GB/T 15448-1995 Fixed capacitors for electronic equipment Part 19: Sectional specification Metallized polyethylene terephthalate film dielectric DC chip fixed capacitors
Some standard content:
National Standard of the People's Republic of China
Fixed capacitors for use in electronic equipment
Part 19: Sectional specification-Fixed metallized polyethylene terephthalate film dielectric DC chip capacitors GB/T 15448—1995
IEC 384-19-1993
QC 302200
This standard is equivalent to IEC384-19 (1993) Fixed capacitors for electronic equipment Part 19: Sectional specification: Metallized polyethylene terephthalate film dielectric DC chip fixed capacitors. 1 General
1.1 Scope
This standard applies to metallized electrode polyethylene terephthalate (simple vinegar) dielectric DC chip fixed capacitors for use in electronic equipment. This type of capacitor has metallized connecting pieces or welding pieces and is directly mounted on the substrate of the hybrid circuit or printed circuit board. This type of capacitor may have self-healing properties related to the conditions of use. They are mainly used in situations where the AC component is relatively small relative to the rated voltage. This standard does not include fixed capacitors for suppressing radio interference. Capacitors for suppressing radio interference are included in the TEC38414 standard.
1.2 months
The purpose of this standard is to specify the preferred ratings and properties, and select appropriate quality assessment procedures, tests and measurement methods from GB2693. At the same time, the general characteristic requirements of this type of capacitor are given. The test severity and test requirements specified in the detailed specifications of this sub-specification should be equal to or higher than the performance level of this sub-specification. Reducing the performance level is not allowed. 1.3 Related documents
Priority numbers and priority number systems
GB2471 Nominal resistance series of resistors for electronic equipment and nominal capacity series and allowable deviation series of fixed capacitors GB2693 (IFC3841) Fixed capacitors for electronic equipment Part 1: General specification IEC62 Resistors and capacitors marking code
IEC63 Priority number systems for resistors and capacitors
First revision 1967
Second revision 1977
IEC 68
Basic environmental test procedures
EC410 Counting inspection sampling plan and procedures
QC001001IEC electronic component quality assessment system (1ECQ) basic regulations first revised 1992
QC0010021EC electronic component quality assessment system (IECQ) procedure rules first revised 1992
ISO3 priority number - priority number system
State Administration of Technical Supervision 1995-01-05 Approved 1995-08-01 Implementation
GB/T15448-1995
Note: Except for TFC68, the other standards above adopt the current version. For 1EC68, the version cited in the corresponding test clause of the general specification should be used. 1.4 Narrowness to be specified in the detailed specification
Detailed specifications should be written based on the relevant blank detailed specifications. The requirements of the detailed specification shall not be less stringent than those of the general specification, the sectional specification and the air detail specification. When more stringent requirements are included, they shall be listed in 1.9 of the detailed specification and indicated in the test schedule, such as by an asterisk. Note: For convenience, the contents of 1.4.1 may be given in tabular form. The following contents shall be given in each detailed specification and the specific values shall preferably be selected from the appropriate clauses in the relevant sectional specification. 1.4.1 Outline drawings and dimensions
Outline drawings of capacitors shall be provided for ease of identification and comparison with other capacitors. The detailed specification shall also specify the dimensions and tolerances that affect interchangeability and installation. All dimensions shall preferably be indicated in millimeters. If the original dimensions are given in inches, the converted dimensions shall be supplemented in millimeters.
The length, width and height of the capacitor body shall normally be given. When necessary, for example, when a detailed specification includes recommended items (size and capacitance/voltage range), the dimensions and tolerances shall be placed below the drawing in tabular form. When the outer structure is different from the above structure, the detailed specification shall specify the dimensional content sufficient to describe such capacitors. 1.4.2 Installation
The detailed specification shall give the installation method for normal use. The installation method specified by the test and measurement (when required) shall be consistent with Clause 4.1 of this subspecification.
1.4.3 Ratings and Characteristics
The ratings and characteristics shall comply with the relevant provisions of this specification and meet the following requirements: 1.4.3.1 Nominal capacitance range
See 2.2.1 Tea.
