title>GB/T 3789.13-1991 Test method for electrical performance of transmitting tubes Test method for static characteristic curve of common-gate circuit - GB/T 3789.13-1991 - Chinese standardNet - bzxz.net
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GB/T 3789.13-1991 Test method for electrical performance of transmitting tubes Test method for static characteristic curve of common-gate circuit

Basic Information

Standard ID: GB/T 3789.13-1991

Standard Name: Test method for electrical performance of transmitting tubes Test method for static characteristic curve of common-gate circuit

Chinese Name: 发射管电性能测试方法 共栅电路静态特性曲线的测试方法

Standard category:National Standard (GB)

state:in force

Date of Release1991-08-15

Date of Implementation:1992-04-01

standard classification number

Standard ICS number:Electronics >> 31.100 Electron Tubes

Standard Classification Number:Electronic Components and Information Technology>>Electro Vacuum Devices>>L35 Electro Vacuum Devices Comprehensive

associated standards

alternative situation:Replaces GB 3789.13-83

Publication information

publishing house:China Standards Press

Publication date:1992-04-01

other information

Release date:1983-06-29

Review date:2004-10-14

Drafting unit:Electronic Standardization Institute of the Ministry of Machinery and Electronics Industry and Factory 799

Focal point unit:National Technical Committee for Standardization of Vacuum Devices

Proposing unit:Ministry of Machinery and Electronics Industry of the People's Republic of China

Publishing department:State Bureau of Technical Supervision

competent authority:Ministry of Information Industry (Electronics)

Introduction to standards:

This standard specifies the test method for the static characteristic curve of the common-gate circuit of the transmitting tube. This standard applies to the transmitting tube used in television transmitting equipment. GB/T 3789.13-1991 Test method for the electrical performance of transmitting tubes Test method for the static characteristic curve of the common-gate circuit GB/T3789.13-1991 Standard download decompression password: www.bzxz.net

Some standard content:

National Standard of the People's Republic of China
Test methods for electrical properties of transmitting tubes
Measurements of the ekectrical properties of transmitting tubesMethods of measurements of statice characteristic curve tor cormrnon grid circuit1Subject content and scope of application
This standard specifies the test methods for statice characteristic curve of common-grid circuit of transmitting tubes. This standard applies to transmitting tubes for television transmitting equipment. 2 Reference standards
GB/T3789.1 General principles for testing methods for electrical properties of transmitting tubes 3 Terminology
GB/T 3789. 13 -- 91
3.1 Constant current characteristic curve of anode for common grid circuit When the voltages of the other electrodes remain unchanged and the anode current takes a certain value, the relationship curve between the voltage between the cathode and the first grid and the voltage between the anode and the first grid (the relationship curves between the voltage between the cathode and the first grid and the voltage between the anode and the first grid when the anode current takes different values ​​constitute a family of characteristic curves)
3.2 Constant current characteristic curve of screen far common gridcitcuit
When the voltages of the other electrodes remain unchanged and the second grid current takes a certain value, the relationship line between the voltage between the cathode and the first grid and the voltage between the anode and the first grid (the relationship curves between the voltage between the cathode and the first grid and the voltage between the anode and the first grid when the first grid current takes different values ​​constitute a family of characteristic curves).
3.3 Constant current characteristic curve of gtride for command grid circuit
When the voltages of the other electrodes remain unchanged and the second grid current takes a certain value, the relationship curve between the voltage between the cathode and the first grid and the voltage between the anode and the first grid (the relationship curves between the voltage between the cathode and the first grid and the voltage between the anode and the first grid when the first grid current takes different values ​​constitute a family of characteristic curves).
4 Electrical schematic diagram
Approved by the State Bureau of Technical Supervision on August 15, 1991 and implemented on April 1, 1992
The main components in Figure 2 should meet the following requirements: P
Rh Re, Ra-
Pulse signal generator:
GB/T 3789. 13--91
Common-gate DC method test electrical schematic diagram
Figure 2 Common-gate pulse method test electrical schematic diagram
Unrestricted resistor. The error is not more than 1%, and the resistance should meet the following conditions: Ri≤0. 03 Rimn +R20.03R2mun; The voltage drop on R should be less than 5% of the cathode pulse voltage value; The minimum internal resistance of an electron tube when it is turned on; Where. Rrdo-
Rg2hmya—
The equivalent minimum resistance between the third grid and the cathode of an electron tube when it is turned on: R
When the RBR resistance is small, the influence of the wire and contact resistance should be considered. Due to the influence of heat dissipation, the resistance GB/T 3789. 13-91
The change should not exceed ±0.5% of the normal value: C. C.2—·Capacitor, the capacity should meet the following conditions: C.zp*
Ra, R2——Resistance. The resistance should meet the following conditions: 0
Pulse drop coefficient;
Where: pr
T——Pulse width;wwW.bzxz.Net
T——Pulse period.
Resistance. The DC voltage drop on it should not exceed 0.5% of the cathode DC voltage, C,1-capacitor. Its selection condition is that when the gate pulse current flows, the voltage drop on the capacitor should not exceed 1% of the pulse amplitude. The capacitor should be able to ensure the positive band operation of the pulse circuit; P~P-
Pulse voltage meter or indicator.
5 Test equipment and test rules
Test equipment and test rules should comply with the provisions of GB/T3789.1. 6 Test method
6.1 Common gate DC method
6.1.1 Add the filament voltage according to the specification.
6.1.2 Add the voltages of other poles according to 3.1~3.3 and measure the corresponding values, and draw the corresponding characteristic curve. 6.2 Common pulse method
6.2.1 Add the filament voltage and a sufficiently positive cathode voltage according to the specification to make the tube under test in the cut-off state. 6.2.2 Superimpose a negative pulse voltage on the positive voltage of the cathode, measure the corresponding values ​​according to 3.1 to 3.3, and draw the corresponding characteristic curve.
Note: ① When the electrodes of the transistor exceed the specified maximum dissipation power, the pulse method is used for testing. ② When measuring the characteristic curve of the tetrode, both the second grid voltage equals the specified value and equals 50% to 80% of the specified value should be drawn. Additional explanation:
This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is drafted by the Electronic Standardization Institute of the Ministry of Machinery and Electronics Industry and Factory 779.
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