Please refer to this standard for details. GB 5731-1985 Fixed resistors for electronic equipment Part 2: Blank detail specification: Low power non-wirewound fixed resistors Assessment level E (for certification) GB5731-1985 standard download decompression password: www.bzxz.net

National Standard of the People's Republic of China
Fixed resistors for use in electronic equipment
Part 2: Blank detail specification:
Low-power non-wirewound fixed resistors
Assessment level E
Fixed resistors for use in electronic equipmentPart 2: Blank detail specification:Fixed low-power non-wirewound resistorsAssessment level E
(Available for certification)
This standard is equivalent to IEC115-2-1 (1982). Blank detail specification
UDC 621.316
.84/.86
GB 5731-85
IEC 115-2-1-1982
QC 400101
Blank detail specification is a supplementary document to the sub-specification and includes the format, arrangement and minimum content requirements of the detailed specification. Detailed specifications that do not comply with these requirements cannot be considered as standards that comply with the requirements of the IEC electronic component quality assessment system. The content of 1.4 of the sectional specification should be taken into account when preparing the detailed specification. The following information should be filled in the numbered position in brackets on the first page: Identification of the detailed specification
【1 Organization authorized to prepare this detailed specification: IEC or national standards body. 【2】 IEC and/or national standard detailed specification number, publication date and other information required by the national system. 【3】 IEC and/or national standard general specification number and its year number. 【4】 IEC and/or national standard blank detailed specification number. Identification of resistors
【5】 Brief description of the type of resistor.
【6】 Brief description of typical structure (where applicable). NOTE: When the resistor is not designed for use on printed wiring boards, this should be clearly stated in this position of the detailed specification. 【7】 Outline drawing with main dimensions that have an important influence on interchangeability, and/or reference to national or international documents on outline. Alternatively, such a drawing can be given in an appendix to the detailed specification. 【8】Purpose or purpose group and/or assessment level. Note: One or several assessment levels used in the detailed specification should be selected from 3.3.3 of the sub-specification, which means that if the test grouping remains unchanged, several assessment levels can share a blank detailed specification. 【9】Reference data of the most important characteristics to facilitate comparison between various types of resistors. Safety standard temperature 1 (
Electronic components for quality assessment according to GB5729-85
Appearance drawing: (see Table 1)
(First angle view)
［3］
(The shape is allowed to vary within the specified size range) GB5731-85
【2］
IEC115-2-1-1982
Low-power non-wirewound fixed resistors Device
Insulated or non-insulated
Assessment level: E
Stability grade%
The valid data of the components qualified according to this detailed specification are given in the list of qualified products. [4]
[5]
[6]
[8]
[9]
General data
1.1 Recommended installation method (to be explained) GB 5731-85
(See Section 1.4.2 of GB573085). 1.2 Dimensions, Ratings and Characteristics
70℃ Rated
All dimensions are in millimeters.
Resistance Range*
Nominal Resistance Permissible Deviation
Climate Category
Low Pressure
Stability Grade
Resistance Change Limit:
Long-term test
Short-term test
Resistance temperature characteristics (20°C
to upper category temperature)
(For carbon synthesis type)
Temperature coefficient
or temperature characteristics
(as applicable)
Element limiting voltage (DC or AC effective value)
8.5kPa(85mbar)
± (_%R+_)
± (%R+2)
Temperature coefficient
(For other types)
Reduced power consumption
α:_10-6/℃
Resistors covered by this specification shall be reduced according to the following curve: Insulation voltage
(DC or AC
peak value)
(The detailed specification shall include an appropriate curve) Note: See also 2.2.3 of the sub-specification.
1.3 Related documents
GB5729-85 Fixed resistors for electronic equipment Part 1: General specification
Maximum size
GB57 30-85 Fixed resistors for electronic equipment Part 2: Sectional specification: Low power non-wirewound fixed resistors 1.4 Marking
* The preferred value is the E series of IEC63.
d Nominal
GB5731-85
The marking on components and packaging shall comply with the requirements of Article 2.4 of the general specification GB5729-85. Note: The marking details on components and packaging shall be specified in detail in the detailed specification. 1.5 Ordering information
Orders for resistors of this specification shall list the following minimum information in general text or code form: a. Nominal resistance,
b. Permissible deviation of nominal resistance;
c. Number and version number of the detailed specification and variety marking. 1.6 Release batch certification record
Required or not required.
