JB/T 5837-1991 ZP series 2000A and above tube-shell rated rectifier diodes
Some standard content:
Mechanical Industry Standard of the People's Republic of China
ZP Series 2000A and Above Case Rated Rectifier Diodes 1 Subject Content and Scope of Application
This standard specifies the limit values, characteristic values and inspection rules and basis of case rated rectifier diodes. This standard applies to ZP2000, ZP2500, and ZP3000 cavity packaged rectifier diodes. 2
Cited standards
GB2900.32
Electrical terminology Power semiconductor devices
GB4937
GB4938
GB4024
ZBK46003
3 Technical requirements
Methods for mechanical and climatic test of discrete semiconductor devices Acceptance and reliability of discrete semiconductor devices
Test methods for reverse blocking triode thyristors for semiconductor devices Shell and tube for power semiconductor devices
8.1 Dimensions
Dimensions are in accordance with ZT type in ZBK46003. 3.2: Limiting values (absolute maximum ratings) 3.2.1
Limiting values are as specified in Table 1
Limiting values
Case temperature
Creep temperature
Equivalent junction temperature
Reverse repetitive peak voltage
Reverse non-repetitive peak voltage
Forward average current single-phase sine wave 180°
Conduction angle, resistive load
Forward (non-repetitive) surge current
Installation force
Ir(ar)
Reverse repetitive peak voltage VR is classified as per Table 2. Ministry of Machinery and Electronics Industry approved L on October 24, 1991, ZP2000, ZP2500, ~40~110, -40~160, 100~3000, VRRM= 0.9VnSM, JB5837—91, ZP3000, 18.8×106, 1601, implementation on October 24, 1992, Electrical Characteristics, Electrical Characteristics are as specified in Table 3. Characteristics and Conditions, Tem. =.25℃ (unless otherwise specified)
Forward peak voltage
Reverse repetitive peak current
Junction temperature -25℃ and 150℃
Junction to case thermal resistance
JB.583791
Symbol unit
Value (maximum value)
ZP2000
Note: ① In the following groups of inspections or tests, the junction temperature of 150℃ is actually 150-9℃ characteristic curve (not used for inspection)
The following characteristic curves should be given in the product manual: Case temperature and forward average current derating relationship curve; a.
Forward volt-ampere characteristic curve:
c. Transient thermal impedance vs. time curve d.
ZP2500
ZP3000
I\t characteristic curve;
Function relationship curve of maximum forward power dissipation vs. forward average current (conduction angle as parameter). Inspection rules
(Group A) Inspection
All inspections are non-destructive.
Tests for Group A shall be in accordance with the provisions of Table 4,
External visual inspection
Non-operating
Forward peak
Reverse repetition
Peak current
See B1 in Appendix
See B2 in Appendix
Te=25℃
(Unless otherwise specified)
Normal lighting and normal vision
According to A2b
According to A2b
I= 2I()
Junction temperature = 25℃ and 150℃
ZP2000
Inspection requirements (maximum value)
ZP2500
ZP3000
Marking is complete and clear, surface is not damaged,
Plating layer is not peeled off
Polarity is reversed
AQL(I)
JB·5837-—91
Note: ① The sampling of AQL (I) in the inspection requirements column can be found in A1 in Appendix A. When required, the forward peak voltage can also be tested at a junction temperature of 150℃. If the first inspection of Group A fails, it can be resubmitted for inspection according to A2 in Appendix A, which is one level stricter, but it can only be resubmitted once. 4.2 Periodic (Group B) Inspection
Group B inspection shall be in accordance with Table 5. For the standardized products produced normally, at least one batch of Group B inspection shall be carried out every year. Table 5
Temperature change
Final test
Forward peak
Hair repetitive peak
Value current
Electrical durability
Final test:
Forward peak
Hair repetitive peak
Value current
Release batch certificate
ZBK46003
GB4937,
GB4937,
(leakage rate)
GB4938,
Tcaxe=25C
(unless otherwise specified)
Two-box method, -40℃, 180℃
Cycle 5 times, each Cycle high and low temperature respectively
1h, transfer time 3~4min
Pressure fluorine oil leak detection
According to A2b
According to A2b
Commercial temperature reverse junction temperature = 150℃ Sine
wave 50Hz, 70%
VRRM, 16818h
According to A2b
According to A2b
Inspection requirements (maximum value)
ZP2000ZP2500
ZP3000Unit
Maximum shape and installation dimensions meet the requirements mm6
Briefly give the property data of B5 and B8, VFu and IR values before and after inspection, and inspection conclusion. Note: n and c in the inspection requirements column are the sampling number and qualified judgment number respectively, the same below. 1.9
If Group B fails the first inspection, additional sampling can be conducted according to A2 in Appendix A for another inspection, but each inspection group can only be additional once, and the additional samples should undergo all inspections of the group. 4.3 Periodic (Group C) Inspection
Group C inspection shall be in accordance with Table 6. For the standardized products produced normally, at least one batch of Group C inspection shall be conducted every year. The inspection marked with (D) is destructive.
