title>Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level E - SJ 2746-1987 - Chinese standardNet - bzxz.net
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Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level E

Basic Information

Standard ID: SJ 2746-1987

Standard Name:Detail specification for electronic components-Fixed power resistors-Fixed wirewound power resistors for Type RXG1 Assessment level E

Chinese Name: 电子器件详细规范 功率型固定电阻器 RXG1型功率型线绕电阻器 评定水平E

Standard category:Electronic Industry Standard (SJ)

state:in force

Date of Release1987-01-09

Date of Implementation:1987-10-01

standard classification number

Standard ICS number:L13

Standard Classification Number:General>>Standardization Management and General Provisions>>A01 Technical Management

associated standards

Publication information

publishing house:Electronic Industry Press

Publication date:1987-09-01

other information

Review date:2017-05-12

drafter:Han Changsheng, Guo Xiubao, Xing Guojiang

Drafting unit:795 Factory and other units

Focal point unit:Standardization Institute of the Ministry of Electronics Industry

Publishing department:Ministry of Electronics Industry of the People's Republic of China

Introduction to standards:

SJ 2746-1987 Detailed specification for electronic devices Power fixed resistors RXG1 type Power wirewound resistors Assessment level E SJ2746-1987 standard download decompression password: www.bzxz.net



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Ministry of Electronics Industry of the People's Republic of China Standard SJ2746-87
Detailed specification for electronic components
Power fixed resistors
RXG1 type power wirewound resistors
Assessment level E
Published on January 9, 1987
Implemented on October 10, 1987
The Ministry of Electronics Industry of the People's Republic of China issued the Ministry of Electronics Industry of the People's Republic of China Standardized detailed specification for electronic components
RXG1 type power wirewound resistors
China Electronics Technology Standardization Institute
Quality assessment of electronic components shall be in accordance with GB5729-85 Fixed resistors for electronic equipment Part 1 General specification
(Other forms are allowed within the specified size range) SJ2746-87
SJ2746—87
GB5733—85
IEC115-4—1
RXG1 power type
Wirewound resistor
Non-insulated enamel coating
Assessment level: E
Stability grade: 5%
The valid data of resistors qualified according to this detailed specification are given in the list of qualified products. Ministry of Electronics Industry of the People's Republic of China Issued on January 9, 1987 and implemented on October 1, 1988
1 General data
1.1 Recommended installation method
SJ2746—87
Chapter 1 General data
Resistors should be installed in the normal way. The distance between the resistor body and the installation point should be 6±1m. t.2: Dimensions, ratings and characteristics
Rated at 70℃Rated temperature coefficient at 25℃αElement limiting voltage (DC variety
HI, HG
Power consumption (W)
Power consumption (W)
(10\
LI, LG
MJ, MG
NJ, NG
/C) or A·C effective value) (V)
All dimensions are in mm.
Maximum size
(See Note ②)
For RXG1 type resistors with a power of 2.5W, the lead diameter is allowed to be 0.6 to 0.05. In the quality certification application
, the places where the diameter of 0.6 is allowed to be used should be explained so that it can be included in the list of qualified products. Resistance range"
Nominal resistance tolerance
Climate category
Low pressure
Stability grade
Resistance change limit:
Long-term test
Short-term test
Temperature coefficient α:
1 to 50k
±1%, ±2%, ±5%, ±10%
55/200/56
390m/s*
10~500Hz
4000±10 times
0.75mm or 98m/s
8.5kPa(85bar)
±(5%R+0.1Q)
±(1%R+0.05)||tt ||10≤R is ±200×10-8/℃
102>R≥59 is ±400×10~/℃
52>R is not specified
245℃
·The preferred value is the E24 series of IEC63.
