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JB/T 10005-1999 Small probe micrometer

Basic Information

Standard ID: JB/T 10005-1999

Standard Name: Small probe micrometer

Chinese Name: 小测头千分尺

Standard category:Machinery Industry Standard (JB)

state:in force

Date of Release1999-05-20

Date of Implementation:2000-01-01

standard classification number

Standard ICS number:Mechanical Manufacturing>>Machine Tool Devices>>25.060.20 Indexing and Tool/Workpiece Holding Devices

Standard Classification Number:Machinery>>Process Equipment>>J42 Measuring Tools and Measuring Instruments

associated standards

alternative situation:ZB J42002-1987

Procurement status:ISO 3611 NEQ

Publication information

other information

Focal point unit:National Technical Committee for Standardization of Measuring Tools and Instruments

Publishing department:National Technical Committee for Standardization of Measuring Tools and Instruments

Introduction to standards:

JB/T 10005-1999 This standard is a revision of ZB J42 002-87 "Small Probe Micrometer". During the revision, only the editorial modification was made according to the relevant regulations, and the main technical content was not changed. This standard specifies the type and size, technical requirements, marking and packaging of small probe micrometers. This standard is applicable to small probe micrometers with graduation values ​​of 0.01mm and 0.001mm, micrometer screw pitch of 0.5mm, and measurement range up to 75mm. This standard was first issued in 1987. JB/T 10005-1999 Small Probe Micrometer JB/T10005-1999 Standard download decompression password: www.bzxz.net

Some standard content:

ICS 25.064.24
Machinery Industry Standard of the People's Republic of China
JB/T10005-1999
Small probe micrometer
Smallanvilmicrometer
Published on May 20, 1999
National Bureau of Machinery Industry
Implemented on January 1, 2000
JB/T10005-1999
This standard is revised on the basis of ZBJ42002-87. The technical content of this standard is consistent with that of ZBJ42002-87, and it has been re-edited according to relevant regulations. Appendix A of this standard is the appendix of the standard.
This standard replaces ZBJ42002-87 from the date of implementation. This standard is proposed and managed by the National Measuring Instrument Standardization Committee. The responsible units are: Qinghai Measuring Tool Factory, Gua Lin Measuring Tool Factory, Shanghai Ji Tool Factory, Chengdu Measuring Tool Factory, Beijing Second Tool Factory.
Main contributors of this standard: Li Jinghua, Wang Ronghua, Lin Guanhua, Jin Mingsheng, Sui Diqiu, Gao Xiangjun: This standard was first issued in 198.
Mechanical Industry Standard of the People's Republic of China
Small Probe Micrometer
Smsllanvi micrometer
This standard specifies the type and size, technical requirements, specifications and packaging of small probe micrometers. JB/T10005—1999
Replaces ZB J42 Appendix 2—87
This standard applies to small probe micrometers with a graduation value of 0.01mm and 0.001mm, a micrometer screw pitch of 0.5mm, and a measuring range of up to 75mm.
This standard adopts the following definitions:
2.1 Micrometer with small probe
An outside diameter micrometer with two smaller measuring surfaces, 1.2 Indication error
The distance between the engraved indication value and the actual separation of the two measuring surfaces, 2.3 Dynamic deviation of micrometer
The indication error obtained along the full range of the micrometer screw is obtained by the load, the difference between the highest point and the lowest point of the curve on the ordinate 3 Type and size|| tt||3. [The type of small probe micrometer is shown in Figure 1. The measuring plate width and graduation value are shown in Table 1 (the figure is for illustration only and does not represent the detailed structure frame
Graduation value
Approved by the State Machinery Industry Bureau on May 20, 1999. Brief description of the value of the width of the support number of the nesting material stomach because of the cru bone its division is required to be healthy
Milk installation
(1-15,-2n
015.0-20, 025,2550.50-73
2000-01-01 implementation
JB/T10005—1999
3.2 The measurement numbers of the fixed sleeve of the small measuring scale shall be in accordance with the provisions of Table 2 unless otherwise specified. 2
To liquid
Scale micro-character mark
0.5, 10.15
0,5. 10. 15.
、5.10、15、20.25
2530,35,40,45.50
50.55.60.65,70,75
3.3 The diameter of the micrometer rod and the measuring rod of the small probe micrometer should be 2mm, and the length should be 5mm. 3,4 The small probe micrometer should be equipped with a locking device to tighten the micrometer screw. 4 Technical requirements
4.1 The small probe micrometer should not have any external defects that affect its use: 4.2 The movement of the micrometer rod of the small probe micrometer should be smooth and free of sticking. Its axial and radial directions should be stable. Should not be greater than 0.01mm. 4.3 For small probe micrometers with a diameter of less than or equal to 25mm, the deviation between the two surfaces should not exceed 1.3mm. 1.4 The locking device of the small probe micrometer should be able to ensure the semi-fixed tightening of the micrometer screw. When locked, the change in the distance between the two measuring surfaces should not exceed 0.002mm
4.5 The width of the longitudinal scale line of the fixed sleeve of the small probe micrometer and the scale line on the subscript should be 0.15-0.20mm, and the difference in scale width should not be greater than 0.03mm.
4.6 When the small probe micrometer is in the same position, the distance from the end face of the two differential surfaces to the fixed sleeve scale line is allowed to be no greater than 0.05mm, offline not too much.1mm
4.7 The distance from the engraved surface of the fixed sleeve to the edge of the micrometer cone should not be greater than 0.40mm. 4.8 The small head should be inlaid with hard metal for micrometer measurement. 4.9 The surface accuracy R value of the small head on the micrometer measuring surface is 0.4m4, 10 The force when the small head micrometer measures each surface in contact with the spherical surface should be 3~8, and the measurement value should not be greater than 4.11 The indication error of the small head F micrometer, the flatness of the measuring egg surface, the parallelism of the two measuring disks, the deformation of the scale frame when subjected to external force along the axis of the micrometer screw, and the movement deviation of the micrometer head should not exceed the provisions of Table 3 , Table 3
Measurement range
0-25,25~50
50--75
Indication value setting
Measurement: Degree
Question Measurement of parallelism of center frame when subjected to 0
Method: Flatness of side egg surface and measurement of maximum surface deformation within 0.05m day range 1 + .2
Thank you for your support. JE/T[0005-1599
4.12 Small probe micrometer should be equipped with a tool for adjusting the zero position, and small probe micrometer with a measurement upper limit greater than or equal to 5mml should be equipped with a calibration gauge. The small deviation of the calibration plate rod and the parallelism tolerance of the two measurements are shown in Table 4. Table 4
Nominal size
Pre-calibration difference
4.13 The hardness of the measuring plate surface of the small probe for the calibration rod of the micrometer should not be less than 766HV (62HRC. 4.14 The surface cohesion R value of the measuring plate surface of the small probe for the micrometer is 0.04μm. 5 Marking and packaging
5.1 The markings on the small measuring head sub-ruler:
a) Manufacturer's name or registered trademark:
6) Production range:
Graduation value: wwW.bzxz.Net
Product serial number.
52 The nominal size of the calibration scale should be marked
5.3 The packaging box of the small measuring head sub-ruler should be marked: a) Manufacturer's factory or registered trademark;
) Product name: ||t t||)Measuring range,
Inner parallel tolerance of measuring surface
5.4 The bottom of the small probe micrometer shall be treated with rust prevention and packed before packaging. The product shall not be damaged during transportation due to poor packaging. 5.5 The small probe micrometer that has been verified to meet the requirements of this standard shall be accompanied by a product certificate: the product certificate shall be marked with the standard number, product number and factory date of this standard.
JB/T1(005—2999
Appendix A
(Appendix to the standard)
Test method of small sub-head micrometer
This appendix is ​​about the test method of small sub-head micrometer before factory inspection. A1 Movement deviation of micrometer head
During the inspection, the probe head shall be carefully fastened to the clamp or plate and installed in the position close to the measurement of the micrometer lever. A temporary fixed measuring station with a suitable length and a spherical measuring surface is then used for inspection with a group of scales of the following size series: 2.5, 5.1, 7.7, 10.3, 12.9, 15, 17.6, 20.2, 22.8 and 25mm. Note: The small probe micrometer with a measuring lower limit of 4 mm is required to be inspected and may be exempted from inspection. A2 Indication difference
Fasten the small probe micrometer on the clamp and inspect the small probe micrometer between the two measuring surfaces in turn with a group of scales of 2.5, 5.1, 7.7, 10.3, 12.9, 15, 17.6, 20.2, 22.8 and 25 mm2. Measure the deviation between the residual indication value of the small probe micrometer and the two measuring surfaces at each position. The small probe micrometers of 0~15mm and 0~20mm can be respectively inspected with the above-mentioned The first eight blocks in the plate are tested. Connect all points to make an indication error curve, and the difference between the highest point and the lowest point on the ordinate is the indication error. For small single-headed F-type micrometers with a lower limit equal to or greater than 25mm, when checking the indication error, the above-mentioned special block should be combined with the mother block corresponding to the lower limit of the measuring mother block for inspection.
Deformation of A3 scale frame under 10N force
The scale frame of the small probe micrometer (close to the differential end) is mounted on the special tool on the rate table with the differential at the top and the force at the bottom, and the measurement display of the lever micrometer is used to measure the surface of the measurement base, and then a force of 3N is applied to one side of the scale station along the axis of the micrometer screw: and then the reading is taken on the lever micrometer, and the difference between the two readings is converted into the deformation when the force is 1N, which is the deformation of the scale frame of the small probe micrometer.
A4 Axial spacing and radial spacing
Height 4.1 is used to check the axial spacing value. If there is any abnormality, the axial spacing value A4 is recorded on a special inspection fixture.z Check the diameter by hand. If there is any objection, the radial distance is measured at 10mm from the inner end face of the center frame: A5 Force measurement and force change
Measure the force and force change value of the small probe micrometer on the micrometer special gauge A6 Position of the two measuring surfaces
Put the small probe on the micrometer on the adjustable support on the table, so that the differential axis is parallel to the platform working surface. When the frame is horizontal and vertical, use the dial indicator to measure the position of the two measuring surfaces 6 and 5 respectively, and the deviation of the two measuring surfaces is calculated by subtracting (A1): , =812 + (6,)2
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