SJ/T 10573-1994 Detailed specification for electronic devices Precision fixed resistors RJ75 type precision metal film resistors Evaluation level E SJ/T10573-1994 standard download decompression password: www.bzxz.net

Electronic Industry Standard of the People's Republic of China
Detailed specification for electronic componentsFixed precislon resistors TypeRJ75 metalfilmprecisionresistors
Assessment level This standard applies to RJ75 type precision metal film resistors. It is formulated in accordance with IEC115-5-1 (1983) "Fixed resistors for electronic equipment Part 5: Blank detailed specification: Precision fixed resistors Assessment Level E", and meets the requirements of fixed resistor exemption GB/T5729 GB5734-85 IEC115-1 (1982) "Fixed resistors for electronic equipment Part 1: General specification" and IEC1155 (1982) "Fixed resistors for electronic equipment Part 5: Sectional specification: Precision fixed electrical appliances". The standard organization of China Electronic Components Quality Certification Committee is China Electronics Technology Standardization Institute. Approved by the Ministry of Electronics Industry of the People's Republic of China on August 8, 1994 and implemented on December 1, 1994
SJ/T10573-94
Ministry of Electronics Industry of the People's Republic of China
Electronic components of quality disk evaluated according to GB/T5729 "Fixed resistors for electronic equipment Part 1: General specification"
Appearance drawing:
Note: 1) Length of paint layer at the root of lead wire.
SJ/T10573-94
SJ5735-85
IEC115-5--1(1983)
QC400301
Precision group resistor
RJ75 precision film resistor
Coated insulation type
Assessment level, E
Stability grade: 0.5%
The valid data of the qualified components according to this detailed specification are given in the list of qualified products. -2
1 General data
1.1 Recommended installation method
The resistor should be installed in the normal way.
SJ/T10573-94
In the vibration and shock test, the distance between the mounting point and the resistor body is 6±1mm. 1.2 Dimensions, Ratings and Characteristics
Temperature Coefficient
10-/℃
All dimensions are in millimeters.
Resistance Range1)
Permitted Resistance Deviation
Climate Category
Low Pressure
Stability Grade
Resistance Temperature Coefficient α
Resistance Change Limit:
Long-term Test
Short-term Test
Limiting Voltage
(dc or ac.rms)
1kn~1Mn
(de or ac,peak)||t t||±1%, ±0.5%, ±0.25%, ±0.1%55/125/56
8.5kPa(85mbar)
±25×10-6/℃
±15×10-/℃
±(0.5%R+0.05Ω)
±(0.1%R+0.012)
Note: 2) The priority value is the E series in the IEC63: resistor and capacitor priority number system. 1.2.1 Power reduction
The resistors included in this specification shall be reduced in power consumption according to the following curve, percentage of rated power consumption
Note, see also 2.2.3 of the sub-specification.
1.3 Related documents
General specification: GB/T5729
Sub-specification: GB5734—85
Fixed resistors for electronic equipment
Fixed resistors for electronic equipment
Maximum size
0.8±0.05
Environmental temperature C
Part 1: General specification
Part 5: Sub-specification: Precision fixed resistors 3
1.4 Marking
SJ/T10573—94
The marking on the resistor and its packaging shall comply with the requirements of Article 2.4 of GB/T5729. The minimum marking content on the resistor is,
Nominal resistance;
Permissible deviation of resistance;
Temperature coefficient of resistance.
Contents of marking on the package:
Nominal resistance
Permissible resistance deviation;
Temperature coefficient of resistance;
Year, month (or week) of manufacturing;
Detailed specification number:
Name and trademark of the manufacturer;
Quantity in the package;
Name or code of the packing personnel:
Seal of the inspection department;
Certification mark (only for certified products). 1.5 Ordering information
Orders for resistors of this specification shall list the following minimum contents in text or code form: a.
Nominal resistance;
Permissible resistance deviation;
Detailed specification number and variety number.
1.6 Release batch certification record
Provided upon the request of the ordering party.
1.7 Additional content (not tested)
The weight of the resistor shall not exceed 2g.
1.8 Supplement and improvement of the severity and requirements specified in the general specification and (or) sectional specification None.
2 Inspection requirements
2.1 Procedure
2.1.1 For identification and approval, the procedure shall be in accordance with the provisions of Article 3.2 of the sectional specification GB5734. 2.1.2 For quality conformity inspection, the test list (Table 2) lists the sampling, cycle, severity and requirements. Article 3.3.1 of the sectional specification specifies the composition of the inspection batch.
Note: When drying is required. Procedure 1 of Article 4.3 of the general specification GB/T5729 shall be adopted. Table 2
Note: ① Except for the resistance change requirements, which shall be selected from Tables 1 and 2 of the sectional specification, the clause numbers of the test items and performance requirements are quoted from the general specification GB/T5729.
②Inspection level and AQL are selected from IEC410: Sampling plan and procedure for inspection by attributes. ?Table:
p-period (month);
n-sample size;
SJ/T10573-94bzxz.net
c-qualified number (allowable number of unqualified products); D-destructive;
ND-non-destructive;
IL-inspection level;
AQL-qualified quality level.