1.2.1 Power reduction
SJ2746—87
The resistors involved in this specification shall reduce power consumption according to the following curve: 116
1.3 Related documents
Environmental benefits
GB5729—85 (IEC115—1) Fixed resistors for electronic equipment Part 1: General specification GB5732—85 (IEC115—4) Fixed resistors for electronic equipment Part 4: Sectional specification: Power type fixed resistors Resistors
1.4 Marking
The marking of components and packaging shall comply with the requirements of Article 2.4 of GB5729-85. The certification mark shall be clearly shown on the packaging. 1.4.1 The marking on the resistor shall include the following: nominal resistance;
Nominal resistance allowable deviation:
Year and month of manufacture.
The following contents shall be clearly marked on the packaging of the resistor: a.
Nominal resistance,
Nominal resistance allowable deviation
Year and month of manufacture;
Detailed specification number and variety mark,
Manufacturer's name or trademark.
1.5 Ordering data
Orders for resistors of this specification should be listed in general text or code form. The following minimum contents shall be given: a. Nominal resistance value,
b. Permissible deviation of nominal resistance value,
c. Detailed specification number and version number and variety mark. 1.6 Qualification test record
When the ordering party has a requirement, the content and format of the qualification test record shall be agreed upon by the ordering party and the manufacturer. 1.7 Additional contents (not for inspection)
1.7.1 If it is necessary to bend the lead wire; the bending point shall be no less than 2mm from the lead wire exit of the resistor, and the bending radius shall be no less than the diameter of the lead wire.
SJ2746-87
1.7.2 If the resistor is mounted on a printed circuit board, precautions shall be taken to avoid damage to the circuit board due to the heating of the resistor.
1.8 For the additional contents of the general specification and the sub-specification, the solvent resistance shall be in accordance with GB2423.30-82 method 2, and this test shall be included in the Cs group of the C group test. Chapter 2
Inspection requirements
2 Inspection requirements
2,1 Procedure
2,1.1 The identification and approval procedure shall comply with the provisions of Article 3.2 of the sub-specification GB5732-85. 2.1.2 Quality consistency inspection, the inspection list (Table 2) includes sampling, cycle, severity and requirements, and Article 3.3.1 of the sub-specification stipulates the composition of the inspection batch. Note: When drying is required, Procedure 1 of Article 4.3 of the general specification GB572985 shall be adopted. Qiu 2
Note, ① Except for the resistance change requirements which are selected from Tables 1 and 2 of the sub-specification GB5732-85, the clause numbers of the test items and performance requirements are quoted from the general specification GB5729-85. ② Inspection level (IL) and qualified quality level (AQL) are selected from IEC410 "Sampling plan and procedure for inspection by attributes". ?Table:
p--cycle, month
nsample size
C--qualified number (allowable number of unqualified products: D--destructive
ND--non-destructive
IL--inspection level
clause number and test items
(see note?)
Group A inspection (batch by batch)
A1 grouping
4.4,1 appearance inspection
qualified quality level
IEC410||tt ||Test conditions
(See Note ①)
(See Note ②)
Performance requirements
(See Note ①)
Marking is clear and in accordance with
1.4 of this specification
Clause number and test items
(See Note @)
A2 Grouping
4.4.2 Dimensions
(Regulatory inspection)
4.5 Resistance
Group B inspection (batch by batch)
4.17 Solderability
4.1 6. Strength of lead terminals
4.13. Overload
SJ2746-87
Continued Table 2
Test strip
(See Note?)
Use
Non-aging
Slot welding method:
Temperature: 235℃±5℃
Time, 2±0.5S
