Some standard content:
ICS 25.060.20
Machinery Industry Standard of the People's Republic of China
JB/T10030-1999
Grating linear displacement measuring system
Grating linear displacement measuring system1999-05-20 Issued
State Bureau of Machinery Industry
Implementation on 2000-01-01
JB/T10030-1999
This standard is revised on the basis of B42036-89 Grating linear displacement measuring system: the technical contents of this standard are the same as those of ZB142036-89, and it is only re-screened according to relevant regulations. This standard replaces 2BJ4203689 from the date of its implementation. Appendix A and Appendix B of this standard are both standard appendices, and Appendix C of this standard is a suggestive appendix.
All the standardization of measuring instruments in this standard is proposed and reported by the Inspection Committee. The responsible unit for the drafting of this standard is: Ordinary Institute of China, and the main drafter of this standard is: Li Qiao.
This standard was first issued in 1989.
Mechanical Industry Standard of the People's Republic of China
Grating Linear Displacement Measurement System
Grutiny Linear Displacement Measurement System JB/T10030-1999
Generation 20436-89
This standard specifies the minimum parameters, technical requirements and test methods of the grating displacement measurement system (hereinafter referred to as the measurement system). This standard is for the measurement system with a resolution of 0.1-10 μm. Reference Standards
The texts contained in the following standards, when cited in this standard, constitute the provisions of this standard. When this standard is published, the versions shown are valid. All standards are subject to revision. Parties using water standards should consider using the latest versions of the following standards. GB: 9[—1990
G8/T63BB1981
GB/T 6587.21986
GB/T6587.3:986
JB/T 6214—1992
3 Definitions
This standard adopts the following definitions.
J.1 Optical linear displacement measurement system
Packaging storage and transportation marking
Transport packaging receiving and sending marking
Electronic measuring equipment temperature test
Electronic measuring instrument humidity test
Guidelines for instrument reliability verification test and measurement test (exponential distribution) Based on the principle of photoelectric generation of optical signals, the optical linear displacement sensor receives linear displacement and displays its value on an optical digital display.
3.2 System resolution
The minimum length counting unit displayed by the measurement system, 3.3 Measurement system subdivision error
The maximum error between the total number of bars within the optical grating interval and the original signal after the measurement system is subdivided or borrowed from the frequency store. 3.4 Peak-to-peak error
The difference between the highest point and the lowest point on the error curve of the measuring system 4 Basic parameters
Basic parameters according to the attenuation 1 Regulation
National Machinery Industry Bureau 1999-05-20 Approved 2000-01-01 Energy
Resolution
Effective start
Compliance speed
5 Technical requirements
5.1 Working conditions
JB/T10030-1999
0.1: 0.2: 0.5;1.0: 2.0: 5.0: 10 huan
1610:50:60;100;150:200:250:300;350;400:450:>69:600;70:960;990:[000:1100:[200:1300:140015c0:1600:18D0:20C0220D
2400:2600:2800:3000| |tt||1:6:12:[8:30:48:60
.5.1.1 The temperature range of the measuring system working environment should be 0-15%, and the relative humidity should not be greater than 90%. 5.1.2 The power supply frequency used by the measuring system should be 5Hz, the rated voltage should be 220V, and the voltage feedback range should be 85%-10% of the rated output value.
5.2 Appearance and interaction
5.2,! The glass surface of the measuring system should not have bubbles or cracks, and the metal surface should not have defects such as rust, particles and coating shedding. All signs and numbers should be accurate and clear.