Note: When the detailed specification allows products with different capacitance ranges, the following statement shall be added: "The range of various capacitance values within each voltage range shall be given in the list of qualified products."
1.4.3.2 Additional characteristics
For design and application, when additional characteristics are considered necessary for the detailed specification of components, these additional characteristics may be specified in a table. 1.4.3.3 Soldering
For solderability and soldering heat resistance tests, the detailed specification shall specify the test methods, severity levels and requirements. 1.4.4 Marking
The detailed specification shall specify the marking content on capacitors and packaging. Any differences from Article 1.6 of this specification shall be specifically stated. 1.5 Terminology
In addition to the definitions and terms in GB2693, the following definitions are supplemented: 1.5.1 Chip capacitors are small capacitors with dimensions, terminal characteristics and shapes suitable for surface mounting on hybrid circuits or printed circuit boards. 1.5.2 Performance grade 1 capacitors (long-life) Long-life capacitors with strict requirements on electrical parameters. 1.5.3 Performance grade 2 capacitors (general purpose) General purpose capacitors with less stringent requirements on electrical parameters than grade 1 capacitors. 1.5.4 Rated voltage (Uk) rated voltage Rated voltage refers to the maximum DC voltage that can be continuously applied to the capacitor at the rated temperature. Note: The sum of the DC voltage and the AC peak voltage applied to the capacitor shall not exceed the rated voltage value. Unless otherwise specified in the detailed specifications, the AC peak voltage shall not exceed the following percentage of the rated voltage at the specified frequency - and shall not be greater than 28V: 50Hz+20%:
100Hz:15%
10 000Hz:1%.
1.6 Marking
GB/T 15448—1995
Should be in accordance with the requirements of Article 2.4 of GB2693, and the following details: 1.6.1 The content given by the mark is usually selected from the following items, and the relative importance of each item is expressed in the order of the listed positions: a.
Nominal capacitance (IEC62 is marked with words or codes; rated voltage (direct current can be represented by one or a symbol); the maximum allowable deviation of the nominal capacitance;
Category voltage;
Year and month (or week) of manufacture;
Manufacturer name or trademark:
Climate category:
Manufacturer's product model name;
Detailed specification number.
1.6.2 The body of the chip capacitor is usually not marked. If some marks can be marked, the capacitor should be clearly marked as much as possible. The above useful content. Any duplication of content should be avoided on the markings on the capacitors. 1.6.3 Any marking should be clear and not easily smeared or wiped off by hand. 1.6.4 The packaging of the capacitor should be clearly marked with all the information in 1.6.1. 1.6.5 Any additional marking should be based on the principle of not causing confusion. 2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in the detailed specification shall be selected in priority from the following items. 2.1.1 Preferred climate category
The capacitors covered by this specification shall be classified into climate categories according to the general principles given in IEC68-1. The lower category temperature and upper category temperature and the time of the steady-state damp heat test shall be selected from the following values: Lower category temperature: 55℃-40℃ and -25.℃; Upper category temperature: +85℃, +100 and +125℃ Steady-state damp heat test time: 410,21 and 56d. Note: If continuous operation at 125C exceeds the time required for the durability test, it is considered to have accelerated aging (see detailed specification). The severities of the cold and dry heat tests are the lower and upper category temperatures respectively. 2.2 Preferred ratings
2.2.1 Nominal capacitance (Cr)
The preferred values of nominal capacitance are:
1-1.5—2.2—3.3—4.7 and 6.8 and decimal multiples of these values. These values are in accordance with the E6 priority number system given in GB2471. If other values are required, they should be selected from the E12 number system. 2.2.2 Nominal capacitance tolerance
The preferred tolerance of nominal capacitance is ±10% and ±20%. 2.2.3 Rated voltage (1k)
The preferred values of rated voltage are 25-40-63-100-160-250 and 400V. These values are in accordance with GB321 The R5 priority number system is given.
2.2.4 Category voltage (Uc)
The category voltage is:
1 When the limit category temperature is 100℃, 0.0.&Ug
When the upper category temperature is 125℃, 0.5UR2.2.5 Rated temperature
The rated temperature is marked as 85℃,
3 Quality assessment procedure
3.1 Initial manufacturing stage
GB/T 15448—1995
The initial manufacturing stage is the winding of the capacitor core or an equivalent operation. 3.2 Structurally similar components
Capacitors produced by the same process and materials are considered to be structurally similar capacitors. They may be of different case sizes, capacitance and voltage values.