1.7 Additional contents (not for inspection)
1.8 Additional or improved severity and requirements for the provisions of the general specification and (or) sectional specification Note: Requirements shall be added or improved only when necessary. 2 Inspection requirements
2.1 Procedure
2.1.1 The identification and approval procedure shall comply with the provisions of Section 3.2 of Section 5730-85. 2.1.2 For quality consistency inspection, the test list (Table 2) includes sampling, cycle, severity and requirements. Section 3.3.1 of the sectional specification specifies the composition of the inspection batch.
Note: When drying is required, Procedure I of Section 4.3 of the general specification GB5729-85 shall be adopted. Table 2
Note: ① Except for the resistance change requirements, which shall be selected from Tables 1 and 2 of Section 5730-85, the clause numbers of the test items and performance requirements are quoted from the general specification GB5729-85.
②Inspection level (IL) and acceptable quality level (AQL) are selected from IEC410: Sampling plan and procedure for attribute inspection. ③Table:
p——cycle, month:
n——sample size
C——qualified number (allowable number of non-conforming products); D——destructive;
ND——non-destructive;
IL——inspection level
AQL——acceptable quality level
Clause number and test items
(See Note ①)
Group A inspection
Batch by batch)
A1 grouping
4.4.1 Visual inspection
D or ND
IEC410.
Test conditions
(See note)
(See note ②)
Performance requirements
(See note ①)
According to 4.4.1
The marking is clear and complies with
Article 1.4 of this specification
Clause number and test items
(See note ①)
Group A2
4.4.2 Dimensions (gauge inspection
4.5 Resistance value
Group B inspection
(Batch by batch)
Group B1
4.7 Withstand voltage (for insulated resistors only)
B Group 2
4.17 Solderability
4.13 Overload
Group B3
4.8.4.2 Resistance temperature coefficient
*See ​​Section 2.3.4 of the sub-specification.
D or ND
GB5731--85
Continued Table 2
Test conditions
(See Note ①)
Should use mm gauge
(When applicable)
Method:
Method:
Test*
Duration
Rated*
The voltage applied should be
2.5 times the rated voltage or 2 times the component limit voltage (whichever is lower)
Appearance inspection
This test is only applicable when the resistance temperature coefficient is required to be less than ±50
×10-6/℃.
Only do one cycle from 20℃ to 70℃ to
20℃
(See Note ②)
Performance requirements
(See Note ①)bzxZ.net
According to Table 1 of this specification
According to 4.5.2
No breakdown or arcing
As applicable, the solder on the wetted
terminal can flow freely or the solder should flow within
_s to indicate that the package
Tin is good
No visible damage, mark
△R<±(_%R||tt ||α≤_10-6/℃
Clause number and test items
(See Note ①)
Group C inspection
(cycle)
Group C1A
(
half of the sample of Group C1)
4.16 Terminal strength
4.18 Resistance to soldering heat
Group C1B
(
half of the sample of Group C1)
4.19 Rapid temperature change
4.22 Vibration
D or ND
GB 5731-85
Continued Table 2
Test conditions
(See Note ①)
Tension, bending and torsion
Tests shall be conducted as per applicable Visual inspection
Method:
Visual inspection
6A=Lower category temperature
B=Upper category temperature
Visual inspection
Installation method: See this specification||tt| |Article 1.1
Procedure: B4
Frequency range: 10~500Hz
Amplitude: 0.75mm or
Acceleration 98m/s2 (whichever is smaller)
Total duration: 6h
Appearance inspection
Sample size and
Qualified judgment number
(see Note ③)
Performance Requirements
(See Note ①)
No visible damage
△R<±(_%R
No visible damage, marking
△R<±(_%R
No visible damage
△R<±(_%R
No visible damage
R<±(_%R
Clause number and test items
(See Note)||tt ||Group C1
(Combined sample of samples from Groups C1A and C1B)
4.23 Climate sequence
Cyclic damp heat, test
Db, the first cycle
—cold
—low pressure
—Cyclic damp heat, test
Db, the remaining cycles
DC load
Group C2
4.25.170℃ Durability
D or ND
GB5731-85
Continued Table 2
Test conditions
(See Note ①)
8.5kPa(85mbar)
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 100 0h
Check at 48h, 500h and
1000h:
Appearance inspection
Check at 1000h:
Insulation resistance (only for insulated resistors)
If required by the detailed specification, the test should be extended to
Check at 2000h, 4000h
and 8000h ：
Sample size and
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
