title>Detail specification for electronic components-Fixed precision resistors,Type RJ76 metal film precision resistors Assessment level E - SJ/T 10574-1994 - Chinese standardNet - bzxz.net
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Detail specification for electronic components-Fixed precision resistors,Type RJ76 metal film precision resistors Assessment level E
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Standard ID:
SJ/T 10574-1994
Standard Name:Detail specification for electronic components-Fixed precision resistors,Type RJ76 metal film precision resistors Assessment level E
SJ/T 10574-1994 Detailed specification for electronic devices Precision fixed resistors RJ76 type precision metal film resistors Evaluation level E SJ/T10574-1994 standard download decompression password: www.bzxz.net
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Electronic Industry Standard of the People's Republic of China Detailed specification for electronic components Fixed precision resistors Type RJ76 metal film resistors Assessment level ESJ/T10574-94 Replaces SJ2679-86 GB5735-85 This standard applies to RJ76 type precision metal film resistors, which are in accordance with IEC115--5-1 (1983) "Fixed resistors for electronic equipment" QC400301 GB /T5729 Part 5: Blank Detailed Specification: Precision Fixed Resistors Assessment Level E" is formulated in accordance with the requirements of GB5734-85 IEC115-1 (1982) "Fixed Resistors for Electronic Equipment Part 1: General Specification" and IEC115-5 (1982) "Fixed Resistors for Electronic Equipment Part 5: Sectional Specification: Precision Fixed Resistors". The standard organization of the China Electronic Components Quality Certification Committee is the China Electronics Technology Standardization Institute. Approved by the Ministry of Electronics Industry of the People's Republic of China on August 8, 1994 and implemented on December 1, 1994 SJ/T10574-94 Ministry of Electronics Industry of the People's Republic of China Service Part 1: General Specifications" Evaluation According to GB/T5729 Electronic equipment quality fixed resistors electronic components Appearance drawing: Note: 1) Length of the lead root layer. SJ/T10574—94 SJ5735-85 IEC115--5-1(1983) QC400301 Precision fixed resistors RJ76 precision metal film resistors Coated insulation type Assessment level, E Stability grade: 0.5% The valid data of the components qualified according to this detailed specification are given in the list of qualified products. 2 1 General data 1.1 Recommended installation method The resistors should be installed in the normal way, SJ/T10574—94 In the vibration and shock test, the distance between the mounting point and the resistor body is 6±1mm. 1.2 Dimensions, Ratings and Characteristics Temperature Coefficient 10~/℃ All dimensions are in millimeters. Resistance Range Permitted Resistance Deviation Climate Category Low Pressure Stability Grade Resistance Temperature Coefficient α Limiting Voltage (de or ac.rms) 1k0~1Mn (dc or ac.peak) ±1%,±0.5%,±0.25%,±0.1%55/125/56| |tt||8.5kPa(85mbar) ±25×10-6/℃ ±15×10-5/℃ Resistance change limit: Long-term test Short-term test ±(0.5%R+0.05Ω) ±(0.1%R+0.01Q) Note: 2) The priority value is the E series in the IEC63: priority number system for resistors and capacitors. 1.2.1 Power reduction The resistors included in this specification shall be reduced in power consumption according to the following curve: Percentage of rated power consumption Maximum size Ambient temperature Note: See also 2.2.3 of the sub-specification. 1.3 Related documents General specification: GB/T5729 Sub-specification: GB5734--85 Fixed resistors for electronic equipment Fixed resistors for electronic equipment Part 1 General specification 1.0±0.05 Part V: Sub-specification: Precision fixed resistors 3 1.4 Marking SJ/T10574—94 The markings on resistors and their packaging shall comply with the requirements of Article 2.4 of GB/T5729. The minimum marking content on the resistor: Nominal resistance value; Permissible deviation of resistance value; Temperature coefficient of resistance. Contents of marking on the package: Nominal resistance Permissible resistance deviation; Temperature coefficient of resistance; Year, month (or week) of manufacturing; Detailed specification number; Name and trademark of the manufacturer; Quantity in the package; Name or code of the packing personnel; Seal of the inspection department, Certification mark (only for certified products). 