This standard is applicable to the development, production and procurement of devices. SJ 20158-1992 Semiconductor integrated circuit JT54S151, JT54S153 and JT54S157 type S-TTL data selector detailed specification SJ20158-1992 standard download decompression password: www.bzxz.net

Military standard of the electronics industry of the People's Republic of China SJ20158--92 Detail specification for types JIT54S151.JT54S153 and JT54S157 DATASELECTORS/MULTIOLEXERS of S-TTL semiconductor integrated circuits Issued on November 19, 1992 Implementation on May 1, 1993 Issued by the Ministry of Machinery and Electronics Industry of the People's Republic of China 1 Specification 1.1 Subject content．
1.2 Scope of application
1.3 Classification
2 Reference documents
3 Requirements
3.1 Detailed requirements
3.2 Design, structure and dimensions
3.3 Lead materials and coating
3.4 ​​Electrical characteristics
Electrical test requirements
3.6 Standard benefits
3.7 Division of microcircuit groups
4 Quality assurance regulations
Sampling and inspection
Identification inspection:
Quality consistency inspection
Inspection method
5 Delivery preparation
5.1 Packaging requirements...
6 Instructions
6.1 Intended use
6.2 Ordering information
6.3 Abbreviations, symbols and definitions
6.4 Substitution
TIKAONKAa-
People's Republic of China Electronic Industry Military Standard Semiconductor Integrated Circuits
JT54S151, JT54S153 and JT54S157 Type S-TTL Data Selector Detailed Specification
Detail specification for types JT54S151, JT54S153 and JT54S157DATA SELECTORS/MULTIOLEXERS ofS-TTL semiconductor integrated circuits1 Scope
1.1 Subject content
SJ20158—92
This specification specifies the detailed requirements for the semiconductor integrated circuits JT54S151, JT54S153 and JT54S157 type S-TTL data selectors (hereinafter referred to as devices). 1.2 Scope of application
This specification applies to the development, production and procurement of devices. 1.3 Classification
The devices given in this specification are classified according to device model, device grade, packaging form, rated value and recommended operating conditions.
1.3.1 Device number
The device number should be in accordance with the provisions of Article 3.6.2 of GJB597 "General Specification for Microcircuits". 1.3.1.1 Device model
The device models are as follows:
Device type
Jr54S151
JT54S153
JT54S157
1.3.1.2 Device level
Device name
8-to-1 data selector (with select input, complementary output) Dual 4-to-1 data selector [with select input) Quad 2-to-1! The device grade of the data selector (with common select input) is Class B as specified in Article 3.4 of GJB597 and Class B1 as specified in this specification. 1.3.1.3 Package form
The package form is as follows:
Approved by the Ministry of Machinery and Electronics Industry of the People's Republic of China on November 19, 1992 and implemented on May 1, 1993
1.3.2 Absolute maximum ratings
The absolute maximum ratings are as follows:
Power supply voltage
Input voltage
Storage temperature
JT54S151
JT54S153
JT54S157
Lead soldering temperature (10 s）
Shao Wen 2)
5J2013892
Packaging form (according to GB7092 "Semiconductor circuit dimensions") C20P3 (ceramic leadless package)
D16S3 (ceramic dual-row package)
F16X2 (ceramic flat package)
H16X2 (ceramic fusion-sealed flat package)
J16S3 (ceramic fusion-sealed dual-row package)
Note: 1) The device should be able to withstand the increased power consumption when testing the output short-circuit current (oE); 2) Except for the aging test in Section 4.3 of this specification, the junction temperature should not exceed 175°C. 1.3.3 Recommended operating conditions
The recommended operating conditions are as follows:
Power supply voltage
Input high level voltage
Input low level current
Input high level current
Input low level current
Operating ambient temperature
2 Reference documents
GB3431.1—82 Semiconductor integrated circuit symbols Electrical parameter symbols GB3431.2-86 Semiconductor integrated circuit symbols Terminal function symbols GB3439—82 Flat conductor integrated circuits Basic principles of TTL circuit test methods GB4590—84 Mechanical and climatic test methods for semiconductor integrated circuits GB4728.12—83 Graphic symbols for electrical diagrams Binary logic units 2
HTTKAONKAca-
$20158—92
GB7092—93 Semiconductor integrated circuit dimensions GJB548-88 Microelectronic device test methods and procedures GJB597—88 General specification for microcircuits
GJB/Z105 Manual for anti-static discharge control of electronic products 3 Requirements
3.1 Detailed requirements
Service item requirements should be in accordance with the provisions of GJB597. 3.2 Design, structure and dimensions
The design, structure and dimensions shall comply with the provisions of GJB597 and this specification: 3.2.1 Logic symbols, logic diagrams and terminal arrangement Logic symbols, logic diagrams and terminal arrangement shall comply with the provisions of Figure 1. The terminal arrangement is a top view. a: JT54S151
Logic symbol
, F, H, J type
Lead end arrangement
1 select
Logic diagram
h. JT54S153
Logic symbol
SJ20158—92
(14)(15)(1)(2)(3)(A)
(11)(12) (13)
D, F, H, J type
Lead end arrangement
1ehYec
15h23T
1 20 19
TKAONKAa-
Remote map
SJ20158—92
2ST2D2D22P12DoAp
c.JT54S157
Logic symbol
AIDID2IDIIDa1ST
Arrangement of the end of the mountain
E), F, H, J type
Logic Pavilion
16 Yec
130：
212019
174401
14g300
910111213.
