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YB/T 172-2000 Quantitative phase analysis of silica bricks by X-ray diffraction method

Basic Information

Standard ID: YB/T 172-2000

Standard Name: Quantitative phase analysis of silica bricks by X-ray diffraction method

Chinese Name: 硅砖定量相分析 X射线衍射法

Standard category:Metallurgical Industry Standard (YB)

state:in force

Date of Release2000-07-26

Date of Implementation:2000-12-01

standard classification number

Standard ICS number:Glass and ceramic industry >> 81.080 Refractory materials

Standard Classification Number:Building Materials>>Refractory Materials>>Q41 Silica Refractory Materials

associated standards

Publication information

publishing house:China Standards Press

ISBN:155066.2-13453

Publication date:2004-04-19

other information

drafter:Ren Gangwei, Zhang Huirong, Gao Xuanyi, Zhao Mengxi

Drafting unit:Luoyang Refractory Materials Research Institute, Beijing Coking Plant, Shanxi Mengxian Xixiaoping Refractory Materials Co., Ltd.

Focal point unit:National Technical Committee for Refractory Standardization

Proposing unit:National Technical Committee for Refractory Standardization

Publishing department:State Bureau of Metallurgical Industry

Introduction to standards:

This standard specifies the definition, principle, instrumentation, standard samples, sample preparation, quantitative analysis, and test report of X-ray quantitative phase analysis of silica bricks. This standard is applicable to the quantitative analysis of tridymite, cristobalite, and residual quartz in silica bricks. YB/T 172-2000 X-ray diffraction method for quantitative phase analysis of silica bricks YB/T172-2000 Standard download decompression password: www.bzxz.net

Some standard content:

Ferrous Metallurgy Industry Standard of the People's Republic of China IB/T 172
Phase quantitative analysis of silica bricks-X-ray diffraction method
Published on 2000-07-26
Published by State Bureau of Metallurgical Industry
Implementation on 2000-12-01
YB/T172-2000
This standard partially refers to my country's JG/T62-1!8 National Quantity Determination Standard X-ray Diffraction Method 3. There is no standard for the determination of residual stone content in non-metallic materials, especially bricks. The content of residual stone in bricks is a variable indicator of quality, and plays a role in promoting the production control and quality inspection of bricks. The appendix of this standard is the appendix of the standard.
This standard is proposed by the National Refractory Standardization Technical Committee. The drafting units of this standard are: Xiyang Refractory Research Institute, Beijing Jiaohua Guangxi Xiyun County Xixiaokong Refractory Co., Ltd. The main contributors of this standard are: Ren Gangqing, Zhang Huirong, Liang Yijie, Yue Mengxi. 1 Scope
Metallurgical Industry Standard of the People's Republic of China Quantitative Phase Analysis of Silica Bricks-X-ray Diffraction Methodwww.bzxz.net
Phose yuntilatlve anulysis uf silica bricks-X-ray diffraclios method
YB/T 172—2000
This standard specifies the definition, principles, instruments and equipment, sampling, sample preparation, analysis and test report of the quantitative and analytical method of the line.
It is applicable to the quantitative analysis of fresh quartz, quartz and residual quartz in silica bricks. 2 Cited standards
The clauses contained in the following standards become the clauses of this standard through reference in the technical standards. The current and new versions of this standard are valid. All standards will be revised so that all parties to this standard can use the new version of the standard. JIG/258 National F Verification Center for Multi-Product X-ray Radiometers 3 Definitions
The following definitions are applicable to the quantitative analysis of fresh quartz, quartz and residual quartz in silica bricks. 3. Cited standards
The following standards are applicable to the quantitative analysis of fresh quartz, quartz and residual quartz in silica bricks. 3. Cited standards
The following standards are applicable to the quantitative analysis of fresh quartz, quartz and residual quartz in silica bricks. 3. Cited standards
The following standards are applicable to the quantitative analysis of fresh quartz, quartz and residual quartz in silica bricks. 3. Cited standards
The following standards are applicable to the quantitative analysis of fresh quartz, quartz and residual quartz in silica bricks. 3. Cited standards 32. The analytical lines
need to study the common strength and determine the characteristics of the analyzed phase content based on this. 3.3. Isomers of silicon oxide
have different compositions. For example, quartz and quartz have different compositions, but their structures are different. 34. Pre-orientation
will increase the radiation extension of some surfaces due to the coarse particle size of the sample or the compression of the sample. 4. Principle and calculation formula
The multi-phase sample will be subjected to radiation treatment. The strength of the test sample is proportional to the content of the phase in the sample, and the absorption rate is proportional to the mass absorption rate of the multi-phase mixed sample. Quartz and residual quartz are all isomorphs of silicon oxide. The external method is simple and easy to use, and can be directly processed by a microcomputer.
Add the following formula: IW
fk-(w]
(x)+(w);
Account, Wx... Test mouth to be tested five percent, %; 1: - Sample to be tested relative analysis of the destruction of the request (Ix. 1 Special wine label line of the time change: State Metallurgical Industry Bureau 2100-07-26 approved x 1cc
2000-12-01 implementation
YB/T172-2000
), - the mass absorption coefficient of the standard sample is the maximum, c/() - the absorption coefficient of the sample is cm only: if there is no standard quartz, quartz, burnt quartz and other substances in the product: x
extension is equal to 1 toilet:
If other special phases are found: can be calculated according to the chemical composition of the formula Its mass absorption coefficient is calculated as follows: (im)
Wherein, (w)—mass absorption coefficient of the sample, cm/e(pm). A
, (m)—mass absorption coefficient of the second compound in the sample, cm/A, content of the first compound in the sample, %. Calculate (m) and substitute it into formula (1) to obtain W. The comprehensive quality of the instrument and equipment
in this paper is better than ±1% . The determination method is carried out according to the provisions of JG629 and the appendix of the standard.
6 Standard sample
61a-Stone standard sample
α-Stone contains more than 30% of salt. After diffraction and dimming microscope monitoring, no other phases are found except quartz. The X-ray pseudo-radiation line is bright and sharp. There is no broadening phenomenon.
62 Stone standard sample
Considering that quartz has more than 30% of salt, it is necessary to use the one that has been used for a long time in a high humidity furnace. Understand, the following 1 workpiece is all quartz Ai signed by X-ray and polarizing microscope. If there is a little bit of quartz, it must be multiplied by the correction coefficient when quantitative calculation. G.3 Six quartz standard
is a molten stone powder with Si content greater than 0.0AHm, ground to fine powder less than 0.0AHm, and then processed by 5G3C slow energy, heat preservation 1X line and polarizing microscope to complete the warehouse. The refraction rate is 1.1610. CC2 4..
7 Sample preparation
7.1 Remove the surface of each test paper: Take the color paper to less than 100mm, and make the powder wood sample by quartering. 7.2 The sample channel should be bottomless, and can be pressed on the surface of the sample. The sample rack is generally made of mortar or glass. 73 The ground powder is made into a sample in the rack and vertically pressed into a box. 7. The preparation requirements of the standard sample are the same as those of the test sample, including the size of the sample rack and the size of the sample rack. 5. If there is a preferred orientation, the sample can be re-made or the rotating sample table can be used. B Quantitative analysis
B.1 Test conditions
日.1.1 Hao
LukaCoKa.
日. 7-2 Scanning speed
20 degrees should not exceed 1°/rri1:8. 1. 3. Single-base system
For random selection, 1°
Acceptable selection of 0.3mm or 0.6mm:
8.2 The selection of points
YB/T172
8.2.1 Use (1ci0) surface. CoK224.5CuKa2c~.1°8.2-2. Stone type: (101) surface, CoK: 0.5~1.5; CuKr; 26*27*8.2.3 Use (101)f: CrKe.24.5~24*, CuKα:].5°~32.5°. If the force is not good for the quartz (0302) surface, the peak shape can be decomposed according to Figure 2 and then the right-hand process thermal conductivity Ix can be calculated according to formula (4):
Peak shape decomposition
Where: x—spectral intensity, mn
--- peak height, mm
Half-height width, mm.
The radiation intensity of the standard sample is the same as that of the sample. When measuring the thermal conductivity
, do a real-time measurement first to see if there is any selective selection. If there is a selective selection, it is necessary to re-make the rod and add a rotating table.
After computer processing, the visual intensity can be directly obtained. If it is difficult to calculate, it can be calculated according to formula (4). Lin Bai, Fangshi type measured Shengzhi, anti-price shooting surface and other three meats, take the average value: I Baijia because of the low content of at least five, take the average value 9 error analysis
standard error of the financial section
according to 10 fast in the complex, the error is 1.4, the coefficient of variation is 1.0%; Fangshi beauty standard error is 2.3: coefficient of variation 2. The standard error of g stone is 0.56 coefficient of variation 12.2. Standard error calculation formula (5):
-(5)
coefficient of variation calculation formula (6):
coefficient of variation ()
x:
half of the value of the first test;
first: the fruit of the first test:
——standard error..
1 Test report
The test report should include:
8) Commissioning unit;
1) Commissioning date:
c) Sample name and record:
d) Sample abbreviation:
c) Test total part;
Test result;
|) Test form
h) Notifier and reviewer
i) Test date.
YA/T 172—2000
YB/T 172—2Q00
Appendix A
(Appendix with shaded area)
Determination of comprehensive stability
The comprehensive image stability of the instrument in this standard refers to the condition that the sample and diffraction conditions are constant. The (101) sample surface of the standard material is diffused. After the instrument is stable for 2 hours, the computer is used to record the rapid measurement every minute. After continuous measurement for 6 hours, the comprehensive stability is improved and the formula (1) is used.
Xu — Xrr
X... I X..
The formula S will be stable, %
X.. is the maximum value;
X.ie—·define the minimum position,
...Al?
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