title>Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level E - SJ 2746-1987 - Chinese standardNet - bzxz.net
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Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level E
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Standard ID:
SJ 2746-1987
Standard Name:Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level E
SJ 2746-1987 Detailed specification for electronic devices Power fixed resistors RXG1 type Power wirewound resistors Assessment level E SJ2746-1987 standard download decompression password: www.bzxz.net
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Ministry of Electronics Industry of the People's Republic of China Standard SJ2746-87 Detailed specification for electronic components Power fixed resistors RXG1 type power wirewound resistors Assessment level E Published on January 9, 1987 Implemented on October 10, 1987 The Ministry of Electronics Industry of the People's Republic of China issued the Ministry of Electronics Industry of the People's Republic of China Standardized detailed specification for electronic components RXG1 type power wirewound resistors China Electronics Technology Standardization Institute Quality assessment of electronic components shall be in accordance with GB5729-85 Fixed resistors for electronic equipment Part 1 General specification (Other forms are allowed within the specified size range) SJ2746-87 SJ2746—87 GB5733—85 IEC115-4—1 RXG1 power type Wirewound resistor Non-insulated enamel coating Assessment level: E Stability grade: 5% The valid data of resistors qualified according to this detailed specification are given in the list of qualified products. Ministry of Electronics Industry of the People's Republic of China Issued on January 9, 1987 and implemented on October 1, 1988 1 General data 1.1 Recommended installation method SJ2746—87 Chapter 1 General data Resistors should be installed in the normal way. The distance between the resistor body and the installation point should be 6±1m. t.2: Dimensions, ratings and characteristics Rated at 70℃Rated temperature coefficient at 25℃αElement limiting voltage (DC variety HI, HG Power consumption (W) Power consumption (W) (10\ LI, LG MJ, MG NJ, NG /C) or A·C effective value) (V) All dimensions are in mm. Maximum size (See Note ②) For RXG1 type resistors with a power of 2.5W, the lead diameter is allowed to be 0.6 to 0.05. In the quality certification application , the places where the diameter of 0.6 is allowed to be used should be explained so that it can be included in the list of qualified products. Resistance range" Nominal resistance tolerance Climate category Low pressure Stability grade Resistance change limit: Long-term test Short-term test Temperature coefficient α: 1 to 50k ±1%, ±2%, ±5%, ±10% 55/200/56 390m/s* 10~500Hz 4000±10 times 0.75mm or 98m/s 8.5kPa(85bar) ±(5%R+0.1Q) ±(1%R+0.05)||tt ||10≤R is ±200×10-8/℃ 102>R≥59 is ±400×10~/℃ 52>R is not specified 245℃ ·The preferred value is the E24 series of IEC63. 1.2.1 Power reduction SJ2746—87 The resistors involved in this specification shall reduce power consumption according to the following curve: 116 1.3 Related documents Environmental benefits GB5729—85 (IEC115—1) Fixed resistors for electronic equipment Part 1: General specification GB5732—85 (IEC115—4) Fixed resistors for electronic equipment Part 4: Sectional specification: Power type fixed resistors Resistors 1.4 Marking The marking of components and packaging shall comply with the requirements of Article 2.4 of GB5729-85. The certification mark shall be clearly shown on the packaging. 1.4.1 The marking on the resistor shall include the following: nominal resistance; Nominal resistance allowable deviation: Year and month of manufacture. The following contents shall be clearly marked on the packaging of the resistor: a. Nominal resistance, Nominal resistance allowable deviation Year and month of manufacture; Detailed specification number and variety mark, Manufacturer's name or trademark. 1.5 Ordering data Orders for resistors of this specification should be listed in general text or code form. The following minimum contents shall be given: a. Nominal resistance value, b. Permissible deviation of nominal resistance value, c. Detailed specification number and version number and variety mark. 1.6 Qualification test record When the ordering party has a requirement, the content and format of the qualification test record shall be agreed upon by the ordering party and the manufacturer. 1.7 Additional contents (not for inspection) 1.7.1 If it is necessary to bend the lead wire; the bending point shall be no less than 2mm from the lead wire exit of the resistor, and the bending radius shall be no less than the diameter of the lead wire. SJ2746-87 1.7.2 If the resistor is mounted on a printed circuit board, precautions shall be taken to avoid damage to the circuit board due to the heating of the resistor. 