4D14Do3D13Do 2D12De 1D11Dr
Figure 1 Logic symbol, logic diagram and little end arrangement 5
TKAONKAa-
3J 20158—92
3.2.2 Function table
The functions are as follows:
a.JTS4S151
JT54S153
JT54S157
Note: is high power: I. is low power: × is any state. D~D, is the complement of the corresponding D~D. 3.2.3 Power schematic
The manufacturer should submit the electrical schematic to the appraisal agency before appraisal. The electrical schematic diagram should be submitted to the appraisal agency for filing. 3.2.4 Package form
sJ 20158—92
The package form should comply with the provisions of Article 1.3.1.3 of this specification. 3.3 Lead material and coating
Lead material and coating should comply with the provisions of Article 3.5.6 of GJB597. 3.4 Electrical Characteristics
The electrical characteristics shall comply with the provisions of Table 1 of this specification. Table 1-1 Electrical Characteristics of JT54S151
Conditions 1)
Output high voltage
Input low voltage
Input voltage
Input current at maximum input voltage
Input half-voltage current
Input current 2)
Power supply current
Transmission delay time
Note: 1) The complete test conditions are shown in Table 3. 2) Only one output can be short-circuited at a time.
(if not otherwise specified
-55\C≤T≤125°C)
Vre=4.5 V, Vr-2.0 V
on-1mA
Pcc=4.5 V, VIH-2.0 V
Vn=0.7 V, fot=20 mA
Vcc-4.5 V, Iik--18 mA
Vec=5.5 V, V=5.5 V
Vcc=5.5 V, Vi-2.7 V
Vcc-5.5 V, Vf-0.5 V
R,=2802
Ci-15 pF
A→Y
A→W
D→Y
D→W
ST-→Y
ST-→W
Specification value
Input: high level voltage
Low indication
Input pin position current
Maximum input current
Input level current
Input low level current
Input short circuit current 2)
Power supply current
Propagation delay time
SJ20158—92
Table 1—2 Electrical properties of JT54S153
Condition 1
Method: 1) The complete test conditions are listed in Table 3. 2) Only one output terminal can be tested at a time. | |tt | mA
Ycc-4.5 V, Jk--18 mA
Yce-5.5 V, Vr-5.5 V
Vcc=5.5 V, Vi-2.7 V
Vcc=5.5 V, V-0.5 V
Yco-S.5 v
RL=280
Cr=15 pF
A→Y
A→D→Y
Specification
TTKAONKAa-
Output high level voltage
Output low level voltage
Input clamping voltage
Input current at maximum input voltage
Input high level current
Input low level current
Output short-circuit current 2)
Power supply current
Propagation delay time
sJ 20158—92
Table 1-3 Electrical characteristics of JT54S157
Note: 1) The complete test conditions are listed in Table 3. 2) Only one input can be short-circuited at a time.
