This standard specifies the technical requirements and inspection basis for single-phase bridge rectifier modules. This standard applies to single-phase bridge rectifier modules (hereinafter referred to as modules) composed of four rectifier tube chips and rated at MDS5 to MDS150 according to the shell temperature. JB/T 5834.2-1991 Power rectifier module MDQ series 5A and above single-phase bridge rectifier module JB/T5834.2-1991 Standard download decompression password: www.bzxz.net
Some standard content:
Mechanical Industry Standard of the People's Republic of China Power Rectifier Module MDQ Series 5A and Above Single-Phase Bridge Rectifier Module Subject Content and Scope of Application This standard specifies the technical requirements and inspection basis of single-phase bridge power rectifier modules. JB5834.2-91 This standard applies to single-phase bridge rectifier modules (hereinafter referred to as modules) composed of four rectifier tube chips and rated at MDQ5~MDQ150 according to the shell temperature. 2 Reference standards GB4937 Mechanical and climatic test methods for discrete semiconductor devices GB4938 Acceptance and reliability of discrete semiconductor devices GB2423.4 Basic environmental test procedures for electric and electronic products Test Db: Alternating damp heat test method GB2900.32 Electrical terminology Power semiconductor devices 3 Technical requirements 3.1 Dimensions The module models and recommended dimensions are shown in Figures 1 to 7. 3.2 Rated values 3.2.1 The maximum rated values (limit values) shall comply with the provisions of Table 1 (the currents and voltages other than I. (I. = 2Ip (Av)] are single chip values, the same below). Parameters and values DC output MDQ100 MDQ150 Forward average Forward (non-repeating repeating) surge current|| tt||Approved by the Ministry of Machinery and Electronics Industry on October 24, 1991 38 Reverse repetitive Peak voltage Reverse non-repetitive Bee value voltage 50~1000VRM=0.9VrSM Equivalent junction temperature (or 150) Storage temperature -40~140 (or 160)|| tt||1992—10-01 implementation Note: ①I. is the value at the corresponding shell temperature. JB5834.2-91 ②The shell temperature is the temperature of the geometric center point (reference point) of the long side of the bottom plate of the module shell. ③The equivalent junction temperature and storage temperature The values in brackets are for non-epoxy package type, the same below. 4—03.2 (MDQ5) (MDQ5, MDQ1 0) JB5834.2-91 (MDQ10) JB5834.2-~91 (NDQ20, MDQ40) JB.5834.2--91 (MDQ60, MDQ100) JB5834.291||t t||JB5834.2--91 ( VRRM) is classified according to Table 2. Rated reverse repetitive peak voltage. Characteristic value Characteristic value shall comply with the provisions of Table 3. MDQ100 MDQ150 Forward peak voltage Reverse repetitive peak current Note: ①Junction-to-case thermal resistance is the thermal resistance from the chip junction to the module case reference point. and Junction-to-case thermal resistance ②Module insulation voltage is the withstand voltage between each terminal and the case, which is the minimum value, and the others are the maximum value. Inspection rules Batch-by-batch (Group A) inspection Group A inspection shall comply with the provisions of Table 4. (Cannot work) ViSo(RMS) Inspection method Visual inspection under normal lighting and normal vision According to A2b See B1 in Appendix B||t t||See B2 in Appendix B Sine wave, 50Hz, voltage 2000V, Maintenance time 1min ①USL is the value of the corresponding model in Table 3, the same below. Note: ②AQL sampling see A1 in Appendix A. Marking is clear, no mechanical damage on the surface Polarity is reversed V>10USL IRRM> 100USL Comply with the provisions of Table 3 No breakdown or flashover Module insulation voltage Viso(RMS) Sampling plan AQL(I) JB5834.2--91 If the first inspection of Group A fails, it can be resubmitted for inspection in accordance with the stricter level A1 in Appendix A, but it can only be resubmitted once. 4.2 Periodic (Group B) Inspection Group B inspection shall be in accordance with the provisions of Table 5. For the standardized products produced normally, at least one batch of Group B inspection shall be carried out every year. The inspection marked with (D) is destructive. Table 5 Inspection items Weldability (applicable only to welding electrodes)www.bzxz.net Temperature change followed by Damp heat cycling (D) Electrical durability Release batch certification record Inspection method According to Figures 1 to 7 2.1.2 of GB4937 (Sandalwood welding method) 3.1.1 of GB4937 Ta=-40+ Tn=140-g (or 160-g) 5 cycles Test Db, method 2 Severity: 