1.8 For the additional contents of the general specification and the sub-specification, the solvent resistance shall be in accordance with GB2423.30-82 method 2, and this test shall be included in the Cs group of the C group test. Chapter 2 Inspection requirements 2 Inspection requirements 2,1 Procedure 2,1.1 The identification and approval procedure shall comply with the provisions of Article 3.2 of the sub-specification GB5732-85. 2.1.2 Quality consistency inspection, the inspection list (Table 2) includes sampling, cycle, severity and requirements, and Article 3.3.1 of the sub-specification stipulates the composition of the inspection batch. Note: When drying is required, Procedure 1 of Article 4.3 of the general specification GB572985 shall be adopted. Qiu 2 Note, ① Except for the resistance change requirements which are selected from Tables 1 and 2 of the sub-specification GB5732-85, the clause numbers of the test items and performance requirements are quoted from the general specification GB5729-85. ② Inspection level (IL) and qualified quality level (AQL) are selected from IEC410 "Sampling plan and procedure for inspection by attributes". ?Table: p--cycle, month nsample size C--qualified number (allowable number of unqualified products: D--destructive ND--non-destructive IL--inspection level clause number and test items (see note?) Group A inspection (batch by batch) A1 grouping 4.4,1 appearance inspection qualified quality level IEC410||tt ||Test conditions (See Note ①) (See Note ②) Performance requirements (See Note ①) Marking is clear and in accordance with 1.4 of this specification Clause number and test items (See Note @) A2 Grouping 4.4.2 Dimensions (Regulatory inspection) 4.5 Resistance Group B inspection (batch by batch) 4.17 Solderability 4.1 6. Strength of lead terminals 4.13. Overload SJ2746-87 Continued Table 2 Test strip (See Note?) Use Non-aging Slot welding method: Temperature: 235℃±5℃ Time, 2±0.5S Immersion depth: Should be R-0.5mm from the root of the lead Tension force 10N, 20N| |tt||Appearance inspection See sub-specification GB573285 Appearance inspection (See Note ②) Performance requirements (See Note ④) According to the provisions of Table 1 of this specification Good tinning should be manifested as solder free flow no visible damage △R<±(1%R+0.05) no visible damage, clear marking AR<±(1%R+0.050) Clause number and test items (See Note?) Group C inspection (cycle) Group C1A (half of the sample of Group C1) 4.16. Terminal strength 4.18. Resistance to soldering heat Group C1B (the other half of the sample of Group C1 ) 4.19. Rapid temperature change 4.20 Magnetic transfer SJ 2746-87 Continued 2 Test conditions (See Note ①) Tensile force: 10N, 20N Sample size and qualified judgment number (See Note ③) Bending: (number of terminals Twisting: (number of terminals other half) Appearance inspection: Resistance value, IEC68-2-20 (1979) Test Tb, method 1A Trough temperature, 260±5 Time: 10±1S Penetration depth, distance from the terminal Wire root Appearance inspection: e: -55℃ 8g+200℃ Appearance inspection See 1.1 of this specification for installation Acceleration, 390m/S* Total number of magnetic field: 4000 Performance requirements (See Note ①) No visible damage △R<±(1%R+0.05Q) No visible damage, clear marking △R≤±(1%R+0.05) No visible damage △R<±(1%R±0.050)||t t||Clause number and test items (See Note?) 4.21. Shock 4.22. Vibration C1 group (C1A and C1B Overall of group samples) 4,23. Climate sequence One cycle of damp heat Test D First cycle Low pressure One cycle of damp heat SJ2746-B7 Continued Table 2 Test conditions (See Note ④) Appearance inspection Installation See 1.1 of this specification Acceleration: 49 0m/Ss Pulse duration: Pulse waveform, half sine wave Appearance inspection See 1.1 of this specification for installation Amplitude: 0.75mm or acceleration 98m/S (whichever is smaller) Total duration, 6h Appearance inspection Sample size and qualified judgment number (See Note ③) Performance requirements (Note not required) No visible damage AR<±(1%R+0.05Q) No visible damage △R≤±(1% R+0.050) No visible damage △R<+(1%R+0.059) Clause number and test items (See Note?) Test D, the rest C2 group 4.25.2. Room temperature durability C3 group 4.8. Resistance value changes with temperature Solvent resistance D group test (cycle) D1 group SJ2746-87 Continued Table 2 Test conditions (See Note①) Appearance inspection Duration, 1000h Sample size and number of food grid judgments (See Note ③) Inspect at 48, 500 and 1000h: Appearance inspection: It is recommended that the manufacturer extend the test to 8000h every year. Inspect at 2000, 4000 and 8000 55℃/20 20/200℃ According to GB2423.30-82 Method 2 Performance requirements (See Note ④) No visible damage, clear markings|| tt||△R≤±(5%R+0.19) No visible damage