title>JB/T 7826.2-1996 MTQ(MFQ) series thyristor single-phase bridge module - JB/T 7826.2-1996 - Chinese standardNet - bzxz.net
Home > JB > JB/T 7826.2-1996 MTQ(MFQ) series thyristor single-phase bridge module
JB/T 7826.2-1996 MTQ(MFQ) series thyristor single-phase bridge module

Basic Information

Standard ID: JB/T 7826.2-1996

Standard Name: MTQ(MFQ) series thyristor single-phase bridge module

Chinese Name: MTQ(MFQ)系列晶闸管单相桥模块

Standard category:Machinery Industry Standard (JB)

state:in force

Date of Release1996-09-03

Date of Implementation:1997-01-01

standard classification number

Standard Classification Number:Electrical Engineering>>Power Transmission and Transformation Equipment>>K46 Power Semiconductor Devices and Components

associated standards

Publication information

publishing house:China Machinery Industry Press

Publication date:1997-01-01

other information

drafter:Sun Fumin, Dai Yongxiang, Guo Lanqiong, Huang Yifu, Dong Dayong, Shi Jianxin, Zha Manrong

Drafting unit:Yangzhou Siling Electronics Co., Ltd., Wuxi Radio Components Factory No. 5, Beijing Chunshu Rectifier Factory

Focal point unit:Xi'an Power Electronics Technology Research Institute of the Ministry of Machinery Industry

Proposing unit:Xi'an Power Electronics Technology Research Institute of the Ministry of Machinery Industry

Publishing department:Ministry of Machinery Industry of the People's Republic of China

Introduction to standards:

This standard specifies the dimensions, technical requirements, inspection rules, packaging, storage and transportation of MTQ and (MFQ) series thyristor single-phase bridge modules. This standard applies to single-machine bridge modules (hereinafter referred to as modules) consisting of four ordinary thyristor cores or two ordinary thyristor cores and two ordinary rectifier cores. JB/T 7826.2-1996 MTQ (MFQ) series thyristor single-phase bridge module JB/T7826.2-1996 Standard download decompression password: www.bzxz.net

Some standard content:

JB/T7826.2--1996
This standard is formulated to adapt to the production, development and application of thyristor modules and actively adopt international standards. The technical requirements and parameter indicators of this standard adopt the general level of similar foreign products. The setting of the inspection items of this standard is based on the performance requirements of thyristor modules, and refers to the national standard GB4940 "Ordinary Thyristors" and has made some additions and deletions.
The test methods adopted in this standard, in addition to the JB/T762594 "Test Methods for Quality Thyristor Modules", the test methods for discrete devices are implemented in accordance with GB4024 "Test Methods for Reverse Blocking Triode Thyristors of Semiconductor Devices". In order to ensure the product quality of thyristor modules, this standard stipulates that at least one batch of temperature change tests should be conducted every six months. Appendix A and Appendix B of this standard are both appendices to the standard. This standard is proposed and managed by the Xi'an Power Electronics Technology Research Institute of the Ministry of Machinery Industry. The drafting units of this standard: Yangzhou Siling Electronics Co., Ltd., Wuxi Radio Components Factory No. 5, Beijing Chunshu Rectifier Factory, Xiangfan Instrument Components Factory, and Fuxin Transistor Factory.
Drafters of this standard Sun Fumin
Zeng Taoying Dong Dayong
Shi Jianxin Cha Manrong
Dai Yongxiang
Guo Lanqiong
1 Scope
Mechanical Industry Standard of the People's Republic of China
MTQ (MFQ) series thyristor single-phase bridge module JB/T7826.2-1996
This standard specifies the dimensions, technical requirements, inspection rules, packaging, storage and transportation of MTQ (MFQ) series thyristor single-phase bridge module. This standard applies to single-phase bridge modules (hereinafter referred to as modules) composed of four ordinary thyristor cores or two ordinary thyristor cores and two ordinary rectifier cores.
Cited Standards
The provisions contained in the following standards constitute the provisions of this standard through reference in this standard. When the standard is published, the versions shown are valid. All standards will be revised. Parties using this standard should explore the possibility of using the latest versions of the following standards. GB2423.4~—81
GB4024—83
GB493785
GB493885
JB/T2423—91
JB/T6306—92
JB/T7625—-94
Type and size
Electrical connection type
3.2 Model description
Basic environmental test procedures for electrical and electronic products Test Db: Alternating damp heat test method Test method for reverse blocking triode thyristor of semiconductor device Mechanical and climatic test method for discrete semiconductor device Acceptance and reliability of discrete semiconductor device
Model naming method for power semiconductor device
Dimensions of power semiconductor module
Test method for thyristor module Law
Approved by the Ministry of Machinery Industry in 199609--03
VDRM (VRRM) levels
Average output current value (unit: A)
Single-phase bridge code (Q) and serial number
Thyristor (thyristor and rectifier mixed) module
Implementation on 1997-01-01
3.3 Dimensions
The dimensions should comply with 3.3 of JB/T6306. 4
Rated values ​​and characteristic values
4.1 Parameter level
JB/T7826.2-1996
4.1.1 The levels of off-state repetitive peak voltage (VDRM) and reverse repetitive peak voltage (VkRM) shall be as specified in Table 1 (voltage and current are the values ​​of a single tube core, the same below).
VDR, VRRM
VDRM, VRRX
The level of the critical rise rate (di/dt) of the on-state current shall be as specified in Table 2Table 2
The level of the critical rise rate (dv/dt) of the off-state voltage shall be as specified in Table 3Table 3
4.2 Rated values
The maximum rated values ​​(limit values) shall comply with those specified in Table 4 and shall apply to the entire operating temperature range.
On-state (forward) average
It(AV)
Ie(ay)
(forward)
Root mean square
It(RMS)
Ip(RMs)
On-state current critical
Rate of rise
A, B, C
Gate average power
Off-state, reverse
Gate peak
Repetitive|| |tt||Peak voltage
Off state, reverse
Non-repetitive peak
value voltage
Highest quality
Thanks to the manufacturer
The characteristic value should comply with the provisions of Table 5
(Forward)
Average current
Is(Ay)
Characteristic curve
On state (forward)
Peak voltage
Off state, reverse
Repetitive peak
value current
JB/T7826. 2—1996
≤100
≤150
≤150
≤150
≤150
≤200
≤200
The upper limit value is given by the manufacturer
gate contact
current
≤100
≤150
≤150
≤200|| tt||≤200
Gate contact
Electric voltage
Gate non-contact
Electric voltage
Off-state voltage
Critical rate of rise
In the enterprise standard or product manual, at least the following characteristic curves of the module and its single tube core should be given: a)
Derating curve of module base plate temperature and on-state average current; on-state volt-ampere characteristic curve;
Relationship curve of transient thermal resistance and time (given when the on-state average current ITcAv is greater than 50A). 5 Inspection rules
Batch inspection
Each batch of products must be inspected according to Table 6, and all inspections in Table 6 are non-destructive. Table 6
