3.22 For devices with accuracy levels of 0.005, 0.01, 0.02, 0.05, D, 1, 0.2, before testing, the device should be tested under the following conditions: For other types of capacitors, they should be placed under the test conditions for at least 8 hours before testing. 3.3 Determine the conditions for change of working frequency || tt || 3.3.1 The capacitors should have working frequency specifications or working frequency ranges. The allowable working frequency should be within 50kHz. The recommended working frequency range is within 1MHz. The frequency value (range) should be specified in the technical conditions of the capacitor. 3.3.2 The capacitor should be placed in an ambient temperature of 5~40°C and a relative humidity of 40°C. %~80%, the maximum + is 98.3~104.3Pa under normal conditions,
3.33 When determining the change of a certain influencing quantity, all other influencing quantities should be kept under their own consideration plan. 3.4 Annual instability of actual value of capacitance 3.4.1 For capacitors with an accuracy of 0.005, 0.01, 0.02, 0.05, 0.1, 0.2, 0.5, 1, 0, and a nominal value of 1-10°pF, the annual instability of the actual value of the capacitance is Should not be greater than the provisions of Table 3, the actual annual uncertainty of the capacitor capacitance shown in the table is not more than the actual annual uncertainty of the specification (×10/) 3.4.2 For capacitors with a nominal capacity less than PF or less than 10 pF, the actual annual uncertainty of the capacitance shall not exceed the technical conditions of the specific capacitor type. The loss tangent value D of the capacitor shall be selected from the following series: 2 GB S090—88Www.bzxZ.net
1×10,2×10,3×10,4×t0,$×10. Among them: -5.—4.-3,-2
35.2 The loss tangent value D of air dielectric capacitors shall not be greater than 1×10~353 The loss tangent value D of mica dielectric capacitors shall not be greater than 2×10-, 3.9.4 For other dielectric capacitors, the loss tangent value D shall be specified in the technical conditions of the capacitor model, 3.6 The reference frequency or the higher reference frequency shall be within the range of the reference frequency and the working range. The variation of capacitance caused by any frequency within the operating frequency range
3.6.1 For capacitors with a nominal compensation of not more than 100F, it is not allowed to exceed the basic error limit. 36.2 For capacitors with a nominal value of less than 100F, the technical conditions of the capacitors shall specify the variation of capacitance caused by any change of 10% from the reference environment to the normal working environment speed range
3.7.1 For capacitors with a nominal value of less than 100F: For capacitors with an accuracy index of 1, it is not allowed to exceed one-half of the basic error limit. 1. For capacitors with an accuracy index of 0.5, it is not allowed to exceed tenth of the basic error limit. c. For electrical appliances with accuracy indexes of 0.005, 0.01, 0.02, 0.05, 0.1, and 0.2, the basic error limit is not allowed to be exceeded.
3.72 For the technical conditions of the capacitor with a capacity rating of 100 kcal and a specific type of capacitor, it is stipulated that the insulation and insulation resistance of the capacitor circuit should comply with the provisions of GB6738-86 "Safety requirements for electrical measuring instruments, indicating and recording instruments and accessories".
3.82 The insulation resistance between the capacitor circuit and the screen should comply with the provisions of GB6738-86 "Safety requirements for electrical measuring instruments, indicating and recording instruments and accessories". The resistance should not be less than 100M. 3.9 The capacitor should have a connection to the external circuit. The structure of the container should be properly marked with a printed mark (seal position). The position of the mark seal should be properly arranged to ensure that the mark (seal) will not be damaged. The components of the gas flow should be properly arranged to ensure that the gas flow will not be damaged without damaging the mark (seal). 3.11 The variability of the capacitor should be specified in the technical specifications of the specific type of capacitor. 4 Test method
4.1 Test conditions:
Basic error of capacitors (Article 3.1). Determination of the actual value of the plate (Article 3.4). Determination of the cut-off value D (Article 3.5) during the consumption period It must be carried out under the conditions specified in 3.2. The efficiency check (3.6) and the benefit variation (3.3) must be carried out under the conditions specified in 3.3.
