This standard specifies the basic principles of the test methods for the electrical characteristics of semiconductor integrated circuit voltage regulators. This standard applies to the test of the electrical characteristics of semiconductor integrated circuit voltage regulators, and does not apply to two-terminal (single-port) devices. GB/T 4377-1996 Basic principles of test methods for semiconductor integrated circuit voltage regulators GB/T4377-1996 Standard download decompression password: www.bzxz.net

National Standard of the People's Republic of China
Semiconductor integrated circuits
Basic principles of measuring methodsof voltageregulator
1 Subject content and scope of application
GB/T4377-1996
Replaces GB4377-84
This standard specifies the basic principles of measuring methods for the electrical characteristics of semiconductor integrated circuit voltage regulators (hereinafter referred to as devices). This standard applies to the testing of the electrical characteristics of semiconductor integrated circuit voltage regulators, and does not apply to two-terminal (single-port) devices. 2 Reference standards
GB3431.1 Semiconductor integrated circuits Text symbols Electrical parameters Text symbols 3 General requirements
3.1 During all tests, care should be taken to ensure that no parasitic oscillations occur. 3.2 The input power supply should have essentially zero impedance to the signal frequency used in the test. 3.3 Undesirable transient input voltages and currents should be avoided. 3.4 If the test results are affected by thermal effects, the test should be completed in a short time. For example, the pulse method is recommended. In this case, the pulse conditions should be specified.
3.5 All test equipment should introduce only negligible errors. The above applies to static and dynamic tests. 3.6 The output voltage test equipment must have a sensitivity that meets the requirements relative to the voltage difference being measured. The appropriate method is that the output voltage V. is compared with the high-stability pre-adjusted reference voltage VREF. Then the difference between V. and VR is detected and amplified, preferably using a gain-stabilized amplifier.
3.7 Unless otherwise specified, during the device test, the range of deviation of the ambient or reference point temperature from the specified value should comply with the provisions of the detailed specifications. 3.8 When the device under test is connected or disconnected from the test system, the device's use limit conditions should not be exceeded. 3.9 During the test, the device under test should be connected to the additional network specified in the detailed specifications. 3.10 Figure 1 is the total test circuit, and Figures 2 to 16 are the test circuits of each parameter after Figure 1 is decomposed. 3.11 The electrical parameter text symbols used in this standard are in accordance with the provisions of GB3431.1. Approved by the State Administration of Technical Supervision on July 9, 1996, and implemented on January 1, 1997
GB/T4377—1996
Oscilloscope
Note: Together with any additional networks required to limit the output current and/or regulate the output voltage Figure 1 Test circuit
4 Electrical characteristics test
4.1 Voltage regulation rate S and voltage stability factor Svs. 4.1.1 Purpose
Negative intercept network 1
Load network, etc. 2
Filter
Sound ratio current source
Effective signal
Voltmeter
Determine the voltage regulation rate and voltage stability factor by changing the DC input voltage and recording the corresponding output voltage change. 4.1.2 Test principle diagram
The test principle diagram of voltage regulation rate and voltage stability factor is shown in Figure 2a. GNT
4.1.3 Test conditions
GB/T4377—1996
Selected pulse
During the test, the following test conditions shall comply with the provisions of the detailed specification: a.
Ambient or reference point temperature;
Input voltage and its variation;
Output voltage;
Load network (providing the required output current); other external networks (when applicable);
Test repetition frequency and maximum duty cycle.
Test procedure
Output current
At the specified ambient temperature T., connect the device under test to the test system of Figure 2a. 4.1.4.2 Set the switch S shown in Figure 2a to position "1" to apply the specified DC input voltage V1 to the input terminal of the device under test. 4.1.4.3 Adjust the output voltage of the device to the specified value V., recorded as Vo1 (see Figure 2b). 4.1.4.4 Place the switch S shown in Figure 2a in position "2" so that the input voltage V1+△V1 is applied to the input terminal of the device, and the output voltage of the device is measured at this time, recorded as Vo2 (see Figure 2b). 4.1.4.5 Calculate the voltage regulation rate Sv according to formula (1) or (2). Sy
V×100%
SV=V. XAV
Where: AVo=Vo1-V02.
