SJ 20228-1993 Gould 1421 digital storage oscilloscope verification procedure
Some standard content:
Military standard of the People's Republic of China for the electronics industry FL0150
SJ20228--93
Gould 1421 digital storage oscilloscope
Verification regulation of model Gould 1421storage0scltloscope1993-02-09Released
China Electronics Industry Corporation
1993-05-01Implemented
Military standard of the People's Republic of China for the electronics industry Gould 1421 digital storage oscilloscope
Verification regulation of model Gould 1421 storage oscilloscope1Range
1.1 Main content
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This verification procedure specifies the verification conditions, verification items, verification methods, verification result processing and verification cycle of Gould1421 digital storage oscilloscope. 1.2 Scope of application
This verification procedure is applicable to the verification of Gould1421 digital storage oscilloscope. Other types of digital storage oscilloscopes can also be verified with reference to this procedure. 2 References
There are no provisions in this chapter.
3 Definitions
There are no provisions in this chapter.
4 General requirements
China Electronics Industry Corporation 19930209 Issued 61993-05-01 Implementation
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4.1 Purpose and principle of the instrument under test
Guid1421 digital storage oscilloscope is used to measure, display, store and record transient or single-shot signals. It has two independent channels and can be used as a dual-channel digital storage oscilloscope or a general-purpose oscilloscope.
The instrument is mainly composed of a preamplifier, an attenuator, a sample/hold circuit, a beam conversion circuit, an analog/digital converter, a semiconductor memory, a time base circuit, a trigger circuit, a control logic circuit, a vertical and horizontal final amplifier, an oscilloscope circuit and a power supply circuit. 4.2 Technical requirements
4.2.1 Vertical deflection (CH1 and CH2 alternately) 1. Bandwidth, DC~20MHz (3dB);
b. Deflection factor, 2mV/div~10V/div; accuracy ±3%: c. Input protection: 400V (DC) or peak (AC). 4.2.2 Horizontal deflection
, Sweep time factor of passband mode
0.5ps/div~0.2s/div; accuracy: ±3% b. Sweep time factor of storage mode
0.5ps/div~50s/div; accuracy: ±3% eX expansion
X10 button gives the fastest sweep time factor 50ps/div, accuracy: ±3% (50ns/div is ±5%).
4.2.3 Trigger (synchronization) characteristics
See the table below
Coupling mode
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Trigger frequency range
～2MHz
～20MHz
10Hz～2MHz
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4.2.4 Digital storage part
a, storage capacity: 1024×8bits/channel: Trigger sensitivity
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b. Vertical resolution: 1/256, about 30 levels/divc. Water rate resolution: 1/1024. About 100 sampling points/div (50 sampling points/di in 0.05ms/div dual trace); positive. Expansion: ×10 button reduces the resolution of all levels by 10 times: e. Maximum sampling rate: 2MSa/s;
F. Point connection: linear interpolation between sample points. 4.2.5 Calibration signal
n. Square wave voltage: 1V, -1 accuracy, ±2%; b. Square wave frequency: 1kHz,
4.2.6 Drawing output (analog output for display) aY output: CH1 and CH2 are output through 4mm socket at the same time. Amplitude 100mV/div
bX output: X sawtooth wave is output through 4mm socket, amplitude 100mV/civ. c, Output scanning rate: Range 50s/div～50ms/div. d. Pen hold output: High output indicates pen hold, TTL open collector maximum voltage 15V. Maximum pen hold current 8mA.
4.3 Verification conditions
4.3.1 Environmental conditions
e. Ambient temperature, 205℃;
b. Relative humidity: 45%~75%;
c. Atmospheric pressure: 861u6kPa+
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d. Power supply: 220V±2%.50H2±1%: e. Surrounding environment: no mechanical grip and electromagnetic field interference that may affect normal operation. 4.3.2 Calibration equipment
4.3.2.1 Oscilloscope calibrator
Overshoot: 2%:
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Time uncertainty; <0. 01%:
Voltage uncertainty: above 50mV <0.5%±50gVbelow 50mV≤0.5%=5uV
Reference model: S03;S06
4. 3.2.2 Bacteria count generator
Frequency range: 10Hz~20MHz;
Open circuit output voltage: ≥20V, p
Sine wave distortion: <1%;
Reference model: GFG--8016G, FG1617. 4.3.2.3 Steady amplitude sine signal generator
Frequency range: 10Hz～20MHz;
Level unevenness: 0.3cB:
Distortion: <3%;
Reference model: VP-7220C; MG545C. 4.3.2.4 Ultra-high frequency voltmeter
Voltage range: lmV～3V
Frequency additional error: soil 5%;
Frequency range: 5kHz～30MHz:
Reference model: 92BD.
4.3.2.5 Digital frequency meter
Frequency measurement range: 10Hz~20MHz;
Crystal oscillator stability: 1×10\/d;
Reference model: SC—7201.