3.3 Release batch certification records
When the detailed specification specifies the monthly use requirements, the requirements in 3.5.1 of GB2693 shall be adopted. After the durability test, the parameters to be specified for the change are the change in capacitance, loss tangent and insulation resistance. 3.4 Qualification Approval
The procedure for qualification approval testing is given in 3.4 of GB 2693. The schedule for qualification approval testing on a batch-by-batch and periodic testing basis is given in 3.5 of this specification. The procedure for using a fixed sample size test schedule is given in 3.4.1 and 3.4.2 below. 3.4.1 Sampling for Qualification Approval Based on a Fixed Sample Size Procedure Fixed Sample Size Procedure In accordance with 3.4-2 (2) of GI 32693, the sample should be sufficient to represent the range of capacitors for which qualification approval is required. It can be The samples shall consist of the minimum and maximum voltages, and the minimum and maximum capacities of these voltages, which may not be the full range covered by the detailed specification. When the rated voltage has more than ten values, the intermediate voltage shall also be tested. Therefore, when approving a certain range of products, it is required to test 4 to 6 values (capacitance/voltage combinations). When there are fewer than four values, the number of samples tested shall be equal to the number required for the four values. The following backup samples are permitted:
(a) Only one product per value, which can be used to replace the allowable failures in the core group (b) Only one product per value, which can be used to replace those that do not belong to the group Samples that fail accidentally due to the manufacturer's accident. "The number specified in the D\ group is proposed under the assumption that all groups are tested: otherwise the number can be reduced accordingly. When additional groups are required in the list of qualification and approval tests, the number of samples required for the \0\ group should also be increased by the same number of samples required for the additional group.
Table 1 gives the number of samples used for each group or subgroup of the qualification and approval test and the number of permissible non-conforming products. 3.4.2 Tests
The qualification and approval of the electric wearer included in each detailed specification must be subjected to the full series of tests specified in Tables 1 and 2. The tests of each group must be carried out in the specified order.
All samples shall be subjected to the "α\ group test and then divided into other groups: "Non-conforming samples found in the α\ group test shall not be used in other groups. A capacitor that fails to meet all or part of the tests of a test group is counted as "· non-conforming product". When the number of non-conforming products does not exceed the permissible number of non-conforming products specified in each group or subgroup and the total permissible number of non-conforming products, the qualification and approval shall be granted.
Note: Tables 1 and 2 together constitute the fixed sample size test schedule, where Table 1 contains the sample details and the number of unqualified products allowed for different tests or test groups, and Table 2 together with the test details included in Chapter 1 gives a complete summary of the test conditions and performance requirements, and indicates the content that should be selected in the detailed specification, such as test methods or test conditions. The test conditions and performance requirements in the fixed sample size test schedule should be alternated with the provisions for quality consistency inspection in the detailed specification. Group No.
Test ItembZxz.net
Appearance Inspection
Capacitance
Dissipation Angle Tangent
Withstand Voltage
Insulation Resistance
Backup Sample
Resistance to Soldering Heat
Component Solvent
Weldability
Marking Solvent Resistance\
End Surface Plating
Bonding Strength
Appearance Inspection
Capacitance
Dissipation Angle Tangent
Withstand Voltage
Insulation Resistance
Adhesion
Rapid Temperature Change
Climate Sequence
Steady-state Damp Heat
Durability||tt ||Charging
GB/T15448—1995
Table 1 Sampling plan for identification and approval test and the number of unqualified products allowed, evaluation level E Number of samples (n) and the number of unqualified products allowed (pd) Each value of this specification clause\
Note: 1) Capacitance/voltage combination, see 3.4.1.35
Four or less than four values\
2) For any value, the number of unqualified products allowed shall not exceed one pd
Into a variety of values\
pd total
3) Any unqualified samples found after installation - shall not be counted as unqualified products allowed in the following tests, and these unqualified products shall be replaced by backup samples. 4) If required by detailed specifications.