ZBK46003
Normal meat (no re-weighting) rg
Surge current
Final test.
Forward peak voltage
Reverse repetitive peak current
See Appendix
B in B3
Teabe=25℃
(Unless otherwise specified)
Junction temperature -150℃, one cycle
wave, 20 times
According to A2b
According to A2b
ZP2000
Inspection requirements (maximum value)
ZP2500
ZP3000
Metal dimensions meet the requirements
According to 3.2's L, H two levels
Junction-to-case thermal resistance
Electrical durability
Final test:
Forward peak current
Reverse repetitive
Peak current
High temperature storage
Final test:
Forward peak
Reverse repetitive peak
Value current
Political approval
See Appendix B
GB4938,
GB4937,
JB5837-91
Continued Table 6
Ta=25℃|| tt||(Unless otherwise specified)
Temperature Reverse Bias Junction Temperature = 150℃
Sine Wave 50Hz, 70%
VrRM10008h
According to A2b
Connected to A2b
T=160-No.r
According to A2b
According to A2b
ZP2000
Inspection Requirements (Maximum Value)
ZP2500
ZP3000
Briefly give the attribute data of C8 and C9, the VFM and [rRM values before and after the inspection, and the inspection conclusion. If the first submission of Group C fails the inspection, it can be handled as the first submission of Group B. Approval (Group D) Test
The test of Group D is as specified in Table 7. IVD is the initial value of each device. Table 7
Thermal cycle load
Final test:
Forward derating
Reverse repetitive peak
Value current
Constant acceleration
Final test:
Forward derating
Reverse repetitive peak
Value current
See Appendix B5
GB4937,
T25℃
(Unless otherwise specified)
Number of cycles;
Crimp devices 5000 times
Weld devices 1000 times
According to A2b
According to A2b
Two different Each axis of the main axis
Two directions for 1min
According to A2b
According to A2b
ZP2000
Inspection requirements (maximum value)
ZP2500
ZP3000
5 Marking and ordering information
5.1 Marking on the device
a, device model and quality category,
JB5837-91
b. Terminal identification
Use the graphic symbol "ice" of the diode to indicate the cathode terminal; or paint a red dot to indicate the cathode terminal, and paint a blue (or black) dot or no color on the anode terminal.
Manufacturer name, code or trademark,
Inspection batch identification code.
5.2 Marking of device packaging box
All markings on the device except terminal markings; a.
Moisture-proof and rain-proof markings;
c..This standard number.
5.3 Ordering information
To order a device, at least the following information is required: accurate model,
This standard number;
Quality assessment Class I:
A1AQL sampling
AQL sampling according to Table A1
Batch range
16—25
26—50
91-150
151-280
281-500
501-1200
1201-3200
3201-10000
1000135000
35001-150000
JB583791
Appendix A
Sampling rate
(supplement)
Sample size
Note: ①This table belongs to inspection level (IL) II; 0.40
②C: number of qualified judgments, I: number of unqualified judgments, ③The arm head indicates that the first sampling plan pointed to should be used. If the sample size at the corresponding point pointed by the arrow is equal to or greater than the batch size, a 100% inspection should be carried out.
A2 Additional sampling
Additional sampling according to Table A2
Sample quantity
Initial sampling
Additional sampling
Additional number
Qualified number
B1 Forward peak voltage (VFM)
This test uses the pulse method.
B1.1 Principle circuit and requirements
The principle circuit is shown in Figure B1.
JB5837-91
Appendix B
Inspection and testing of limit values and electrical characteristics
(Supplement)
D—Device under test,
Rs—Resistors that have been calibrated to measure current:
Inductors and capacitors that generate forward current pulses; L, C-
S—Switching devices that control current pulses, which generate pulses when turned on and should be disconnected immediately after the pulse current ends; Ve, Ap
-Peak voltmeter, peak current meter or oscilloscope. The peak voltmeter should be able to display the voltage value when the forward current reaches the peak value.
B1.2 Test conditions
-Adjustable pulse AC power supply.
Junction temperature: 25℃ for batch test, 25℃ and T(vi) when required a.
Forward peak current: . yuan times of rated forward average current (yuan can be 3) or as specified in product standards; b.
Current pulse width: selected according to the carriers of the device under test can fully reach equilibrium during the measurement; c.
Current pulse: can be a single time or a low repetition frequency with negligible heat generation; d.
Measurement point position: as specified in Figure B2,
Metal pressure plate
Metal pressure plate
JB5837-91
f. Tightening pressure or torque between the device under test and the fixture: as specified in product standards. B2 Reverse repetitive peak current (IRRr)
B2.1 Principle circuit and requirements
The principle circuit is shown in Figure B3;
D-device under test;
Reverse characteristics;
D1, D:-diode that provides negative half-cycle voltage, so that only the reverse current of D is measured-an adjustable AC voltage source:
Rs-resistor that has been calibrated to measure current; R-current limiting protection resistor. When D breaks down, the current passing through D is limited; Ap, Ve
-peak ammeter, peak voltmeter or oscilloscope. The peak ammeter displays the current value when the reverse voltage reaches the peak value.