1.5 Ordering information Orders for resistors of this specification shall list the following minimum contents in text or code form: a. Nominal resistance; Permissible resistance deviation; Detailed specification number and variety number. 1.6 Release batch certification record Provided upon the request of the ordering party. 1.7 Additional content (not tested) The weight of the resistor shall not exceed 3.5g. 1.8 Supplement and improvement of the severity and requirements specified in the general specification and (or) sectional specification None. 2 Inspection requirements 2.1 Procedure 2.1.1 For identification and approval, the procedure shall be in accordance with the provisions of Section 3.2 of Section GB5734. 2.1.2 For quality consistency inspection, the test list (Table 2) lists sampling, cycle, severity and requirements. Section 3.3.1 of the sectional specification specifies the composition of the inspection batch. Note: When drying is required. Procedure I of Section 4.3 of the general specification GB/T5729 shall be adopted. Table 2 Note: ① Except for the resistance change requirements, which shall be selected from Tables 1 and 2 of the sectional specification, the clause numbers of the test items and performance requirements are quoted from the general specification GB/T5729. ②Inspection level and AQL are selected from IEC410: Sampling plan and procedure for inspection by attributes. ③In the table, p is a period (month); n is a sample size; SJ/T10574-94 c is the number of qualified judgments (the number of unqualified products allowed); D is destructive; ND is non-destructive; IL is the inspection level; AQL is the qualified quality level. Clause number and test items (See Note ①) Group A inspection (batch by batch) Group A1 4.4.1 Appearance inspection Group A2 4.4.2 Dimensions (for gauge inspection) 4.5 Resistance value Group B inspection (batch by batch) Group B1 4.7 Endurance Voltage B2 Group 4.17 Solderability 4.13 Overload 4.30 Marking Solvent resistance B3 Group Temperature coefficient of resistance -IEC410 Test conditions (See Note?) Method V-block method No aging Method: IEC68-2 -20 Test method of Ta 1 Applied voltage: 2.5 times rated voltage or 2 times component limiting voltage, whichever is smaller Duration: 5s Appearance inspection Solvent: See 3.1.1 of IEC68-2-45 Solvent temperature: 23±5℃Method 1 Wipe test Material: absorbent cotton Recovery: Not applicable Only 20℃~70℃~~ 20℃-one cycle (See Note ②) Performance requirements (See Note?) According to Article 4.4.1 The marking is clear and complies with Article 1.4 of this According to Table 1 of this specification According to 4.5.2 strips No breakdown or arcing Solder wets the lead and can flow freely No visible damage, clearly marked AR≤±(0.5%R Clearly marked ≤±25×10-*/℃ ≤±15×10-/℃ Multiple models and test items (See Note) Group C inspection (cycle) CIA group Half of the sample of group C1 4.16 Terminal strength 4 .18 Resistance to soldering heat C1B group The other half of the sample in C1 group 4.19 Rapid temperature change 4.21 Shock 4.22 Vibration SJ/T10574—94 Continued Table 2 Test conditions (See Note?) Tensile force: 20N Bending: half of the number of terminals Torsion: the other half of the number of terminals Appearance inspection Method: IEC68—2—20||tt| |Test Tb method 1A Failure time: 10±18 Appearance inspection 8-55℃ Og: 125℃ Appearance inspection Installation method: See 1.1 of this specification Acceleration: 490m/s Pulse waveform: Half sine wave Number of impacts: 3 times in axial positive and negative directions, 3 times in radial direction Appearance inspection Installation method: See 1.1 of this specification Procedure B4 Frequency range: 10 ~500Hz Amplitude: 0.75mm or accelerationbzxZ.net 98m/s (whichever is less stringent) Total duration: 6h Sample size and Qualified number (See Note?) Performance requirements (See Note?) No visible damage AR±(0.1%R No visible damage, clear marking AR≤±(0.1%R No visible damage AR<±(0.1% R No visible damage AR<±(0.1% R Clause number and test items (See Note ①) C1 Group Samples of Groups C1A and C1B are combined 4.23 Climate sequence One dry heat One cycle of damp heat, test Db, First cycle One case cold One low pressure One cycle of damp heat, test Db, The rest of the cycles DC load C2 Group 4.25.170℃ durability C3 Group 4.8 Resistance change with temperature SJ/T10574-94 Continued Table 2 Test conditions (See Note ①) Visual inspection 