Standard Classification Number:Electrician>>Power transmission and transformation equipment>>K46 power semiconductor technology and components
associated standards
Publication information
publishing house:Machinery Industry Press
Publication date:1993-01-01
other information
drafter:Tian Wenfu, Lin Youting, Guo Lanqiong, Qin Xianman
Drafting unit:Beijing Chunshu Rectifier Factory, Chengdu Electric Welding Machine Research Institute of the Ministry of Mechanical and Electronic Industry
Focal point unit:Xi'an Institute of Electronics and Electric Power Technology, Ministry of Mechanical and Electronic Industry
Proposing unit:Xi'an Institute of Electronics and Electric Power Technology, Ministry of Mechanical and Electronic Industry
Publishing department:Ministry of Machinery Industry of the People's Republic of China
This standard specifies the technical requirements for the type, size, parameters, inspection and marking of thyristors used in the main circuits of power frequency resistance welding machines and arc welding machines. This standard applies to KE type 50A reverse blocking three-stage thyristors (hereinafter referred to as thyristors) rated according to the shell for resistance welding machines and arc welding machines. JB/T 6324-1992 KE type 50A to 500A thyristor for electric welding machine JB/T6324-1992 Standard download and decompression password: www.bzxz.net
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K46 JB People's Republic of China Pressure Machinery Industry Standard JB/T63241992 KED50A500A 1992-06-26 4 e 1/4 1993-01-01fish G R2 0P uDEe/ KED50A500A 1 Subject content and scope of application JB/T63241992 This standard specifies the technical requirements for the type, size, parameters, inspection and marking of thyristors used in the main circuit of power frequency resistance welding machines and arc welding machines. This standard applies to KE type 50A to 500A reverse blocking three-stage thyristors (hereinafter referred to as thyristors) rated by shell for resistance welding machines and arc welding machines. 2 Reference standards GB2900.32 GB4024 GB4937 GB4938 GB8446.1 Electrical terminology Power semiconductor devices Test methods for reverse blocking three-pole thyristors for semiconductor devices Mechanical and climatic test methods for discrete semiconductor devices Acceptance and reliability of discrete semiconductor devices Radiators for power semiconductor devices GB/T11456 Dimensions of profile heat sinks for power semiconductor devices JB42 77 JB/Z363 Technical conditions for packaging of power semiconductor devices Heat sinks for power semiconductor devices Use guide model and dimensions 3 3.1 Model KEO- Off-state and reverse repetitive peak voltage levels Power frequency rated on-state average current (unit: A) For resistance welding machines and arc welding machines Reverse blocking triode thyristors 3.2 Appearance 3.2.1, Bolt type The dimensions of bolt-type thyristors shall comply with the requirements of Figure 1 and Table 1. 1992-06-26 Mouse 1 1993-01-01 Push d, Recommend IT(AV) A 50 100 200 300 M Cathode lead Soft cathode lead|| tt||Hard cathode lead Soft cathode lead Hard cathode lead Soft cathode lead Hard cathode lead Soft cathode lead Hard cathode lead M d M12 M12 M16×1.5 M16×1.5 M2 0×1. .5 M20×1.5 M24X1.5 d 8.5 8.5 8.5 R 10.5 10.5 10.5 M24X1.5 d| |tt||JB/T63241992 Figure 1a Figure 1b Table 1 Scale M 3.2~4.5 3.2~4.5 3.2~4.5 3.2~4.5 3.2~4.5 7 16 23 23 10 210 e10 No. 150± 15 200±20 250±25 250±25 > > 64 ≤64 S80 ≤80 110 110 110 ≤110 mm 31 27 32 32 41 41 41 31 37|| tt | | 32 | | tt | | 48 | Comply with Figure 2 and Table 2. Dmax | |tt | | D | | tt | The overall dimensions of the flat plate concave flat plate thyristor shall comply with the requirements in Figure 3 and Table 2. Dmax D L Figure 3 Table 2 foot generation 中 D Dmx A αT L 4 200 30 65| |tt||≤16 Rating and characteristic values 4.1 rating Concave plate shape Recommended ITLAV 300||tt| |35 80 ≤16 400 35 80 ≤16 3.5~4.0|| tt||200±20 500 40 85 ≤17 200 37±2 85 T 7y Boss flat plate Recommended Iav) 300 44±2 90 14±1 26±2 400 44±2 90 3.5~4.0 200 ±20 The maximum rating (limit value) shall comply with the provisions of Table 3 and is applicable to the entire operating temperature range. 