4.2 Determination of basic error of capacitors 6
, for capacitors with accuracy levels of 1 and 0.5, the total measurement error caused by standard instruments, test methods and test conditions should be less than two tenths of the allowable basic error limit, and the test results should comply with the provisions of 1.1 of the technical standard. b. For capacitors with other accuracy levels, the total measurement error caused by standard instruments, test methods and test conditions should be less than two tenths of the allowable basic error limit. The measurement error shall not exceed one third of the allowable basic value. The test results shall comply with the provisions of Article 3.1 of this standard. The annual instability of the actual value of the capacitor shall be determined by comparing the actual value of the capacitor with the measured value. The test results shall comply with the standard values ​​in Table 3 of this standard. The standard device used shall not be replaced. The annual instability of the device itself and the accuracy of the test shall not exceed one tenth of the basic error limit of the device.
4.4 Determination of the loss tangent of the device 4.4.1 For devices with a loss period of less than 5×10-, the total measurement error caused by the expected conditions of the standard instrument and test method shall not exceed one third of the allowable loss tangent value, and the test results shall comply with the provisions of Article 3.5 of this standard. 4.4.2 For devices with a loss tangent value less than or equal to 5×10- and greater than or equal to 1×10-, the total flux error caused by the non-test conditions of the standard instrument test method shall not exceed half of the allowable value, and the test results shall comply with the provisions of Article 3.4 of this standard. 4.4.3 For devices with a loss tangent value less than 1×10-. The total measurement error caused by the white power test, the excitation test method and the test conditions shall not exceed the allowable loss tangent value D. The test results shall comply with the provisions of 3.5 of this standard. 4.5 Determination of the capacitance variation caused by the reference frequency or the reference frequency range from the limit to any frequency within the corresponding working frequency range
4.5.1 Taking into account the various provisions given in Table 2 of Article 3.2.1, the actual value of the capacitor capacitance (C) obtained under the reference frequency (minus the limit frequency of the reference frequency range) is compared with the actual value of the capacitor capacitance [Gn] obtained under any frequency within the adjacent working frequency range. The difference in capacitor capacitance is calculated by the following formula and expressed as relative error 5. C-Ce
Where: C is the actual value of the capacitor measured at the reference rate (or the limiting frequency of the reference rate monitor): C is the actual value of the capacitor capacity measured at any rated rate within the adjacent working frequency range. The calculation result shall comply with the provisions of 3.6.1 of this standard. Under the recommended frequency conditions, the variation of the capacitor capacity shall be within the technical conditions of the specific model. (2)
4.% The variation of the capacitor capacity caused by a change of 1nT from the reference temperature to any temperature within the normal working environment range is determined by comparing the actual value of the capacitor capacity (C) measured at the reference temperature with the actual value of the capacitor capacity (C) measured at any temperature within the normal working temperature range. The variation of the capacitor capacity when the variation is 10% shall be calculated according to the following formula and expressed as a relative error. t=SC- Gn)x 10
Formula: C. --- Actual capacitance value of the device under test adjustment; X100%
Ci --- Actual capacitance value measured at any temperature within the working temperature range. The calculation results are in accordance with the provisions of 3.7.1 of this standard. 4.7 Determination of insulation strength and insulation resistance
4.7. The determination method of the insulation arc between the terminal and the insulation of the device (3.8.1) shall be in accordance with the provisions of GB6738, 4.7.2 The determination method of the insulation resistance between the electrical circuit and the screen of the device (3.8.2) shall be in accordance with the provisions of GB6738, 4.8 Determination of the connection terminal and sealing position of the capacitor 4.1 The connection terminal (3.9) and sealing position (3.10) of the capacitor can be checked. 5 Inspection regulations
5.1 Each capacitor shall be subjected to factory test and type test during service life: (3)
