SJ/T 10574-1994 Detailed specification for electronic devices Precision fixed resistors RJ76 type precision metal film resistors Evaluation level E SJ/T10574-1994 standard download decompression password: www.bzxz.net

Electronic Industry Standard of the People's Republic of China
Detailed specification for electronic components Fixed precision resistors Type RJ76 metal film resistors Assessment level ESJ/T10574-94
Replaces SJ2679-86
GB5735-85
This standard applies to RJ76 type precision metal film resistors, which are in accordance with IEC115--5-1 (1983) "Fixed resistors for electronic equipment" QC400301
GB /T5729
Part 5: Blank Detailed Specification: Precision Fixed Resistors Assessment Level E" is formulated in accordance with the requirements of GB5734-85
IEC115-1 (1982) "Fixed Resistors for Electronic Equipment Part 1: General Specification" and IEC115-5 (1982) "Fixed Resistors for Electronic Equipment Part 5: Sectional Specification: Precision Fixed Resistors". The standard organization of the China Electronic Components Quality Certification Committee is the China Electronics Technology Standardization Institute. Approved by the Ministry of Electronics Industry of the People's Republic of China on August 8, 1994 and implemented on December 1, 1994
SJ/T10574-94
Ministry of Electronics Industry of the People's Republic of China
Service Part 1: General Specifications" Evaluation
According to GB/T5729 Electronic equipment quality fixed resistors electronic components
Appearance drawing:
Note: 1) Length of the lead root layer.
SJ/T10574—94
SJ5735-85
IEC115--5-1(1983)
QC400301
Precision fixed resistors
RJ76 precision metal film resistors
Coated insulation type
Assessment level, E
Stability grade: 0.5%
The valid data of the components qualified according to this detailed specification are given in the list of qualified products. 2
1 General data
1.1 Recommended installation method
The resistors should be installed in the normal way,
SJ/T10574—94
In the vibration and shock test, the distance between the mounting point and the resistor body is 6±1mm. 1.2 Dimensions, Ratings and Characteristics
Temperature Coefficient
10~/℃
All dimensions are in millimeters.
Resistance Range
Permitted Resistance Deviation
Climate Category
Low Pressure
Stability Grade
Resistance Temperature Coefficient α
Limiting Voltage
(de or ac.rms)
1k0~1Mn
(dc or ac.peak)
±1%,±0.5%,±0.25%,±0.1%55/125/56| |tt||8.5kPa(85mbar)
±25×10-6/℃
±15×10-5/℃
Resistance change limit:
Long-term test
Short-term test
±(0.5%R+0.05Ω)
±(0.1%R+0.01Q)
Note: 2) The priority value is the E series in the IEC63: priority number system for resistors and capacitors. 1.2.1 Power reduction
The resistors included in this specification shall be reduced in power consumption according to the following curve: Percentage of rated power consumption
Maximum size
Ambient temperature
Note: See also 2.2.3 of the sub-specification.
1.3 Related documents
General specification: GB/T5729
Sub-specification: GB5734--85
Fixed resistors for electronic equipment
Fixed resistors for electronic equipment
Part 1 General specification
1.0±0.05
Part V: Sub-specification: Precision fixed resistors 3
1.4 Marking
SJ/T10574—94
The markings on resistors and their packaging shall comply with the requirements of Article 2.4 of GB/T5729. The minimum marking content on the resistor:
Nominal resistance value;
Permissible deviation of resistance value;
Temperature coefficient of resistance.
Contents of marking on the package:
Nominal resistance
Permissible resistance deviation;
Temperature coefficient of resistance;
Year, month (or week) of manufacturing;
Detailed specification number;
Name and trademark of the manufacturer;
Quantity in the package;
Name or code of the packing personnel;
Seal of the inspection department,
Certification mark (only for certified products). 1.5 Ordering information
Orders for resistors of this specification shall list the following minimum contents in text or code form: a.
Nominal resistance;
Permissible resistance deviation;
Detailed specification number and variety number.
1.6 Release batch certification record
Provided upon the request of the ordering party.
1.7 Additional content (not tested)
The weight of the resistor shall not exceed 3.5g.
1.8 Supplement and improvement of the severity and requirements specified in the general specification and (or) sectional specification None.
2 Inspection requirements
2.1 Procedure
2.1.1 For identification and approval, the procedure shall be in accordance with the provisions of Section 3.2 of Section GB5734. 2.1.2 For quality consistency inspection, the test list (Table 2) lists sampling, cycle, severity and requirements. Section 3.3.1 of the sectional specification specifies the composition of the inspection batch.
Note: When drying is required. Procedure I of Section 4.3 of the general specification GB/T5729 shall be adopted. Table 2
Note: ① Except for the resistance change requirements, which shall be selected from Tables 1 and 2 of the sectional specification, the clause numbers of the test items and performance requirements are quoted from the general specification GB/T5729.
②Inspection level and AQL are selected from IEC410: Sampling plan and procedure for inspection by attributes. ③In the table,
p is a period (month);
n is a sample size;
SJ/T10574-94
c is the number of qualified judgments (the number of unqualified products allowed); D is destructive;
ND is non-destructive;
IL is the inspection level;
AQL is the qualified quality level.
Clause number and test items
(See Note ①)
Group A inspection (batch by batch)
Group A1
4.4.1 Appearance inspection
Group A2
4.4.2 Dimensions
(for gauge inspection)
4.5 Resistance value
Group B inspection (batch by batch)
Group B1
4.7 Endurance Voltage
B2 Group
4.17 Solderability
4.13 Overload
4.30 Marking Solvent resistance
B3 Group
Temperature coefficient of resistance
-IEC410
Test conditions
(See Note?)