5.2.2、All solid parts should be solid and reliable, all moving parts should be flexible and stable, and there should be no hysteresis phenomenon. 5.2.3 The display of the effective range of the measuring system should meet the specified value, and the display of reference zero, clean zero, mutual number, direction identification and other functions should be normal. 5. 3 Accuracy
The system accuracy is divided into six levels. The error peak value A of each level is calculated according to the formula in Table 2. The accuracy is indicated by half of the value 4 and marked with a "-". Table 2
Uncertainty level
Note: L- is the most effective and most suitable for dynamic overflow, mm5.4 Subdivision error, indication variability and return error peak bee driving A
The subdivision error, indication variability and return error of the measuring system should not be greater than the provisions of Table 1. 2
Degree of measurement
0.5: 1.0:2.0:5.0:10
5.5Stability
J9/T10030-1999
Degree of error
Pulse maximum! 」
Under the temperature condition, the stability of the indication value within 4 hours is not greater than one pulse. 5.6Reliability
The reliability of the motherboard system is expressed by the mean time between failures 1BF, and its MTBF should be not less than 0h5.7Safety
5.7.1 The full current between any terminal of the power socket and the housing should not be less than 3.5mA. 5.7.2 The DC insulation resistance between any terminal of the power socket and the casing should be not less than 5M0. 5.7.3 During the test, when the AC current is 1500V, the casing current is 1m, and there should be no breakdown phenomenon. 5.8 Immunity The measuring system should have electromagnetic penetration capability. When subjected to interference, the indication change should not exceed one pulse. 6 Test method 6.1 Environmental adaptability test shall be carried out in accordance with GR/T 6587.2 and GR/T 65873. 1 Power supply fluctuation test When the supply voltage is 187V (effectively 242V), the measurement system shall maintain accuracy, and its accuracy shall meet the requirements of the corresponding level. 6.3 External and discharge test
Use visual inspection and sensory inspection,
Focus.4 Accuracy test
Under the specified temperature conditions of each grade of the grating system, use the long plate measuring system with a verification uncertainty less than one-half or one-half of the specified value of the grating measuring system to be tested (when the accuracy is less than ±1.5 μm/m), and compare and test within the effective range. Take half of the peak error value and add "±" as the accuracy. 6.5 Subdivision error test
Use the long plate measuring system with a verification uncertainty less than one-half of the specified value of the subdivision error of the grating measuring system to be tested (when the resolution is 0.1 and 0.2 μm), and compare and test within one grating distance. The number of measuring points is as specified in Table 4, and the maximum error value among each measuring point is taken.
Huzhou Branch
10;20;40:50
【pcs】
6.6 Indication variability test
JB/10030-1999
Use the high pin virtual length measurement system as the positioning reference, and re-measure the point of the optical measurement system under test 10 times, and take the maximum difference of the multiple readings of the point.
6.7 Return error test
Use the Zhou Shang precision length measurement system as the positioning reference, and move the point of the optical measurement system under test in the positive and negative directions: take the absolute value of the difference in the readings in the positive and negative directions of the point. 6. Monthly indication running test
Under the working conditions, the temperature gradient does not last for [℃ every day. After the measurement system is turned on for 10 minutes, read the indication every 0.5h, and take the indication change of the grating digital display within 4h.
6.9 Reliability test
The reliability of the observation system shall be carried out in accordance with JB/T6214. The calculation rules for the number of failures can be found in Table A (Appendix 6.10 of the standard). Safety test
6.10.1 Gradual current test
For the product with the housing, the test circuit shown in Figure 1 can be used. First adjust the voltage to 242V, and then use K, K, and other combinations to test the maximum end current.
Test product
Medical load switch
Converter power supply
Figure 1 Gradual current test circuit diagram
6.02 Insulation group test
Peak workbench
Centrifugal switch
After applying voltage to the specified test part for 1m with 500V megawatt, read the insulation resistance value. 6.10.3 Withstand voltage test
Apply AC with a frequency of 50Hz and a voltage of 1500V between the primary of the power transformer (the input end should be short-circuited) and the housing. The withstand voltage time is 1min and there should be no breakdown.
6. 11 Anti-interference test
Carry out according to Appendix B (standard appendix) or Appendix C (suggestive appendix). Inspection rules
7.1 Products can leave the factory only after passing the factory quality inspection. The factory inspection items include the contents of 5.2-5.4. Products must undergo type inspection when they are put into production. The number of samples is not less than 3 sets. New product finalization appraisal:
b) Major changes in design:
e) Major process changes:
d) Key material changes:
) Production renewal for more than one year: F) Normal production for two years.