5.1 Each capacitor shall be subjected to factory test and type test according to the requirements of 3.1 (basic reading): 3.4 (actual value of annual inductance): 3.5 (main cut-off value D during loss period): 3.8 insulation strength and insulation resistance): 3.11 (completeness) and the requirements of Section 6 (standard) and other requirements (the requirements specified in the specific connection technical conditions) of this standard! 5.3 Factory test 5.4 The sample for type test shall be no less than 3 samples. The type test shall be carried out in accordance with the technical requirements of the technical standard. If there are any samples that do not meet the requirements after the type test, double the number of samples shall be taken for testing. If the samples are qualified, the type test is considered to be qualified. If they are still unqualified, the type test is considered to be unqualified. 5.5 In any of the following cases, type test shall be carried out: 4
GB 9090--88
When a new product or old product is transferred to the factory for trial production and identification: b. When the product is officially produced, if there are major changes in the structure, materials, and process that may affect the product performance: during regular production, after a certain amount of production has been accumulated, a weekly test cavity should be carried out: d. After the product has been discontinued for a long time, when the factory inspection results are significantly different from the previous type test results: when the national quality supervision agency issues requirements for type testing 6.1 The following items should be marked on the brand name shell: ··6. "The name of the manufacturing unit or b. Product name:
, product factory number and manufacturing date: .. Nominal value of capacitor:
Capacitor equivalent index (use the symbol in Table 4). Rated working voltage
g, test voltage (use the symbol C in Table 4); b. Reference position (use the symbol + in Table 4 D)
Transformer terminal and its polarity: ground terminal (use the symbol F-311 in Table 4), external electromagnetic tower shielding terminal short (use the symbol L in Table 4 F-27);
6.2 Marks and symbols should be marked, not sensitive Other marks, symbols and positions required for capacitor work should be specified in the technical requirements of the specific conductive device. 6.3
6.4 The materials for capacitor marking are listed in Table 4.
Symbols for marking capacitors
Test voltage is greater than 500V (for example 2F)
Unregulated power test receiver
GB9090—88
Continued Table 4
Use when the support surface is vertical
Use when the support surface is half rainy
The angle between the support surface and the horizontal surface is as follows: When convenient to use (browse 60 to 1)—1 usage example, nominal usage range: 80-100: press D-2 usage indicates low, standard usage range: one:~+! press D-3 usage example, probe usage request: 45~75 training
reported accuracy rate data is expressed in % (excellent 0.02) accuracy index is expressed in scientific notation (example 2×10*) accuracy level is expressed in m example 2cp)
S.....C.....
P—27
F—33
for packaging, transportation and storage
GB 9090-88
T.1 The packaging of capacitors shall comply with the provisions of ZHY003 "Technical Conditions for Packaging of Instruments and Meters". 72 The transportation and storage of capacitors shall comply with the provisions of ZBY002 "Basic Environmental Conditions and Test Methods for Transportation and Storage of National Instruments and Meters".
Appendix:
This standard is approved by the Institute of Instruments and Meters of Shanghai. The Shanghai Institute of Instruments and Meters is responsible for the production of this standard.According to the provisions given in Table 2, the actual capacitance of the capacitor measured at the test temperature is compared with the actual marked value of the capacitor capacitance (Ct) measured at any temperature within the normal operating temperature range. The variation of the capacitor capacitance when the change is 10 is calculated according to the following formula and expressed as a relative error. Formula: Ct=SC-Gn)x 10
--- Actual capacitance value of the device obtained under the test adjustment factor; X100%
Ci--Actual capacitance value measured at any temperature within the test working temperature range. The calculation result shall comply with the requirements of Article 3.7.1 of this standard. 4.7 Determination of insulation strength and insulation resistance
4.7. The determination method of the insulation curvature between the terminal and the insulation of the device (Article 3.8.1) shall be in accordance with the provisions of GB6738. 4.7.2 The determination method of the insulation resistance between the electrical circuit and the screen of the device (Article 3.8.2) shall be in accordance with the provisions of GB6738. 4.8 Determination of the connection terminals and sealing position of the capacitor 4.1 The connection terminals (Article 3.9) and sealing position (Article 3.10) of the capacitor shall be inspected. 5 Inspection regulations
5.1 Each capacitor shall be subjected to factory test and type test during service life: (3)