Method V-block method
No aging
Method: IEC68-2 -20
Test method of Ta 1
Applied voltage: 2.5 times
rated voltage or 2 times component
limiting voltage, whichever is smaller
Duration: 5s
Appearance inspection
Solvent: See 3.1.1 of IEC68-2-45
Solvent temperature: 23±5℃Method 1
Wipe test Material: absorbent cotton
Recovery: Not applicable
Only 20℃～70℃～~
20℃-one cycle
(See Note ②)
Performance requirements
(See Note?)
According to Article 4.4.1
The marking is clear and complies with Article 1.4 of this
According to Table 1 of this specification
According to 4.5.2 strips
No breakdown or arcing
Solder wets the lead
and can flow freely
No visible damage, clearly marked
AR≤±(0.5%R
Clearly marked
≤±25×10-*/℃
≤±15×10-/℃
Multiple models and test items
(See Note)
Group C inspection (cycle)
CIA group
Half of the sample of group C1
4.16 Terminal strength
4 .18 Resistance to soldering heat
C1B group
The other half of the sample in C1 group
4.19 Rapid temperature change
4.21 Shock
4.22 Vibration
SJ/T10574—94
Continued Table 2
Test conditions
(See Note?)
Tensile force: 20N
Bending: half of the number of terminals
Torsion: the other half of the number of terminals
Appearance inspection
Method: IEC68—2—20||tt| |Test Tb method 1A
Failure time: 10±18
Appearance inspection
8-55℃
Og: 125℃
Appearance inspection
Installation method: See 1.1 of this specification
Acceleration: 490m/s
Pulse waveform: Half sine wave
Number of impacts: 3 times in axial positive and negative directions, 3 times in radial direction
Appearance inspection
Installation method: See 1.1 of this specification
Procedure B4
Frequency range: 10 ~500Hz
Amplitude: 0.75mm or accelerationbzxZ.net
98m/s (whichever is less stringent)
Total duration: 6h
Sample size and
Qualified number
(See Note?)
Performance requirements
(See Note?)
No visible damage
AR±(0.1%R
No visible damage, clear marking
AR≤±(0.1%R
No visible damage
AR<±(0.1% R
No visible damage
AR<±(0.1% R
Clause number and test items
(See Note ①)
C1 Group
Samples of Groups C1A and C1B are combined
4.23 Climate sequence
One dry heat
One cycle of damp heat, test Db,
First cycle
One case cold
One low pressure
One cycle of damp heat, test Db,
The rest of the cycles
DC load
C2 Group
4.25.170℃ durability
C3 Group
4.8 Resistance change with temperature
SJ/T10574-94
Continued Table 2
Test conditions
(See Note ①)
Visual inspection
8.5kPa(85mbar)
Visual inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Visual inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125℃
Sample size and
Number of qualified judgments
(See Note ③)
Performance requirements
(See Note ①)
No visible damage
AR ≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R100MQ
No visible damage,
AR≤±(0.5%R
R≥1GO
±25×10-/℃
≤±15×10-/℃
±25×10-/℃
±15×10-/℃
Clause number and test items
(See Note?)
D Group Inspection (Cycle)
D1 Group
4.24 Steady State Damp Heat
D2 Group
4.4.3 Dimensions
(Detailed)||t t||4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10574—94
Continued Table 2
Test conditions
(See Note ①)
4.24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000l
Inspection at 48, 500 and 1000h:
Appearance inspection
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note?)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note ①)
No visible damage, clear marking
AR≤土(0.5%R
R≥100MQ
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R
R≥1Gn23 Climate sequence
-Dry heat
-One cycle of damp heat, test Db,
First cycle
-Cold
-Low pressure
-One cycle of damp heat, test Db,
The rest of the cycles
DC load
C2 group
4.25.170℃ durability
C3 group
4.8 Resistance change with temperature
SJ/T10574-94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa (85mbar)
Appearance inspection
Insulation resistance
Sustainable Duration: 1000h
At 48, 500 and 1000h
Inspection:
Appearance inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125℃
Sample size and
Qualified number
(See Note ③)
Performance requirements
(See Note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R100MQ
No visible damage,
AR≤±(0.5%R||tt ||R≥1GO
±25×10-/℃
≤±15×10-/℃
±25×10-/℃
±15×10-/℃
Clause number and test items
(See Note?)
D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10574—94
Continued Table 2
Test conditions
(See Note①)
4. 24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000l
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note?)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(See Note ①)
No visible damage, clear marking
AR≤土(0.5%R
R≥100MQ
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R
R≥1Gn23 Climate sequence
-Dry heat
-One cycle of damp heat, test Db,
First cycle
-Cold
-Low pressure
-One cycle of damp heat, test Db,
The rest of the cycles
DC load
C2 group
4.25.170℃ durability
C3 group
4.8 Resistance change with temperature
SJ/T10574-94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa (85mbar)
Appearance inspection
Insulation resistance
Sustainable Duration: 1000h
At 48, 500 and 1000h
Inspection:
Appearance inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125℃
Sample size and
Qualified number
(See Note ③)
Performance requirements
(See Note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R100MQ
No visible damage,
AR≤±(0.5%R||tt ||R≥1GO
±25×10-/℃
≤±15×10-/℃
±25×10-/℃
±15×10-/℃
Clause number and test items
(See Note?)
D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10574—94
Continued Table 2
Test conditions
(See Note①)
4. 24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000l
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note?)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(See Note ①)
No visible damage, clear marking
AR≤土(0.5%R
R≥100MQ
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R
R≥1Gn
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