4.1.4.6 Calculate the voltage stability factor Svs according to formula (3). Svs
4.2 Current regulation rate Sr and current stability factor Srs. 4.2.1 Purpose
4V. /V.
（1）
00.000.00(2)
（3）
The current regulation and current stability factor are determined by changing the DC output current and recording the corresponding DC output voltage change. 4.2.2 Test Schematic Diagram
The current regulation and current stability factor test schematic diagram is shown in Figure 3a. 3
4.2.3 Test Conditions
GB/T4377—1996
During the test, the following test conditions shall comply with the provisions of the detailed specifications: a.
Ambient or reference point temperature;
Input voltage;
Output voltage,
(Load network that provides the required output current and its change); other external networks (when applicable);
Test repetition frequency and maximum duty cycle.
Test Procedure
4. 2.4. 1
Under the specified ambient temperature, connect the device under test to the test system of Figure 3a. Apply the specified input voltage V1 to the input terminal of the device under test. 4.2.4.2
Select the source pulse
4.2.4.3 Under the specified output current 1., read the output voltage value V., recorded as Vo (see Figure 3b). 4.2.4.4
When the output current is 1., read the output voltage value Vo2 (see Figure 3b). 4.2.4.5
Calculate the current regulation rate S1 according to formula (4).
V×100%
Where: AV. =Vo1Vo2.
（4）
GB/T4377—1996
4.2.4.6 Calculate the current stability factor Ss according to formula (5). Ss=
4.3 Ripple rejection ratio 8g
4.3.1 Purpose
AV/V×100%
A/l.
The ripple rejection ratio is determined by measuring the input and output ripple voltages. 4.3.2 Test schematic
The test schematic of the ripple rejection ratio is shown in Figure 4. a
4.3.3 Test conditions
During the test, the following test conditions shall comply with the provisions of the detailed specifications: a.
Ambient or reference point temperature;
The input ripple signal is a sine wave, and the frequency should be selected in the range of 50Hz to 100kHz; input voltage;
Output voltage;
Filter capacitors and compensation capacitors;
Load network (providing the required output current); other external networks (when applicable).
4.3.4 Test procedure
At the specified ambient temperature, connect the device under test to the test system. 4.3.4.2
Apply the specified input voltage V to the input terminal of the device under test so that the output voltage V reaches the specified value. (5)
3Add the specified ripple signal V to the input end of the device under test, set the switch S to position "1" to measure the input ripple voltage 4.3.4.3
peak-to-peak value VP.
Then set the switch S to position "2" to measure the output ripple voltage peak-to-peak value Vops. 4.3.4.4
Calculate the ripple rejection ratio Srp according to formula (6): 4.3.4.5
4.4 Output voltage temperature coefficient St
Sro = 201g Vom
(6)
4.4.1 Purpose
GB/T4377—1996
The temperature coefficient of the adjusted output voltage is determined by measuring the adjusted output voltage at different temperatures. 4.4.2 Test schematic
The output voltage temperature coefficient test schematic is shown in Figure 5. D:T
4.4.3 Test conditions
During the test, the following test conditions shall comply with the provisions of the detailed specifications: a.
Ambient or reference point temperature;
Test temperature range;
Input voltage;
Output voltage;
Load network (providing the required output current); other external networks (when applicable).
Test procedure
Connect the device under test to the test system at the specified ambient temperature. Apply the specified DC input voltage VI to the input terminal of the device under test. Adjust the output voltage of the device under test to the specified value Vo. 4.4.4.3
4.4.4.4 Place the device under test in a constant temperature box, and measure the output voltage at a lower constant temperature T, recorded as Vo1. 4.4.4.5 Adjust the temperature in the constant temperature box to a higher temperature T2 and stabilize it, then measure the output voltage, recorded as Vo2. 4.4.4.6 Calculate the output voltage temperature coefficient Sr according to formula (7): Vo2-Vol
4.4.5 Notes
· (7)
a. When the device under test is an adjustable voltage regulator, the influence of the temperature coefficient of the external resistor network on the test results should be avoided as much as possible; b. During the entire test process, the temperature and power limit values ​​should be prevented from being exceeded. 4.5 Long-term stability of output voltage St
4.5.1 Purpose
Test the change of output voltage value over time. 4.5.2 Test schematic diagram
The schematic diagram of the output voltage long-term stability test is shown in Figure 6. 6
4.5.3 Test conditions
GB/T4377—1996
During the test, the following test conditions shall comply with the provisions of the detailed specifications: a.
