SJ 20641-1997 Specification for Indium Antimonide Single Crystal for Infrared Detectors SJ20641-1997 Standard download decompression password: www.bzxz.net

Military Standard of the Electronic Industry of the People's Republic of China FL5971
SJ20641-97
Specification for indium antimonide singlecrystals for used in infrared detectorPublished on June 17, 1997
Implementation on October 1, 1997
Approved by the Ministry of Electronics Industry of the People's Republic of China Military Standard of the Electronic Industry of the People's Republic of China Specification for indium antimonide singlecrystals for used in infrared detector1 Scope
1.1 Subject Content
SJ 20641—97
This specification specifies the requirements for doped and undoped indium single crystals for infrared detectors, quality assurance provisions, delivery preparation and other requirements.
1.2 Scope of application
This specification applies to the direct preparation of indium antimonide single crystals for infrared detectors. 1.3 Classification
1.3.1 Specifications
According to the conductivity type, InSb single crystals can be divided into N-type and P-type. 1.3.2 Model
The model of the terraced single crystal shall comply with the provisions of GJB11296-89 (Nomenclature of infrared detection material models). 2 Referenced documents
GB 11296 - 89
Nomenclature of infrared detection material models
GB 11297.6 - 89
Corrosion display and measurement method of dislocation pits of indium antimonide single crystal GB 11297.7 - 89
GJB 1209 - 91
ZBN 30003 -88
3 Infant request
3.1 Qualification
Test method for resistivity and ear coefficient of antimonide single crystal Test method and procedure for certification of microcircuit production line Packaging of optical parts
Products submitted in accordance with this specification shall be products approved by the certification board or finalized. 3.2 Specifications and dimensions
The specifications and dimensions of single crystals are shown in Table 1
The Ministry of Electronics Industry of the People's Republic of China issued on June 17, 1997 and implemented on October 1, 1997
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3.3 Macroscopic quality
The longest direction
The surface of the single crystal shall be free of cracks, voids and crystal lines. 3.4 Crystal plane and orientation
SI 20641-- 97
Diameter (minor axis)
Crystal plane is (111) or (211). Crystal orientation deviation ≤±13.5 Dislocation pit density (EPD)
EPD<100 pieces/cm2.
3.6 Electrical properties
The electrical properties of the single product are shown in Table 2;
Table 2 Electrical properties of single crystal (77K)
Conductive type
Quality assurance regulations
4.1 Inspection responsibility
Dopant
Non-doped
Carrier concentration
#3×1014
1×106
1×1016
3 × 1014 = 2.0 × 1013
Hall mobility
cmn*/vs
5× 105
5×103
5×103
1× 10s
Length (effective)
Resistivity
23 ×10 2
0.2 ~ 1.3
0.2 ～.3
4 4 × 10 -2 ~
Unless otherwise specified in the contract or order, the contractor shall be responsible for completing all inspections required by this specification. If necessary, the ordering party or the superior appraisal agency has the right to inspect any of the inspection items described in this specification. 4.1.1 Responsibility for Conformity
All products must comply with all requirements of Chapters 3 and 5 of this specification. All inspections specified in this specification shall become an integral part of the contractor's entire inspection system or quality program. If the contract includes inspection requirements not specified in this specification, the contractor shall also ensure that the products submitted for acceptance comply with the contract requirements. Quality conformity inspection does not allow the submission of products that are known to be defective, nor can it require the ordering party to accept defective products. 4.2 Inspection classification
The inspections specified in this specification are divided into:
a. Appraisal inspection;
b. Quality consistency inspection;
4.3 Environmental conditions
Ambient temperature: 15~35;
Relative humidity: 45%~75%!
Atmospheric pressure: 86~106kPa
4.4 Identification and inspection
SJ 20641-97
Identification and inspection shall be carried out before the product is officially put into production. Identification and inspection shall also be carried out when there are major changes in raw materials or manufacturing processes that may affect the identification and inspection results. 4.4.1 Inspection location
The identification inspection shall be carried out in a laboratory approved by the relevant competent authorities. 4.4.2 Inspection samples
The samples should be products manufactured by the equipment and processes normally used in production. The samples for identification inspection should be randomly selected from the total number of identification inspection samples submitted.
