This standard specifies the terms, principles and methods for the calibration of the metrological characteristics of contact (stylus) instruments for measuring the surface structure of workpieces by the profile method. This standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for measuring the surface structure by the profile method as described in GB/T 6062-2002. The calibration is completed with the aid of measurement standards. GB/T 19600-2004 Technical Specification for Product Geometric Measurements (GPS) Calibration of Contact (Stylus) Instruments for Surface Structure Profile Method GB/T19600-2004 Standard download decompression password: www.bzxz.net

ICS 17. 040. 30
National Standard of the People's Republic of China
GB/T 19600—2004/ISO 12179.2000Geometrical Product Specifications(GPS)-Surface texture---Profile method---Calibration of contact (stylus) instrunents(ISO 12179:2000, IDT)
2004-11-11 Issued
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China Standardization Administration of China
2005-07-01 Implementation
GB/T1960D—2004/ES012179:2000 Foreword
This standard is equivalent to the international standard ISO12179:2000 "Technical Specification for Product Geometry (GPS) Surface Structure Profile Method Contact (Stylus) Instrument Calibration" (English version) This standard mainly specifies the calibration principles of contact (stylus) instruments that meet the definition of GB/T6062, and provides calibration methods and procedures for calibrating instruments using measurement standards. This standard is applicable to the calibration of stylus-type measuring instruments that use the wheel method to measure the surface structure of the disk. Appendices A and B of this standard are normative appendices; Appendix C and Appendix D are informative appendices. This standard is proposed by the National Technical Committee for Standardization of Product Dimensions and Geometry and is under the jurisdiction of the National Technical Committee for Standardization of Product Dimensions and Geometry. The drafting units of this standard are: Mechanical Science Research Institute, Harbin Institute of Technology, Times Group, China Institute of Metrology, Chengdu Tool Research Institute, Beijing Institute of Metrology, Harbin University of Technology. The main drafters of this standard are: Yu Xinling, Lang Yanmei, Wang Zhongbin, Gao Sitian, Deng Ninghaoxun, Chen Jie. :com1Scope
CB/1 19600--2004/S012179:2000 Product Geometry Specification (GPS)
Surface Structure Profile Method
Calibration of Contact (Stylus) Instruments
This standard specifies the terms, principles and methods for the calibration of the metrological characteristics of contact (stylus) instruments for measuring the surface structure of workpieces by the profile method. This standard applies to the calibration of the metrological characteristics of contact (stylus) instruments for measuring the surface structure by the wheel method described in GB/T6062-2002. This calibration is done with the help of measurement standards. Appendix A gives the calibration of instruments for measuring graphical method parameters. Appendix B applies to the calibration of contact (stylus) instruments for simplified calculations. Such instruments do not meet the definition of GB/T6062-2002. 2 Normative references
The clauses in the following standards become clauses of this standard through reference in this standard. For any dated referenced document, all subsequent amendments (excluding errata) are not applicable to this standard. However, parties to an agreement based on this standard are encouraged to study whether the latest versions of these documents can be used. For any undated referenced document, its latest version applies to this standard. GB/T 3505-2000 Technical Specifications for Product Geometric Quantities (GPS) Surface Structure Profile Method Terms, Definitions and Parameters of Surface Structure (egvIS0 4287:1997)
GB/T6062-2002 Technical Specification for Product Geometry (GPS) Nominal Characteristics of Surface Structure Wheel Method Contact (Stylus) Instruments (eqyIS03274:1996)
GB/T18618-2002 Technical Specification for Product Geometry (GPS) Graphic Parameters of Surface Structure Profile Method (egYISt)12085:1996)
GB/T18779.1-2002 Product Technical Specification for Geometric Measurement (GPS) Measurement and Inspection of Workpieces and Measuring Equipment Part 1: Rules for Determining Qualified or Unqualified According to the Specification (eqVIS014253-1:1998) GB/T18779.2-2004 Technical Specification for Geometric Measurement (GPS) Measurement and Inspection of Workpieces and Measuring Equipment Part 2: Guidelines for the Evaluation of Uncertainty of GPS Measurements in Calibration of Measuring Equipment and Product Inspection (IS0/TS14253-2:1999, IDT) GB/T 19022.3~~1994Quality assurance requirements for measuring equipment Part 1: Metrological confirmation system for measuring equipment (inlt ISO) 10012-1:1992)
(GB/TJ9867.1-2003Product geometric quantity technical specification (GPS)Surface structure profile measurement standard Part 1: Physical measurement standard ISO5436-1:2000, IDT)JJF1001—1998General metrological terms and definitions (VIM 2nd edition, 1993)JJF1059—1999Evaluation and expression of measurement uncertainty. (GUM 1st edition, 1995)3 Terms and definitions
The terms and definitions established by GB/T3505, CB/T6062, GB/T18779.1, JJF1001 and JJF1059 and the following terms and definitions apply to this standard.