5.1 Each capacitor shall be subjected to factory test and type test according to the requirements of 3.1 (basic reading): 3.4 (actual value of annual inductance): 3.5 (main cut-off value D during loss period): 3.8 insulation strength and insulation resistance): 3.11 (completeness) and the requirements of Section 6 (standard) and other requirements (the requirements specified in the specific connection technical conditions) of this standard! 5.3 Factory test 5.4 The sample for type test shall be no less than 3 samples. The type test shall be carried out in accordance with the technical requirements of the technical standard. If there are any samples that do not meet the requirements after the type test, double the number of samples shall be taken for testing. If the samples are qualified, the type test is considered to be qualified. If they are still unqualified, the type test is considered to be unqualified. 5.5 In any of the following cases, type test shall be carried out: 4
GB 9090--88
When a new product or old product is transferred to the factory for trial production and identification: b. When the product is officially produced, if there are major changes in the structure, materials, and process that may affect the product performance: during regular production, after a certain amount of production has been accumulated, a weekly test cavity should be carried out: d. After the product has been discontinued for a long time, when the factory inspection results are significantly different from the previous type test results: when the national quality supervision agency issues requirements for type testing 6.1 The following items should be marked on the brand name shell: ··6. "The name of the manufacturing unit or b. Product name:
, product factory number and manufacturing date: .. Nominal value of capacitor:
Capacitor equivalent index (use the symbol in Table 4). Rated working voltage
g, test voltage (use the symbol C in Table 4); b. Reference position (use the symbol + in Table 4 D)
Transformer terminal and its polarity: ground terminal (use the symbol F-311 in Table 4), external electromagnetic tower shielding terminal short (use the symbol L in Table 4 F-27);
6.2 Marks and symbols should be marked, not sensitive Other marks, symbols and positions required for capacitor work should be specified in the technical requirements of the specific conductive device. 6.3
6.4 The materials for capacitor marking are listed in Table 4.
Symbols for marking capacitors
Test voltage is greater than 500V (for example 2F)
Unregulated power test receiver
GB9090—88
Continued Table 4
Use when the support surface is vertical
Use when the support surface is half rainy
The angle between the support surface and the horizontal surface is as follows: When convenient to use (browse 60 to 1)—1 usage example, nominal usage range: 80-100: press D-2 usage indicates low, standard usage range: one:~+! press D-3 usage example, probe usage request: 45~75 training
reported accuracy rate data is expressed in % (excellent 0.02) accuracy index is expressed in scientific notation (example 2×10*) accuracy level is expressed in m example 2cp)
S.....C.....
P—27
F—33
for packaging, transportation and storage
GB 9090-88
T.1 The packaging of capacitors shall comply with the provisions of ZHY003 "Technical Conditions for Packaging of Instruments and Meters". 72 The transportation and storage of capacitors shall comply with the provisions of ZBY002 "Basic Environmental Conditions and Test Methods for Transportation and Storage of National Instruments and Meters".
Appendix:
This standard is approved by the Institute of Instruments and Meters of Shanghai. The Shanghai Institute of Instruments and Meters is responsible for the production of this standard.According to the provisions given in Table 2, the actual capacitance of the capacitor measured at the test temperature is compared with the actual marked value of the capacitor capacitance (Ct) measured at any temperature within the normal operating temperature range. The variation of the capacitor capacitance when the change is 10 is calculated according to the following formula and expressed as a relative error. Formula: Ct=SC-Gn)x 10
--- Actual capacitance value of the device obtained under the test adjustment factor; X100%
Ci--Actual capacitance value measured at any temperature within the test working temperature range. The calculation result shall comply with the requirements of Article 3.7.1 of this standard. 4.7 Determination of insulation strength and insulation resistance
4.7. The determination method of the insulation curvature between the terminal and the insulation of the device (Article 3.8.1) shall be in accordance with the provisions of GB6738. 4.7.2 The determination method of the insulation resistance between the electrical circuit and the screen of the device (Article 3.8.2) shall be in accordance with the provisions of GB6738. 4.8 Determination of the connection terminals and sealing position of the capacitor 4.1 The connection terminals (Article 3.9) and sealing position (Article 3.10) of the capacitor shall be inspected. 5 Inspection regulations