JB/T10030-1999
7.3 If the type inspection piece is accidentally dropped or unqualified, the double sampling inspection shall be carried out: if it is still unqualified, it shall be judged as unqualified and marked. The packaging and cross-storage shall be marked.
8.1 Marking
8.1.1 The measuring system shall be marked with:
) manufacturer name;
b product name:
e registered trademark;
d accuracy grade:
|) product model or mark
manufacturing date or production number.
8.1.2 The markings on the packaging box shall include the contents of 8.1.1 and the shipping and receiving marks, storage and transportation drawings and markings. The packaging marks shall comply with the relevant provisions of GB191:
8.2 Packaging
8.2.1 The packaging of these systems shall have good rust-proof, moisture-proof and moisture-proof properties. 8.2.2 The packaging card of the measuring system shall include product certificate, instruction manual, packing list and other random documents and attachments. 8.3 Storage
The measuring system shall be stored in a temperature of -10-55%, relative humidity less than 90%, no corrosive gas and clean and well ventilated environment. A1 Fault Judgment
JB/T10030-1999
Appendix A
1 Appendix of the standard)
Fault Count Calculation Provisions
When the measuring system fails to meet any of the technical requirements in Chapter 5 during the test, it shall be deemed a fault. Chapter A1.1 Fault Judgment shall be based on the following provisions
) The calculation of fault judgment shall be in accordance with the following provisions: a) 1 fault shall be calculated for each fault; c) 1 fault shall be calculated for each fault; c) repeated faults shall be calculated for each fault; d) when multiple faults occur at the same time, they shall be calculated once; e) the faults shall be calculated as follows: Failures caused by stepping on, breaking, contact with the good and bad parts, etc., are calculated once for each change:! Failures that are normal at room temperature and occur at high temperature are calculated once: When the adjustable components lose their adjustment function, they should be calculated once each time: Failures caused by each component failure should be calculated once. A1.2\ The following conditions are not handled as faults: a) Failures caused by failure to meet the requirements of this standard; b) Failures caused by components with special life indicators exceeding the specified life; and c) Failures caused by operating errors.
Appendix B
(Appendix to the standard
Immunity interference test I
On the power grid with the same load as the panel, artificially create the following loads (the power source should be away from the light standard, except for the ones specified in Table 1):
a) Use a 40A AC contactor to start a 5~10kw motor every 5min, and test for 20 times: b) At a distance of 2m from the measuring system, use an incandescent machine to weld 20mm; s) Switch the electric fan, dial the circuit or use a 6m AC/DC flashlight to open and close it 1 time: d) Use a 7SA single-phase AC contactor to continuously break the circuit 30 times) At a distance of 5m from the measuring system, use any kind of controllable power supply of 5-20kW to continuously operate (this test is only performed on the measurement system with a resolution of 10.
1 power supply The principle diagram of the low frequency repetitive interference source is shown in the figure. C1.1
C1.2 Low frequency repetitive interference waveform
JB/T10030—1999www.bzxz.net
(Time recording)
Anti-interference test
Indicates that the repetitive frequency of the repetitive interference wave is superimposed on the value of the AC power line of the power line; b) Each repetitive frequency of the repetitive interference wave is composed of 1kHz quotient filter, and after the correction reaches 1.5 cycles, it is reduced to half of the first half-wave value:
) The low frequency repetitive interference wave is divided into 30 levels, each level represents 1000V power) The output impedance of the low frequency repetitive source is 150, and the voltage of each repetitive interference wave is formed in Figure 2. C2
cI.3 Test connection diagram and test frequency
The test system should be tested for anti-interference performance under the condition of a certain power supply voltage change of + (10~15)%. The differential mode interference and common mode interference connection diagrams are shown in Figure C3 and Figure C4.
