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GB/T 5095.9-1997 Basic test procedures and measurement methods for electromechanical components for electronic equipment Part 9: Miscellaneous tests

Basic Information

Standard ID: GB/T 5095.9-1997

Standard Name: Basic test procedures and measurement methods for electromechanical components for electronic equipment Part 9: Miscellaneous tests

Chinese Name: 电子设备用机电元件 基本试验规程及测量方法 第9部分:杂项试验

Standard category:National Standard (GB)

state:in force

Date of Release1997-01-02

Date of Implementation:1998-10-01

standard classification number

Standard ICS number:Electronics >> 31.220 Electromechanical components for electronic and telecommunication equipment

Standard Classification Number:Electronic Components and Information Technology>>Electronic Components>>L10 Electronic Components General

associated standards

alternative situation:GB 5095.9-1986

Procurement status:≡IEC 512-9-92

Publication information

other information

Release date:1986-02-04

Review date:2004-10-14

Drafting unit:Standardization Institute of the Ministry of Electronics

Focal point unit:National Technical Committee for Standardization of Electromechanical Components for Electronic Equipment

Publishing department:State Bureau of Technical Supervision

competent authority:Ministry of Information Industry (Electronics)

Introduction to standards:

The test methods specified in this standard shall be adopted when detailed specifications of electromechanical components for electronic equipment within the scope of TC48 are required. They may also be adopted when detailed specifications of similar components are required. GB/T 5095.9-1997 Basic test procedures and measurement methods for electromechanical components for electronic equipment Part 9: Miscellaneous tests GB/T5095.9-1997 Standard download decompression password: www.bzxz.net

Some standard content:

GB/T 5095.9—1997
This standard is equivalent to IEC512-9:1992 "Basic test procedures and measurement methods for electromechanical components for electronic equipment Part 9: Item tests", which is the first revision of GB5095.9-86. This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is under the jurisdiction of the National Technical Committee for Standardization of Electromechanical Components for Electronic Equipment. This standard is recommended by the Standardization Institute of the Ministry of Electronics Industry. The main drafters of this standard are Yu Kafang, Wang Qilong, Zhang Juhua, and Wang Yutang. GB/T 5095.91997
IEC Foreword
1) Formal resolutions or agreements of IEC (International Electrotechnical Commission) on technical issues are formulated by technical committees participated by national committees with special concerns about these issues, and represent the consensus of international workers on the issues involved as much as possible. 2) These resolutions or agreements are published in the form of standards, technical reports or guidelines, and are recommended for international use, and in this sense, they are recognized by national committees.
3) In order to promote international unification, each IEC National Committee has the responsibility to make its national and regional standards adopt IEC standards as much as possible. Any differences between IEC standards and national or regional standards should be indicated in the national or regional standards. International Standard IEC 512-9 IEC/TC 48 (Electromechanical Components for Electronic Equipment) has been developed. This second edition of the standard replaces the first edition published in 1977 and its amendment 1 (1982). This standard is used together with Part 1: General Principles (IEC512-1). The other test items included in the whole set of standards are given in Appendix A of IEC:512-1. These test items are published after they are developed.
The text of this standard is based on the first edition of 1EC512-9 Epidemiology, Revision 1 (1982) published in 1977 and the following documents: Six-month method
18(CO)299
18(CO)300
48(CO)309
48(CO)318
Voting report
48(00306
48(C))307
48(0)311
48(CO)321
Two-month procedure
48(CO)312
Voting for detailed information on approval of this standard can be found in the voting reports listed in the table above. Voting report
48(CO)313
0.1Scope
National Standard of the People's Republic of China
Electromechanical components for elcetronic equipmentBasic testing procedures and measuring methodsPart 9: Miscellaneous tests
Part 0 General
GR/T 5095. 9
idt 1Ec: 512-9: 1992
Substitute GB 5195. 9—86
The test methods specified in this standard shall be adopted when detailed specifications for electromechanical components used in electrical equipment are required within the TC48 specification period. They may be adopted when detailed specifications for similar components are required. 0.2 Referenced standards
The provisions contained in the following standards become the provisions of the standards through reference in this standard. When this standard is published, the versions shown are valid. All standards will be revised. All parties using this standard should explore the possibility of using the latest versions of the following standards. GB/T5095.2—19 97 Basic test procedures and measurement methods for core components of radio and television equipment Part 2: General inspection, electrical continuity, contact resistance test, insulation test and voltage stress test (iditIEC5122:1991) GB5169.1-85 Guidelines for fire hazard tests for electric and electronic products - Glow-wire test methods (eqvIEC695-2-1:1980) GB/T5169.585 Needle-flame test methods for fire hazard tests for electric and electronic products (egvIEC695-2-2:1980) GB7343- 87 Passive radio interference filters and suppression components, test methods for the resistance to mechanical stress (eAVCISPR17:1981) Part 1 Cable clamp test
1 Test 17a; Cable clamp strength
1.1 The purpose of this test is to establish a detailed standard test method to assess the ability of a cable to withstand the mechanical stresses that may be encountered in normal use. 1.2 Preparation of test samples
The test sample should be a cable or wire bundle that is mounted on the relevant component or part with the help of a cable clamp. The test sample should be prepared according to the detailed longitudinal Prepare and install in accordance with the provisions of the specification. * Scope of TC48: To formulate international standards for related components of communication equipment and electrical devices using similar technologies and their organic and non-functional connections. 1. R.F. connectors shall no longer be issued by this technical committee. Developed by TC46 and RI, 2. Sockets with electrical or electronic components shall be introduced by relevant technical requirements. Approved by the State Administration of Technical Supervision on December 26, 1997 and implemented on October 1, 1998. 1.3 Test method GB/T 5095. 9-1997 The test sample is firmly fixed, and the cable or wire bundle is in a horizontal position. The specified vertical force can be applied to the cable or wire bundle at a specified distance from the cable clamp to produce a bending moment. This force is increased steadily to the specified value at a rate not exceeding 20N/s. Keep the specified value for 1 minute and then remove the force to return the cable to a horizontal state: then rotate the test sample horizontal auxiliary line 90°. Every time it rotates 90°: the specified torque should be repeatedly applied for test riding, and the number of repetitions shall be specified in the detailed specifications. 1.4 Final inspection
The joints of the cable or wire bundle and the intermediate cable fire device, and the joints of the intermediate cable fire tightening device and the components or parts should be visually inspected according to GB, T 5095. 2-1997 test 1a. 1.5 Requirements
The cable or wire bundle or the test sample shall not be damaged. The displacement of the cable or conductor bundle shall not exceed the value specified in the detailed specification. 1.6 Details to be specified