Electrical test requirements
(No other provisions
55 °C≤T≤125 °℃)
Ycc=4.5 V, Vu-2.0 V
Ton--1 mA
Vcc=4.5 V. VtH-2.0 V
Vr=0.7V, lor=20 mA
Vcc=4.5V, IIk=-18mA
Vec=5.5 V, Vr-5.5 V
Vox-5.5 V. V,-2.7 V
Voc=5.5 V, V-0.5 v
Vox=5.5 V,A, ST input
Rt=2800
CL=15 pF
—A→1
any D→Y
ST→+Y
Specification value
The electrical test requirements for devices at all levels should be the relevant groups specified in Table 2 of this specification, and the electrical tests for each group shall be in accordance with the provisions of Table 3.
Table 2 Electrical test requirements
Intermediate (before aging) electrical test
Intermediate (after aging) output test
Final electrical test
Test requirements for Group A
Group C I point electrical test (Method 5005)
Grouping added for Group C inspection
Class B devices
A2.A3,A7,A9
Grouping (see Table 3)
Class B devices
A2, A3. A7,A9
A1, A2, A3 A7,A9, A10, At1
A1,A2,A3
Not required
Group D Endpoint Electrical Test (Method 5005)
A1,A2,A3
Note: 1) This group requires PDA calculation (see Section 4.2). AI. A2, A3, A7, A9
A1, A2, A3
AlU，All
Al. A2, A3
Reference Standard
GB3439
SJ 20158—92
Table 3—1 JT54S151 Electrical Test
(Unless otherwise specified, T=25°C)
Vcc-4.5 V, A input terminal Vlr=0.8 V, measure Y (measured output terminal IoH=-1 mA) A input terminal connected to Vm=2.0V, measure W (measured output terminal In=-1mA)
Vcc=4.5V, A input terminal Fi=0.8V. Measure W (measured output terminal Fal =20 mA) A input terminal Vu-2.0 V, measure Y (measured output IoL = 20 mA)
Vcc = 4.5 V, measured input Ik = 18 mA Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -5.5 V
Ycc = 5.5 V, ST and A are preset according to the function table, measured input V -2.7 V
Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -0.5 V
Vcc = 5.5 V, when measuring W output, A terminal V -5.5 V,ST, D7 grounded
When measuring Y output, DO0 connected to V,=5.5V, ST, A terminal grounded
Vcc=5.5V, all inputs grounded, output open circuit specification value
minimum maximum
T,-125\C, except VIk is not tested, parameters, conditions, specification values ​​are required to be the same as A1 group TA=-55℃C, except Vik is not tested, parameters, conditions, specification values ​​are required to be the same as AI group. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Y
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca-7 V
Vcc-5.5 V, Vf-0.5 V
R,=2802
Ci-15 pF
A→Y
A→W
D→Y
D→W
ST-→Y
ST-→W
Specification value
Input: high level voltage
Low indication
Input pin position current
Maximum input current
Input level current
Input low level current
Input short circuit current 2)
Power supply current
Propagation delay time
SJ20158—92
Table 1—2 Electrical properties of JT54S153
Condition 1
Method: 1) The complete test conditions are listed in Table 3. 2) Only one output terminal can be tested at a time. | |tt | mA
Ycc-4.5 V, Jk--18 mA
Yce-5.5 V, Vr-5.5 V
Vcc=5.5 V, Vi-2.7 V
Vcc=5.5 V, V-0.5 V
Yco-S.5 v
RL=280
Cr=15 pF
A→Y
A→D→Y
Specification
TTKAONKAa-
Output high level voltage
Output low level voltage
Input clamping voltage
Input current at maximum input voltage
Input high level current
Input low level current
Output short-circuit current 2)
Power supply current
Propagation delay time
sJ 20158—92
Table 1-3 Electrical characteristics of JT54S157
Note: 1) The complete test conditions are listed in Table 3. 2) Only one input can be short-circuited at a time.
Electrical test requirements
(No other provisions
55 °C≤T≤125 °℃)
Ycc=4.5 V, Vu-2.0 V
Ton--1 mA
Vcc=4.5 V. VtH-2.0 V
Vr=0.7V, lor=20 mA
Vcc=4.5V, IIk=-18mA
Vec=5.5 V, Vr-5.5 V
Vox-5.5 V. V,-2.7 V
Voc=5.5 V, V-0.5 v
Vox=5.5 V,A, ST input
Rt=2800
CL=15 pF
—A→1
any D→Y
ST→+Y
Specification value
The electrical test requirements for devices at all levels should be the relevant groups specified in Table 2 of this specification, and the electrical tests for each group shall be in accordance with the provisions of Table 3.
