SJ/T 1146-1993 Test method for volume resistivity of organic thin films for capacitors SJ/T1146-1993 Standard download decompression password: www.bzxz.net

Electronic Industry Standard of the People's Republic of China
Test methods for bulk resistivity of organic film for use in capacitors
1 Subject content and applicable range
1.1 Subject content
This standard specifies the test method for the volume resistivity of organic film for use in capacitors. 1.2 Scope of application
SJ/T1146-93
Replaces SJ1146-77
This standard is applicable to the determination of the volume resistivity of organic film for use in capacitors with a thickness of 250um under normal climatic conditions or at high temperatures.
2 Reference standards
SJ/T1145 General rules for electrical properties test methods of organic film for use in capacitors 3 Key points of the method
This method is to apply a fixed DC voltage to the sample, measure the leakage current in the thickness direction, and calculate the volume resistivity. 3.1 Test method
3.1.1 Method 1 Vacuum evaporation aluminum electrode method (this method is an arbitration method) 3.1.1.1 Sample
Single-layer sample, double-sided vapor deposition of metal aluminum, the vapor deposition surface is circular, the area is 19.2cm, the vapor deposition surfaces on both sides of the sample should be concentric, the surface should be flat, bright, free of impurities and oxidation diffusion defects. 3.1.1.2 Test instrument and electrode
3.1.1.2.1 Test instrument
It can measure high resistance meters above 104Q, and its measurement error does not exceed ±10%. 3.1.1.2.2 Electrode
The upper electrode is cylindrical, made of brass, with a contact area of ​​19.2cm and a mass of 750±10g; the lower electrode is a brass disk electrode with an area of ​​145cm, and the upper and lower electrode surfaces should be smooth and flat. 3.1.1.3 Test steps
Place the sample between the upper and lower electrodes, and the upper electrode should be completely consistent with the sample evaporation surface; a.
Use a DC voltage of 10±1V or 100±10V, and read the resistance of the sample after applying the voltage for 1 minute: C
Measure the film thickness of the unevaporated part of the sample around the evaporation surface (measure at least 5 points) and take the average value as the sample thickness. Approved by the Ministry of Electronics Industry of the People's Republic of China on December 17, 1993 and implemented on June 1, 1994
3.1.1.4 Calculation of test results
Take the half-mean of the three test results as the substitute result 376114651
Where: ov--volume resistivity of the sample, QcmRv--volume resistivity of the sample, a;
S--area of ​​the sample, cm
d--thickness of the sample, cm.
If the test values ​​of any two samples differ by one order of magnitude, the sample should be taken and retested according to the regulations. 3.1.2 Method 2 Rubber Aluminum Foil Electrode Method
3.1.2.1 Sample
3.1.2.1.1 Sample size
Determined according to the size of the measuring electrode, but must be greater than the electrode diameter by more than 10mm3.1.2.1.2 The number of sample layers is determined by the sample thickness (d), see the table below. The layers must be kept clean, the air should be exhausted, and the layers should be neatly selected without wrinkles and scratches.
Sample thickness and number of layers
Degree (d)
d≥10
10>d>6
3.1.2.1.3 Sample requirements and test conditions shall comply with the relevant provisions of SJ/T1145. 3.1.2.1.4 Number of samples Each group of samples shall not be less than 3. 3.1.2.2 Test instruments and electrodes
3.1.2.2.1 Test instruments
Any high resistance meter capable of measuring 10*Ω or above can be used, and its measurement error shall not exceed ±10%; b.
The insulation resistance of the measuring end wire shall not be less than 1014Ω; if testing is required at high temperature, the insulation resistance between the insulators at the two electrode lead ends and the grounded box shell shall not be less than 101\Qc
, the temperature in the box shall be uniform, and the temperature fluctuation shall not exceed ±2℃. 3.1.2.2.2 Electrode
The diameter of the upper electrode is 20±0.1mm, the diameter of the lower electrode is 25±0.1mm, the material is copper, the maximum allowable value of the working surface roughness R of the electrode is 0.8um, and the electrode is in close contact with the sample by a screw-tightening contact electrode fixture. The metal material of the fixture is copper or steel, and the insulating material is polytetrafluoroethylene or other materials with an insulation resistance of not less than 1×101\Q; b. Add conductive rubber electrodes or leather aluminum foil electrodes to the working surfaces of the upper and lower electrodes, see Figure 1 and Figure 2: Conductive rubber electrode: The volume resistivity should be greater than 1000Ω·cm, the thickness is about 1mm, the hardness is H40~H50, and the maximum allowable value of the surface roughness R is 1.25gm. d. Rubber aluminum foil electrode: The rubber is wrapped with aluminum foil, the aluminum foil should be annealed, the thickness should be less than 10km, the rubber thickness is 1mm, the surface should be flat and smooth, and the hardness is H40~H^50. Figure 1bzxz.net
1. Metal electrode,
2. Conductive rubber.
3.1.2.3 Test steps
a, test voltage is 100~1000V
SJ/T1146-93
1. Metal electrode;
2. Conductive rubber;
b. Sandwich the sample between two electrodes, the two electrodes must be concentric, the electrodes and the sample must be in close contact, and the sample must be fully discharged to eliminate the influence of static electricity;
c. Connect the sample, electrode and high resistance meter, and then test. After applying voltage for 1 minute, read the volume resistance value of the tested sample;
Measure the thickness of the sample at 3 points within the contact range of the main electrode, and take the arithmetic average as the sample thickness. 3.1.2.4 Calculation of test results shall be in accordance with Article 3.1.1.4. Additional notes:
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by Tongjiao City Film Capacitor General Factory. The main drafters of this standard are Zhang Xiaohong, Ye Lixin and Zhou Rong. This standard was first issued in June 1977 and revised for the first time in ××××.
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