Calibration
A set of operations performed to determine, under specified conditions, the relationship between the value indicated by a measuring instrument or measuring system, or the value represented by a physical quantity or reference material, and the corresponding value reproduced by a standard. GB/T 19600---2004/IS0 12179:20003.2
Task related calibrationA set of operations performed to determine, under specified conditions, the relationship between the value indicated by a measuring instrument and the corresponding value of a set of strictly defined measured parameters that constitute a subset of the measurement capability of the measuring instrument. 3.3
Adjustment (of a measuring instrument)An operation to bring the performance of a measuring instrument into a state suitable for use. 3.4
(neasurement) standard
(avoidance) standard
etalon
a physical quantity, measuring instrument, reference material or measuring system used as a reference in order to define, achieve, preserve or reproduce a unit or one or more values ​​of a quantity.
uncertainty of measurement characterizes the dispersion of the values ​​reasonably attributed to the measurand, a parameter associated with the measurement result. 3.6
traceability
The property of a measurement result or the value of a measurement standard being able to be related to a specified reference standard, usually a national or international measurement standard, by an unbroken chain of comparisons with specified uncertainties. 4 Application conditions
Short design and calibration of contact (stylus) instruments 4.1
Contact (stylus) instruments generally consist of a host, a driver, a probe and a profile recorder (see GB/T 6062). If the host is equipped with several drives and probes, each configuration of the instrument should be calibrated separately. 4.2 Calibration of various configurations
When the basic components of the contact (stylus) instrument are changed, which intentionally or unintentionally affects the measured performance or measurement results, the instrument should be calibrated. Each configuration of the instrument should be calibrated separately. Example: After the probe of the contact (stylus) instrument is replaced, it should be recalibrated. 4.3 Calibration location
Taking into account the influence of external environmental factors, the calibration of the contact (stylus) instrument should be carried out in a location with similar environmental conditions as the use environment. Example: noise, temperature, vibration, air flow, etc. 5 Measurement Standards
The following measurement standards may be used for calibration as specified in Chapter 6: - Optical flats;
Depth measurement standard (Fig. 1), Class A as defined in GB/T 19067.1; Spacing measurement standard (Fig. 2), Class C as defined in GB/T 19067.1 l Tilted optical flats (Fig. 3):
...··· Contour coordinate measurement standard (consisting of a sphere or calibration cylinder): Class E as defined in GB/T 19067.1; Roughness measurement standard (Fig. 4), Class D as defined in GB/T 19067.1; Note: It is recommended that when using coordinate measurement standards to calibrate contact (stylus) instruments, the stylus should not rotate more than ±1.5 degrees within the stroke length. 6 Metrological characteristics of contact (stylus) instruments
Among the metrological characteristics of contact (stylus) instruments, only those characteristics relevant to the measurement task are evaluated. Sister, when measuring the spacing parameters, it is not necessary to calibrate the vertical profile component.
