title>GB/T 3789.13-1991 Test method for electrical performance of transmitting tubes Test method for static characteristic curve of common-gate circuit - GB/T 3789.13-1991 - Chinese standardNet - bzxz.net
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GB/T 3789.13-1991 Test method for electrical performance of transmitting tubes Test method for static characteristic curve of common-gate circuit
Basic Information
Standard ID:
GB/T 3789.13-1991
Standard Name: Test method for electrical performance of transmitting tubes Test method for static characteristic curve of common-gate circuit
This standard specifies the test method for the static characteristic curve of the common-gate circuit of the transmitting tube. This standard applies to the transmitting tube used in television transmitting equipment. GB/T 3789.13-1991 Test method for the electrical performance of transmitting tubes Test method for the static characteristic curve of the common-gate circuit GB/T3789.13-1991 Standard download decompression password: www.bzxz.net
Some standard content:
National Standard of the People's Republic of China Test methods for electrical properties of transmitting tubes Measurements of the ekectrical properties of transmitting tubesMethods of measurements of statice characteristic curve tor cormrnon grid circuit1Subject content and scope of application This standard specifies the test methods for statice characteristic curve of common-grid circuit of transmitting tubes. This standard applies to transmitting tubes for television transmitting equipment. 2 Reference standards GB/T3789.1 General principles for testing methods for electrical properties of transmitting tubes 3 Terminology GB/T 3789. 13 -- 91 3.1 Constant current characteristic curve of anode for common grid circuit When the voltages of the other electrodes remain unchanged and the anode current takes a certain value, the relationship curve between the voltage between the cathode and the first grid and the voltage between the anode and the first grid (the relationship curves between the voltage between the cathode and the first grid and the voltage between the anode and the first grid when the anode current takes different values constitute a family of characteristic curves) 3.2 Constant current characteristic curve of screen far common gridcitcuit When the voltages of the other electrodes remain unchanged and the second grid current takes a certain value, the relationship line between the voltage between the cathode and the first grid and the voltage between the anode and the first grid (the relationship curves between the voltage between the cathode and the first grid and the voltage between the anode and the first grid when the first grid current takes different values constitute a family of characteristic curves). 3.3 Constant current characteristic curve of gtride for command grid circuit When the voltages of the other electrodes remain unchanged and the second grid current takes a certain value, the relationship curve between the voltage between the cathode and the first grid and the voltage between the anode and the first grid (the relationship curves between the voltage between the cathode and the first grid and the voltage between the anode and the first grid when the first grid current takes different values constitute a family of characteristic curves). 4 Electrical schematic diagram Approved by the State Bureau of Technical Supervision on August 15, 1991 and implemented on April 1, 1992 The main components in Figure 2 should meet the following requirements: P Rh Re, Ra- Pulse signal generator: GB/T 3789. 13--91 Common-gate DC method test electrical schematic diagram Figure 2 Common-gate pulse method test electrical schematic diagram Unrestricted resistor. The error is not more than 1%, and the resistance should meet the following conditions: Ri≤0. 03 Rimn +R20.03R2mun; The voltage drop on R should be less than 5% of the cathode pulse voltage value; The minimum internal resistance of an electron tube when it is turned on; Where. Rrdo- Rg2hmya— The equivalent minimum resistance between the third grid and the cathode of an electron tube when it is turned on: R When the RBR resistance is small, the influence of the wire and contact resistance should be considered. Due to the influence of heat dissipation, the resistance GB/T 3789. 13-91 The change should not exceed ±0.5% of the normal value: C. C.2—·Capacitor, the capacity should meet the following conditions: C.zp* Ra, R2——Resistance. The resistance should meet the following conditions: 0 Pulse drop coefficient; Where: pr T——Pulse width;wwW.bzxz.Net T——Pulse period. Resistance. The DC voltage drop on it should not exceed 0.5% of the cathode DC voltage, C,1-capacitor. Its selection condition is that when the gate pulse current flows, the voltage drop on the capacitor should not exceed 1% of the pulse amplitude. The capacitor should be able to ensure the positive band operation of the pulse circuit; P~P- Pulse voltage meter or indicator. 5 Test equipment and test rules Test equipment and test rules should comply with the provisions of GB/T3789.1. 6 Test method 6.1 Common gate DC method 6.1.1 Add the filament voltage according to the specification. 6.1.2 Add the voltages of other poles according to 3.1~3.3 and measure the corresponding values, and draw the corresponding characteristic curve. 6.2 Common pulse method 6.2.1 Add the filament voltage and a sufficiently positive cathode voltage according to the specification to make the tube under test in the cut-off state. 6.2.2 Superimpose a negative pulse voltage on the positive voltage of the cathode, measure the corresponding values according to 3.1 to 3.3, and draw the corresponding characteristic curve. Note: ① When the electrodes of the transistor exceed the specified maximum dissipation power, the pulse method is used for testing. ② When measuring the characteristic curve of the tetrode, both the second grid voltage equals the specified value and equals 50% to 80% of the specified value should be drawn. Additional explanation: This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is drafted by the Electronic Standardization Institute of the Ministry of Machinery and Electronics Industry and Factory 779. Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.