5.1 Each capacitor shall be subjected to factory test and type test during service life: (3)
5.1 Each capacitor shall be subjected to factory test and type test according to the requirements of 3.1 (basic reading): 3.4 (actual value of annual inductance): 3.5 (main cut-off value D during loss period): 3.8 insulation strength and insulation resistance): 3.11 (completeness) and the requirements of Section 6 (standard) and other requirements (the requirements specified in the specific connection technical conditions) of this standard! 5.3 Factory test 5.4 The sample for type test shall be no less than 3 samples. The type test shall be carried out in accordance with the technical requirements of the technical standard. If there are any samples that do not meet the requirements after the type test, double the number of samples shall be taken for testing. If the samples are qualified, the type test is considered to be qualified. If they are still unqualified, the type test is considered to be unqualified. 5.5 In any of the following cases, type test shall be carried out: 4
GB 9090--88
When a new product or old product is transferred to the factory for trial production and identification: b. When the product is officially produced, if there are major changes in the structure, materials, and process that may affect the product performance: during regular production, after a certain amount of production has been accumulated, a weekly test cavity should be carried out: d. After the product has been discontinued for a long time, when the factory inspection results are significantly different from the previous type test results: when the national quality supervision agency issues requirements for type testing 6.1 The following items should be marked on the brand name shell: ··6. "The name of the manufacturing unit or b. Product name:
, product factory number and manufacturing date: .. Nominal value of capacitor:
Capacitor equivalent index (use the symbol in Table 4). Rated working voltage
g, test voltage (use the symbol C in Table 4); b. Reference position (use the symbol + in Table 4 D)
Transformer terminal and its polarity: ground terminal (use the symbol F-311 in Table 4), external electromagnetic tower shielding terminal short (use the symbol L in Table 4 F-27);
6.2 Marks and symbols should be marked, not sensitive Other marks, symbols and positions required for capacitor work should be specified in the technical requirements of the specific conductive device. 6.3
6.4 The materials for capacitor marking are listed in Table 4.
Symbols for marking capacitors
Test voltage is greater than 500V (for example 2F)
Unregulated power test receiver
GB9090—88
Continued Table 4
Use when the support surface is vertical
Use when the support surface is half rainy
The angle between the support surface and the horizontal surface is as follows: When convenient to use (browse 60 to 1)—1 usage example, nominal usage range: 80-100: press D-2 usage indicates low, standard usage range: one:~+! press D-3 usage example, probe usage request: 45~75 training
reported accuracy rate data is expressed in % (excellent 0.02) accuracy index is expressed in scientific notation (example 2×10*) accuracy level is expressed in m example 2cp)
S.....C.....
P—27
F—33
for packaging, transportation and storage
GB 9090-88
T.1 The packaging of capacitors shall comply with the provisions of ZHY003 "Technical Conditions for Packaging of Instruments and Meters". 72 The transportation and storage of capacitors shall comply with the provisions of ZBY002 "Basic Environmental Conditions and Test Methods for Transportation and Storage of National Instruments and Meters".
Appendix:
This standard is approved by the Institute of Instruments and Meters of Shanghai. The Shanghai Institute of Instruments and Meters is responsible for the production of this standard.
P—27
F—33
Packing, transportation and storage
GB 9090-88
T.1 The packaging of capacitors shall comply with the provisions of ZHY003 "Technical conditions for packaging of instruments and meters". 72 The transportation and storage of capacitors shall comply with the provisions of ZBY002 "Basic environmental conditions and test methods for transportation and storage of national instruments and meters".
Appendix:
This standard is approved by the Institute of Instruments and Instruments of Shanghai. The Shanghai Institute of Instruments and Instruments is responsible for the production of this standard.
P—27
F—33
Packing, transportation and storage
GB 9090-88
T.1 The packaging of capacitors shall comply with the provisions of ZHY003 "Technical conditions for packaging of instruments and meters". 72 The transportation and storage of capacitors shall comply with the provisions of ZBY002 "Basic environmental conditions and test methods for transportation and storage of national instruments and meters".
Appendix:
This standard is approved by the Institute of Instruments and Instruments of Shanghai. The Shanghai Institute of Instruments and Instruments is responsible for the production of this standard.
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