Table 2 Electrical test requirements
Intermediate (before aging) electrical test
Intermediate (after aging) output test
Final electrical test
Test requirements for Group A
Group C I point electrical test (Method 5005)
Grouping added for Group C inspection
Class B devices
A2.A3,A7,A9
Grouping (see Table 3)
Class B devices
A2, A3. A7,A9
A1, A2, A3 A7,A9, A10, At1
A1,A2,A3
Not required
Group D Endpoint Electrical Test (Method 5005)
A1,A2,A3
Note: 1) This group requires PDA calculation (see Section 4.2). AI. A2, A3, A7, A9
A1, A2, A3
AlU，All
Al. A2, A3
Reference Standard
GB3439
SJ 20158—92
Table 3—1 JT54S151 Electrical Test
(Unless otherwise specified, T=25°C)
Vcc-4.5 V, A input terminal Vlr=0.8 V, measure Y (measured output terminal IoH=-1 mA) A input terminal connected to Vm=2.0V, measure W (measured output terminal In=-1mA)
Vcc=4.5V, A input terminal Fi=0.8V. Measure W (measured output terminal Fal =20 mA) A input terminal Vu-2.0 V, measure Y (measured output IoL = 20 mA)
Vcc = 4.5 V, measured input Ik = 18 mA Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -5.5 V
Ycc = 5.5 V, ST and A are preset according to the function table, measured input V -2.7 V
Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -0.5 V
Vcc = 5.5 V, when measuring W output, A terminal V -5.5 V,ST, D7 grounded
When measuring Y output, DO0 connected to V,=5.5V, ST, A terminal grounded
Vcc=5.5V, all inputs grounded, output open circuit specification value
minimum maximum
T,-125\C, except VIk is not tested, parameters, conditions, specification values ​​are required to be the same as A1 group TA=-55℃C, except Vik is not tested, parameters, conditions, specification values ​​are required to be the same as AI group. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Y
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca-7 V
Vcc-5.5 V, Vf-0.5 V
R,=2802
Ci-15 pF
A→Y
A→W
D→Y
D→W
ST-→Y
ST-→W
Specification value
Input: high level voltage
Low indication
Input pin position current
Maximum input current
Input level current
Input low level current
Input short circuit current 2)
Power supply current
Propagation delay time
SJ20158—92
Table 1—2 Electrical properties of JT54S153
Condition 1
Method: 1) The complete test conditions are listed in Table 3. 2) Only one output terminal can be tested at a time. | |tt | mA
Ycc-4.5 V, Jk--18 mA
Yce-5.5 V, Vr-5.5 V
Vcc=5.5 V, Vi-2.7 V
Vcc=5.5 V, V-0.5 V
Yco-S.5 v
RL=280
Cr=15 pF
A→Y
A→D→Y
Specification
TTKAONKAa-
Output high level voltage
Output low level voltage
Input clamping voltage
Input current at maximum input voltage
Input high level current
Input low level current
Output short-circuit current 2)
Power supply current
Propagation delay time
sJ 20158—92
Table 1-3 Electrical characteristics of JT54S157
Note: 1) The complete test conditions are listed in Table 3. 2) Only one input can be short-circuited at a time.
Electrical test requirements
(No other provisions
55 °C≤T≤125 °℃)
Ycc=4.5 V, Vu-2.0 V
Ton--1 mA
Vcc=4.5 V. VtH-2.0 V
Vr=0.7V, lor=20 mA
Vcc=4.5V, IIk=-18mA
Vec=5.5 V, Vr-5.5 V
Vox-5.5 V. V,-2.7 V
Voc=5.5 V, V-0.5 v
Vox=5.5 V,A, ST input
Rt=2800
CL=15 pF
—A→1
any D→Y
ST→+Y
Specification value
The electrical test requirements for devices at all levels should be the relevant groups specified in Table 2 of this specification, and the electrical tests for each group shall be in accordance with the provisions of Table 3.