Detailed specification requirements The following details shall be specified for this test: a) Preparation of test specimen and type of conductor bundle or cable used: whether it shall be connected to the contact: 6) Installation of test specimen:
c) Magnitude of force or moment and point of force application;
d) Number of tests:
c) Requirements for final inspection;
t) Any differences from the standard test method. 2 Test 17b: Ability of cable clamp to resist cable rotation 2.1 The detailed standard test method shall be used to assess the ability of the cable clamp to resist cable or conductor bundle rotation without damaging the outer surface of the cable or conductor bundle, the cable clamp, components or parts. 2.2 Preparation of test specimen
The test specimen shall be a cable or conductor bundle specified on the relevant component or part in the normal way by means of a cable clamp. The test specimen shall be prepared and installed as specified in the detailed specification. 2.3 Test method
Make the cable or wire bundle from the end 5 to the entrance axis of the test sample deflect 45 ~ 50 °, and then rotate 360 ​​°. The speed and number of rotations shall be in accordance with the detailed specifications. During the test, the torque or tension to which the cable or wire bundle is subjected shall not be greater than the minimum value required to keep the cable or wire bundle in the correct position.
2.4 Final inspection
At the junction of the cable or wire bundle and the cable clamping device, and at the junction of the cable clamping device and the component or part, an appearance inspection shall be carried out according to test 1a of GH/T5095.21997. 2.5 Requirements
The outer surface of the cable or wire bundle, or the test sample, shall be free of damage. 2.6 Detailed specifications to be specified The following details should be specified for this test a) Preparation of the test sample and the type of cable or wire harness used: 6) Installation of the test sample; c) Number and speed of rotation: d) Requirements for final inspection: CB/T 5095.9 1997 e) Differences from the standard test method: 3 Test 17c: Ability of cable clamp to resist cable pulling (tension) 3. January's sufficient to establish a detailed standard test method to assess the ability of the cable clamp to prevent longitudinal movement of the cable or wire harness, 3.2 Preparation of test samples
The test sample is a cable or wire bundle that is fixed to the relevant component or part in the normal way with the help of a cable clamping device. The test sample should be prepared and installed in accordance with the provisions of the detailed specification: the test sample should not be connected.
3.3 Test method
The test sample should be fixed to the ground so that the cable or wire bundle is in a vertical position. The specified tension is applied to the outgoing end of the cable or wire bundle along the axial direction.
This force should be steadily increased to the specified value at a rate not exceeding 20.V/*, and maintained at the maximum value. 3.4 Final inspection
At the joint of the cable clamping device of the cable or wire bundle, and at the joint of the central device and the matching component or part, the appearance inspection should be carried out according to test 1a in GR/T50915.2-1997. 3.5 Requirements
No harmful operating damage should be caused. The position of the relay or conductor bundle should not exceed the specified value in the detailed specification. 3.6 Details to be specified
Detailed specification requirements The following details shall be specified for this test a) Preparation of test specimens and type of cables and wire harnesses used; h) Installation of test specimens;
) Required force;
d) Requirements for final inspection:
e) Any differences from standard test methods. 4 Test 17d: Ability of cable clamps to resist twisting of cables The
of 4.1 is a standard test method established to assess the ability of a cable type to prevent twisting of a cable or wire harness along its axis. 4.2 Preparation of test specimens
The test specimens are cables or wire harnesses specified on the relevant components or parts with the aid of a cable clamping device: The test specimens shall be prepared and installed in accordance with the provisions of the detailed specification. 4.3 Test method
The test sample shall be firmly fixed, and a torque shall be applied to the cable or wire bundle at the specified distance from the cable clamp. The torque shall be steadily increased to the specified value at a rate not exceeding 9.3N·m/s: the maximum value shall be maintained for 1 minute. 4.4 Final test
The joints of the cable or wire bundle and the cable clamp, as well as the joints of the components or parts of the cable clamp, shall be visually inspected according to test 1a in GB/T5095.21997. 4.5 Requirements
The cable or wire bundle shall not move or rotate in the cable clamp, and the movement of the cable clamp relative to the component or part shall be less than the specified value in the detailed specification.
4.6 Details to be specified in this article
..comGB/T 5095.9—1997
Detailed specification requirements The following details should be specified for this test: 2) Preparation of test samples and type of cable or wire harness used; 6) Installation of test samples:
c) Detailed provisions of the test:
d) Torque, time and working point: c) Requirements for final inspection;
f) Differences from standard test methods Part II Explosion hazard test
5 Test 18a: Explosion hazard (deleted) Part III Chemical corrosion resistance test
6 Test 19a: Resistance of pre-insulated crimping sleeves to liquids
6.1 The purpose of this article is to establish a detailed standard test method to assess the ability of the insulating sleeve of a pre-insulated crimping sleeve to resist specified liquids under specified conditions. 6.2 Test sample preparation
The test sample shall include a crimped contact or terminal with a pre-insulated crimp sleeve and a corresponding cable or conductor, which shall be prepared in accordance with the provisions of the detailed specification.
The cable or conductor components prepared in accordance with the specified connection specifications shall be assembled with the crimp sleeve and then crimped in the usual way. 6.3 Appearance inspection