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4.3.2.6 High-sensitivity oscilloscope
Frequency range: DC~1MHz;
Minimum deflection factor: 100uV/div;
Common mode rejection ratio:>10000:1:
Reference model: SR12.
4.3.2.7 Ultra-low frequency oscilloscope
XY display:
Reference model: TD4551.
4.3.2.8 Television image signal generator
Reference model: XT—14.
5 Detailed requirements
5.1 Verification items and verification methods
5.1.1 Appearance and normal working inspection
5.1.1.1 The digital storage oscilloscope under inspection (hereinafter referred to as the inspected instrument) shall be accompanied by the product technical manual. If it is not the first inspection, the previous verification certificate shall be attached. 5.1.1.2 The inspected instrument shall not have any mechanical damage that affects its normal operation and correct reading, and the knob shall work reliably.
5.1.1.3 Functional check of general oscilloscope working mode a. Set the Y-axis deflection factor switch VOLTS/DIV of CH1 and CH2 to 0.5, the knob Var to the calibration position, and the vertical mode MODE switch to dual-trace Dua!. Turn the X-displacement and Y-displacement knobs to the middle position, set the scanning time factor selection switch TIME/div to 0.2ms, select CH1 or CH2 as the trigger source, and select DC or AC as the trigger coupling. Release all other keys: Connect the power supply. Turn the power/brightness control knob clockwise away from the disconnected position. The power indicator light should be on. Preheat for a certain period of time, use two test lines to add the calibration signal to the CH1 and CH2 input terminals, and adjust the brightness, focus, displacement and trigger level knobs appropriately. Two grid waveforms should be clearly and stably displayed on the screen within the effective working surface. Turning the variable knob Var will change the displayed waveform height. The waveform should not change when adjusting the brightness. b.When the MODE switch selects CH1, only the CHI signal is displayed on the screen; when CH2 is selected, only the CH2 signal is displayed on the screen; when Add is selected, 4 grids of waveform are displayed on the screen (the algebraic sum of CH1 and CH2). If the Invert key is pressed, a horizontal sweep line is displayed on the screen (the algebraic difference between CHI and CH2); when the MODE switch selects X-Y, two bright spots are displayed on the screen, whose connecting line is 45° to the horizontal axis. c. Set the trigger mode button Auto/Normal to Normal position. Select the trigger slope "+" or "-". Adjust the trigger level knob appropriately. The trigger indicator light should be on. A stable waveform should be displayed on the screen. Turn the variable sweep time factor knob VarSweep. The waveform will be compressed or expanded in the horizontal direction. Press the expansion button Mag in the ×10 position. The waveform will be expanded by 10 in the horizontal direction.
Connect the CH2 signal to the external trigger input hole. Select the external Ext as the trigger source. Adjust the trigger level knob. The stable waveform of CH1 should be displayed on the screen. Add the video signal of appropriate amplitude of the XT-14 color/black-and-white television image signal generator to the CH1 input terminal of the instrument under test. Select TV for the trigger coupling mode. Select +" or -" according to the polarity of the video signal synchronization pulse. Select TVV for the sweep time factor switch in the 0.2s~0.1ms range. Select T in the 0.05ms~0.5us range. VH, adjust the trigger level knob appropriately, and the corresponding video signal stable waveform should be seen.
d. Record the results in Table A1 of Appendix A (Supplement). 5.E.1.4 Functional inspection of digital storage working mode a. Single and pre-trigger working inspection
Set up and connect the instrument according to 5.1.1.3a, set the scan time factor selection switch to 0.05ms, set the Norm/Store button to Store working mode, set the Auto/Normol button to Normal mode, select 25% for pre-trigger, press the Armed/Stored indicator light, adjust the trigger level knob to make the trigger indicator light, the Armed/Stared light no longer flashes but stays on, and the waveform of Figure 1a is displayed on the screen: select pre-trigger: 6
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75%. Operate in the same way. The waveform of Figure 1b should be displayed on the screen. s. sdiv
b. Continuous dynamic mode, m5/key multiplication by 1000 function and latch function check. Feed the 1H2 square wave of appropriate amplitude of the function generator to the CH1 input terminal of the instrument under test. Press the Release key. The Armed/SLored light goes out, set the scan time factor switch to 0.5ms, press the ms/Sec key to the Sec position, the waveform on the screen rolls from right to left, adjust the trigger level knob. Make the trigger light flash once every 1s, and the waveform on the screen still moves. Press the HOLDalI key. The waveform on the screen is latched and no longer rolls. C. Continuous refresh mode and HOLLD) CH2 latch function check. Add the above function generator signals to the CH2 input terminal at the same time. Roll/ Set the Refresh key to the Refresh mode. Adjust the trigger level knob to make the trigger light flash, and the waveform on the screen is refreshed repeatedly from left to right. Press the IIOIDCH2 key, only the CH2 waveform is latched: press the HOLDall key, both waveforms are latched and unchanged. d. Check the isochronous sampling operation