Ambient or reference point temperature;
Input voltage;
Output voltage;
Stabilization time △t;
Load network (providing the required output current I.); other external networks (when applicable).
Test procedure
Connect the device under test to the test system at the specified ambient temperature. Apply the specified DC input voltage V1 to the input terminal of the device under test.
Adjust the output voltage of the device under test to the specified value Vo, recorded as Vo1; keep the output current I. unchanged. 4.5.4.4 Measure the device’s endpoint output voltage Vo2 within the specified time range △t. 4.5.4.5 Calculate the output voltage long-term stability St according to formula (8): Vo2-Vo108
When necessary, the time drift △V can be calculated according to formula (9). (St): 4Vo(S)=Vo2-Vo1
4.6 Output noise voltage Vno
4.6.1 Purpose
Measure the root mean square output noise voltage at the specified DC input voltage. 4.6.2 Test schematic
The output noise voltage test schematic is shown in Figure 7. (8)
(9)
4.6.3 Test conditions
GB/T4377—1996
During the test, the following test conditions shall comply with the provisions of the detailed specification: a.
Ambient or reference point temperature;
Input voltage,bzxz.net
Output voltage;
Noise bandwidth, center frequency of bandpass filter; low-pass or applicable bandpass filter;
Output capacitance and compensation capacitance;
(Load network that provides the required output current); other external networks (when applicable).
4.6.4 Test procedure
Connect the device under test to the test system at the specified ambient temperature. 4.6.4.1
4.6.4.2Apply the specified DC input voltage V1 to the input of the device under test. Filter
4.6.4.3 Adjust the output voltage of the device under test to the specified value V., and measure the output noise voltage Vno (RMS value). 4.7 Standby current consumption Ip and standby current consumption change △Ip4.7.1 Purpose
When the input voltage and output current are at the specified values, determine the standby current consumption; when the input and output conditions change, determine the standby current consumption change.
4.7.2 Test schematic
The standby current consumption and standby current consumption change test schematic is shown in Figure 8 Ｄｔ
4.7.3 Test conditions
During the test, the following test conditions shall comply with the provisions of the detailed specifications:8
Ambient or reference point temperature;
Input voltage;
Output voltage;
GB/T4377—1996
(Load network that provides the required output current); other external networks (when applicable).
4.7.4 Test Procedure
In the specified ambient temperature, connect the device under test to the test system. Apply the specified DC input voltage V1 to the input end of the device under test. Adjust the output voltage of the device under test to the specified value V. . 4.7.4.3
Measure the input current I1 and output current Io of the device under test. Calculate the standby consumption current ID according to formula (10): Ip-Io
Apply the specified DC output current Io to the output end of the device under test. Set the switch S shown in Figure 8 to position "1" and read the current value IDv1. 4.7.4.8 Set the switch S1 shown in Figure 8 to position 2", and read the current value Ipv2. 4.7.4.9 Calculate the standby current consumption change AIpv (corresponding voltage) according to formula (11): 4Ipy = [pvi — IDv2
4.7.4.10 Apply the specified input voltage V1 to the output end of the device under test. 4.7.4.11 Set the switch S2 shown in Figure 8 to position 1", and read the current value IDm. 4.7.4.12 Set the switch S2 shown in Figure 8 to position 2", and read the current value Inz. 4.7.4.13 Calculate the standby current consumption change △In (corresponding current) according to formula (12): 4I=[In — Ip12]
4.7.5 Notes
(10)
-(11)
(12)
The current through the additional network should be small enough to be ignored. If this requirement cannot be met, corrections must be made during calculation. 4.8 Short-circuit current Ios
4.8.1 Purpose
Measure the short-circuit current at the specified input voltage. 4.8.2 Test schematic
The short-circuit current test schematic is shown in Figure 9 . A
4.8.3 Test conditions
DUT
During the test, the following test conditions shall comply with the provisions of the detailed specification: a. Ambient or reference point temperature;
Input voltage;
Output voltage;
Duration of short circuit at the output terminal;
GB/T4377—1996
Load network (providing the required output current); other external networks (when applicable).