The test sample shall be visually inspected using a 2 to 1 magnification mirror in accordance with the provisions of test 1a in GB/T5095.2-1997. Ensure that the insulation sleeve of the crimped sleeve is not cracked or cut to avoid invalid test. 6.4 Test method
6.4.1 Condition test
The test product shall be placed in a liquid at the temperature specified in the detailed specification for 20 h (unless otherwise specified in the detailed specification). Immerse two test samples in each liquid, and at least one test sample can withstand the test of the liquid: 6.4.2 Recovery
After the test sample is taken out of the liquid, allow it to recover for 1 minute under the test standard atmosphere, and then wipe off the residual liquid. 6.5 Final inspection
6.5.1 Appearance inspection
Use a 2 to 100 times magnifying glass to conduct an appearance inspection in accordance with the provisions of test 1a of GB/T5095.2-1997. 6.5.2 Radio voltage
After the appearance inspection, prepare the test sample, and then conduct the positive test and withstand voltage test in accordance with the detailed provisions of GB/T5095.2-1997 + test 4c.
6.6 Requirements
6.6.1 External inspection
The test sample should be inspected for cracks or other defects that are not suitable for use. The insulating sleeve is allowed to change to 6.6-2 Withstand voltage
Dead breakdown or arcing
6.7 Details to be specified
GB/T 5095.9--1997
Detailed specification requirements The following details should be specified for this test: a) Preparation of test samples:
b) Cable or wire to be used;
c) Crimp type and die adjustment position;) Flooding time (if different 20h):
Withstand voltage value:
g) Difference from standard test method, 7 Test 19h: Odor resistance (deleted) Part 4 Fire hazard test
8 Test 20a; Flame flammability, needle flame
8.1 Purpose
is to establish a detailed standard test method to determine the flammability of components when exposed to needle flame under specified conditions. The needle flame test simulates the small flame effect that can be generated under internal fault conditions of the equipment, that is, the intensity of the combustion source used is similar to the combustion level of a single electronic component accidentally overheating or catching fire. 8.2 Preparation of test specimens
The test specimens shall consist of unconnected components and shall be mounted as specified in the detailed specification. 8.3 Test method
The test shall be carried out in accordance with GB 5169.5. A wooden board covered with shrink paper shall be placed under the test specimen as specified in GB 5169.5. The position of the test specimen and the point of application of the flame shall be as specified in the detailed specification. The burner shall be mounted at approximately 45° so that any burning products dripping from the test specimen can freely bury themselves on the cushioning layer! For the same reason, it is desirable to specify that the test specimen position is slightly inclined (approximately 80°). Where corners apply, the flame shall be not less than 10 mm from the nearest corner unless otherwise specified in the detailed specification. The burner shall be ignited at a distance from the test specimen and the flame height shall be adjusted to 12 mm ± 1 mm. The burner shall then be placed in the test position so that the flame penetrates the test specimen by approximately 2 mm. Therefore, a vertical distance of 8mm to 10mm between the burner tip and the test surface or edge is sufficient, but the horizontal distance between the burner tip and the test surface must be about 5mm when burning a vertical surface. Test evaluation
H. Example of test position
Figure 1 Pin tower test
Test sample
b. Example of test position
The specification shall specify the severity level to be adopted (duration of application of flame). The duration of application of the following test flames specified in GB5169.5 shall be preferred! 55.10s, 20s.30, 60s.120s
GB/T 5095. 9—1997
At the end of the flame application time, the flame is removed from the test sample. B-4 requirement
After the burner is removed, the test sample should preferably not continue to burn. If burning continues, the duration of burning shall not exceed the maximum limit of the detailed specification. Any dripping shall not ignite the paper bedding layer. Details to be specified in Part 8.5 Detailed specifications require that the following details shall be specified for this test: a) Number and specifications of test samples: h) Installation of test samples: d) Severity level (duration of flame application): c) Maximum burning time; d) Flame increase point: c) Maximum burning time; t||f) What are the differences between the standard test methods? 9 Test 20h: Flame resistance (under consideration) 10 Test 20c: Flame combustion, Glow wire 10.1H
is to establish detailed standard test methods to determine the flammability of components when subjected to a hot wire test under specified conditions. The glow test simulates the thermal stress that may be generated in a short period of time by a heat source or fire source, such as a hot component or an overloaded component, to assess the hazard of a single component if it catches fire or burns using simulation technology. 10.2 Preparation of test products
The test sample consists of a component that is not connected and is installed as specified in the detailed specification. 10.3 Test method
The test shall be carried out in accordance with the provisions of GH 5169.1. A wooden board covered with a sheet of paper shall be placed under the test sample.1. The position of the test sample and the application point of the glow wire shall be as specified in the detailed specification. The glow wire is made of a 4mm diameter aluminum (80%) chromium (20%) wire and a ring of specified size. The temperature of the glow wire is measured with an armored fine wire heat-insulating wire with an outer diameter of 0.5 mm. The base material is a nickel-aluminum wire of the chromium type. The welding point is inside the installation. The glow wire with a thermocouple is shown in Figure 2. The test device should be designed to keep the glow wire on a horizontal plane. It applies a force of 0.8N to 1.2N to the test sample. When the glow wire or the test sample moves relative to the horizontal direction for a distance of less than 1 mm, this positive force value is maintained at the same time. The temperature of the top of the glow wire and the duration of its application on the test sample shall be as specified in the detailed specification. Preferred test temperature