JB/T100301999
Original network research
Dry cleaning number
Frequency high use condition
Dry batch number
Requirement level data
Work performance monitoring technology
. During the performance test, the core is equipped with a F-type power supply, and the differential and common mode levels are gradually increased. When the test system cannot work normally, record the fault type and the corresponding interference level. The differential mode should not be lower than [0 level, and the common mode interference should not be lower than 25 level. [2 Power supply and high-frequency conduction test brief description
.1 Test signal source
8/10030—1999
RF average frequency signal generator or frequency blocking signal generator and dynamic frequency amplifier channel, the total output impedance is 502C2.2 Test wiring and test steps
Test wiring diagram C5 wiring, the high-frequency interference signal generated by the signal is added to the test product through the power live wire, the test product and the power source are closely isolated. When testing, the load resistor R in the isolation network should be disconnected, so that the interference signal is added to the test product, the signal source, the cable, and the connection are the same. The line is close to the real bottom, and its characteristic impedance is effectively the same as that of the special one.
The test product is checked and operated under rated voltage. Adjust the test signal source to make its output voltage as high as 1V. It varies in the range of 0.1S-300MHz. First, scan the whole frequency band in reverse, and then select 10 points according to the user's C] for test. Can the system work normally? Otherwise, write down the type of fault and the corresponding sensitive frequency point table.
Scan the frequency range
High-frequency radiation sensitivity test
The test product is inspected at rated voltage! In the sequence, verify the standard signal transmission data, generate an interference field strength of 0.15-300MHz/Vm around the test product, first scan it within a certain period of time, then select one frequency point for test, the system should be able to work normally, and record the type of fault and the corresponding sensitive frequency point.1 The measuring system should be marked with: a) manufacturer name; b) product name; e) registered trademark; d) accuracy level; d) product model or mark; 3) manufacturing date or production number. 8.1.2 The markings on the packaging box shall include the content of 8.1.1 and the shipping and receiving marks, storage and transportation drawings and markings. The packaging marks shall comply with the relevant provisions of GB191: 8.2 Packaging 8.2.1 The packaging of the measuring system shall have good rust-proof, anti-impact and moisture-proof properties. 8.2.2 The packaging card of the measuring system shall include product certificate, instruction manual, packing list and other random documents and attachments. 8.3 Storage
The measuring system shall be stored in a temperature of -10-55%, relative humidity less than 90%, no corrosive gas and clean and well ventilated environment. A1 Fault Judgment
JB/T10030-1999
Appendix A
1 Appendix of the standard)
Fault Count Calculation Provisions
When the measuring system fails to meet any of the technical requirements in Chapter 5 during the test, it shall be deemed a fault. Chapter A1.1 Fault Judgment shall be based on the following provisions
) The calculation of fault judgment shall be in accordance with the following provisions: a) 1 fault shall be calculated for each fault; c) 1 fault shall be calculated for each fault; c) repeated faults shall be calculated for each fault; d) when multiple faults occur at the same time, they shall be calculated once; e) the faults shall be calculated as follows: Failures caused by stepping on, breaking, contact with the good and bad parts, etc., are calculated once for each change:! Failures that are normal at room temperature and occur at high temperature are calculated once: When the adjustable components lose their adjustment function, they should be calculated once each time: Failures caused by each component failure should be calculated once. A1.2\ The following conditions are not handled as faults: a) Failures caused by failure to meet the requirements of this standard; b) Failures caused by components with special life indicators exceeding the specified life; and c) Failures caused by operating errors.
Appendix B
(Appendix to the standard
Immunity interference test I
On the power grid with the same load as the panel, artificially create the following loads (the power source should be away from the light standard, except for the ones specified in Table 1):
a) Use a 40A AC contactor to start a 5~10kw motor every 5min, and test for 20 times: b) At a distance of 2m from the measuring system, use an incandescent machine to weld 20mm; s) Switch the electric fan, dial the circuit or use a 6m AC/DC flashlight to open and close it 1 time: d) Use a 7SA single-phase AC contactor to continuously break the circuit 30 times) At a distance of 5m from the measuring system, use any kind of controllable power supply of 5-20kW to continuously operate (this test is only performed on the measurement system with a resolution of 10.