6.1 Residual wheel calibration
GB/T 19600--2004/1SO 12179:2000 Use an optical flat surface without scratches to reproduce the residual wheel profile. For task-related calibration, appropriate wheels and parameters should be selected (e.g., roughness of the wheel Ra.Rg or Rt: waviness of the profile Wg or Wt). Note: This calibration method can be used to evaluate the straightness of the external guide rail, the influence of the external environment and instrument noise on the measurement. The front position is mm
Figure 1 Example of degree measurement standard (type A2)
Example of spacing measurement standard (type C)
Figure 3 Tilted optical flat crystal and measurement plan example GB/T 19600-2004/IS0 12179:2000MHH
0.0 41 B.15 1E3
0.34.368.4
Figure 4 Roughness measurement standard (type D) and measurement plan example 6.2 Profile vertical component calibration
The profile depth is reproduced with the depth measurement standard to evaluate the indication error of the instrument when measuring the vertical component of the profile. Note: If there is no depth measurement standard, the closest block can be used instead. When using gauge blocks, the influence of the uncertainty of the gauge block height difference should be considered. 6.3 Calibration of horizontal wheel components
The average precision PSm of the wheel contour unit reproduced by the spacing measurement standard is used to evaluate the indication error of the instrument when measuring the horizontal wheel contour component.
6. 4 Calibration of wheel sector coordinate measurement system
The tilted optical plane reproduces:
The angle value of the least squares best fit angle: The total height Pt of the original contour after removing the least squares best fit straight line; The instrument errors related to the horizontal and vertical coordinate components (such as changes in sliding speed, nonlinearity of the measurement display, etc.) are determined from the surface. After removing the least squares best fit nominal shape, the wheel contour coordinate measurement standard reproduces the total commercial degree Ft of the original contour from the surface to establish the coordinate system.
6.5 Comprehensive calibration of contact (stylus) instruments
Roughness tidal volume standard reproducibility:
Arithmetic mean deviation Rai
Maximum height of profile Rz
The comprehensive inspection of the performance of the contact (stylus) instrument is realized. 7 Calibration
7. 1 Preparation for calibration
Before calibration, the contact (stylus) instrument should be checked according to the manufacturer's operating instructions to determine whether the instrument is working properly, and then the state of the stylus tip should be checked according to the manufacturer's instructions. For the calibration of the contact (stylus) instrument, the following preparations should be made: - Evaluate the residual profile.
GB/T 19600—2004/IS0 12179:2000 - The working surface of the depth measurement standard should be adjusted as horizontally as possible with the reference surface. All measuring standards shall be correctly levelled, i.e. the working face of the roughness measuring standard shall be levelled to within 10 % of the set measuring range and not more than 10 μm over the entire evaluation length.
For task-related calibration, a roughness measuring standard shall be used that is appropriate to the roughness of the surface to be measured. Each measurement shall be made in the middle of the vertical measuring disc range of the probe. - A sufficient number of measurements shall be made for each measuring standard in order to achieve the specified measurement uncertainty (see clause 8). Due to the influence of factors such as inhomogeneities of the measuring standard, variations in the measuring process and the repeatability of contact (stylus) instruments, a number of repeated measurements shall normally be made.
- The measuring conditions for the measuring standards shall correspond to those used for the calibration of the measuring standards. ... - The best fit procedure (e.g. least squares, minimum area, etc.) used for the calibration of the measuring standards shall be used. 7.2 Evaluation of residual profile
Measure the optical flat. Determine the residual profile and calculate the surface structure parameters P and Pg. In task-related calibration, calibration shall be carried out under measuring conditions that correspond to the actual measurement. For example, when measuring a roughness measuring standard, the sampling length is set to α = 0.8 mm, the cut-off length ratio is 300:1 and the evaluation length is 4 mm. The measured values ​​of Rα and Rz shall be given and briefly explained on the calibration certificate of the instrument. 7.3 Calibration of the vertical component of the profile
7.3.1 Purpose of calibration
Measure the groove section of the depth measuring standard, calculate the parameter values ​​from the original profile curve and determine the difference between them and the corresponding parameter values ​​given in the calibration certificate of the measuring standard.