Preferred application duration is 30s+13.1211
GB/T 5095.9
-[0 5
2 Respect for people
" Glowing wire welded to the porridge; 2 Thermocouple; 3-bolt Figure 2 Glowing wire and thermocouple position
10.4 Requirements
After the glowing wire is removed, the test sample should preferably not burn. If it continues to burn, the burning time should not exceed the maximum limit specified in the detailed specification
Any dripping should not ignite the silk paper bedding layer. 10.5 Details to be Specified The following details shall be specified for this test: a) Number and size of test specimens b) Test specimen installation c) Severity level (duration of glow-wire application) d) Point of application of glow-wire e) Maximum duration of burning f) Any differences from the standard test method g) Glow-wire tip height. Part V Radio Frequency Resistance Tests 11 Test 21a: Radio Frequency Shunt Resistance 11. 1 This test is a detailed standard test method to determine the value of the radio frequency shunt resistance which reduces the quality of a component when connected in parallel to a 1,C circuit. This value shall be expressed in terms of shunt attenuation resistance. 11.2 Test specimen preparation The test specimen shall be prepared and installed as specified in the detailed specification. 11.3 Test method
RF shunt resistance should be measured at the measuring points specified in the detailed specification using suitable measuring equipment. The measurement error should not exceed 10%.
The test frequency should be given in the detailed specification, and the preferred frequencies are: 10MHz, 10MHz, 30MHz and 100MHz. GB/T5095.9—1997
Note: For detailed test specifications, see Appendix A (i.e. Appendix C of IEL:169-1). 11.4 Requirements
The value of the RF shunt resistance shall not be less than the value specified in the detailed specification 11.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: h) Preparation and installation of the test sample
h) Measurement point,
c) Measurement frequency;
d) Minimum value of the RF shunt resistance;
) What is the difference between the standard test methods? Part 6 Capacitance Tests
12 Test 22a: Capacitance Measurement
12.1 The purpose of this test is to establish a detailed standard test method to measure the capacitance between conductive parts of electromechanical components. 12.2 Preparation of test samples
The test samples shall be prepared and installed as specified in the detailed specification. 12.3 Test method
Measurements may be made between any of the following combinations of contacts: a) Between a contact and the following parts grounded at a common point: all other contacts:
All metal parts:
Mounting board.
h) Between any two adjacent contacts, all of the following zeros grounded at a common point: all other contacts;
All metal parts:
Mounting board.
) Measurement of the voltage at other points or operating conditions specified in the detailed specification The frequency of the voltage measurement shall be determined in the detailed specification and the test equipment shall be certified. For example, a capacitance bridge with an accuracy of 15% shall be used. The preferred measurement frequency is:
1kHz±200[z, 1MIIz±200kHz
12.4 Requirements
The voltage signature value shall not exceed the value specified in the detailed specification. 12.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: a) Preparation of test samples; b) Mounting of test samples; c) Contact combinations to be measured; d) Measurement frequency; d) Maximum permissible capacitance; f) Differences from the standard test method. 13 Test 23a: Screening effect
14 Test 23b: Integral filter suppression characteristics 14. January
GB/T 5095. 9—1997
Part 7 Screening and filtering tests
Establish detailed standard test methods to measure the suppression characteristics of single and multiple circuit filters in batch electronic components. 14.2 Test sample preparation
The test sample shall be wired and mounted in the test fixture specified in the detailed specification. 14.3 Measurement procedure
The suppression characteristic shall be measured in accordance with the test circuit of Figure A1 or Figure A2 of GB7343-87. 14.4 Requirements
The measured suppression characteristic shall not be less than the minimum value specified in the detail specification. 14.5 Details to be specified
The following details shall be specified in the detail specification when performing this test: a) Preparation of test specimens:
15) Details of test specimen mounting and test clamps;
1) Test frequency or frequency range;
1) Load impedance (when required);
e) System impedance:
1) Test method:
2) Minimum value of insertion loss
h) Any differences from the standard test method. 15 Test 23c: Crosstalk (Deleted)
Chapter 8 Magnetic Interference Test
16 Test 24a: Residual Magnetism
16.1 This standard test method is to establish detailed test methods to measure the magnetism of components after exposure to a certain field. 16.2 Test Sample Preparation
The components shall be equipped with all contacts, connectors and plugs. The test samples shall be equipped with the accessories required by the detailed specifications. 15.3 Test Drive Method
The probe shall be placed horizontally on a magnetic stand and the probe shall be kept away from the measuring instrument by connecting a soft wire. The salt measuring instrument is adjusted to rotate the probe in the direction so that the reading is "0\. The test sample should be placed in a magnetic field with a magnetic field strength of about 0.5T (5000G) for 3 times. Note: The test sample should not be magnetized to the polar part. Immediately after the test sample is magnetized, it should be placed no more than 31m away from the probe, but it should not be operated alone. The test sample should be placed in the direction so that the measuring instrument can measure the maximum value.