1 power supply The principle diagram of the low frequency repetitive interference source is shown in the figure. C1.1
C1.2 Low frequency repetitive interference waveform
JB/T10030—1999
(Time recording)
Anti-interference test
Indicates that the repetitive frequency of the repetitive interference wave is superimposed on the value of the AC power line of the power line; b) Each repetitive frequency of the repetitive interference wave is composed of 1kHz quotient filter, and after the correction reaches 1.5 cycles, it is reduced to half of the first half-wave value:
) The low frequency repetitive interference wave is divided into 30 levels, each level represents 1000V power) The output impedance of the low frequency repetitive source is 150, and the voltage of each repetitive interference wave is formed in Figure 2. C2
cI.3 Test connection diagram and test frequency
The test system should be tested for anti-interference performance under the condition of a certain power supply voltage change of + (10~15)%. The differential mode interference and common mode interference connection diagrams are shown in Figure C3 and Figure C4.
JB/T100301999
Original network research
Dry cleaning number
Frequency high use condition
Dry batch number
Requirement level data
Work performance monitoring technology
. During the performance test, the core is equipped with a F-type power supply, and the differential and common mode levels are gradually increased. When the test system cannot work normally, record the fault type and the corresponding interference level. The differential mode should not be lower than [0 level, and the common mode interference should not be lower than 25 level. [2 Power supply and high-frequency conduction test brief description
.1 Test signal source
8/10030—1999
RF average frequency signal generator or frequency blocking signal generator and dynamic frequency amplifier channel, the total output impedance is 502C2.2 Test wiring and test steps
Test wiring diagram C5 wiring, the high-frequency interference signal generated by the signal is added to the test product through the power live wire, the test product and the power source are closely isolated. When testing, the load resistor R in the isolation network should be disconnected, so that the interference signal is added to the test product, the signal source, the cable, and the connection are the same. The line is close to the real bottom, and its characteristic impedance is effectively the same as that of the special one.
The test product is checked and operated under rated voltage. Adjust the test signal source to make its output voltage as high as 1V. It varies in the range of 0.1S-300MHz. First, scan the whole frequency band in reverse, and then select 10 points according to the user's C] for test. Can the system work normally? Otherwise, write down the type of fault and the corresponding sensitive frequency point table.
Scan the frequency range
High-frequency radiation sensitivity test
The test product is inspected at rated voltage! In the sequence, verify the standard signal transmission data, generate an interference field strength of 0.15-300MHz/Vm around the test product, first scan it within a certain period of time, then select one frequency point for test, the system should be able to work normally, and record the type of fault and the corresponding sensitive frequency point.1 The measuring system should be marked with: a) manufacturer name; b) product name; e) registered trademark; d) accuracy level; d) product model or mark; 3) manufacturing date or production number. 8.1.2 The markings on the packaging box shall include the content of 8.1.1 and the shipping and receiving marks, storage and transportation drawings and markings. The packaging marks shall comply with the relevant provisions of GB191: 8.2 Packaging 8.2.1 The packaging of the measuring system shall have good rust-proof, anti-impact and moisture-proof properties. 8.2.2 The packaging card of the measuring system shall include product certificate, instruction manual, packing list and other random documents and attachments. 8.3 Storage
The measuring system shall be stored in a temperature of -10-55%, relative humidity less than 90%, no corrosive gas and clean and well ventilated environment. A1 Fault Judgment
JB/T10030-1999
Appendix A
1 Appendix of the standard)
Fault Count Calculation Provisions
When the measuring system fails to meet any of the technical requirements in Chapter 5 during the test, it shall be deemed a fault. Chapter A1.1 Fault Judgment shall be based on the following provisions
) The calculation of fault judgment shall be in accordance with the following provisions: a) 1 fault shall be calculated for each fault; c) 1 fault shall be calculated for each fault; c) repeated faults shall be calculated for each fault; d) when multiple faults occur at the same time, they shall be calculated once; e) the faults shall be calculated as follows: Failures caused by stepping on, breaking, contact with the good and bad parts, etc., are calculated once for each change:! Failures that are normal at room temperature and occur at high temperature are calculated once: When the adjustable components lose their adjustment function, they should be calculated once each time: Failures caused by each component failure should be calculated once. A1.2\ The following conditions are not handled as faults: a) Failures caused by failure to meet the requirements of this standard; b) Failures caused by components with special life indicators exceeding the specified life; and c) Failures caused by operating errors.