Immersion depth: Should be R-0.5mm from the root of the lead
Tension force 10N, 20N| |tt||Appearance inspection
See sub-specification GB573285
Appearance inspection
(See Note ②)
Performance requirements
(See Note ④)
According to the provisions of Table 1 of this specification
Good tinning should be manifested as solder
free flow
no visible damage
△R<±(1%R+0.05)
no visible damage, clear marking
AR<±(1%R+0.050)
Clause number and test items
(See Note?)
Group C inspection (cycle)
Group C1A
(half of the sample of Group C1)
4.16. Terminal strength
4.18. Resistance to soldering heat
Group C1B (the other half of the sample of Group C1
)
4.19. Rapid temperature change
4.20 Magnetic transfer
SJ 2746-87
Continued 2
Test conditions
(See Note ①)
Tensile force: 10N, 20N
Sample size and qualified judgment number
(See Note ③)
Bending: (number of terminals
Twisting: (number of terminals
other half)
Appearance inspection:
Resistance value,
IEC68-2-20 (1979)
Test Tb, method 1A
Trough temperature, 260±5
Time: 10±1S
Penetration depth, distance from the terminal Wire root
Appearance inspection:
e: -55℃
8g+200℃
Appearance inspection
See 1.1 of this specification for installation
Acceleration, 390m/S*
Total number of magnetic field: 4000
Performance requirements
(See Note ①)
No visible damage
△R<±(1%R+0.05Q)
No visible damage, clear marking
△R≤±(1%R+0.05)
No visible damage
△R<±(1%R±0.050)||t t||Clause number and test items
(See Note?)
4.21. Shock
4.22. Vibration
C1 group (C1A and C1B
Overall of group samples)
4,23. Climate sequence
One cycle of damp heat
Test D First cycle
Low pressure
One cycle of damp heat
SJ2746-B7
Continued Table 2
Test conditions
(See Note ④)
Appearance inspection
Installation See 1.1 of this specification
Acceleration: 49 0m/Ss
Pulse duration:
Pulse waveform, half sine wave
Appearance inspection
See 1.1 of this specification for installation
Amplitude: 0.75mm or acceleration
98m/S (whichever is smaller)
Total duration, 6h
Appearance inspection
Sample size and qualified judgment number
(See Note ③)
Performance requirements
(Note not required)
No visible damage
AR<±(1%R+0.05Q)
No visible damage
△R≤±(1% R+0.050)
No visible damage
△R<+(1%R+0.059)
Clause number and test items
(See Note?)
Test D, the rest
C2 group
4.25.2. Room temperature durability
C3 group
4.8. Resistance value changes with temperature
Solvent resistance
D group test (cycle)
D1 group
SJ2746-87
Continued Table 2
Test conditions
(See Note①)
Appearance inspection
Duration, 1000h
Sample size and number of food grid judgments
(See Note ③)
Inspect at 48, 500 and 1000h:
Appearance inspection:
It is recommended that the manufacturer extend the test to 8000h every year. Inspect at
2000, 4000 and 8000
55℃/20
20/200℃
According to GB2423.30-82 Method 2
Performance requirements
(See Note ④)
No visible damage,
clear markings|| tt||△R≤±(5%R+0.19)
No visible damage
AR<±(5%R+0.1Q)
△R<±(10%R+0.2Q)
(The result is for reference only)
α±200×10-/℃
5~<102
α±400×10-0/℃
<59Not specified
Marking does not fall off
Clause number and test items
(See Note@)
4.24. Steady-state damp heat
D2 group
4.14 Temperature rise||t t||D3 grouping
4.4.3. Dimensions (detailed)
4.25.3. Upper limit category
Temperature durability
Additional instructions:
SJ2746--87
Continued Table 2
Test conditions
(See Note ④)
10 samples in the first group
10 samples in the second group
Appearance inspection
Duration: 1000h
Inspect at 48h, 500h and 1000h
Appearance inspection
This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Factory 795 and other units. Sample size and qualified judgment number
(see note ③)
The main drafters of this standard are Han Changsheng, Guo Xiubao and Xing Guojiang. n
Performance requirements
(see note?)
No visible damage. Clear marking
AR<±(5%R+0.1Q)
245℃
According to Table 1 of this specification
No visible damage
AR≤±(5%R+0.19)75mm or acceleration
98m/s (whichever is smaller)
