title>HG/T 2617-1994 Determination method of film base tangent value - HG/T 2617-1994 - Chinese standardNet - bzxz.net
Home > HG > HG/T 2617-1994 Determination method of film base tangent value
HG/T 2617-1994 Determination method of film base tangent value

Basic Information

Standard ID: HG/T 2617-1994

Standard Name: Determination method of film base tangent value

Chinese Name: 片基正切值测定方法

Standard category:Chemical industry standards (HG)

state:in force

Date of Implementation:1995-01-01

standard classification number

Standard ICS number:Imaging Technology >> 37.040 Photographic Technology

Standard Classification Number:Chemicals>>Information Chemicals>>G81 Photosensitive Materials

associated standards

Publication information

other information

Introduction to standards:

HG/T 2617-1994 Determination method of film base tangent value HG/T2617-1994 standard download decompression password: www.bzxz.net

Some standard content:

Chemical Industry Standard of the People's Republic of China
HG /T 2617 —94
Determination method of film base tangent
1994-04-13 Issued
Ministry of Chemical Industry of the People's Republic of China
Implementation on 1995-01-01
Chemical Industry Standard of the People's Republic of China
Determination method of film base tangent
Title Content and scope of application
This standard specifies the determination method of film base tangent. This standard is applicable to cellulose triacetate film base and cellulose ester film base. 2 Terminology
HG /T 2617 94
2.1 Tangent value of film base
After the wide film base is cut longitudinally, the vertical distance of the film base edge deviating from the straight line at a certain length is measured, which is called the film base tangent value. This is used to quantitatively evaluate the degree of deformation of the film base caused by uneven internal stress. 3 Method summary
Cut the remaining wide film of specified length longitudinally into 1/2 and 1/4 width samples. The sample is relaxed to the maximum extent and flattened. At this time, the embossed side edge of the base will present a curve to varying degrees. The distance of the embossed side edge of the base from the straight line is measured at the specified length position. This value is used to indicate the degree of deformation of the base. Test equipment
As shown in Figure 1. The test bench is 3.1 meters long and 1.0 to 1.2 meters wide. The surface is flat and smooth. Graduation line
Reference line
Figure 1 Tangent value test bench
Graduation line
0021-0001
The reference line is parallel to the long side of the test bench and is 50mm away from the edge of the test bench. The pin used for positioning is located at the midpoint of the reference line and is tangent to the reference line. There is a scale line perpendicular to the reference line on both sides of the reference line at 1.27m away from the pin. The graduation value is 1mm. The scale value at the intersection of the scale line and the reference line is zero. The value is positive toward the inside of the test bench and negative in the opposite direction. Approved by the Ministry of Chemical Industry of the People's Republic of China on April 13, 1994, and implemented on January 1, 1995
5 Test steps
HG/T2617-94
5.1 Remove the outermost circle of the large axis film base, pull out the film base, and mark the left and right sides of the film base near the lace on it as shown in Figure 2, and take a 3.0m long whole film base as the sample.
5.2 The sample should be balanced for 24 hours at a temperature of 20±5℃ and a relative humidity of 50%±10%, and tested under the same conditions.
Put the film base surface facing up and flat on the test bench, and cut the film base sample longitudinally from the center to obtain two 1/2 width samples.
Bottom surface
Figure 2 Film base direction
Direction of film base pulling out
5.4 Take one of the samples and place it on the test bench, so that the edge of the embossed side is close to the pin on the reference line near the midpoint, and the length of the sample is basically parallel to the reference line.
5.5 Hold the film next to the pin with one hand to prevent it from sliding freely: use the other hand (wearing fine yarn gloves) or a soft brush to brush the sample flat in all directions with the pin as the center, brush at least four times to make the sample as flat as possible. 5,6 Record the difference between the edge of the embossed side and the two scale lines The reading of the intersection, i.e. the value of the film base edge deviating from the reference line, is in meters, and is taken to one decimal place, as shown in Figure 3.
Film base sample
Scale line
Embossed edge
Measurement position
Figure 3 Schematic diagram of tangent value measurement
5.7 Reposition the sample, and repeat the test twice according to the operation steps of 5.4 to 5.6, reference line
5.8 Cut the 1/2 width sample into two 1/4 width samples from the center longitudinally, and take the 1/4 width sample with the embossed edge and repeat 5. 4 ~ 5. 7 Operation,
5. 9 Repeat 5.4 ~ 5.8 operations for another 1/2 width sample, 6 Test data processing
HG / T 2617 — 94
6.1 Calculate the algebraic sum of the deviation values ​​measured on both sides of the pin for each sample, which is the test value of the sample, 6.2 The arithmetic mean of the three tests is the tangent value of the sample. 7 Test result evaluation
During the manufacturing process, the film base causes uneven internal stress distribution due to factors such as stretching and heat setting. It deforms and causes the film base to be cut longitudinally. The edge of the film base deviates from linearity: the measurement result is a positive value, indicating that the film base is tight in the middle and loose at the two edges, and a negative value indicates that the middle is loose and the edges are too tight. The larger the absolute value of the tangent value, the greater the deformation caused by uneven internal stress of the film base. The tangent values ​​of the 1/2 sample and the 1/4 sample respectively represent the deformation conditions of different parts of the film base. 8. Need for repeatability of the method
The same sample shall be measured multiple times (not less than 10 times) according to the method of this standard, and the standard deviation of the measurement results shall be less than 1.0. Test report
The test report shall include the following contents:
Sample name, specification, machine number, axis number, manufacturer; b. Test date:
c. Test conditions:
d. Test data and calculation results of left and right 1/2 samples and 1/4 samples; description of abnormal phenomena found in the test; f. Test personnel.
Additional instructions:
This standard was proposed by the Technical Supervision Department of the Ministry of Chemical Industry of the People's Republic of China, and this standard is under the jurisdiction of the First Film Factory of China Lucky Film Company. This standard was drafted by Xiamen Fuda Photosensitive Materials Co., Ltd., and Wuxi Film Factory and Shanghai Photosensitive Film Factory participated in the drafting. The main drafters of this standard are Gao Yuan, Xie Qingyao, Ding Ying, and Fang Jianguo. People's Republic of China
Chemical Industry Standard
Determination Method of Film Tangent
HG/T2617-94
Editorial Department of Chengji Chemical Industry Standard
(Institute of Standardization, Ministry of Chemical Industry)
Postal Code: 100011
Printing Institute of Standardization, Ministry of Chemical Industry
Copyright reserved. No Reproduction
Format 880×12301/16 Number of Words on a Printing Sheet 6000 First Edition in December 1994
First Printing in December 1994bzxz.net
Print Quantity 1 — 500
Book Fee 1,90 Yuan
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.