4.4.3 Inspection
The items of identification inspection, inspection sequence, number of samples to be tested and the allowable number of unqualified products shall be as specified in Table 3. Table 3 Identification inspection
Inspection items
Specifications and dimensions
Macro quality
Failure surface and orientation
Dislocation corrosion pit density
Electrical characteristics
4.4.4 Determination of non-conformity
Required chapter number
Inspection method chapter number
Number of test samples
Allowed number of non-conforming products
If the test sample passes all the inspections or tests listed in Table 3, the identification inspection is qualified; if one or more of the inspections exceed the allowed number of non-conforming products specified in Table 3, the identification qualification will not be granted. 4.4.5 Maintenance of Qualification
Qualification is maintained through quality consistency inspection. The contractor shall submit a copy of the quality consistency inspection record to the superior appraisal agency once a year as needed. 4.5 Quality consistency inspection
4.5.1 Batch inspection
100% inspection of indium antimonide single crystals shall be carried out on each root. The inspection items and sequence shall be as specified in Table 4. Table 4 Batch inspection
Specifications and dimensions
Macro quality
Dislocation pit density
Electrical properties
Requirements Article number
Inspection method Article number
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4.5.2 Periodic inspection
SI 20641-97
Periodic inspection shall be carried out in accordance with the provisions of Table 5; the number of samples for periodic inspection shall be two; periodic inspection shall be carried out once a year. Table 5 Periodic inspection
Crystal plane and orientation
4.5.3 Unqualified
Chapter number
Inspection method Chapter number
Products that fail the batch inspection shall be eliminated before delivery; if the periodic inspection fails, the contractor shall, based on the guarantee of product quality, submit double samples for re-inspection and notify the ordering party. If the re-inspection still fails, the non-conformity and the measures taken shall be provided to the superior appraisal agency. 4.6 Packaging Inspection
The packaging and marking requirements specified in Chapter 5 shall be inspected by visual inspection. Any transport package that does not meet the requirements of Chapter 5 shall be rejected.
4.7 Inspection method
4.7.1 Specifications and dimensions
The specifications and dimensions of antimony steel single crystals shall be visually inspected using a vernier caliper with a resolution of 0.02 mm and a plastic transparent ruler and shall comply with the requirements of Article 3.2.
4.7.2 Macro quality
The macro quality of single crystals inspected visually or with a 5-10x magnifying glass shall comply with the requirements of Article 3.3. 4.7.3 Electrical properties
Perform according to GB 11297.7 method.
4.7.4 Crystal plane and orientation
4.7.4.1 Test method
Perform according to GJB1209 method 1520
4.7.4.2 Preparation and treatment of test samples
The single crystal grown by the Czochralski method is cut off the head and tail of the pre-shoulder according to the growth direction, and the two symmetrical sides of the remaining effective length are ground off the cutting loss balance layer with M10 abrasive for later use. 4.7.4.3 Result evaluation
The crystal plane and orientation accuracy of the cut surface of a single crystal shall comply with the requirements of 3.4. 4.7.5 Dislocation corrosion pit densitywww.bzxz.net
According to GB 11297.6 method.
5 Delivery preparation
5.1 Packaging and boxing
5.1.1 Packaging
Put the indium antimonide single crystal into a special plastic box. 5.1.2 Boxing
Pack according to the "I level" packaging requirements in Chapter 2 of ZBV30003. If the transportation conditions are good, it can also be packed according to the "II level\ packaging requirements. The packaging box should be equipped with product certificates and test reports. 4
5.2 Transportation
SJ 20641-97
The product can be transported by any auxiliary transportation tools, but anti-impact, anti-vibration and anti-extrusion measures should be adopted to avoid damage to the product due to falling and bumping.
5.2.2 Storage
The product should be stored in a clean, dry and non-corrosive environment. 5.2.3 Marking
5.2.3.1 Outer packaging
The outer packaging box should be marked according to the requirements of Chapter 5 of ZBN30003. 5.2.3.2 Inner packaging
The following information should be indicated on the special inner packaging box of antimonide indium crystal: a. Product name and model;
b: Military mark \J\;
Manufacturing year and month;
d. Product number and production batch number;
Quantity;
f, Contractor Name.
6 Notes
6.1 Intended use
The indium antimonide single crystals specified in this specification are intended for various military application infrared detectors. 6.2 Contents of ordering documents
The following contents shall be stated in the contract or order
b. Name and number of this specification;
b. Model,
c. Dimensions, cutting surface and weight;
d. Quantity:
Packing level:
Other.
Additional notes:
This specification is under the jurisdiction of the China Electronics Technology Standardization Institute. This specification was drafted by the China Electronics Technology Standardization Institute. The main drafters of this specification are Liu Yun and Li Zhaorui. Project code: B55001
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