Add a 10MHz sine signal to CH1. Set the scan time factor switch to 0.5us. Press the Arm key, and the Armed/Stored light flashes. Adjust the trigger level knob to make the trigger light on. The Armed/Stored light will no longer flash but stay on, and the screen should display a sine waveform consisting of many connected bright spots corresponding to the input signal period. e. Record the results in Table A1. 5.1.2 Verification of calibration signal 5.1.2.1 Check of calibration signal frequency Connect the measuring instrument as shown in Figure 2 and read the indication of the frequency meter. Then the error of the calibration signal frequency is calculated according to formula (1) and the result is recorded in Table A2. ff. × 100% Where: - nominal value of calibration signal frequency. Hz. number of the instrument under test 5.1.2.2 Verification of calibration signal amplitude Digital frequency meter Connect the measuring instrument as shown in Figure 3. Set the calibration signal of the instrument under test and the signal of the voltage calibrator of the oscilloscope calibrator to the same level. Feed them to the differential input terminals Y and Y of the same channel of the high-sensitivity oscilloscope respectively. Set the coupling mode of the high-sensitivity oscilloscope to "AC", set the scanning time factor switch to the appropriate position, change the amplitude of the output voltage of the oscilloscope calibrator, and display the waveform shown in Figure 48 and 4b on the screen. Gradually reduce the deflection factor of the high-sensitivity oscilloscope (generally, the voltage value per degree of deflection should be 50 to 100 times smaller than the nominal voltage value of the signal under test), and fine-tune the amplitude deviation knob of the oscilloscope calibrator to make lines a and b coincide. At this time, the deviation value indicated by the oscilloscope calibrator is the correction value of the calibration signal. Record the result in Table A2.
Eggerizer
Signal output
Oscilloscope calibrator 5.1.3 Verification of trigger characteristics 5.1.3.1 Trigger frequency range and trigger sensitivity a. Internal trigger KAONKAca-SJ2022893 Connect the measuring instrument as shown in Figure 5. When the trigger slope is "+" or "+", select different frequency points at the high, middle and low ends of the bandwidth range for testing. The instrument under test is a general oscilloscope, and the operation mode is set to Normal. Position, trigger source to CHI. Adjust the signal source output voltage and the trigger level knob of the instrument under test, and record the minimum height (div) of the signal at each frequency point that can be stably displayed on the screen. The value is the internal trigger sensitivity of the instrument under test at the corresponding frequency point. Record the results in Table A3. Steady amplitude signal generator
b. External trigger
Matching resistor
Test instrument
CHi CH2a
Connect the device as shown in Figure 6. Set the trigger source of the instrument under test to \Ext\. According to the method in 5.1.3.1a, measure the minimum voltage (peak-to-peak value) when a stable waveform can be displayed, which is the external trigger sensitivity. Record the results in Table A3.
Standard amplitude normal signal generator
Test instrument
Matching resistor
5. 1. 4 Verification of X-axis system in general oscilloscope working mode 5.1.4.1 Verification of scanning time factor
UHF
Voltage cutter
a. Connect the instrument according to Figure 7a. Set the Y-axis coupling of the instrument under test to \AC”, the trigger source to \CH1, and the variable scanning knob to \calibration\ position. Adjust the time scale signal interval of the oscilloscope calibrator to be consistent with the nominal scanning time factor of the instrument under test, and fine-tune the trigger voltage knob and adjust the \T\ deviation knob of the oscilloscope calibrator to make the second and tenth peaks of the time scale signal coincide with the horizontal scale lines of 10% and 90% respectively. As shown in Figure 7h, 10
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At this time, the calibrator deviation is the correction value of the scanning time factor error. The oscilloscope calibrator
output. bZxz.net
Tested Instrument
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b. Verify all levels of the scan time factor switch according to 5.1.4.1a. Record the results in Table A4.
S.1.4.2 Verification of Extended Scan Time Factor Set the scan time factor of the tested instrument to 0.5us and the scan extension to ×10, and perform verification according to 5.1.4.1. Record the results in Table A4. 5.1.5 Verification of the Y-axis system in the general oscilloscope working mode 5.1.5.1 Verification of the deflection factor
a. Connect the instrument as shown in Figure 8, set the variable knob Var to the calibration position, set the deflection factor to 2mV and the voltage box of the oscilloscope calibrator to 10mV. Adjust the \V\ deviation knob of the oscilloscope calibrator so that the height of the image displayed on the screen coincides with the scale of 5 grids. The indicated value of "V\ deviation" of the calibrator is the correction value of the Y-axis deflection factor error at this level.
KAONKAca-Connect the instrument as shown in Figure 8, set the variable knob Var to the calibration position, set the deflection factor to 2mV, and set the voltage box of the oscilloscope calibrator to 10mV. Adjust the V deviation knob of the oscilloscope calibrator so that the height of the image displayed on the screen coincides with the scale of 5 grids. The indicated value of the V deviation of the calibrator is the correction value of the Y-axis deflection factor error at this level.
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