This specification specifies the determination of the X value of the component of mercury cadmium telluride wafers by X-ray fluorescence method. This specification is applicable to the quantitative determination of the X value of the component of mercury cadmium telluride wafers with an X value in the range of 0.100~0.350mol. SJ 20719-1998 X-ray fluorescence method for the determination of the X value of mercury cadmium telluride crystals SJ20719-1998 Standard download decompression password: www.bzxz.net

Military Standard of the Electronic Industry of the People's Republic of China FL5971
SJ 20719 — 1998
Method of determination X value for mercury cadmium telluride for use in X -- ray fluorimetryPublished on 1998-03-18Implementation on 1998-05-01Approved by the Ministry of Electronics Industry of the People's Republic of China Military Standard of the Electronic Industry of the People's Republic of China Method of determination X value for mercurycadraium telluride for use in X - ray fluortmetry1 Scope
1.1 Subject Content
This standard specifies the determination of the component X value of mercury cadmium telluride wafers by X-ray fluorescence method. 1.2 Scope of application
SJ 20719—1998
This standard is applicable to the quantitative determination of the x-value of the mercury wafer components with x-values ​​in the range of 0.100~0.350mol. 2 Referenced documents
GJIB1866-94 Specification for mercury wafers for infrared detectors 3 Definitions
3.1 x-value
The mercury cadmium material is an alloy solid solution composed of HgTe and CdTe in a certain ratio, and the component ratio of its components in Hel-Cd,Te is the x-value.
3.2 X-ray fluorescence determination X-ray fluorimetry uses X-rays to irradiate the measured substance, and each element in the substance is stimulated to emit fluorescence (secondary x-rays) of a specific wavelength. According to the specific wavelength of the characteristic X-rays and the intensity of the specific wavelength rays, the content of each element in the substance can be qualitatively and quantitatively determined.
4—General requirements
4.1 Atmospheric conditions of the measuring hood
The Ministry of Electronics Industry of the People's Republic of China issued iiKAoNirAca on March 18, 1998
Implementation on May 1, 1998
Standard: Ambient temperature: 25±10℃;
b. Relative humidity: not more than 75%;
c. Atmospheric pressure: 86-106kPa.
4.2 Measurement environment requirements
SJ 20719 - 1998
Mechanical shock and vibration are not allowed in the measurement laboratory, and a certain cleanliness condition shall be guaranteed, and there shall be no dust and no corrosive gas.
5 Detailed requirements
5.1 Summary of methodswww.bzxz.net
The mercury-radium-telluride material is an alloy solid solution. When X-rays are irradiated onto the mercury-telluride wafer, each component is stimulated to emit a characteristic fluorescence spectrum. Different components have different fluorescence peak wavelengths. Based on the relationship between the specific wavelength and the atomic number, the component can be qualitatively determined. Then, based on the determination of the specific X-ray intensity, the coordinate method can be used to quantitatively determine the X-ray value. 5.2 Instruments and measurement conditions
5.2.1 Instruments
X-ray fluorescence instrument.
5.2.2 Measurement conditions
5.2.2.1 Platinum target X-ray fluorescence tube:
a. High voltage 45kV;
b. Tube current 30mA.
5.2.2.2 Lithium fluoride crystal.
5.2.2.3 Spectral line measurement:
a, Caks;
b, diffraction angle 8 = 8.28°.
5.2.2.4 Flash counter (SC): high voltage 850V. 5.2.2.5 Differential measurement method:
Baseline 250
b. Density width 400;
c. Timed counting;
d. Counting time 40sc
5.3 Determination steps
5.3.1 Preparation of standard samples
5.3.1.1 Prepare a series of standard samples:
a. Prepare a group of synthetic ingots according to the ratio of X values ​​of 0.100, 0.150, 0.195, 0.265, 0.300, and 0.350 mol;
b. In the middle of each ingot, take three adjacent wafers with a thickness of 1.0~1.5 mm;C. Take the first and last two pieces of adjacent blue wafers and measure the cadmium and mercury contents respectively by chemical analysis or atomic absorption method, and keep the middle piece as standard sample;
d. Take the standard sample with the same content and proportion as the nominal X value; 2
SJ 20719 - 1998
. At the same time, take three adjacent wafers of the standard sample b to measure the uniformity of cadmium content. It should meet the requirements of △X in Article 3.3.2 of GJB1866;
f. Draw the curve of X-ray intensity and X value 5.3.1.2 Preparation of samples:
Cut a wafer with a diameter of not less than 5mml from the mercury cadmium telluride ingot to be tested. The surface of the wafer should be flat, without holes and cracks, and cleaned with high-grade anhydrous ethanol, air-dried and ready for use. 5.3.2 Determination procedure
Use the double standard method, take two samples and two standard samples. 5.3.2.1 First, use a mercury telluride wafer to perform background subtraction counting at the same diffraction angle (i.e. 28), and output the pulse counts by printer.
5.3.2.2 Place the prepared sample in the sample chamber of the spectrometer and cover it with a suitable cover to prevent dust from affecting the test results. 5.3.2.3 The measurement sequence is standard sample-sample-standard sample. 5.3.2.4 Repeat the counting three times for each test
5.3.2.5 Repeat the above steps with another sample. 5.3.3 Data processing and calculation
Select the standard value of the sample according to the pulse count when preparing the series of standard samples, and then calculate according to formula (1): +Xstandard2-star mark × (1-Istandard1)-
Xtest = Xstandard1+ 2-1standardI
Where: Xtest—X value of the sample;
Xstandard1, Xstandard2—X values ​​of standard sample 1 and standard sample 2: Istandard], 1standard2—counts of standard sample 1 and standard sample 2; Istandard1, 1standard2—counts of standard sample 1 and standard sample 2; Istandard2, 1standard2—counts of standard sample 1 and standard sample 2; Istandard1, 1standard2—counts of standard sample 1 and standard sample 2; Istandard1, 1standard2—counts of standard sample 1 and standard sample 2; Istandard1, 1standard2—counts of standard sample 1 and standard sample 2.
5.4 Error analysis
The error of this method mainly consists of two parts: systematic error and accidental error. 5.4.1 Systematic error
The systematic error mainly includes pulse counting statistical error and instrument stability error. The control method is as follows: a. This method uses chemical analysis and atomic absorption method for calibration; b. The statistical error of pulse counting adopts the timing counting method, and its relative deviation is controlled within ±0.5%: C. Instrument stability error, generally adopts continuous operation for more than 6 hours, and its error is controlled within ±1%. 5.4.2 Random error
Random error mainly comes from the error caused by different operators or the same operator measuring at different times. According to the results of a large amount of data statistics, it can be controlled within ±0.003mol. 6 Contents of the test report
The test report should include the following:
a: Operator's name:
b. Measurement date;
C. The number and location of the measured mercury cadmium telluride ingot; 3
KANKAca-
The X value of the sample;
Measurement error.
Additional instructions:
SI 20719 - 1998
This standard is under the jurisdiction of the China Electronics Technology Standardization Institute. This standard was drafted by China Electronics Standardization Institute. The main drafters of this standard are Li Zhaorui and Liu Yun. Project code: B65002.
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