55℃ 6 cycles||t t||High temperature reverse bias 3.2 of GB4938 Sine wave 50Hz, 70% VRRM, junction temperature = 125-℃ (or 150℃) 1688h Qualification criteria Maximum shape and installation dimensions meet the requirements Good wetting Final test: V, InR meet the requirements of Table 3 Final test: V≤1.1USL IRRM≤2USL Briefly give the relevant attribute data and test conclusions of each group of B5 and B8 Note: In the sampling plan column, n is the sampling number, c is the qualified judgment number, the same below. Sampling plan If the first inspection of Group B fails, additional sampling can be carried out according to A2 in Appendix A, but each inspection group can only be supplemented once, and the additional samples should undergo all inspections of the group. 4.3 Periodic (Group C) Inspection Group C inspection shall be in accordance with Table 6. For the standardized products in normal production, at least one batch of Group C inspection shall be carried out every year. 45 Welding heat resistance (only applicable to welding electrodes) Electrical durability High temperature storage Release batch certification record JB5834.2-91 Inspection method According to Figures 1 to 7 See B3 in Appendix B 50%VRRM 1 time 1 cycle, 20 times See B4 in Appendix B 2.2.2 of GB4937 Method 1A High temperature reverse bias 3.2 of GB4938 1000h, other conditions are the same as B8 GB4937 3.2 Tatg=140- (or 160-℃), Qualification criteria All dimensions meet the requirements Final test: VM≤1.1USL IRRM2USL Meet the requirements of Table 3 Final test: VM, IRRM meet the requirements of Table 3 Final test: VrM≤1.1USL IRRM≤2USL Final test: IRRM≤2USL Briefly give the relevant attribute data and test conclusions of the C8 and C9 groups. If the first submission inspection of group C fails, it can be handled as the first submission inspection failure of group B. 5 Marking and ordering information 5.1Marking on the product a. Product model and quality category (Class I). b. Manufacturer name, code or trademark. Electrical schematic diagram, use "~" to indicate the input terminal, "+" and "" to indicate the output terminal. c. Inspection batch identification code. Marking on the packaging box (box) Product name, model and quality category Manufacturer name, code or trademark Inspection batch identification code Moisture-proof, rain-proof mark, etc. 5.3Ordering information To order a specific product, at least the following information is required: a. Product model and quality category b.The number of this standard is c. Others Sampling plan A1 AQL sampling AQL sampling according to Table A1 Batch range 16-25 151-280 281-500 501-1200 Sample size This subsidiary inspection level (I) II; Note: JB5894.2-91 (supplement) c is the qualified number, I is the unqualified number; ② The arrow indicates that the first sampling plan should be used. If the sample size at the corresponding point is equal to or greater than the batch, the batch should be inspected 100%. 2 Additional sampling Additional sampling according to Table A2 Initial sampling n1 Additional sampling II2 Additional number Grid determination B1 Forward peak voltage (VgM) This test uses the pulse method. B1.1 Principle circuit and requirements The principle circuit is shown in Figure B1. B58343-90 Appendix B Inspection and testing of limit values and electrical characteristics (Supplement) -A resistor that has been calibrated to measure current; Device under test: -Inductor and capacitor that generate forward current pulses; L, c- -Switching device that controls current pulses, generates pulses when turned on, and should be disconnected immediately after the pulse S current ends, Vr, Ap Peak voltmeter, peak value ammeter or oscilloscope. The peak value voltmeter should be able to display that the forward current reaches the peak adjustable pulse AC power supply. B1.2 Test conditions Voltage value at the time of value: Junction temperature: 25℃ for batch tests, 25℃ and T() when required; a. Forward peak current: times of rated forward average current (3 is acceptable) or as specified in product standards, b. Current pulse width: selected based on the carriers of the device under test being able to fully achieve equilibrium during the measurement, current pulse: can be a single shot or a low repetition frequency with negligible heat generation; Measurement point location: as specified in Figure B2 or the corresponding two terminals of the module; Metal pressure plate Metal pressure plate The tightening pressure or torque between the device under test and the fixture: as specified in product standards. f. Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.