Test procedure
4. 8. 4. 1
Under the specified ambient temperature, connect the device under test to the test system. Set the switch S shown in Figure 9 to position "1". Apply the specified DC input voltage VI to the input end of the device under test. 4.8.4.3
4.8.4.4 Adjust the output voltage of the device under test to the specified value Vo. 4.8.4.5 Set the switch S to position "2", and measure the short-circuit output current 1os within the specified time. 4.9 Output Impedance Zo
4.9.1 Purpose
Determine the output impedance by measuring the AC voltage and AC current at a given frequency. 4.9.2 Test Schematic
The output impedance test schematic is shown in Figure 10. Du
4.9.3 Test conditions
During the test, the following test conditions shall comply with the provisions of the detailed specification: a.
Ambient or reference point temperature;
Input voltage;
Output voltage;
Performance of the AC current source (current amplitude, output impedance, frequency range); test frequency;
Load network (providing the required output current); other external networks (when applicable).
Test procedure
Connect the device under test to the test system at the specified ambient temperature. Apply the specified DC input voltage V1 to the input terminal of the device under test. Adjust the output voltage of the device under test to the specified value V. . Adjust the frequency of the AC current source to the specified value and measure the AC current I and AC voltage V. Calculate the output impedance Zo according to formula (13):
· (13)
4.9.5 Notes
GB/T4377—1996
a. The output impedance of the AC current source Zm≥100zo; b. The influence of parasitic impedance and wiring impedance on the measurement results should be prevented. 4.10 Reference voltage VREF
4.10.1 Purpose
At the reference end, measure the voltage of the device under the specified input voltage and output conditions. 4.10.2 Test Schematic
The reference voltage test schematic is shown in Figure 11. T
GND Reference Station
4.10.3 Test Conditions
During the test, the following test conditions shall comply with the provisions of the detailed specifications: ambient or reference point temperature;
Input voltage;
Output voltage;
Load network (providing the required output current); other external networks (when applicable).
4.10.4 Test Procedure
At the specified ambient temperature, connect the device under test to the test system. 4.10.4.2
Apply the specified power supply input voltage V1 to the input terminal of the device under test. 4.10.4.3 Adjust the output voltage of the device under test to the specified value Vo, and measure the reference voltage at the reference terminal. 4.11 Startup Voltage Range VoR
4.11.1 Purpose
The voltage range value obtained within the time range for the specified output voltage to be established. 4.11.2 Test Schematic Diagram
The schematic diagram of the start-up voltage test is shown in Figure 12. 11
4.11.3 Test Conditions
GB/T4377—1996
During the test, the following test conditions shall comply with the provisions of the detailed specifications: a.
Ambient or reference point temperature;
Input voltage,
Switching time of switch S;
Reading pulse time;
Load network (providing the required output current); other external networks (when applicable).
Test Procedure
At the specified ambient temperature, connect the device under test to the test system. Apply the specified DC input voltage V1 to the input terminal of the device under test. 4.11.4.2
Determine the closing time of switch S and the reading pulse time. 4.11.4.3
4.11.4.4 Read the output voltage value Von within the specified time range. 4.12 Thermal Regulation S
4.12.1 Purpose
Measure the change in the output voltage of the device under test caused by the applied power within the specified time to determine the thermal regulation. 4.12.2 Test Schematic
The thermal regulation test schematic is shown in Figure 13a; the waveform is shown in Figure 13b. N
Figure 13a
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