title>GB/T 3389.2-1999 Test methods for properties of piezoelectric ceramic materials Static test of longitudinal piezoelectric strain constant d33 - GB/T 3389.2-1999 - Chinese standardNet - bzxz.net
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GB/T 3389.2-1999 Test methods for properties of piezoelectric ceramic materials Static test of longitudinal piezoelectric strain constant d33
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Standard ID:
GB/T 3389.2-1999
Standard Name: Test methods for properties of piezoelectric ceramic materials Static test of longitudinal piezoelectric strain constant d33
Standard Classification Number:Electronic Components and Information Technology>>Special Materials, Parts, and Structural Components for Electronic Equipment>>Special Materials for L90 Electronic Technology
This standard specifies the static test method for the longitudinal piezoelectric strain constant d33 of piezoelectric ceramic materials. This standard applies to the static test of the longitudinal piezoelectric strain constant d33 of piezoelectric ceramic materials. GB/T 3389.2-1999 Piezoelectric ceramic material performance test method Static test of longitudinal piezoelectric strain constant d33 GB/T3389.2-1999 Standard download decompression password: www.bzxz.net
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UDC621.315.612-79 National Standard of the People's Republic of China GB3389.2--82 Test methods for the properties ofpiezoelectric ceramics Static test for piezoelectric strain constant d33Test methods for the properties ofpiezoelectric ceramics Static test for piezoelectric strain constant ds319821230Promulgated National Standard Approved Implementation on 11-01-1983 WNational Standard of the People's Republic of China Test methods for the properties ofplezoelectric ceramics Static test for piezoelectric str ain constant desThis standard applies to the static test of the longitudinal piezoelectric strain constant ds: of piezoelectric ceramic materials. 1 Table of terms and symbols UDC621.315.612 GB 338#.2-82 The definitions of terms used in this standard can be found in GB3389.1-82 "Terms and symbols for testing methods of piezoelectric ceramic materials". The symbols, names and units used in this standard are shown in the table below. No. Test principle Parallel capacitance Self-capacitance of sample Potential grid Longitudinal piezoelectric strain constant Applied to the sample Short-circuit switch Charge generated in the sample after pressure release External electric stop Voltage measured by electrometer (S1 system) C/N or m/v When there is no external electric field, the electrical short-circuit condition is met, and the force is applied along the polarization direction, the linear positive electric equation can be simplified to: De = dsT Published by the National Bureau of Standards on December 30, 1982 +++++++++ (+ ) 1983-11-01 W: 1,--electric displacement constant, C/n2 GB 3389.2--82 -longitudinal compressive strength constant, C/N or m/V T, longitudinal stress, N/em. When the force-bearing area of the specimen is equal to the charge-releasing area, and the capacitance C connected to the specimen is much larger than the free capacitance C of the specimen, formula (1) can be written as follows: 3 Test conditions das“normal the charge generated by the specimen after the force is released, C, the force applied to the specimen during the test, N, parallel capacitance, F: the voltage measured by the electrometer, V. 3.1 Environmental conditions Normal test atmospheric conditions; 20 ~ 30 ℃ Standard atmospheric conditions for test: 25 ± 1 t 3.2 Specimen requirements Relative saturation 45%~75% Relative saturation 48% ~ 52% 86 106kPa 86~106kPa On both sides of the sample, a metal layer is completely covered as an electrode, and polarization treatment is performed along the thickness direction. The surface of the sample should be flat. The width of the main plane should not exceed half of the thickness. 3.3 Preparation of samples before testing The sample should be kept clean and dry. According to different ceramic materials, the storage time after polarization should be asked, and the test should be carried out after two hours under the environmental conditions specified in this standard. 4 Test method Method 4.1 Test circuit The test circuit is shown in the figure below. 1 Electrometer: 2,6-the base of the pressurizing device, 3.5-the upper and lower electrodes of the pressurizing device, 4-the sample, the central parallel capacitor, K-short circuit and closed; F,-the force applied to the sample 2Www.bzxZ.net WGB3389.2-82 4.2 Test equipment and requirements Electrometer: the sensitivity is not less than 10.1mV, the input impedance is greater than 1010α measurement error The difference is less than 5%. Parallel capacitor: The capacitor C is more than 100 times the capacitance of the sample. Adding device: It should be able to slowly pressurize and quickly release. The pressure should be vertical! The surface of the sample, and the sample will not move sideways during release. The size of the electrode must be large enough to cover the silver layer of the sample, and the positive force error should not be greater than 1%. Requirements for the entire test system: The insulation resistance of the entire test system should be less than J101\, the hydrogen circuit should be in good contact, the test line should be connected with a braided wire, and the grounding should be kept good. 4.3 Test Test step Put the sample in the center of the upper and lower lead electrodes shown in the figure, close the short-circuit switch K, slowly increase the stress on the sample to 1×101kg/m~1×1nskgm, calibrate the zero point of the electrode, disconnect the short-circuit switch, quickly release the force F3, and record the stable reading of the voltage V on the electrostatic electrode. Calculation of longitudinal piezoelectric strain constant Measure the voltage V according to 4.3, and calculate the longitudinal electric strain constant d* using formula (2). 3 WGB 3389.2.-82 Appendix A Schematic diagram of pressurizing device (See special part) Figure A Schematic diagram of pressurizing device 1-spindle?2-ball bearing, 3-braiding wheel, 4-positioning sleeve, 5-spherical pull rod: 6-pull rod library: 7-drop code, 8--missing code disk, 9-upper plate component, 10-lower electrode component: 11-middle container box, 12 micro switch +13-cam: 11-bracket component 15-handle component: 16-adjusting water half screw component, 17-sample E WAdditional instructions: GB33B9.2-82 This standard was proposed by the Standardization Research Institute of the Ministry of Electric Power Industry. This standard was drafted by the Shan 212 Institute. The main drafter of this standard is Zhang Caili. 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