Table 2 Electrical test requirements
Intermediate (before aging) electrical test
Intermediate (after aging) output test
Final electrical test
Test requirements for Group A
Group C I point electrical test (Method 5005)
Grouping added for Group C inspection
Class B devices
A2.A3,A7,A9
Grouping (see Table 3)
Class B devices
A2, A3. A7,A9
A1, A2, A3 A7,A9, A10, At1
A1,A2,A3
Not required
Group D Endpoint Electrical Test (Method 5005)
A1,A2,A3
Note: 1) This group requires PDA calculation (see Section 4.2). AI. A2, A3, A7, A9
A1, A2, A3
AlU，All
Al. A2, A3
Reference Standard
GB3439
SJ 20158—92
Table 3—1 JT54S151 Electrical Test
(Unless otherwise specified, T=25°C)
Vcc-4.5 V, A input terminal Vlr=0.8 V, measure Y (measured output terminal IoH=-1 mA) A input terminal connected to Vm=2.0V, measure W (measured output terminal In=-1mA)
Vcc=4.5V, A input terminal Fi=0.8V. Measure W (measured output terminal Fal =20 mA) A input terminal Vu-2.0 V, measure Y (measured output IoL = 20 mA)
Vcc = 4.5 V, measured input Ik = 18 mA Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -5.5 V
Ycc = 5.5 V, ST and A are preset according to the function table, measured input V -2.7 V
Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -0.5 V
Vcc = 5.5 V, when measuring W output, A terminal V -5.5 V,ST, D7 grounded
When measuring Y output, DO0 connected to V,=5.5V, ST, A terminal grounded
Vcc=5.5V, all inputs grounded, output open circuit specification value
minimum maximum
T,-125\C, except VIk is not tested, parameters, conditions, specification values ​​are required to be the same as A1 group TA=-55℃C, except Vik is not tested, parameters, conditions, specification values ​​are required to be the same as AI group. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Y
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca-5 v
RL=280
Cr=15 pF
A→Y
D→Y
Specifications
TTKAONKAa-
Output high level voltage
Output low level voltage
Input clamping voltage
Input current at maximum input voltage
Input high level current
Input low level current
Output short-circuit current 2)
Power supply current
Propagation delay time
sJ 20158—92
Table 1-3 Electrical characteristics of JT54S157
Note: 1) The complete test conditions are listed in Table 3. 2) Only one input can be short-circuited at a time.
Electrical test requirements
(No other provisions
55 °C≤T≤125 °℃)
Ycc=4.5 V, Vu-2.0 V
Ton--1 mA
Vcc=4.5 V. VtH-2.0 V
Vr=0.7V, lor=20 mA
Vcc=4.5V, IIk=-18mA
Vec=5.5 V, Vr-5.5 V
Vox-5.5 V. V,-2.7 V
Voc=5.5 V, V-0.5 v
Vox=5.5 V,A, ST input
Rt=2800
CL=15 pF
—A→1
any D→Y
ST→+Y
Specification value
The electrical test requirements for devices at all levels should be the relevant groups specified in Table 2 of this specification, and the electrical tests for each group shall be in accordance with the provisions of Table 3.
Table 2 Electrical test requirements
Intermediate (before aging) electrical test
Intermediate (after aging) output test
Final electrical test
Test requirements for Group A
Group C I point electrical test (Method 5005)
Grouping added for Group C inspection
Class B devices
A2.A3,A7,A9
Grouping (see Table 3)
Class B devices
A2, A3. A7,A9
A1, A2, A3 A7,A9, A10, At1
A1,A2,A3
Not required
Group D Endpoint Electrical Test (Method 5005)
A1,A2,A3
Note: 1) This group requires PDA calculation (see Section 4.2). AI. A2, A3, A7, A9
A1, A2, A3
AlU，All
Al. A2, A3
Reference Standard
GB3439
SJ 20158—92
Table 3—1 JT54S151 Electrical Test
(Unless otherwise specified, T=25°C)
Vcc-4.5 V, A input terminal Vlr=0.8 V, measure Y (measured output terminal IoH=-1 mA) A input terminal connected to Vm=2.0V, measure W (measured output terminal In=-1mA)
Vcc=4.5V, A input terminal Fi=0.8V. Measure W (measured output terminal Fal =20 mA) A input terminal Vu-2.0 V, measure Y (measured output IoL = 20 mA)
Vcc = 4.5 V, measured input Ik = 18 mA Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -5.5 V
Ycc = 5.5 V, ST and A are preset according to the function table, measured input V -2.7 V
Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -0.5 V
Vcc = 5.5 V, when measuring W output, A terminal V -5.5 V,ST, D7 grounded
When measuring Y output, DO0 connected to V,=5.5V, ST, A terminal grounded
Vcc=5.5V, all inputs grounded, output open circuit specification value
minimum maximum
T,-125\C, except VIk is not tested, parameters, conditions, specification values ​​are required to be the same as A1 group TA=-55℃C, except Vik is not tested, parameters, conditions, specification values ​​are required to be the same as AI group. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Y
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca-5 v
RL=280
Cr=15 pF
A→Y
D→Y
Specifications
TTKAONKAa-
Output high level voltage
Output low level voltage
Input clamping voltage
Input current at maximum input voltage
Input high level current
Input low level current
Output short-circuit current 2)
Power supply current
Propagation delay time
sJ 20158—92
Table 1-3 Electrical characteristics of JT54S157
Note: 1) The complete test conditions are listed in Table 3. 2) Only one input can be short-circuited at a time.