16.4 Requirements
CB/T 5095.9—1997
The measured value should not exceed the maximum value specified in the detailed specification. 16.5 Details to be specified
Detailed specification requirements The following details should be specified in this test: a) Accessories equipped with the test sample +
b) Maximum value of residual magnetism;
c) Differences from the standard test method. 17
Test 24h: Magnetic induction of compass to components (deleted)5
Details to be Specified
Detailed Specification Requirements The following details shall be specified for this test: a) Number and size of test specimens1
b) Test specimen installation;
c) Severity level (duration of glow-wire application);
d) Glow-wire application point;
e) Maximum duration of burning;
f) Any difference from the standard test method;
g) Glow-wire tip height.
Part 5 Radio Frequency Resistance Tests
11 Test 21a: Radio Frequency Shunt Resistance
11. 1 This test method is a detailed standard test method for determining the value of the radio frequency shunt resistance which reduces the quality of a component when connected in parallel to a 1,C circuit. This value shall be expressed in terms of shunt attenuation resistance. 11.2 Test specimen preparation
The test specimen shall be prepared and installed as specified in the detailed specification. 11.3 Test method
RF shunt resistance should be measured at the measuring points specified in the detailed specification using suitable measuring equipment. The measurement error should not exceed 10%.
The test frequency should be given in the detailed specification, and the preferred frequencies are: 10MHz, 10MHz, 30MHz and 100MHz. GB/T5095.9—1997
Note: For detailed test specifications, see Appendix A (i.e. Appendix C of IEL:169-1). 11.4 Requirements
The value of the RF shunt resistance shall not be less than the value specified in the detailed specification 11.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: h) Preparation and installation of the test sample
h) Measurement point,
c) Measurement frequency;
d) Minimum value of the RF shunt resistance;
) What is the difference between the standard test methods? Part 6 Capacitance Tests
12 Test 22a: Capacitance Measurement
12.1 The purpose of this test is to establish a detailed standard test method to measure the capacitance between conductive parts of electromechanical components. 12.2 Preparation of test samples
The test samples shall be prepared and installed as specified in the detailed specification. 12.3 Test method
Measurements may be made between any of the following combinations of contacts: a) Between a contact and the following parts grounded at a common point: all other contacts:
All metal parts:
Mounting board.
h) Between any two adjacent contacts, all of the following zeros grounded at a common point: all other contacts;
All metal parts:
Mounting board.
) Measurement of the voltage at other points or operating conditions specified in the detailed specification The frequency of the voltage measurement shall be determined in the detailed specification and the test equipment shall be certified. For example, a capacitance bridge with an accuracy of 15% shall be used. The preferred measurement frequency is:
1kHz±200[z, 1MIIz±200kHz
12.4 Requirements
The voltage signature value shall not exceed the value specified in the detailed specification. 12.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: a) Preparation of test samples; b) Mounting of test samples; c) Contact combinations to be measured; d) Measurement frequency; d) Maximum permissible capacitance; f) Differences from the standard test method. 13 Test 23a: Screening effect
14 Test 23b: Integral filter suppression characteristics 14. January
GB/T 5095. 9—1997
Part 7 Screening and filtering tests
Establish detailed standard test methods to measure the suppression characteristics of single and multiple circuit filters in batch electronic components. 14.2 Test sample preparation
The test sample shall be wired and mounted in the test fixture specified in the detailed specification. 14.3 Measurement procedure
The suppression characteristic shall be measured in accordance with the test circuit of Figure A1 or Figure A2 of GB7343-87. 14.4 Requirements
The measured suppression characteristic shall not be less than the minimum value specified in the detail specification. 14.5 Details to be specified
The following details shall be specified in the detail specification when performing this test: a) Preparation of test specimens:
15) Details of test specimen mounting and test clamps;
1) Test frequency or frequency range;
1) Load impedance (when required);
e) System impedance:
1) Test method:
2) Minimum value of insertion loss
h) Any differences from the standard test method. 15 Test 23c: Crosstalk (Deleted)
Chapter 8 Magnetic Interference Test
16 Test 24a: Residual Magnetism
16.1 This standard test method is to establish detailed test methods to measure the magnetism of components after exposure to a certain field. 16.2 Test Sample Preparation
The components shall be equipped with all contacts, connectors and plugs. The test samples shall be equipped with the accessories required by the detailed specifications. 15.3 Test Drive Method
The probe shall be placed horizontally on a magnetic stand and the probe shall be kept away from the measuring instrument by connecting a soft wire. The salt measuring instrument is adjusted to rotate the probe in the direction so that the reading is "0\. The test sample should be placed in a magnetic field with a magnetic field strength of about 0.5T (5000G) for 3 times. Note: The test sample should not be magnetized to the polar part. Immediately after the test sample is magnetized, it should be placed no more than 31m away from the probe, but it should not be operated alone. The test sample should be placed in the direction so that the measuring instrument can measure the maximum value.
16.4 Requirements
CB/T 5095.9—1997
The measured value should not exceed the maximum value specified in the detailed specification. 16.5 Details to be specified
Detailed specification requirements The following details should be specified in this test: a) Accessories equipped with the test sample +