B2.2 Test conditions
Humidity: 25℃ and T(vi);
Reverse voltage: VRRM
AC voltage frequency: 50Hz
Forward (non-repetitive) surge current (IpsM) B3
Principle circuit and requirements
The principle circuit is shown in Figure B4.
-Device under test,
Ap, Vp
-Peak current meter, peak voltage meter or oscilloscope (long afterglow time); JB5837-91
D1~Diode blocking the forward voltage generated by transformer T2; RThe minimum protective resistor for the normal operation of the circuit; Mechanical electrical or electronic switch with 800 conduction angle; Resistor for regulating surge current;
S-During the forward surge half cycle, there is a low-voltage high-current transformer with
T1-providing a forward half-cycle surge current through S. This current waveform should be basically a sine half-wave with a duration of approximately 10ⅢS and a repetition frequency of approximately 50 pulses per second;
-High-voltage low-current transformer Ti
providing a reverse half-cycle voltage through a rectifier diode D:. If the transformer is fed by a separate power supply, T: and T should be fed on the same phase of the power grid. Its voltage waveform should be basically a sine half-wave.
B3.2 Test conditions
Junction temperature before surge, T();
Surge current peak: as specified in product standards; Reverse half-cycle voltage: 80% VRRM
Number of cycles for each surge: one cycle, conduction angle between 160° and 180°; Number of surges: 20 times.
Junction-to-case thermal resistance (Ri.)
B4.1 Principle
The diode under test is passed through a heating current to generate power loss P. When thermally balanced, the junction-to-case thermal temperature Ric is calculated by the measured equivalent junction temperature T(v) and the tube case temperature Tc according to formula (B1):
Ri=T(vi)-Te
The two-time method can also be used, that is, applying two different heating powers P and P3 to the device under test, and making the two junction temperatures equal by adjusting the cooling conditions (monitored by thermistor voltage), and measuring the corresponding tube case temperature Tc:and Tc2, the junction-to-case thermal resistance can be calculated according to formula (B2): Rie =
B4.2 Principle circuit and requirements
The principle circuit is shown in Figure B5.
D—Device under test,
Tet-Te
E——Power supply for providing heating current I1, the heating current can be DC or AC current; a DC thermistor current that flows through the device under test to monitor its junction temperature within a short period of time after the heating current is interrupted periodically, S
—Electronic switch that periodically interrupts the heating current I,: V,—Thermistor voltage detection unit;
—Electronic switch that closes when the heating current is interrupted, a power meter that indicates the power loss generated by the current in the junction of the device under test, an ammeter and a voltmeter can also be used, and the power is determined by the current and voltage calculation. (B2)
JB5837-91
B4.3 Test conditions
a Heating current I, size: using formula (B1), the power generated by I, should make the junction temperature close to or reach the equivalent junction temperature, usually the rated current. Using formula (B2), by adjusting the two heating currents and cooling conditions, the difference between the two measured shell temperatures is as large as possible to ensure the measurement accuracy,bzxZ.net
b. Thermistor current I,=1%~10%IF(Av)*
Measurement/c requirements are in accordance with 1.6.1 and 2.1.1 of GB4024, c.
d. Thermistor voltage should be measured during 0.5~1ms after the heating current is interrupted; the tightening pressure or torque of the device under test shall be in accordance with the product standard. e.
B5 Thermal cycle negative dissipation
Principle circuit and requirements
The principle circuit is shown in Figure B6.
D——Device under test;
Counter
--Low voltage and high current transformer that provides heating current; T
--Resistor that adjusts heating current;
S--Switch that is periodically turned on and off controlled by a time relay or temperature relay. The junction temperature of the diode under test can be indirectly monitored by the case temperature;
DC ammeter. The relationship between the heating current waveform and the junction temperature change waveform of the test circuit is shown in Figure B7. T
Tin-ioc
≤40℃
Heating time
Cooling time
≤8min
One cycle
B5.2 Test conditions
a. Heating current: The waveform is a half-wave sine wave at industrial frequency, and the value is the rated forward average current (the error is -10% to 0) 96
JB5837—91
b. Junction temperature range: The maximum temperature during heating is T(vi)-%.℃. If the device under test is tested in series, it can be T(vi)-%.℃. The temperature during cooling should not exceed 40℃.
c. The heating time shall not exceed 6min, and the cooling time shall not exceed 8m. d. Number of cycles: 5000 times.
Additional notes:
This standard was proposed and managed by the Xi'an Power Electronics Technology Research Institute of the Ministry of Machinery and Electronics Industry. This standard was drafted by the Xi'an Rectifier Factory. The main drafters of this standard are Zheng Yali and He Chengjie. 97
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