GB/T 15448-1995
Table 2 Identification and approval test: Summary
Note: ① The test and performance requirements are quoted from Chapter 4: Test and measurement procedures. ②) In this table: L) ND = non-destructive Clauses and test items (See Note (D) 4.2.1 Appearance inspection 4.2 Dimensions (if any) 4.3.2 Capacitance 4.3.3 Loss tangent 4.3.1 Voltage 4.3.4 Insulation resistance 4.6 Heat of welding 4.6.1 Initial measurement 4.6.2 Test piece 1.6.3 Final measurement 1.13 Solvent resistance of components (if applicable) 4.7 Solderability 4.7.2 Final measurement 4.14 Marking solvent resistance
(if applicable)1)
D or ND
Test conditions
See Note)
Frequency 1kHz
Method See detailed specification
Capacitance
Select as specified in the detailed specification
Method 1 or 2
Duration: 5+0.55
If method 1 is used, no one and joint
Speed The speed is 25±25mm/s
Appearance inspection (immersion)
Capacitor maximum
Solvent temperature,
Method 2
No aging
Select method 1 or 2 as specified in the detailed specification
External inspection
Solvent,
Solvent overflow:
Note: 1) This test can be carried out on chip capacitors mounted on a substrate. Number of samples (n) and the number of non-conforming products allowed (pd) See Table 1 See Table 1 See Table 1 See Table 1 Performance requirements (see Note () According to 4.2.2 The marking is clear and complies with the detailed specification. See the detailed specification Within the specified allowable deviation range According to 4.3.3.2 No breakdown or flashover. Whiteness is allowed According to 4.3.4.3 According to 4.6.3 and 4.6.1 Strip test
Value comparison|AC/C, ≤3%
See detailed specifications
According to 4.7.2
Clear marking
Clause and test items
(See Note ()
4.5 Combination of normal surface layer
4.1 Installation
4.2.1 Appearance inspection
4.3.2 Current consumption
4.3.3 Loss tangent
4.3.4 Insulation resistance
3.1 Grouping
4.1 Adhesion
4.4.3 Intermediate measurement
4.8 Rapid temperature change
4.8.1 Initial measurement
4.8.2 Test conditions
4.8.3 Intermediate inspection
4.9 Climate sequence
4.9.1 Initial measurement
4.9.2 Dry heat
4.9.3 Damp heat cycle
First cycle
D or ND
Method 1
GB/T 15448—1995
Continued Table 2
Test conditions
(See Note ())
Wipe material: Debonded structure
Recovery,
Capacitance (when the plate is in bending)
Appearance inspection
Base material: -
Total capacitance values
At 1kHz
For CRF
Connect 10kIIz (see also 4.3.3.3) Appearance inspection
Not requiredSee 3 groups
6 yuan = lower category temperature
F-upper category temperature
5 cycles
Duration: about: 30nin
Appearance inspection
Not requiredSee 3 Group
Upper category temperature
Duration: 16h
Lower category temperature
Number of samples (n)
And the number of non-conforming products allowed (d)
See table!