Inspection items
Inspection method
Visual inspection (normal lighting, normal vision)
3.2 of GB4024 (3.2 of GB4023)
3.1 of GB4024 (3.1 of GB4023)
3.4 ​​of GB'4024
AC effective value 2500V, maintain 1min
3.8 of GB4024
dv/dt item is only implemented for the on-state average current IrcAv greater than 50A. 2
Qualified criteria
Module junction
Shell thermal resistance
Bridge arm junction
Shell thermal resistance
AQL(I)
Marking is clear, the surface has no mechanical damage and contamination, which meets the requirements of Table 5
Meet the requirements of Table 5
Meet the requirements of Table 5
No breakdown, flashover phenomenon
Meet the requirements of Table 5
For the specific sampling number of AQL, please refer to Appendix A. If the initial submission fails to meet the requirements, it can be resubmitted for re-inspection according to Appendix A with stricter AQL level, but it can only be resubmitted once.
5.2·Periodic inspection
JB/T7826.2—1996
Items marked with (D) are destructive tests. For the standardized products in normal production, at least one batch of tests shall be conducted every year according to Table 7, among which the temperature change followed by alternating mixed heat and electrical durability test shall be conducted at least once every six months. Table 7bzxZ.net
Inspection Items
Dimensions
Temperature Change Followed by Alternating Humid Heat
Vibration or Shock (D)
High Temperature Storage
Inspection Method
Use measuring tools with accuracy not less than Grade 2
GB 4937 3.1.1
TA=-40+IC
Ts=125-1C
5 cycles, 0.5h exposure each time, GB242 3.4 severity 55, 6 cycles
GB4024 3.6, 25℃C, V,=12V, gate circuit without R3, impulse current ≤0.1Ir(AV)
GB4024 3.7, 25℃, Vp=12V, gate circuit without R3, trigger current pulse tc≤0.5uS, twg=100μs, 50Hz, 10V, 6Q or 8aGB4024 3.5. T, negative cutoff resistance meets the current limiting current greater than IL and less than Isu
4.7 of GB4024, T
4.6 of GB4024, T
4.4 of GB4024, T, Icv=3~5leT
t,≤1.5μs, pulse width
4.2 of GB4023, T-9C, 20 times a cycle JB/T7625.3 4.1
3.8 of GB4024, T, gate open circuit
2.3 of GB4937, 196m/s *, 100~~2000Hz, scan in three mutually perpendicular directions for 2h, 6h in total GB4937 2.4, 980m/s*, last for 6ms, half-sine waveform, impact 3 times in each direction of three mutually perpendicular axes, 18 times in total
GB4937 3.2, TC
1000=h
Qualification criteria
Conform to relevant drawing requirements
Measurement after test:
V(V)≤1.1USL
IRR≤2USL
IoR≤2US L
Viso is in accordance with the provisions of Table 4
is in accordance with the provisions of Table 5
is in accordance with relevant regulations
is in accordance with the provisions of Table 5
is in accordance with the provisions of Table 4
is in accordance with the provisions of Table 4
is in accordance with the provisions of Table 4,
measurement after test
VT(VM)≤1.1USL
IRRM≤2USL
IDRM≤2USL
is in accordance with the provisions of Table 4,
measurement after test is the same as that of serial number 8
is in accordance with the provisions of Table 5
Comply with the provisions of Table 5
Measurement after test is the same as No. 8
Measurement after test is the same as No. 8
Sampling plan
Inspection items
Life test
(AC blocking)
JB/T7826.21996
Table 7 (end)
2.3.2 of GB4938, TC, 1000h
Sine wave 70%VRY, 70%VDRM
1, the number in the square brackets is the number of samples with the average on-state current greater than 50A. 2USL is the upper limit value corresponding to Table 5.
Qualification criteria
Measurement after test is the same as serial number 8
Sampling plan
3 Samples with poor electrical characteristics can be used for appearance and size inspection, and samples after batch inspection and Is, I, R test can be used for other test items. 4
Periodic inspection If the first sampling inspection fails, it can be inspected again by additional sampling according to Appendix B, but only once. Product quality assessment category of this standard
Product quality assessment category of this standard is Class 1. 7·Marking and packaging
7.1·Marking on the module
a) Product model;
Manufacturer name or trademark;
Electrical schematic and terminal identification mark;
Product batch number or serial number.
7.2 Marking on the packaging box
a) Product model;
b) Manufacturer name and trademark.
7.3 Packaging
a) Product packaging must ensure that the product is not mechanically damaged during transportation; the packaging should be printed with the manufacturer's name, the name of the consignee, and the product name; b) Food
c) The packaging box should contain a product certificate.
7.4 Order
The order should state the exact model, the number of this standard and other details. 34
Appendix A (Standard Appendix)
Batch range
91~150
151280
281500
5011200
Sample size
1This table belongs to the inspection level (IL).
2c is the qualified judgment number, and r is the unqualified judgment number. AQL sampling table
3 The arrow indicates that the first sampling plan pointed to should be used. If the sample size at the corresponding point is equal to or greater than the batch, the batch should be inspected 100%.
Appendix B (Standard Appendix)
Additional sampling table
Qualified judgment number
Initial sampling
Additional sampling
Additional number
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.