4.2 Characteristic values The characteristic values ??shall comply with the provisions of Table 4, Vcp is the lower limit value, Others are upper limit values. 3 500 50±2 90 + Type No. KE50 KE100 KE200 KE300 KE400 KE500 normal state average electricity Stream ItuAv) A 50 100 200 300 400 500 | |tt | |310 470 630 790 off-state complex peak median electric current VDRM gold Complex bee Value Voltage Voltage VeR V 400~2000 Off Not heavy Complex Bee Voltage Vpek V Vpru -||tt| |90% Vrex Unrepeatable bee value power plant Volume Vrt VrRx 90% Vaor pass critical rise rate of ground current di/at A/μs 50 50||tt| | 100 | | tt | | 50 | C -40~ +125 Table 3 Liquid Surge Electricity||tt| |Flow Irk I't I't 1 cycle 5 weeks 1 cycle A 940 1900 3800 5600 7500 9400 A 540 1200| |tt||2090 3080 4300wwW.bzxz.Net 5400 A's 5000 18000 72000||tt ||1.6×10 2.8×10 4.4×10 Buy Save Temperature Degree I C -40~ +140 Gate cover bee pressure Vrch|| tt||V 10 10 10 16 16 16 Gate reverse| |tt||peak electricity voltage VgGM V 5 gate forward|| tt||bee value electricity flow Irea A 2 3||tt| |3 3 tight solid force F tight solid force moment FL heavy 博 w kNN·M & by The manufacturer gives tube shell temperature degree Tc c 85||tt| |JB/T6324k 1992 Speciality Off-state repetitive peak current Reverse repetitive peak current On-state peak Voltage holding current holding current gate triggering current gate triggering voltage gate non-triggering voltage Case thermal resistance Critical rise rate of off-state voltage Characteristic curve 4.3 symbol No. Iour||tt| |IRR V I Ier Ver Vep Re dv/dt||tt| |mA mA mA mA mA V JB/T63241992 Table||tt| |bits c/W V/μs KE50 15 15 1.8 250|| tt||150 150 3.0 0. 2 0.40 200 4 KE100 25 25 1.8 300 150| |tt||150 3.0 0. 2 0.20 200 The following characteristic curves are given in corporate standards and product instructions: a. b. c. d. e. t. Case temperature and average on-state current derating relationship curve; through-state volt-ampere characteristic curve; relationship curve between transient thermal impedance and time: KE200 30 30 2.0||tt ||300 200 200 3.0 0.2 0.11 200 Surge current and cycle number Relationship curve (time extends to 5s) and I\t characteristic curve; gate trigger range characteristic curve: The relationship curve between the maximum on-state power consumption and the average on-state current (conduction angle is used as a parameter). Inspection and testing 5 5.1 Batch-by-batch inspection Each batch of products must be inspected batch-by-batch according to Table 5. Serial number 2||tt| |3 4 Inspection Project Inspection Exterior View Vr lor IeRM Yer Ic Table 5 Inspection method Visual inspection under normal lighting and normal|| tt||under normal vision conditions) 3.2 of GB.4024 (25℃) 3.1 of GB4024 (25,125) of GB4024 3.4 (25℃) Qualification criteria KE300 40 40 2.0 350|| tt||200 300 3.0 0.2 0. 08 200 clear logo, surface coating || tt||The layer has no peeling damage Conforms to the requirements of Table 4 Conforms to the requirements of Table 4 Conforms to the requirements of Table 4 Note: ①See Appendix A for the specific sampling plan of AQL . ② If the initial submission fails to pass the inspection, it can be resubmitted according to the stricter level in Appendix A. 5.2 5 Periodic inspection According to Table 6, at least one batch of periodic inspections should be carried out every year for normal production of finalized products. KE400 40 40 2.0 350 250 300 3.5 0. 2 0.05 200 KE500 45 45 2.0 400 250| |tt||350 4.0 0.2 0. 04 200 Sampling plan AQL 1.5 1.0 1.0 1.0 sequence number 1 2 5 6| |tt||7 8 9 Inspection items foot inch temperature cycle (D)||tt| |Following sealing Irsm Re Electrical durability (High temperature reverse bias) High temperature storage dv/dt di/dt JB/T63241992 Table 6 Inspection method Inspect each size according to Figure 1, Figure 2 or Figure 3||tt| |Method GB4937 3.1.1 (Na): two-box method, -40C, 125C cycle 5 times, high and low temperature exposure for 1 hour each cycle, transfer time 3~4min; GB4937 3.7.5 (Qc) : Pressurized fluorine oil leak detection GB4024’s 4.21 cycles 20 times, 15 cycles 6 times each interval 15s GB4024’s 2.2 GB4938’s 3.2.1000+h, 70%VxRM|| tt||Sine wave 50Hz, 125-9℃ GB4937’s 3.2.1000h, 125-℃ GB4024’s 3.8: 125-9℃, gate open