See table above
See Table 1
Note: 1) When the substrate materials used for each group are different, the detailed specification shall specify the substrate material for each group. Performance requirements (see Note ())
Comparison with the measured values in 4.3.2:
[AC/C|10%
No visible visual damage
As per the detailed specification
Comparison with the measured values in group 0:
[AC/C|≤2%
As per the last measured reference value in group 4.3.33.1.3.3 and 3.4)
As per the measured values in 4.3.4.3
Especially visible damage
Especially visible damage
Clause and test items
(see Note (1))
4.9.5 Humidity and heat cycle
Other cycles
4.9.6 Final measurement
3.2 Grouping
4.10 Steady-state vortex
4.10.1 Initial measurement
1.10.2 Final measurement
3.3 Grouping
4.11 Durability
To.11.1 Initial measurement
4. 11. 2 Test cases
4.11.5 Final measurement
D or NL
GB/T154481995
Continued Table 2
Test conditions
(See note)
Duration: 2h
Within 15min after taking out from the test chamber
Apply rated voltage (Uz) for 1min
Appearance inspection
Capacitance
Power consumption tangent
For C1pF: 10kHz
For Cr1μF: 1kHz
Insulation resistance
Not required, see Group 3
External inspection
Capacitance
Loss tangent
For all capacitance values at 1kHz
Insulation resistance
Not required, see Group 3
See 4.11.2, 4.11.3 and 4.11.4 Appearance inspection
Capacitance
Number of samples (n)
And the number of unqualified products allowed (bd)
See Table 1
See Table 1
Performance requirements (see Note (1))
No visible damage, clear markings
Compare with the measured values in Group 3
1A0/C≤5%
With 3 The increment of the measurement values of the three groups is as follows:
Level 1: 0.005
Level 2: 0.008
Level 1: 0.003
Level 2: 0.005
24. 3. 4. 50% of the three measurement values
No visible damage
Compared with the measurement values of the three groups
1C/05%
Compared with the measurement values of the three groups
Approximately increment
21,3. 4. 50% of the 3 measured values
No visible damage
Clear markings
Compared with the 3 groups of measured values
Grade 1: 1AC/C ≤ 5%
Grade 2. 1AC/C 18%
Clause and test items
(See Note (D))
3.4 Grouping
4.12 Soap filling and discharging
4.12.1 Initial measurement
4.12.2 Test conditions
4.12.3 Final test
D or ND
3.5 Quality consistency inspection
3.5.1 Composition of inspection batch
Group A and B Group test
GB/T15448—1995
Continued Table 2
Test conditions
See note)
Loss tangent
For (RlμF:10kI1z
For C>F.1kHz
Insulation resistance
Not required, see group 3
10000 cycles
Electrical load
Loss tangent
For CR≤1μF:10kHz
For Cr>1uF: 1kHz
Insulation resistance
These tests should be carried out on a batch-by-batch basis. The number of samples (n) and the number of permitted non-qualified products () are shown in Table 1. The manufacturer may collect the products currently produced into an inspection batch according to the following provisions; (1) The inspection batch should consist of capacitors with similar structures (see Article 3.2). Performance requirements (see Note (1)) Compared with the measured values of Group 3, the increment of 1g is: Grade 1: 0.003 Grade 2: 0.1005 Grade 1; 0.002 Grade 2: 0.003 Grade 34. 3. 1. 5036 of the 3 measured values are compared with the measured values in Group 3. Grade 1, AC/C1&3% Grade 2: 1AC/5% Compared with the measured values in Group 1, the increment of tg is: Grade 1: 0.003 Grade 2: 0.1005 Grade 1; 0.002 Grade 2: 0.003 Grade 34. 3. 1. 5036 of the 3 measured values are compared with the measured values in Group 3. Grade 1, AC/C1&3% Grade 2: 1AC/5% 05
1 level 02
2 report: 0.003
4. 3, 4. 3 50% of the measured value
(2a) The test sample should be sufficient to represent the values and sizes included in the inspection batch, but the number of values and sizes should be taken into account, and at least 5 samples of any value.
(2b) If the number of samples of a value in the sample is less than 5, the sampling base should be negotiated by the manufacturer and the national supervision and inspection agency. bC group inspection
This group of inspections should be carried out on a periodic basis. GB/T15448-1995
The sample should be sufficient to represent the capacitor products produced within the specified cycle and should be divided into small, medium and large sizes. In order to include the scope of any-cycle approval, each group of sizes should be tested with one voltage. In subsequent cycles, other sizes and/or rated values produced should be tested to cover the entire specification.
3.5.2 Test list
The test list for batch inspection and periodic inspection for quality consistency inspection is given in Table 4 of Chapter 2 of the air interface detail specification. 3.5.3 Delayed delivery
When re-inspection is carried out according to the procedure of Article 3.5.2 of GB2693, the weldability and capacitance shall be inspected as specified in the A and B group inspections.
3.5.4 Assessment level
The assessment level specified in the blank detail specification shall preferably be selected from Table 3A and Table 3B. Table 3A
Inspection group number 2
Note: IL-Inspection level
AQ1.=Qualified quality level
Inspection group \!
