Technical data of Type DW-305 electronic glass
Basic Information
Standard ID:
SJ/T 10587.1-1994
Standard Name:Technical data of Type DW-305 electronic glass
Chinese Name:
ＤＭ－３０５型电子玻璃技术数据
Standard category:Electronic Industry Standard (SJ)
state:Abolished
Date of Release1994-08-08
Date of Implementation:1994-12-01
Date of Expiration:2008-01-20
standard classification number
Standard Classification Number:General>>Standardization Management and General Provisions>>A01 Technical Management
associated standards
alternative situation:SJ 672-83
Publication information
other information
Introduction to standards:
SJ/T 10587.1-1994 DM-305 electronic glass technical data SJ/T10587.1-1994 standard download decompression password: www.bzxz.net
Some standard content:
Electronic Industry Standard of the People's Republic of China
Technical data of type DW-305 electronic glass
Technical data of type DW-305 electronic glassSubject content and scope of application
This standard specifies the chemical composition and physical and chemical performance indicators of DM-305 electronic glass. This standard applies to glass materials used in thyristors and semiconductor device packaging. Reference standards
GB9000: Standard method for chemical analysis of electronic glassGB9622Test method for physical and chemical properties of electronic glass3 Technical requirements
Chemical composition is shown in Table 1.
Weight percentage (%)
67.5±1.0
Note: 1) FeO, as an impurity control, is not included in the percentage composition. 3.2 Physical and chemical performance indicators are shown in Table 2.
1994-08-08 Ministry of Electronics Industry of the People's Republic of China approved SJ/T10587.1--94
Replaced SJ672-83
Test method
GB9000.10
GB9000.14
Implemented on 1994-12-01
Indicator name
SJ/T10587.1-94Www.bzxZ.net
0~3 Average linear thermal expansion coefficient α within the 00℃ range Density
Softening point
Annealing point
Strain point
Dielectric loss tangent value 1g8×10° at rate 6MHz and temperature 20℃Temperature (Tx-10) when volume resistivity is 100Ma·cm Thermal stability
Water resistance and chemical stability level
Additional notes:
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. 1/℃
(49.0±1.0)X10-7
2.260±0.015
720±10
500±10
455±10
≥290
≥190
This standard was drafted by Factory 772, Factory 774 and the Standardization Institute of the Ministry of Electronics Industry. The main drafters of this standard are Wang Yongmei and Liu Chengjun. This standard was first issued in 1973 and revised for the second time in August 1994. 2
Test method
GB9622.11
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