Appendix B
(Appendix to the standard
Immunity interference test I
On the power grid with the same load as the panel, artificially create the following loads (the power source should be away from the light standard, except for the ones specified in Table 1):
a) Use a 40A AC contactor to start a 5~10kw motor every 5min, and test for 20 times: b) At a distance of 2m from the measuring system, use an incandescent machine to weld 20mm; s) Switch the electric fan, dial the circuit or use a 6m AC/DC flashlight to open and close it 1 time: d) Use a 7SA single-phase AC contactor to continuously break the circuit 30 times) At a distance of 5m from the measuring system, use any kind of controllable power supply of 5-20kW to continuously operate (this test is only performed on the measurement system with a resolution of 10.
1 power supply The principle diagram of the low frequency repetitive interference source is shown in the figure. C1.1
C1.2 Low frequency repetitive interference waveform
JB/T10030—1999
(Time recording)
Anti-interference test
Indicates that the repetitive frequency of the repetitive interference wave is superimposed on the value of the AC power line of the power line; b) Each repetitive frequency of the repetitive interference wave is composed of 1kHz quotient filter, and after the correction reaches 1.5 cycles, it is reduced to half of the first half-wave value:
) The low frequency repetitive interference wave is divided into 30 levels, each level represents 1000V power) The output impedance of the low frequency repetitive source is 150, and the voltage of each repetitive interference wave is formed in Figure 2. C2
cI.3 Test connection diagram and test frequency
The test system should be tested for anti-interference performance under the condition of a certain power supply voltage change of + (10~15)%. The differential mode interference and common mode interference connection diagrams are shown in Figure C3 and Figure C4.
JB/T100301999
Original network research
Dry cleaning number
Frequency high use condition
Dry batch number
Requirement level data
Work performance monitoring technology
. During the performance test, the core is equipped with a F-type power supply, and the differential and common mode levels are gradually increased. When the test system cannot work normally, record the fault type and the corresponding interference level. The differential mode should not be lower than [0 level, and the common mode interference should not be lower than 25 level. [2 Power supply and high-frequency conduction test brief description
.1 Test signal source
8/10030—1999
RF average frequency signal generator or frequency blocking signal generator and dynamic frequency amplifier channel, the total output impedance is 502C2.2 Test wiring and test steps
Test wiring diagram C5 wiring, the high-frequency interference signal generated by the signal is added to the test product through the power live wire, the test product and the power source are closely isolated. When testing, the load resistor R in the isolation network should be disconnected, so that the interference signal is added to the test product, the signal source, the cable, and the connection are the same. The line is close to the real bottom, and its characteristic impedance is effectively the same as that of the special one.
The test product is checked and operated under rated voltage. Adjust the test signal source to make its output voltage as high as 1V. It varies in the range of 0.1S-300MHz. First, scan the whole frequency band in reverse, and then select 10 points according to the user's C] for test. Can the system work normally? Otherwise, write down the type of fault and the corresponding sensitive frequency point table.
Scan the frequency range
High-frequency radiation sensitivity test
The test product is inspected at rated voltage! In the sequence, verify the standard signal transmission data, generate an interference field strength of 0.15-300MHz/Vm around the test product, first scan it within a certain period of time, then select one frequency point for test, the system should be able to work normally, and record the type of fault and the corresponding sensitive frequency point.After 5 cycles, it is reduced to half of the first half-wave value:
) The low-frequency interference must be divided into 30 levels, each level represents 1000V power) The power supply impedance is 150, and the voltage of each heavy attenuation interference wave is shaped like Figure 2. C2
cI.3 Test connection diagram and test frequency
The test system should be tested for anti-interference performance under the condition of a specified power supply voltage change of + (10~15)%. The differential mode interference and common mode interference connection diagrams are shown in Figures C3 and C4.