Total duration, 6h
Appearance inspection
Sample size and qualified judgment number
(See Note ③)
Performance requirements
(Exempt from note)
No visible damage
AR<±(1%R+0.05Q)
No visible damage
△R≤±(1%R+0.050)
No visible damage
△R<+(1%R+0.059)
Clause number and test items
(See Note?)
Test D, the rest
C2 group
4.25.2. Room temperature durability
C3 group
4.8. Resistance value changes with temperature
Solvent resistance
Group D test (cycle)
D1 group
SJ2746-87
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
Duration, 1000h
Sample size and number of grid judgments
(See Note ③)
Inspect at 48, 500 and 1000h:
Appearance inspection:
It is recommended that the manufacturer extend the test to 8000h every year. Inspect at 2000, 4000 and 8000
55℃/20||t t||20/200℃
According to GB2423.30-82 Method 2
Performance requirements
(See Note ④)
No visible damage,
Clear marking
△R≤±(5%R+0.19)
No visible damage
AR<±(5%R+0.1Q)
△R<±(10%R+0.2Q)
(The results are for reference only)
α±200×10-/℃
5~<102
α±400×10-0/℃
<59Not specified
Marking does not fall off
Clause number and test items
(See Note @)|| tt||4.24. Steady-state damp heat
D2 group
4.14 Temperature rise
D3 group
4.4.3. Dimensions (detailed)
4.25.3. Upper limit category
Temperature durability
Additional instructions:
SJ2746--87
Continued Table 2
Test conditions
(See Note ④)
10 samples in the first group
10 samples in the second group
Appearance inspection
Duration: 1000h
Inspect at 48h, 500h and 1000h
Appearance inspection
This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Factory 795 and other units. Sample size and qualified judgment number
(see note ③)
The main drafters of this standard are Han Changsheng, Guo Xiubao and Xing Guojiang. n
Performance requirements
(see note?)
No visible damage. Clear marking
AR<±(5%R+0.1Q)
245℃
According to Table 1 of this specification
No visible damage
AR≤±(5%R+0.19)75mm or acceleration
98m/s (whichever is smaller)
Total duration, 6h
Appearance inspection
Sample size and qualified judgment number
(See Note ③)
Performance requirements
(Exempt from note)
No visible damage
AR<±(1%R+0.05Q)
No visible damage
△R≤±(1%R+0.050)
No visible damage
△R<+(1%R+0.059)
Clause number and test items
(See Note?)
Test D, the rest
C2 group
4.25.2. Room temperature durability
C3 group
4.8. Resistance value changes with temperature
Solvent resistance
Group D test (cycle)
D1 group
SJ2746-87bZxz.net
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
Duration, 1000h
Sample size and number of grid judgments
(See Note ③)
Inspect at 48, 500 and 1000h:
Appearance inspection:
It is recommended that the manufacturer extend the test to 8000h every year. Inspect at 2000, 4000 and 8000
55℃/20||t t||20/200℃
According to GB2423.30-82 Method 2
Performance requirements
(See Note ④)
No visible damage,
Clear marking
△R≤±(5%R+0.19)
No visible damage
AR<±(5%R+0.1Q)
△R<±(10%R+0.2Q)
(The results are for reference only)
α±200×10-/℃
5~<102
α±400×10-0/℃
<59Not specified
Marking does not fall off
Clause number and test items
(See Note @)|| tt||4.24. Steady-state damp heat
D2 group
4.14 Temperature rise
D3 group
4.4.3. Dimensions (detailed)
4.25.3. Upper limit category
Temperature durability
Additional instructions:
SJ2746--87
Continued Table 2
Test conditions
(See Note ④)
10 samples in the first group
10 samples in the second group
Appearance inspection
Duration: 1000h
Inspect at 48h, 500h and 1000h
Appearance inspection
This standard was proposed by the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Factory 795 and other units. Sample size and qualified judgment number
(see note ③)
The main drafters of this standard are Han Changsheng, Guo Xiubao and Xing Guojiang. n
Performance requirements
(see note?)
No visible damage. Clear marking
AR<±(5%R+0.1Q)
245℃
According to Table 1 of this specification
No visible damage
AR≤±(5%R+0.19)
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