circuit GB4024’s 4.4: 125℃|| tt | ||Last test, VTM≤1.1USL IM≤2USLIDRM≤2USL Leakage rate, <0.1Pa·cm\/s Last test: VTm≤1.1USL||tt ||IM2USLR2USL Comply with the provisions of Table 4 Last test, Vtm<1.1USL IM≤2USLIDRM2USL Last test: Vrm≤1.1USL IM≤2USLDRM≤2USL Conform to the provisions of Table 4 Conform to the provisions of Table 3 Final test, V≤1.1USL IRRM2USL,IDRM≤2USL||tt || Briefly give the VTM, IRM, IDRM values ??and test conclusions before and after each test Note; ① Periodic inspection, if it fails the first time, additional sampling can be carried out according to Appendix B and another inspection can be carried out, but it can only be added once. ②In the sampling plan, n and c are the sampling number and the passing judgment number respectively. ④Things marked (D) are destructive tests, the same as below. ④The USL in the qualified data column is the corresponding upper limit value in Table 4, the same as below. 5.3 Qualification test Sampling plan 0 9 6 11 6 11 | | tt | | 11 | | tt | | c | | tt | | 1 | Conduct a batch of identification tests. For regular batch products that have been finalized and products that are re-produced every three years or after production has been discontinued for more than half a year, at least one batch of identification tests should be conducted. Table 7 Serial number 1 2 Test items Thermal cycle load test Shock (D) or vibration||tt ||Test method 4.8 for GB4024 Number of cycles: Crimp the device 5000 times Weld the device 1000 times 2.4 (Ea) for GB4937 100g, lasting 6 ms, half sine wave in three directions of mutually perpendicular axes, three times in each direction, a total of 18 times. 2.3(Fc) of GB4937: 20g100~2000 Hz, 2h in each direction, 6h in total Qualification criteria Final test: VTM≤1.1USL|| tt||IRRM≤2USL IDR≤2USL Last test: VTM≤1.1USL IR2USL IDRM≤2USL Sampling plan n 6 6 c 6 6 marking, packaging, transportation, storage 6.1 Logo The logo on the product includes: JB/T63241992 a. Product model; b. Terminal identification mark: represented by a symbol (the arrow points to the cathode terminal) or red, blue (or black), yellow (or white) to represent the cathode, anode, and gate terminals respectively, or only red to represent the cathode terminal; manufacturer's name Code name or trademark, c. d. Inspection lot identification code. 6.2 Certificate The certificate should at least give the actual measured values ??of VTM, IoRM, IRRM, VcT, Ict and the value of di/dt inspected batch by batch. Packaging 6.3 Products should be packaged according to JB4277. The markings on the packaging and accompanying instructions include: a. product model name; manufacturer name code or trademark: b. inspection batch identification code; c. d. Moisture and rainproof sign. 6.4 Transportation Products should not be subject to severe vibrations and impacts during transportation. 6.5 Storage The product should not be exposed to rain and should be placed in a place where the air circulates and the surrounding medium temperature does not exceed the specified storage temperature. The maximum relative humidity of the air does not exceed 90% (equivalent to the air temperature of 20±5℃) and in an environment without corrosive gases. 7 Batch range N 2—8 9—15 16—-25 26—50||tt ||5190 91-150 151-280 281500 501-1200 1201-3200 3201—10000| |tt||10001—35000 Initial sampling Additional sampling Additional number Additional instructions: Sample size n| |tt||2 3 5 8 13 20 32 50||tt ||80 125 200 315 JB/T63241992 Appendix A AQL Sampling Table ( Supplement) 0.65 c o 1 3 5 r 1 + + 2 3 4 6 Appendix B| |tt||Additional sampling (supplementary parts) Sample size n 6911 91316 345 Table||tt ||This standard is proposed and administered by the Xi'an Power Electronics Technology Research Institute of the Ministry of Mechanical and Electronic Industry. AQL(%) 1.0 1 0 1 2 3 5||tt| |7 2 3 4 6 8 1.5 c → 0 + 1 2 3 5 7 10|| tt||2 6 8 11 together lattice judgment number c||tt ||1 2 This standard was drafted by Beijing Chunshu Rectifier Factory and Chengdu Welding Machine Research Institute of the Ministry of Mechanical and Electronics Industry. The main drafters of this standard are Tian Wenfu, Lin Youting, Guo Lanqiong, and Qin Xianman. 8 Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.