AR<±(5%R+0.1Q) △R<±(10%R+0.2Q) (The result is for reference only) α±200×10-/℃ 5~<102 α±400×10-0/℃ <59Not specified Marking does not fall off Clause number and test items (See Note@) 4.24. Steady-state damp heat D2 group 4.14 Temperature rise||t t||D3 grouping 4.4.3. Dimensions (detailed) 4.25.3. Upper limit category Temperature durability Additional instructions: SJ2746--87 Continued Table 2 Test conditions (See Note ④) 10 samples in the first group 10 samples in the second group Appearance inspection Duration: 1000h Inspect at 48h, 500h and 1000h Appearance inspection This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Factory 795 and other units. Sample size and qualified judgment number (see note ③) The main drafters of this standard are Han Changsheng, Guo Xiubao and Xing Guojiang. n Performance requirements (see note?) No visible damage. Clear marking AR<±(5%R+0.1Q) 245℃ According to Table 1 of this specification No visible damage AR≤±(5%R+0.19)75mm or acceleration 98m/s (whichever is smaller) Total duration, 6h Appearance inspection Sample size and qualified judgment number (See Note ③) Performance requirements (Exempt from note) No visible damage AR<±(1%R+0.05Q) No visible damage △R≤±(1%R+0.050) No visible damage △R<+(1%R+0.059) Clause number and test items (See Note?) Test D, the rest C2 group 4.25.2. Room temperature durability C3 group 4.8. Resistance value changes with temperature Solvent resistance Group D test (cycle) D1 group SJ2746-87 Continued Table 2 Test conditions (See Note ①) Appearance inspection Duration, 1000h Sample size and number of grid judgments (See Note ③) Inspect at 48, 500 and 1000h: Appearance inspection: It is recommended that the manufacturer extend the test to 8000h every year. Inspect at 2000, 4000 and 8000 55℃/20||t t||20/200℃ According to GB2423.30-82 Method 2 Performance requirements (See Note ④) No visible damage, Clear marking △R≤±(5%R+0.19) No visible damage AR<±(5%R+0.1Q) △R<±(10%R+0.2Q) (The results are for reference only) α±200×10-/℃ 5~<102 α±400×10-0/℃ <59Not specified Marking does not fall off Clause number and test items (See Note @)|| tt||4.24. Steady-state damp heat D2 group 4.14 Temperature rise D3 group 4.4.3. Dimensions (detailed) 4.25.3. Upper limit category Temperature durability Additional instructions: SJ2746--87 Continued Table 2 Test conditions (See Note ④) 10 samples in the first group 10 samples in the second group Appearance inspection Duration: 1000h Inspect at 48h, 500h and 1000h Appearance inspection This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Factory 795 and other units. Sample size and qualified judgment number (see note ③) The main drafters of this standard are Han Changsheng, Guo Xiubao and Xing Guojiang. n Performance requirements (see note?) No visible damage. Clear marking AR<±(5%R+0.1Q) 245℃ According to Table 1 of this specification No visible damage AR≤±(5%R+0.19)75mm or acceleration 98m/s (whichever is smaller) Total duration, 6h Appearance inspection Sample size and qualified judgment number (See Note ③) Performance requirements (Exempt from note) No visible damage AR<±(1%R+0.05Q) No visible damage △R≤±(1%R+0.050) No visible damage △R<+(1%R+0.059) Clause number and test items (See Note?) Test D, the rest C2 group 4.25.2. Room temperature durability C3 group 4.8. Resistance value changes with temperature Solvent resistance Group D test (cycle) D1 group SJ2746-87 Continued Table 2 Test conditions (See Note ①) Appearance inspection Duration, 1000h Sample size and number of grid judgments (See Note ③) Inspect at 48, 500 and 1000h: Appearance inspection: It is recommended that the manufacturer extend the test to 8000h every year. Inspect at 2000, 4000 and 8000 55℃/20||t t||20/200℃ According to GB2423.30-82 Method 2 Performance requirements (See Note ④) No visible damage, Clear marking △R≤±(5%R+0.19) No visible damage AR<±(5%R+0.1Q) △R<±(10%R+0.2Q) (The results are for reference only) α±200×10-/℃ 5~<102 α±400×10-0/℃ <59Not specified Marking does not fall off Clause number and test items (See Note @)|| tt||4.24. Steady-state damp heat D2 group 4.14 Temperature rise D3 group 4.4.3. Dimensions (detailed) 4.25.3. Upper limit category Temperature durability Additional instructions: SJ2746--87 Continued Table 2 Test conditions (See Note ④) 10 samples in the first group 10 samples in the second group Appearance inspectionwww.bzxz.net Duration: 1000h Inspect at 48h, 500h and 1000h Appearance inspection This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Factory 795 and other units. Sample size and qualified judgment number (see note ③) The main drafters of this standard are Han Changsheng, Guo Xiubao and Xing Guojiang. n Performance requirements (see note?) No visible damage. Clear marking AR<±(5%R+0.1Q) 245℃ According to Table 1 of this specification No visible damage AR≤±(5%R+0.19) Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.