GB/T 15651.3-2003 Semiconductor discrete devices and integrated circuits Part 5-3: Test methods for optoelectronic devices

Basic Information

Standard ID: GB/T 15651.3-2003

Standard Name: Semiconductor discrete devices and integrated circuits Part 5-3: Test methods for optoelectronic devices

Chinese Name: 半导体分立器件和集成电路第5-3部分：光电子器件测试方法

Standard category:National Standard (GB)

state:in force

Date of Release2003-01-01

Date of Implementation:2004-08-01

standard classification number

Standard ICS number:Electronics>>31.260 Optoelectronics, Laser Equipment

Standard Classification Number:Electronic Components & Information Technology >> Optoelectronic Devices >> L50 Optoelectronic Device Combination

associated standards

Procurement status:IEC 60747-5-3:1997,IDT

Publication information

publishing house:China Standards Press

ISBN:155066.1-20664

Publication date:2004-08-01

other information

Release date:2003-11-24

Review date:2004-10-14

drafter:Chen Lan, Na Ren, Wang Shouhua

Drafting unit:Semiconductor Factory of Huayu Optics Valley Co., Ltd.

Focal point unit:National Semiconductor Device Standardization Technical Committee

Proposing unit:Ministry of Information Industry of the People's Republic of China

Publishing department:General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

competent authority:Ministry of Information Industry (Electronics)

Skip to download

Introduction to standards:

This part applies to test methods for optoelectronic devices, except for those used in optical fiber systems or subsystems. GB/T 15651.3-2003 Semiconductor discrete devices and integrated circuits Part 5-3: Test methods for optoelectronic devices GB/T15651.3-2003 Standard download decompression password: www.bzxz.net