This standard specifies the test method for rectifier single-phase bridge modules composed of semiconductor diode chips. This standard is applicable to power semiconductor rectifier single-phase bridge modules with current of 5A and above. Single-phase bridge components composed of rectifier diodes should also be used as a reference. JB/T 6307.2-1992 Power semiconductor module test method Rectifier single-phase bridge JB/T6307.2-1992 Standard download decompression password: www.bzxz.net

Mechanical Industry Standard of the People's Republic of China
Test Methods for Power Semiconductor Modules
Rectifier Single-Phase Bridge
Subject Content and Scope of Application
This standard specifies the test method for rectifier single-phase bridge modules composed of semiconductor diode chips. 6
JB6307.2-92
This standard applies to power semiconductor rectifier single-phase bridge modules with a current of 5A and above, and single-phase bridge rectifier components composed of rectifier diodes should also be used as a reference.
2 Terminology
The scope of this terminology only includes terms applicable to single-phase rectifier bridge modules that are not provided in GB2900.32 "Electrical Terminology Power Semiconductor Devices".
2.1 Reverse Repetitive Peak Current (1)
The maximum reverse peak current when the reverse repetitive peak voltage is applied to both ends of the module's AC terminal. 2.2 Reverse repetitive peak voltage (V)
The maximum instantaneous value of the repetitive reverse voltage that appears at both ends of the module's AC terminals, including all repetitive transient voltages, but excluding all non-repetitive transient voltages.
2.3 Forward peak voltage (Vm)
The maximum instantaneous peak voltage when the two chips in the module's inner arm are connected with a current times the rated DC output current. 2.4 Forward peak current (Im)
The forward peak current that flows into the chip from the module's AC terminals, including all repetitive transient currents. 2.5 Reverse non-repetitive peak voltage (Vrsm) The instantaneous reverse voltage of any non-repetitive maximum instantaneous value that appears at both ends of the module's AC terminals. 2.6 Equivalent junction temperature (T,)
The junction temperature obtained by electrical measurement based on the thermoelectric calibration relationship between the two chips in the module's inner arm. 2.7 Thermal resistance (R)
Under thermal equilibrium conditions, the ratio of the temperature difference between the equivalent junction temperature of the module and the reference point to the power dissipation that produces the temperature difference. 3 Circuit symbols and general requirements for testing
3.1 Circuit symbols
Adjustable AC voltage source;
Adjustable pulse power supply:
Adjustable constant current source;
Approved by the Ministry of Machinery and Electronics Industry on June 26, 1992 and implemented on January 1, 1993
-Constant current source; ||tt ||Transformer;
Diode;
Thyristor;
Resistor;
Adjustable resistor:
Capacitor;
Inductor:
Switch;
Voltmeter;
PA-ammeter;
3.2 General requirements for testingwww.bzxz.net
3.2.1 Test power supply
Wattmeter:
Oscilloscope;
Recording instrument;
Test module.
JB/T6307.2-92
3.2.1.1 All power supplies in the test circuit should have clamping measures to protect the test module from damage caused by transient phenomena such as surges during switching, adjustment and measurement.
3.2.1.2 Power supply fluctuations should not affect the measurement accuracy. The frequency of the AC power supply is 50±1Hz, the waveform is a sine wave, and the waveform distortion coefficient is not greater than 10%; the ripple coefficient of the DC power supply should not be greater than 1% for the reverse characteristic measurement and should not be greater than 10% for the forward characteristic measurement. 3.2.2 Measuring instruments and circuit conditions
3.2.2.1 The instrument should have protection measures to prevent overload caused by failure of the tested module or wiring errors. In order to prevent unwanted half-cycle pulses from entering the amplifier of the oscilloscope, a diode protection can be connected in the circuit. 3.2.2.2 When measuring large current modules, the voltage measurement node should be separated from the current conduction node. When the error caused by the voltage drop in the circuit when measuring current and the current in the circuit when measuring voltage is considerable, the measurement result must be corrected. When measuring small currents, appropriate precautions should be taken to ensure that stray capacitance and inductance do not affect the measurement accuracy, and that the parasitic circuit current and external leakage current are much smaller than the measured current, or their influence is corrected in the measurement results. The accuracy of DC and AC voltmeters, ammeters and measuring shunts should generally be Class 0.5 or higher, and the influence of their impedance on the measurement 3.2.2.3
JB/T6307.2—92
system should be negligible. Instruments with an accuracy lower than Class 0.5 may be used in the following cases: b. have no significant effect on the measurement results;