JB/T100301999
Original research
Dry cleaning code
High frequency use
Dry batch number
Requirement level data
Work performance monitoring technology
. When testing the performance of the equipment, the core is equipped with F-source power, and the differential mode is gradually increased. When the test system cannot work normally, record the fault type and the corresponding interference level. The differential mode should not be lower than [0 level, and the analog interference should not be lower than 25 level. [2 Power supply and high-frequency conduction test brief description
.1 Test signal source
8/10030—1999
RF average frequency signal generator or frequency blocking signal generator and dynamic frequency amplifier channel, the total output impedance is 502C2.2 Test wiring and test steps
Test wiring diagram C5 wiring, the high-frequency interference signal generated by the signal is added to the test product through the power live wire, the test product and the power source are closely isolated. When testing, the load resistor R in the isolation network should be disconnected, so that the interference signal is added to the test product, the signal source, the cable, and the connection are the same. The line is close to the real bottom, and its characteristic impedance is effectively the same as that of the special one.
The test product is checked and operated under rated voltage. Adjust the test signal source to make its output voltage as high as 1V. It varies in the range of 0.1S-300MHz. First, scan the whole frequency band in reverse, and then select 10 points according to the user's C] for test. Can the system work normally? Otherwise, write down the type of fault and the corresponding sensitive frequency point table.
Scan the frequency range
High-frequency radiation sensitivity test
The test product is inspected at rated voltage! In the sequence, verify the standard signal transmission data, generate an interference field strength of 0.15-300MHz/Vm around the test product, first scan it within a certain period of time, then select one frequency point for test, the system should be able to work normally, and record the type of fault and the corresponding sensitive frequency point.After 5 cycles, it is reduced to half of the first half-wave value:
) The low-frequency interference must be divided into 30 levels, each level represents 1000V power) The power supply impedance is 150, and the voltage of each heavy attenuation interference wave is shaped like Figure 2. C2
cI.3 Test connection diagram and test frequency
The test system should be tested for anti-interference performance under the condition of a specified power supply voltage change of + (10~15)%. The differential mode interference and common mode interference connection diagrams are shown in Figures C3 and C4.
JB/T100301999
Original research
Dry cleaning code
High frequency use
Dry batch number
Requirement level data
Work performance monitoring technology
. When testing the performance of the equipment, the core is equipped with F-source power, and the differential mode is gradually increased. When the test system cannot work normally, record the fault type and the corresponding interference level. The differential mode should not be lower than [0 level, and the analog interference should not be lower than 25 level. [2 Power supply and high-frequency conduction test brief description
.1 Test signal source
8/10030—1999
RF average frequency signal generator or frequency blocking signal generator and dynamic frequency amplifier channel, the total output impedance is 502C2.2 Test wiring and test steps
Test wiring diagram C5 wiring, the high-frequency interference signal generated by the signal is added to the test product through the power live wire, the test product and the power source are closely isolated. When testing, the load resistor R in the isolation network should be disconnected, so that the interference signal is added to the test product, the signal source, the cable, and the connection are the same. The line is close to the real bottom, and its characteristic impedance is effectively the same as that of the special one.
The test product is checked and operated under rated voltage. Adjust the test signal source to make its output voltage as high as 1V. It varies in the range of 0.1S-300MHz. First, scan the whole frequency band in reverse, and then select 10 points according to the user's C] for test. Can the system work normally? Otherwise, write down the type of fault and the corresponding sensitive frequency point table.
Scan the frequency range
High-frequency radiation sensitivity test
The test product is inspected at rated voltage! In the sequence, verify the standard signal transmission data, generate an interference field strength of 0.15-300MHz/Vm around the test product, first scan it within a certain period of time, then select one frequency point for test, the system should be able to work normally, and record the type of fault and the corresponding sensitive frequency point.
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