Clause number and test items
(See Note ①)
Group A inspection (batch by batch)
Group A1
4.4.1 Appearance inspection
Group A2
4.4.2 Dimensions
(for gauge inspection)
4.5 Resistance value
Group B inspection (batch by batch)
Group B1
4.7 Endurance Voltage
B2 Group
4.17 Solderability
4.13 Overload
4.30 Marking Solvent resistance
B3 Group
Temperature coefficient of resistance
-1EC410
Test conditions
(See Note)
Method: V-block method
No aging
Method: 1EC68-2 --20
Test method 1
Applied voltage is 2.5 times
rated voltage or 2 times component
limiting voltage, whichever is smaller
Duration: 38
Appearance inspection
Apply agent: See 3.1.1 of IEC68-2-45
Apply agent temperature, 23 ± 5℃ Method 1
Rub Test material, absorbent cotton
Recovery, not applicable
Only one cycle of 20℃~70℃~
20℃
(See Note ②)
Performance requirements
(See Note ①)
According to Article 4.4.1
The marking is clear and complies with Article 1.4 of this
According to Table 1 of this specification
According to 4.5.2 strips
No breakdown or arcing
Solder wets the lead
and can flow freely
No visible damage, clear marking
AR<±(0.5%R
+0.050）
Clear marking
±25×10-/℃
±15×10~/℃
Clause number and test items
(See Note ①)
Group C inspection (kitchen period)
Group C1A
Group C1 sample Half of the sample
4.16 Terminal strength
4.18 Resistance to soldering heat
C1B group
The other half of the sample in C1 group
4.19 Rapid temperature change
4.21 Shock
4.22 Vibration
SJ/T10573-94
Continued Table 2
Test conditions
(See Note?)
Tensile force: 10N
Bending: half of the number of terminals
Torsion: terminal Number of terminals
Appearance inspection
Method IEC68-2-20
Test Tb method 1A
Immersion time: 10±1s
Appearance inspection
8a125℃
Appearance inspection
Installation method: See 1.1 of this specification
Acceleration: 490m/s*
Pulse waveform, half sine wave
Number of impacts: 3 times in the forward and reverse directions of the axial direction, 3 times in the radial direction
Appearance inspection Inspection
Installation method: See 1.1 of this specification
Procedure, B4
Frequency range: 10~500Hz
Amplitude: 0.75mm or acceleration
98m/s (take the less severe
)
Total duration: 6h
Sample size and
Qualified judgment number
(see note)
Performance requirements
(see note ①)
No visible damage
AR≤±(0.1% R
No visible damage, clear marking
AR<±(0.1% R
No visible damage
AR±(0.1%R、
No visible damage
AR≤±(0.1%R
Clause number and test items
(See Note ①)
C1 Group
C1A and CIB Group samples are combined
together
4.23 Climate sequence
One dry heat
One cycle of damp heat, test Db,
First cycle
One cold
One low pressure
One cycle of damp heat, test Db,
The rest of the cycles
DC load
C2 Group
4.25.170℃ durability
C3 Group
4.8 Resistance Value changes with temperature
SJ/T10573—94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa(85mbar)
Appearance inspection
Insulation resistance
Duration, 1000h
At 48, 500 and 100 Inspection at 0h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125℃
Sample size and
Qualified judgment number
(See Note ③)
Performance requirements
(See Note ①)
None Visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100MQ
No visible damage,
AR≤±(0.5%R
R≥1Gn
±25×10-/℃
±15×10-*/℃|| tt||a±25×10-*/℃
≤±15×10-*/℃
Clause number and test items
(See Note ①)
D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(detailed)
4. 25.3 Upper limit category temperature
Additional notes:
SJ/T10573—94
Continued Table 2
Test conditions
(See Note ①)
Article 4.24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Insulation resistance
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note?)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note)
No visible damage, clear marking
AR≤±(0.5%R
R≥100M
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R
R≥1GO23 Climate sequence
-Dry heat
-One cycle of damp heat, test Db,
First cycle
-Cold
-Low pressure
-One cycle of damp heat, test Db,
The rest of the cycles
DC load
C2 group
4.25.170℃ durability
C3 group
4.8 Resistance change with temperature
SJ/T10573-94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa (85mbar)
Appearance inspection
Insulation resistance||tt| |Duration, 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125℃
Sample size and
Qualified number
(See Note ③)
Performance requirements
(See Note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100MQ
No visible damage,
AR≤±(0.5%R| |tt||R≥1Gn
±25×10-/℃
±15×10-*/℃
a±25×10-*/℃
≤±15×10-*/℃
Clause number and test items
(See Note ①)
D group inspection (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Additional instructions:
SJ/T10573—94
Continued Table 2
Test conditions
(See Note ①)
4.2 4.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(See Note?)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(See Note)
No visible damage, clear marking
AR≤±(0.5%R
R≥100M
As specified in Table 1 of this specification
No visible damage
AR≤±(0.5%R
R≥1GO23 Climate sequence
-Dry heat
-One cycle of damp heat, test Db,
First cycle
-Cold
-Low pressure
-One cycle of damp heat, test Db,
The rest of the cycles
DC load
C2 group
4.25.170℃ durability
C3 group
4.8 Resistance change with temperature
SJ/T10573-94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa (85mbar)
Appearance inspection
Insulation resistance||tt| |Duration, 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125℃
Sample size and
Qualified number
(See Note ③)
Performance requirements
(See Note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100MQ
No visible damage,
AR≤±(0.5%R| |tt||R≥1Gn
±25×10-/℃
±15×10-*/℃
a±25×10-*/℃
≤±15×10-*/℃
Clause number and test items
(See Note ①)
D group inspection (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Additional instructions:
SJ/T10573—94
Continued Table 2
Test conditions
(See Note ①)
4.2 4.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(See Note?)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(See Note)
No visible damage, clear marking
AR≤±(0.5%R
R≥100M
As specified in Table 1 of this specification
No visible damage
AR≤±(0.5%R
R≥1GO
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