Note: p=Period (month)
nSame number
c-Number of nonconforming items allowed
Table 3A and Table 3B Note: 1) Assessment levels D, F and G are under consideration. AQL
2) The content of the inspection group is specified in the relevant blank detail specification, Section 2. 4 Test and measurement methods
4.1 Installation
See 4.33 of GB 2693.
4.2 Appearance inspection and dimension inspection
See Article 4.4 of GB2693 and the following rules:
4.2.1 Appearance inspection
A magnifying glass with a magnification of about 10 times should be used, and the illumination should be suitable for the test sample, and the appearance inspection should be carried out according to the required quality level. Note: The operator should have a suitable lighting device for irradiation or emitting illumination light, and a corresponding measuring device. 4.2.2 Requirements
GB/T 15448—1995
Chip capacitors shall be inspected to verify that the materials, design, construction, physical dimensions and workmanship meet the requirements specified in the detailed specifications. 4.3 Electrical tests
4.3.1 Withstand voltage
See 4.6 and the following details in GB 2693; 4.3.1.1 Test circuit
Remove C. capacitors;
The product of Ri and the nominal capacitance Cx shall be less than or equal to 1s and greater than 0.01s; Ki includes the internal resistance of the power supply;
R; The discharge current shall be limited to less than or equal to 1A. 4.3.1.2 The following voltage shall be applied between the test points in Table 1 in 4.5.2 of GB2693. The voltage application time is 1min for the identification and approval test and 1s for the batch-by-batch quality consistency test. Test
4.3.1.3 Requirements
No breakdown or flying arc should occur during the test. Note: Self-healing breakdown is allowed to occur during the application of the test voltage. 4.3.2 Capacitance
See Article 4.7 of GB2693 and the following rules:
Test adjustment voltage
Level 1: 1.60k
Level 2: 1.4k
4. 3.2.1 The capacitor should be measured at a frequency of 1 000Hz or corrected to 1 000Hz. For nominal capacitance greater than 10μF, a frequency of 50Hz to 120H is used. The peak voltage applied at 1 000Hz should not exceed 3% of the rated voltage. At the same time, the peak voltage applied at 50H to 120H should not exceed 20% of the rated voltage. The maximum value is 100V (AC 70Vm). 4.3.2.2 The capacitance shall be within the specified tolerance. 4.3.3 Loss tangent (tg)
See Article 4.8 of GB2693 and the following rules:
4.3.3.1 Test conditions for 1000Hz measurement tgo shall be measured under the following conditions:
Frequency: 1000Hz;
Peak voltage, less than or equal to 3% of the rated capacitance; Error: less than or equal to 10×10 (absolute value). 4.3.3.2 Requirements for 10001Iz measurement
tga should not exceed the values shown in the following table
Nominal capacitance
4.3.3.3 Test conditions for 10kHz measurement Level 1 capacitor
tga (absolute value)
Level 2 capacitor
For (≤1F capacitors, if required in some tests in Table 2, tg should also be measured: - Frequency: 10kHz,
. - Voltage: 1V AC effective value;
GB/T 15448—1995
-Error: less than or equal to 10×10:4 (absolute value. 4.3.4 Insulation resistance
See 4.5 of GB2693 and the following rules:
4.3.4.1 Before the test, the capacitor should be carefully cleaned to remove dirt. It should be kept clean in the test box and during the entire test. 4.3.4.2 Before measurement, the capacitor should be thoroughly discharged. The product of the current in the discharge circuit and the nominal capacitance of the capacitor under test should be greater than or equal to 0.01s or other channels specified in the detailed specifications. 4.3.4.3 The test voltage should comply with GB The test voltage after the internal resistance of the power supply is corrected shall be applied immediately according to the requirements of 1.5.2 of GB 2693. The product of the internal resistance and the nominal capacitance of the capacitor shall be less than 1s or any other value specified in the detailed specification. The insulation resistance shall meet the following requirements: Minimum of the RC product (R - insulation resistance between terminals) Test point meets the requirements of Table 1 in 4.5.2 of GB 2693 Rated voltage: (C nominal capacitance) tr-0. 33F Grade: Minimum insulation resistance between terminals CRSU, 3μF 30 000 4.3.4.4 When the test temperature is not 20 If necessary, multiply the test result by an appropriate correction factor to correct it to the result at 20°C. In case of dispute, the test result at 20°C shall prevail. For metallized poly film capacitors, the following correction factors can be considered as an average value.1 Test conditions for 1000Hz measurement tgo should be measured under the following conditions:
Frequency: 1000Hz;
Peak voltage, less than or equal to 3% of the rated capacitance; Error: less than or equal to 10×10 (absolute value). 4.3.3.2 Requirements for 10001Iz measurement
tga should not exceed the values shown in the following table
Nominal capacitance
4.3.3.3 Test conditions for 10kHz measurement Level 1 capacitors
tga (absolute value)
Level 2 capacitors
For (≤1F capacitors, tg should also be measured if required in certain tests in Table 2: - Frequency: 10kHz,
. - Voltage: 1V AC effective value;
GB/T 15448—1995
-Error: less than or equal to 10×10:4 (absolute value. 4.3.4 Insulation resistance
See 4.5 of GB2693 and the following rules:
4.3.4.1 Before the test, the capacitor should be carefully cleaned to remove dirt. It should be kept clean in the test box and during the entire test. 4.3.4.2 Before measurement, the capacitor should be thoroughly discharged. The product of the current in the discharge circuit and the nominal capacitance of the capacitor under test should be greater than or equal to 0.01s or other channels specified in the detailed specifications. 4.3.4.3 The test voltage should comply with GB The test voltage after the internal resistance of the power supply is corrected shall be applied immediately according to the requirements of 1.5.2 of GB 2693. The product of the internal resistance and the nominal capacitance of the capacitor shall be less than 1s or any other value specified in the detailed specification. The insulation resistance shall meet the following requirements: Minimum of the RC product (R - insulation resistance between terminals) Test point meets the requirements of Table 1 in 4.5.2 of GB 2693 Rated voltage: (C nominal capacitance) tr-0. 33F Grade: Minimum insulation resistance between terminals CRSU, 3μF 30 000 4.3.4.4 When the test temperature is not 20 If necessary, multiply the test result by an appropriate correction factor to correct it to the result at 20°C. In case of dispute, the test result at 20°C shall prevail. For metallized poly film capacitors, the following correction factors can be considered as an average value.1 Test conditions for 1000Hz measurement tgo should be measured under the following conditions:
Frequency: 1000Hz;
Peak voltage, less than or equal to 3% of the rated capacitance; Error: less than or equal to 10×10 (absolute value). 4.3.3.2 Requirements for 10001Iz measurement
tga should not exceed the values shown in the following table
Nominal capacitance
4.3.3.3 Test conditions for 10kHz measurement Level 1 capacitors
tga (absolute value)
Level 2 capacitors
For (≤1F capacitors, tg should also be measured if required in certain tests in Table 2: - Frequency: 10kHz,
. - Voltage: 1V AC effective value;
GB/T 15448—1995
-Error: less than or equal to 10×10:4 (absolute value. 4.3.4 Insulation resistance
See 4.5 of GB2693 and the following rules:
4.3.4.1 Before the test, the capacitor should be carefully cleaned to remove dirt. It should be kept clean in the test box and during the entire test. 4.3.4.2 Before measurement, the capacitor should be thoroughly discharged. The product of the current in the discharge circuit and the nominal capacitance of the capacitor under test should be greater than or equal to 0.01s or other channels specified in the detailed specifications. 4.3.4.3 The test voltage should comply with GB The test voltage after the internal resistance of the power supply is corrected shall be applied immediately according to the requirements of 1.5.2 of GB 2693. The product of the internal resistance and the nominal capacitance of the capacitor shall be less than 1s or any other value specified in the detailed specification. The insulation resistance shall meet the following requirements: Minimum of the RC product (R - insulation resistance between terminals) Test point meets the requirements of Table 1 in 4.5.2 of GB 2693 Rated voltage: (C nominal capacitance) tr-0. 33F Grade: Minimum insulation resistance between terminals CRSU, 3μF 30 000 4.3.4.4 When the test temperature is not 20 If necessary, multiply the test result by an appropriate correction factor to correct it to the result at 20°C. In case of dispute, the test result at 20°C shall prevail. For metallized poly film capacitors, the following correction factors can be considered as an average value.
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.