b) Maximum value of residual magnetism;
c) Differences from the standard test method. 17
Test 24h: Magnetic induction of compass to components (deleted)5
Details to be Specified
Detailed Specification Requirements The following details shall be specified for this test: a) Number and size of test specimens1
b) Test specimen installation;
c) Severity level (duration of glow-wire application);
d) Glow-wire application point;
e) Maximum duration of burning;
f) Any difference from the standard test method;
g) Glow-wire tip height.
Part 5 Radio Frequency Resistance Tests
11 Test 21a: Radio Frequency Shunt Resistance
11. 1 This test method is a detailed standard test method for determining the value of the radio frequency shunt resistance which reduces the quality of a component when connected in parallel to a 1,C circuit. This value shall be expressed in terms of shunt attenuation resistance. 11.2 Test specimen preparation
The test specimen shall be prepared and installed as specified in the detailed specification. 11.3 Test method
RF shunt resistance should be measured at the measuring points specified in the detailed specification using suitable measuring equipment. The measurement error should not exceed 10%.
The test frequency should be given in the detailed specification, and the preferred frequencies are: 10MHz, 10MHz, 30MHz and 100MHz. GB/T5095.9—1997
Note: For detailed test specifications, see Appendix A (i.e. Appendix C of IEL:169-1). 11.4 Requirements
The value of the RF shunt resistance shall not be less than the value specified in the detailed specification 11.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: h) Preparation and installation of the test sample
h) Measurement point,
c) Measurement frequency;
d) Minimum value of the RF shunt resistance;
) What is the difference between the standard test methods? Part 6 Capacitance Tests
12 Test 22a: Capacitance Measurement
12.1 The purpose of this test is to establish a detailed standard test method to measure the capacitance between conductive parts of electromechanical components. 12.2 Preparation of test samples
The test samples shall be prepared and installed as specified in the detailed specification. 12.3 Test method
Measurements may be made between any of the following combinations of contacts: a) Between a contact and the following parts grounded at a common point: all other contacts:
All metal parts:
Mounting board.
h) Between any two adjacent contacts, all of the following zeros grounded at a common point: all other contacts;
All metal parts:
Mounting board.
) Measurement of the voltage at other points or operating conditions specified in the detailed specification The frequency of the voltage measurement shall be determined in the detailed specification and the test equipment shall be certified. For example, a capacitance bridge with an accuracy of 15% shall be used. The preferred measurement frequency is:
1kHz±200[z, 1MIIz±200kHz
12.4 Requirements
The voltage signature value shall not exceed the value specified in the detailed specification. 12.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: a) Preparation of test samples; b) Mounting of test samples; c) Contact combinations to be measured; d) Measurement frequency; d) Maximum permissible capacitance; f) Differences from the standard test method. 13 Test 23a: Screening effect
14 Test 23b: Integral filter suppression characteristics 14. January
GB/T 5095. 9—1997
Part 7 Screening and filtering tests
Establish detailed standard test methods to measure the suppression characteristics of single and multiple circuit filters in batch electronic components. 14.2 Test sample preparation
The test sample shall be wired and mounted in the test fixture specified in the detailed specification. 14.3 Measurement procedure
The suppression characteristic shall be measured in accordance with the test circuit of Figure A1 or Figure A2 of GB7343-87. 14.4 Requirements
The measured suppression characteristic shall not be less than the minimum value specified in the detail specification. 14.5 Details to be specified
The following details shall be specified in the detail specification when performing this test: a) Preparation of test specimens:
15) Details of test specimen mounting and test clamps;
1) Test frequency or frequency range;
1) Load impedance (when required);
e) System impedance:
1) Test method:
2) Minimum value of insertion loss
h) Any differences from the standard test method. 15 Test 23c: Crosstalk (Deleted)
Chapter 8 Magnetic Interference Test
16 Test 24a: Residual Magnetism
16.1 This standard test method is to establish detailed test methods to measure the magnetism of components after exposure to a certain field. 16.2 Test Sample Preparation
The components shall be equipped with all contacts, connectors and plugs. The test samples shall be equipped with the accessories required by the detailed specifications. 15.3 Test Drive Method
The probe shall be placed horizontally on a magnetic stand and the probe shall be kept away from the measuring instrument by connecting a soft wire. The salt measuring instrument is adjusted to rotate the probe in the direction so that the reading is "0\. The test sample should be placed in a magnetic field with a magnetic field strength of about 0.5T (5000G) for 3 times. Note: The test sample should not be magnetized to the polar part. Immediately after the test sample is magnetized, it should be placed no more than 31m away from the probe, but it should not be operated alone. The test sample should be placed in the direction so that the measuring instrument can measure the maximum value.
16.4 Requirements
CB/T 5095.9—1997
The measured value should not exceed the maximum value specified in the detailed specification. 16.5 Details to be specified
Detailed specification requirements The following details should be specified in this test: a) Accessories equipped with the test sample +
b) Maximum value of residual magnetism;
c) Differences from the standard test method. 17 bzxZ.net
Test 24h: Magnetic induction of compass to components (deleted)4 Requirements
The value of the electric signature shall not exceed the value specified in the detailed specification. 12.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: a) Preparation of test samples:
b) Installation of test samples
c) Contact combination to be measured:
d> Measurement frequency;
) Maximum capacitance allowed;
f) Differences from the standard test method. 13 Test 23a: Screening effect
14 Test 23b: Integral filter suppression characteristics 14. January
GB/T 5095. 9—1997
Chapter 7 Shielding and filtering tests
establishes detailed standard test methods to measure the suppression characteristics of single and multiple circuit filters in batch electronic components. 14.2 Preparation of test samples
The test samples shall be wired and mounted in the test fixture specified in the detail specification. 14.3 Measurement procedure
The suppression characteristic shall be measured in accordance with the test circuit of Figure A1 or Figure A2 of GB7343-87. 14.4 Requirements
The measured suppression characteristic shall not be less than the minimum value specified in the detail specification. 14.5 Details to be specified
The following details shall be specified in the detail specification when performing this test: a) Preparation of test samples:
15) Details of test sample mounting and test fixture;
16) Test frequency or frequency range;
17) Load impedance (when required);
18) System impedance:
19) Test method:
20) Minimum value of insertion loss
21) Any difference from the standard test method. 15 Test 23c: Crosstalk (Deleted)
Chapter 8 Magnetic Interference Test
16 Test 24a: Residual Magnetism
16.1 This standard test method is to establish detailed test methods to measure the magnetism of components after exposure to a certain field. 16.2 Test Sample Preparation
The components shall be equipped with all contacts, connectors and plugs. The test samples shall be equipped with the accessories required by the detailed specifications. 15.3 Test Drive Method
The probe shall be placed horizontally on a magnetic stand and the probe shall be kept away from the measuring instrument by connecting a soft wire. The salt measuring instrument is adjusted to rotate the probe in the direction so that the reading is "0\. The test sample should be placed in a magnetic field with a magnetic field strength of about 0.5T (5000G) for 3 times. Note: The test sample should not be magnetized to the polar part. Immediately after the test sample is magnetized, it should be placed no more than 31m away from the probe, but it should not be operated alone. The test sample should be placed in the direction so that the measuring instrument can measure the maximum value.
16.4 Requirements
CB/T 5095.9—1997
The measured value should not exceed the maximum value specified in the detailed specification. 16.5 Details to be specified
Detailed specification requirements The following details should be specified in this test: a) Accessories equipped with the test sample +
b) Maximum value of residual magnetism;
c) Differences from the standard test method. 17
Test 24h: Magnetic induction of compass to components (deleted)4 Requirements
The value of the electric signature shall not exceed the value specified in the detailed specification. 12.5 Details to be specified
Detailed specification requirements The following details shall be specified for this test: a) Preparation of test samples:
b) Installation of test samples
c) Contact combination to be measured:
d> Measurement frequency;
) Maximum capacitance allowed;
f) Differences from the standard test method. 13 Test 23a: Screening effect
14 Test 23b: Integral filter suppression characteristics 14. January
GB/T 5095. 9—1997
Chapter 7 Shielding and filtering tests
establishes detailed standard test methods to measure the suppression characteristics of single and multiple circuit filters in batch electronic components. 14.2 Preparation of test samples
The test samples shall be wired and mounted in the test fixture specified in the detail specification. 14.3 Measurement procedure
The suppression characteristic shall be measured in accordance with the test circuit of Figure A1 or Figure A2 of GB7343-87. 14.4 Requirements
The measured suppression characteristic shall not be less than the minimum value specified in the detail specification. 14.5 Details to be specified
The following details shall be specified in the detail specification when performing this test: a) Preparation of test samples:
15) Details of test sample mounting and test fixture;
16) Test frequency or frequency range;
17) Load impedance (when required);
18) System impedance:
19) Test method:
20) Minimum value of insertion loss
21) Any difference from the standard test method. 15 Test 23c: Crosstalk (Deleted)
Chapter 8 Magnetic Interference Test
16 Test 24a: Residual Magnetism
16.1 This standard test method is to establish detailed test methods to measure the magnetism of components after exposure to a certain field. 16.2 Test Sample Preparation
The components shall be equipped with all contacts, connectors and plugs. The test samples shall be equipped with the accessories required by the detailed specifications. 15.3 Test Drive Method
The probe shall be placed horizontally on a magnetic stand and the probe shall be kept away from the measuring instrument by connecting a soft wire. The salt measuring instrument is adjusted to rotate the probe in the direction so that the reading is "0\. The test sample should be placed in a magnetic field with a magnetic field strength of about 0.5T (5000G) for 3 times. Note: The test sample should not be magnetized to the polar part. Immediately after the test sample is magnetized, it should be placed no more than 31m away from the probe, but it should not be operated alone. The test sample should be placed in the direction so that the measuring instrument can measure the maximum value.
16.4 Requirements
CB/T 5095.9—1997
The measured value should not exceed the maximum value specified in the detailed specification. 16.5 Details to be specified
Detailed specification requirements The following details should be specified in this test: a) Accessories equipped with the test sample +
b) Maximum value of residual magnetism;
c) Differences from the standard test method. 17
Test 24h: Magnetic induction of compass to components (deleted)
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