No visible damage, marking
R<±(_%R
R>100Mα
No visible damage
AR<±(_%R
Clause number and test items
(see Note ① ）
C3 group
4.8 Resistance change with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
D or ND
GB 5731-85
Continued Table 2
Sample size and
Test conditions
(See Note)
Lower category temperature/20℃
20℃/upper category temperature
1) 4.24.2.1:
Group 1 6 samples
Group 2? 10 samples of Group 1
7 samples of Group 3
2) 4.24.2.2:
10 samples of Group 1
20 samples of Group 2
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
Inspect at 48h, 500h and
1000h:
Appearance inspection
Number of qualified judgments
(see Note ③)
Performance requirements
(see Note ①)
△R<±( %R
(The results are for reference only)
or α<10-6/℃
or α<_10-6/℃
No visible damage, mark
△R<±_%R
R>100M2
Comply with the provisions of Table 1 of this specification
No visible damage
Clause number and test items
(See Note ①)
D3 Grouping
4.25 Other temperature durability
(when applicable)
Additional instructions:
D or ND
GB5731-85
Continued Table 2
Sample size and
Test conditions
(See Note ①)
Check after 1000h:
Insulation resistance (only for insulated resistors)| |tt||(This
grouping is applicable only when the power consumption reduction curve is different from
clause 2.2.3 of the
sub-specification GB5730-85
and is required by the
detailed specification)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h: || tt||Insulation resistance (only for insulated resistors)
This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see note ③)
Performance requirements
(see note ①)
△R<±（_%R
No visible damage
△R<±（ %R
(same as C2 group)16 Terminal strength
4.18 Resistance to soldering heat
C1B group
(the other
half of the C1 group sample)
4.19 Rapid temperature change
4.22 Vibration
D or ND
GB 5731-85
Continued Table 2
Test conditions
(See Note ①)
Tensile, bending and torsion
Tests shall be conducted according to applicable Appearance inspection
Method:
Appearance inspection
6A=Lower category temperature
B=Upper category temperature
Appearance inspection
Installation method: See this specification
|Article 1.1
Procedure: B4
Frequency range: 10~500Hz
Amplitude: 0.75mm or
Acceleration 98m/s2 (whichever is smaller)
Total duration: 6h
Appearance inspection
Sample size and
Qualified judgment number
(see Note ③)
Performance Requirements
(See Note ①)
No visible damage
△R<±(_%R
No visible damage, marking
△R<±(_%R
No visible damage
△R<±(_%R
No visible damage
R<±(_%R
Clause number and test items
(See Note)||tt ||Group C1
(Combined sample of samples from Groups C1A and C1B)
4.23 Climate sequence
Cyclic damp heat, test
Db, the first cycle
—cold
—low pressure
—Cyclic damp heat, test
Db, the remaining cycles
DC load
Group C2
4.25.170℃ Durability
D or ND
GB5731-85
Continued Table 2
Test conditions
(See Note ①)
8.5kPa(85mbar)
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 100 0h
Check at 48h, 500h and
1000h:
Appearance inspection
Check at 1000h:
Insulation resistance (only for insulated resistors)
If required by the detailed specification, the test should be extended to
Check at 2000h, 4000h
and 8000h ：
Sample size and
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
No visible damage, marking
R<±(_%R
R>100Mα
No visible damage
AR<±(_%R
Clause number and test items
(see Note ① ）
C3 group
4.8 Resistance change with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
D or ND
GB 5731-85
Continued Table 2
Sample size and
Test conditions
(See Note)
Lower category temperature/20℃
20℃/upper category temperature
1) 4.24.2.1:
Group 1 6 samples
Group 2? 10 samples of Group 1
7 samples of Group 3
2) 4.24.2.2:
10 samples of Group 1
20 samples of Group 2
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
Inspect at 48h, 500h and
1000h:
Appearance inspection
Number of qualified judgments
(see Note ③)
Performance requirements
(see Note ①)
△R<±( %R
(The results are for reference only)
or α<10-6/℃
or α<_10-6/℃
No visible damage, mark
△R<±_%R
R>100M2
Comply with the provisions of Table 1 of this specification
No visible damage
Clause number and test items
(See Note ①)
D3 Grouping
4.25 Other temperature durability
(when applicable)
Additional instructions:
D or ND
GB5731-85
Continued Table 2
Sample size and
Test conditions
(See Note ①)
Check after 1000h:
Insulation resistance (only for insulated resistors)| |tt||(This