b. have no significant effect on the determination of qualification; there is no Class 0.5 standard instrument according to national standards. C
3.2.3 Environmental conditions
3.2.3.1 Atmospheric conditions for room temperature tests
Benchmark atmospheric conditions: temperature 25°C, relative humidity 65%, air pressure 101.3×10°Pa; arbitration test atmospheric conditions: temperature 25±1°C, relative humidity 63%~67%; air pressure 86×10°~106×10°Pa; conventional test atmospheric conditions: temperature 5~35°C, relative humidity 45%~85%, air pressure 86×10°~106×10°Pa. When relative humidity and atmospheric pressure have no significant effect on the measured parameters, the atmospheric conditions can be based only on temperature. When the room temperature deviates far from 25°C, and the temperature has a significant effect on the measured parameters, the measurement results should be corrected according to 25°C. 3.2.3.2 When the tested module is subjected to high temperature test or low temperature test in a high or low temperature box or on a temperature control fixture, the temperature fluctuation is within the range of -1 + 1°C. When the temperature has no obvious effect on the measured parameters, the temperature difference fluctuation is within the range of -2 ~ + 2°C, otherwise the measurement results should be corrected. Unless otherwise specified, high temperature test refers to the test at T-°C, where T is the rated maximum junction temperature; low temperature test refers to the test at the rated minimum junction temperature. 4 Electrical Characteristics Test
4.1 Reverse Repetitive Peak Current (1 yuan m)
4.1.1 Purpose
Measure the reverse repetitive peak current of the module under specified conditions. 4.1.2 Principle circuit and requirements
VD1, VD2-
Figure 1 Reverse repetitive peak current test circuit
Provide negative half-cycle voltage so that only the reverse characteristics of the module are measured; it can limit the current flowing through E to prevent damage to E and the instrument; R1-
Current limiting protection, its value should be selected when E breaks down, calibrate the current non-inductive resistor:
A peak reading meter can be used instead of an oscilloscope, and the peak current meter should be able to display the current value when the reverse voltage reaches the peak value. 4.1.3 Specified conditions
Junction temperature: 25℃, T,
Reverse voltage: Reverse repetitive peak voltage (VzM) b.
AC voltage source frequency: 50Hz.
4.1.4 Test procedure
Adjust the AC voltage source G so that the specified reverse repetitive peak voltage is applied to its arm 1--2. The current value displayed on the oscilloscope or peak reading ammeter is the measured reverse repetitive peak current IxM(12); b., after the AC terminals A1 and A2 of the test module are interchanged, measure the reverse repetitive peak 43
-current IRRM(34)5 of the arm 3-4 in the test module according to procedure a.
JB/T 6307.2-92
c. Take the larger value of the two measurements and define it as the reverse repetitive peak current 1aM of the module. 4.2 Forward peak voltage (Vm)
4.2.1 Purpose
Measure the forward peak voltage of the module by the pulse method under specified conditions. 4.2.2 Principle circuit and requirements
A protective resistor,
Figure 2 Forward peak voltage test circuit
A non-inductive resistor for calibrating current readings;
A thyristor for controlling current pulses,
A pulse current is generated when it is in the on state, and it should be in the off state immediately when the pulse current ends; The pulse width and repetition frequency of G should make the internal heating during the measurement period negligible. A peak reading meter can be used instead of an oscilloscope, and the peak voltmeter should be able to display the voltage value when the forward current reaches the peak value. 4.2.3 Specified conditions
Junction temperature: 25℃ for factory inspection, 25℃ for type inspection and T; = forward peak current: module rated DC output current I. Class times (the unit can be taken as 3);
The wire used to connect the DC terminal of the tested module should be as short as possible. Test procedure
The test module is fastened to the fixture or heat sink, and its DC terminals are connected with wires. The test point for measuring the peak voltage (VF%) should be as close to the module housing as possible.
Note: Pay attention to eliminating contact voltage drop. Current and voltage sampling should be done using the four-point connection method. b.
Adjust the voltage of the pulse power supply from zero to gradually increase it so that the forward current flowing through arms 1-2 of the test module is adjusted to the specified value. At this time, the voltage value displayed by the oscilloscope or peak reading voltmeter is the measured forward peak voltage VeM (12> After the AC terminals A1 and A2 of the test module are interchanged, measure the forward peak voltage of arms 3-4 of the test module in accordance with procedure b. c.
VpM
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