8.5kPa(85mbar) Visual inspection Insulation resistance Duration: 1000h Inspection at 48, 500 and 1000h: Visual inspection Inspection at 1000h: Insulation resistance -55℃/20℃ 20℃/125℃ Sample size and Number of qualified judgments (See Note ③) Performance requirements (See Note ①) No visible damage AR ≤±(0.1%R No visible damage, clear marking AR≤±(0.5%R R100MQ No visible damage, AR≤±(0.5%R R≥1GO ±25×10-/℃ ≤±15×10-/℃ ±25×10-/℃ ±15×10-/℃ Clause number and test items (See Note?) D Group Inspection (Cycle) D1 Group 4.24 Steady State Damp Heat D2 Group 4.4.3 Dimensions (Detailed)||t t||4.25.3 Upper category temperature Durability Additional instructions: SJ/T10574—94 Continued Table 2 Test conditions (See Note ①) 4.24.2.2 Group 1: 10 samples Group 2: 10 samples Appearance inspection Insulation resistance Duration: 1000l Inspection at 48, 500 and 1000h: Appearance inspection Insulation resistance This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and Qualified judgment number (see Note?) This standard was first issued on February 18, 1986 and revised in August 1994. 8 Performance requirements (see Note ①) No visible damage, clear marking AR≤土(0.5%R R≥100MQ According to Table 1 of this specification No visible damage AR≤±(0.5%R R≥1Gn23 Climate sequence -Dry heat -One cycle of damp heat, test Db, First cycle -Cold -Low pressure -One cycle of damp heat, test Db, The rest of the cycles DC load C2 group 4.25.170℃ durability C3 group 4.8 Resistance change with temperature SJ/T10574-94 Continued Table 2 Test conditions (See Note ①) Appearance inspection 8.5kPa (85mbar) Appearance inspection Insulation resistance Sustainable Duration: 1000h At 48, 500 and 1000h Inspection: Appearance inspection Inspection at 1000h: Insulation resistance -55℃/20℃ 20℃/125℃ Sample size and Qualified number (See Note ③) Performance requirements (See Note ①) No visible damage AR≤±(0.1%R No visible damage, clear marking AR≤±(0.5%R R100MQ No visible damage, AR≤±(0.5%R||tt ||R≥1GO ±25×10-/℃ ≤±15×10-/℃ ±25×10-/℃ ±15×10-/℃ Clause number and test items (See Note?) D group test (cycle) D1 group 4.24 Steady state damp heat D2 group 4.4.3 Dimensions (Detailed) 4.25.3 Upper category temperature Durability Additional instructions: SJ/T10574—94 Continued Table 2 Test conditions (See Note①) 4. 24.2.2 Group 1: 10 samples Group 2: 10 samples Appearance inspection Insulation resistance Duration: 1000l Inspection at 48, 500 and 1000h: Appearance inspection Inspection at 1000h: Insulation resistance This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and Qualified judgment number (see Note?) This standard was first issued on February 18, 1986 and revised in August 1994. 8 Performance requirements (See Note ①) No visible damage, clear marking AR≤土(0.5%R R≥100MQ According to Table 1 of this specification No visible damage AR≤±(0.5%R R≥1Gn23 Climate sequence -Dry heat -One cycle of damp heat, test Db, First cycle -Cold -Low pressure -One cycle of damp heat, test Db, The rest of the cycles DC load C2 group 4.25.170℃ durability C3 group 4.8 Resistance change with temperature SJ/T10574-94 Continued Table 2 Test conditions (See Note ①) Appearance inspection 8.5kPa (85mbar) Appearance inspection Insulation resistance Sustainable Duration: 1000h At 48, 500 and 1000h Inspection: Appearance inspection Inspection at 1000h: Insulation resistance -55℃/20℃ 20℃/125℃ Sample size and Qualified number (See Note ③) Performance requirements (See Note ①) No visible damage AR≤±(0.1%R No visible damage, clear marking AR≤±(0.5%R R100MQ No visible damage, AR≤±(0.5%R||tt ||R≥1GO ±25×10-/℃ ≤±15×10-/℃ ±25×10-/℃ ±15×10-/℃ Clause number and test items (See Note?) D group test (cycle) D1 group 4.24 Steady state damp heat D2 group 4.4.3 Dimensions (Detailed) 4.25.3 Upper category temperature Durability Additional instructions: SJ/T10574—94 Continued Table 2 Test conditions (See Note①) 4. 24.2.2 Group 1: 10 samples Group 2: 10 samples Appearance inspection Insulation resistance Duration: 1000l Inspection at 48, 500 and 1000h: Appearance inspection Inspection at 1000h: Insulation resistance This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and Qualified judgment number (see Note?) This standard was first issued on February 18, 1986 and revised in August 1994. 8 Performance requirements (See Note ①) No visible damage, clear marking AR≤土(0.5%R R≥100MQ According to Table 1 of this specification No visible damage AR≤±(0.5%R R≥1Gn Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.