grouping is applicable only when the power consumption reduction curve is different from
clause 2.2.3 of the
sub-specification GB5730-85
and is required by the
detailed specification)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h: || tt||Insulation resistance (only for insulated resistors)
This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see note ③)
Performance requirements
(see note ①)
△R<±（_%R
No visible damage
△R<±（ %R
(same as C2 group)16 Terminal strength
4.18 Resistance to soldering heat
C1B group
(the other
half of the C1 group sample)
4.19 Rapid temperature change
4.22 Vibration
D or ND
GB 5731-85
Continued Table 2
Test conditions
(See Note ①)
Tensile, bending and torsion
Tests shall be conducted according to applicable Appearance inspection
Method:
Appearance inspection
6A=Lower category temperature
B=Upper category temperature
Appearance inspection
Installation method: See this specification
|Article 1.1
Procedure: B4
Frequency range: 10~500Hz
Amplitude: 0.75mm or
Acceleration 98m/s2 (whichever is smaller)
Total duration: 6h
Appearance inspection
Sample size and
Qualified judgment number
(see Note ③)
Performance Requirements
(See Note ①)
No visible damage
△R<±(_%R
No visible damage, marking
△R<±(_%R
No visible damage
△R<±(_%R
No visible damage
R<±(_%R
Clause number and test items
(See Note)||tt ||Group C1
(Combined sample of samples from Groups C1A and C1B)
4.23 Climate sequence
Cyclic damp heat, test
Db, the first cycle
—cold
—low pressure
—Cyclic damp heat, test
Db, the remaining cycles
DC load
Group C2
4.25.170℃ Durability
D or ND
GB5731-85
Continued Table 2
Test conditions
(See Note ①)
8.5kPa(85mbar)
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 100 0h
Check at 48h, 500h and
1000h:
Appearance inspection
Check at 1000h:
Insulation resistance (only for insulated resistors)
If required by the detailed specification, the test should be extended to
Check at 2000h, 4000h
and 8000h ：
Sample size and
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
No visible damage, marking
R<±(_%R
R>100Mα
No visible damage
AR<±(_%R
Clause number and test items
(see Note ① ）
C3 group
4.8 Resistance change with temperature
D group test
(cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions (detailed)
4.25.3 Upper category temperature
Durability
D or ND
GB 5731-85
Continued Table 2
Sample size and
Test conditions
(See Note)
Lower category temperature/20℃
20℃/upper category temperature
1) 4.24.2.1:
Group 1 6 samples
Group 2? 10 samples of Group 1
7 samples of Group 3
2) 4.24.2.2:
10 samples of Group 1
20 samples of Group 2
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
Inspect at 48h, 500h and
1000h:
Appearance inspection
Number of qualified judgments
(see Note ③)
Performance requirements
(see Note ①)
△R<±( %R
(The results are for reference only)
or α<10-6/℃
or α<_10-6/℃
No visible damage, mark
△R<±_%R
R>100M2
Comply with the provisions of Table 1 of this specification
No visible damage
Clause number and test items
(See Note ①)
D3 Grouping
4.25 Other temperature durability
(when applicable)
Additional instructions:
D or ND
GB5731-85
Continued Table 2
Sample size and
Test conditions
(See Note ①)
Check after 1000h:
Insulation resistance (only for insulated resistors)| |tt||(This
grouping is applicable only when the power consumption reduction curve is different from
clause 2.2.3 of the
sub-specification GB5730-85
and is required by the
detailed specification)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h: || tt||Insulation resistance (only for insulated resistors)
This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see note ③)
Performance requirements
(see note ①)
△R<±（_%R
No visible damage
△R<±（ %R
(same as C2 group)170℃ durability
D or ND
GB5731-85
Continued Table 2
Test conditions
(See Note ①)
8.5kPa(85mbar)
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
In Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance (only for insulated resistors)
If required by the detailed specification, the test should be extended to
Inspection at 2000h, 4000h
and 8000h:
|Sample size and
Qualified judgment number
(See Note ③)
Performance requirements
(See Note ①)
No visible damage, marking
R<±(_%R
R>100Mα
No visible damage
AR<±(_%R
Clause number and test items
(See Note ①)|| tt||C3 Group
4.8 Resistance Change with Temperature
D Group Test
(Cycle)
D1 Group