Electrical test requirements
(No other provisions
55 °C≤T≤125 °℃)
Ycc=4.5 V, Vu-2.0 V
Ton--1 mA
Vcc=4.5 V. VtH-2.0 V
Vr=0.7V, lor=20 mA
Vcc=4.5V, IIk=-18mA
Vec=5.5 V, Vr-5.5 V
Vox-5.5 V. V,-2.7 V
Voc=5.5 V, V-0.5 v
Vox=5.5 V,A, ST input
Rt=2800
CL=15 pF
—A→1
any D→Y
ST→+Y
Specification value
The electrical test requirements for devices at all levels should be the relevant groups specified in Table 2 of this specification, and the electrical tests for each group shall be in accordance with the provisions of Table 3.
Table 2 Electrical test requirements
Intermediate (before aging) electrical test
Intermediate (after aging) output test
Final electrical test
Test requirements for Group A
Group C I point electrical test (Method 5005)
Grouping added for Group C inspection
Class B devices
A2.A3,A7,A9
Grouping (see Table 3)
Class B devices
A2, A3. A7,A9
A1, A2, A3 A7,A9, A10, At1
A1,A2,A3
Not required
Group D Endpoint Electrical Test (Method 5005)
A1,A2,A3
Note: 1) This group requires PDA calculation (see Section 4.2). AI. A2, A3, A7, A9
A1, A2, A3
AlU，All
Al. A2, A3
Reference Standard
GB3439
SJ 20158—92
Table 3—1 JT54S151 Electrical Test
(Unless otherwise specified, T=25°C)
Vcc-4.5 V, A input terminal Vlr=0.8 V, measure Y (measured output terminal IoH=-1 mA) A input terminal connected to Vm=2.0V, measure W (measured output terminal In=-1mA)
Vcc=4.5V, A input terminal Fi=0.8V. Measure W (measured output terminal Fal =20 mA) A input terminal Vu-2.0 V, measure Y (measured output IoL = 20 mA)
Vcc = 4.5 V, measured input Ik = 18 mA Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -5.5 V
Ycc = 5.5 V, ST and A are preset according to the function table, measured input V -2.7 V
Vcc = 5.5 V, ST and A are preset according to the function table, measured input V -0.5 V
Vcc = 5.5 V, when measuring W output, A terminal V -5.5 V,ST, D7 grounded
When measuring Y output, DO0 connected to V,=5.5V, ST, A terminal grounded
Vcc=5.5V, all inputs grounded, output open circuit specification value
minimum maximum
T,-125\C, except VIk is not tested, parameters, conditions, specification values ​​are required to be the same as A1 group TA=-55℃C, except Vik is not tested, parameters, conditions, specification values ​​are required to be the same as AI group. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Y
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca--125\C, except VIk is not tested, the parameters, conditions, and specification values ​​are the same as those in group A1 TA=-55℃C, except Vik is not tested, the parameters, conditions, and specification values ​​are the same as those in group AI. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Y
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca--125\C, except VIk is not tested, the parameters, conditions, and specification values ​​are the same as those in group A1 TA=-55℃C, except Vik is not tested, the parameters, conditions, and specification values ​​are the same as those in group AI. Function
Vcc=5.0V, test according to the function table
Vcc5.0V, see Figure 2 of this specification
A→Ybzxz.net
A→W
D-→Y
A→W
ST→Y
ST-→W
KAONKAca-
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