7.3.2 Calibration procedure
Measure the groove of the profile section within the calibration area of ​​the depth measuring standard (see Figure 1). Slide the stylus over the groove at each measurement and determine the groove depth value according to the method given in the calibration certificate of the depth measuring standard. Determine the difference between the measured (average) value (the result of calculation from several measured values) and the value given in the calibration certificate of the measuring standard. If there is no depth measurement standard, two gauge blocks can be placed parallel to each other on the optical flat crystal. The two gauge blocks should be in close contact and there should be no distance between them. Move the stylus across the two gauge blocks and find the height difference between the two gauge blocks from the full-circle oil line. Find the height difference of the two gauge blocks from the gauge block height values ​​given on the calibration certificates of the two gauge blocks and calculate the difference between the actual measured height difference and the gauge block height. 7.4 Calibration of the horizontal component of the profile
7.4.1 Calibration purpose
Measure the distance measurement standard and calculate the difference between the measured distance parameter and the corresponding value given on the calibration certificate of the measurement standard. 7.4.2 Calibration procedure
Measure at points within the full measurement range of the distance measurement standard. An example of a measurement scheme is given in Figure 2. Find the original profile parameter PSm + calculate the difference between the arithmetic mean of several measured values ​​and the value given on the calibration certificate of the measurement standard. 7.5 Calibration of the Profile Coordinate System
7.5.1 Purpose of Calibration
Measure the tilted optical flat, sphere or prism and calculate the Pt value from the profile curve after removing the least squares best fit shape of the sample. 7.5.2 Calibration Procedure
Measure each tilted measurement standard using the same travel length and nominal angle of tilt as specified in the measurement standard calibration certificate. The measurements should be spread out as much as possible over the entire measurement area, as shown in the measurement scheme in Figure 3. Calculate the arithmetic mean of the least squares best fit values ​​of the wheel depth and angle after removing the least squares best fit wheel tide line and record the maximum measured profile depth and the average of the tilt angle.
Measure the profile coordinate standard and calculate the Pt value after removing the least squares best fit nominal shape. GE/T 19600—2004/IS0 12179:2000 The stroke length used for measuring each contour standard shall be in accordance with the provisions of the calibration certificate of the measurement standard. The measurements shall be spread over the entire measurement area. The contour depth after removing the least squares best fit nominal shape is calculated and the maximum contour depth is recorded. Note: Coordinate measurement standards are usually spheres and prisms. 7.6 Calibration of contact (stylus) instruments 7.6.1 Calibration purpose
Measure the roughness measurement standard and calculate the difference between the roughness parameter value obtained from the roughness ratio and the corresponding parameter value given in the calibration certificate of the measurement standard.
7.6.2 Calibration procedure
Measure each roughness measurement standard and the measurements shall be spread over the entire measurement area as much as possible. Figure 4 shows an example of a measurement scheme. Calculate the arithmetic mean of each roughness parameter. Record the difference between the measured roughness parameter value and the value given in the calibration certificate of the measurement standard.
8 Measurement uncertainty
Contents of a calibration certificate for a measurement standard
The following is the information given in a calibration certificate:--Complete description of the metrological characteristic (including the corresponding measurement scheme, filter sampling length, input and output, filter type, description of sampling length, etc.)