4.24 Steady State Damp Heat
D2 Group
4.4.3 Dimensions (Detailed)
4.25.3 Upper Category Temperature
Durability
D or ND
GB 5731-85
Continued Table 2
Sample size and
Test conditions
(See Note)
Lower category temperature/20°C
20°C/Upper category temperature
1) 4.24.2.1:
Group 1 6 samples
Group 2 ? samples
Group 3 7 samples
2) 4.24.2.2:
Group 1 1 0 samples
Group 2, 10 samples
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
△R<±( %R
(The results are for reference only)
or α<10-6/℃
or α<_10-6/℃
No visible damage, mark
△R<±_%R
R>100M2
Comply with the requirements of Table 1 of this specification
No visible damage
Clause number and test items
(See Note ①)
D3 grouping
4.25 Other temperature durability
(When applicable)
Additional instructions:
D or ND
GB5731-85
Continued Table 2
Sample size and
Test conditions||t (See Note ①) Check at 1000h: Insulation resistance (only for insulated resistors) (This grouping is applicable only when the power consumption reduction curve is different from Section 2.2.3 of Section 1 GB5730-85 and is required by the detailed specification) Duration: 1000h Check at 48h, 500h and 1000h: Appearance inspection Check at 1000h: Insulation resistance (only for insulated resistors) This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see note ③)
Performance requirements
(see note ①)
△R<±(_%R
No visible damage
△R<±( %R
(same as C2 group)170℃ durability
D or ND
GB5731-85
Continued Table 2
Test conditions
(See Note ①)
8.5kPa(85mbar)
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
In Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance (only for insulated resistors)
If required by the detailed specification, the test should be extended to
Inspection at 2000h, 4000h
and 8000h:
|Sample size and
Qualified judgment number
(See Note ③)
Performance requirements
(See Note ①)
No visible damage, marking
R<±(_%R
R>100Mα
No visible damage
AR<±(_%R
Clause number and test items
(See Note ①)|| tt||C3 Group
4.8 Resistance Change with Temperature
D Group Test
(Cycle)
D1 Group
4.24 Steady State Damp Heat
D2 Group
4.4.3 Dimensions (Detailed)
4.25.3 Upper Category Temperature
Durability
D or ND
GB 5731-85
Continued Table 2
Sample size and
Test conditions
(See Note)
Lower category temperature/20°C
20°C/Upper category temperature
1) 4.24.2.1:
Group 1 6 samples
Group 2 ? samples
Group 3 7 samples
2) 4.24.2.2:
Group 1 1 0 samples
Group 2, 10 samples
Appearance inspection
Insulation resistance (only for insulated resistors)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
△R<±( %R
(The results are for reference only)
or α<10-6/℃
or α<_10-6/℃
No visible damage, mark
△R<±_%R
R>100M2
Comply with the requirements of Table 1 of this specification
No visible damage
Clause number and test items
(See Note ①)
D3 grouping
4.25 Other temperature durability
(When applicable)
Additional instructions:
D or ND
GB5731-85
Continued Table 2
Sample size and
Test conditions||t (See Note ①) Check at 1000h: Insulation resistance (only for insulated resistors) (This grouping is applicable only when the power consumption reduction curve is different from Section 2.2.3 of Section 1 GB5730-85 and is required by the detailed specification) Duration: 1000h Check at 48h, 500h and 1000h: Appearance inspection Check at 1000h: Insulation resistance (only for insulated resistors) This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see note ③)
Performance requirements
(see note ①)
△R<±(_%R
No visible damage
△R<±( %R
(same as C2 group)3 are different and detailed specifications require, this grouping is applicable)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance (only for insulated resistors)
This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
△R<±（_%R
No visible damage
△R<±（ %R
(same as C2 grouping)3 are different and detailed specifications require, this grouping is applicable)
Duration: 1000h
Inspection at 48h, 500h and
1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance (only for insulated resistors)
This standard is proposed by the Ministry of Electronics Industry of the People's Republic of China. This standard is formulated by the Standardization Institute of the Ministry of Electronics Industry. p
Qualified judgment number
(see Note ③)
Performance requirements
(see Note ①)
△R<±（_%R
No visible damage
△R<±（ %R
(same as C2 grouping)
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.