-Uncertainty U, the numerical value given for the metrological characteristic, the coverage factor used (see GB/T 18779.2);--Standard uncertainty estimate u, the variation of the metrological characteristic within the range (measurement window) used for calibration: Description of how the standard uncertainty estimate u is used for the calculation of the uncertainty U. 8.2 Uncertainty of measurement results when calibrating a measuring instrument with a measurement standard The uncertainty of the measurement results during calibration shall be evaluated according to the method given in GB/T 18779,2. The uncertainty Q of a calibrated metrological characteristic consists of two components u(Q) and u: u(Q) is the sample standard uncertainty estimate of the known quantity:--4 is calculated according to GB/T 18779.The method given in 2 adjusts the uncertainty estimate (correction of systematic errors in the counter characteristics). The expanded uncertainty U is calculated as follows:
U=kxJu(g)-)
where is the coverage factor.
When calculating the uncertainty, it should be noted that the surface or step height of the measurement standard is not completely consistent, so the measurement result is fractional. In the random component of uncertainty, this result is calculated by estimating the standard uncertainty. This random component caused by the measurement standard is included in the expanded uncertainty U of the measurement standard. Therefore, this random component cannot be added to the uncertainty component u(q). To illustrate this point, two complete illustrative examples of analysis of variance (ANOVA) are given in Appendix C. It is allowed to estimate the uncertainty u by experience according to JJF1059 or according to the analysis of variance method (AN()VA). GB/T18779.2 gives a guide to the calculation of uncertainty of calibration results. 9. Calibration certificate for contact (stylus) instruments The calibration certificate should include the information required in GB/T 19022.1 and the following: All information on the contact (stylus) instrument (manufacturer, model, factory number); the measurement standard used (identification number); the basis for the calibration method; a series of measurement conditions involved (i.e., measuring disc range, sliding speed, stroke length, measurement transmission bandwidth, stylus tip radius, etc.); the measurement results of residual wheel using optical flat crystal GB/T 19600-2004/IS012179:2000 - Measuring depth - the measurement results of the accuracy measurement standard and the spacing measurement crown standard, and the difference between them and the corresponding metrological characteristic values ​​of the measurement standard; - the P: value after removing the least squares best fit shape from the profile obtained by measuring the tilted optical flat crystal; - the measurement results of the wheel coordinate measurement disk standard, if necessary, and the Pt value after removing the least squares best fit nominal shape; ... the measurement location and environmental conditions that affect the calibration. The sources of such information include the instrument manufacturer's instructions and the provider of the measurement standard
- the expanded uncertainty of measurement and the uncertainty evaluation document compiled according to GB/T18779.2. GB/T 196002004/IS0 12179.2000 Annex A
(Normative Appendix)
Calibration of instruments for measuring graphical method parameters
This appendix describes the calibration procedures for instruments for measuring graphical method parameters. The definition of graphical parameters can be found in GB/T 18618. A. 1 Measurement standards
4.1.1 Overview
The instrument for measuring the graphical parameters R, AR, W, AW is calibrated using the C4 type surplus standard defined in GB/T 19067.1 (see Figure A.1).
Units are in millimeters
Figure A 1 Roughness and waviness measurement standard (type C4) and measurement scheme A.1.2 Surface resolution
Use the C4 type measurement standard to reproduce:
A measurement standard with a spacing of 0.25 mm, an average depth R of the roughness pattern and an average spacing AR of the roughness pattern; a measurement standard with a spacing of 0.8 mm, an average depth W of the waviness pattern and an average spacing AW of the waviness pattern. A.2 Calibration
a) Select a stylus with a tip radius of 2 μm. The tip radius of the stylus is checked by an electronic microscope: b) Set the common limit values ​​A and B of the pattern to the default values: A=0.5 mm, B=2.5 mm Make the measurement direction as parallel to the measured surface as possible and run along the long side of the measuring standard. c
Select the smallest possible measurement range.
Select the measurement range in the middle of the measurement standard. f) Set the maximum measurement length to 16 mm to ensure that the measurement starts and ends at the contour. GB/T 19600—2004/IS0 12179:2000 g) Make 5 parallel measurements on each measurement standard used for calibration. The 5 measurements are randomly distributed over a wide range of the measurement standard (if measurements are often made at one position of the measurement standard, this will cause wear of the measurement standard). Calculate the average value and standard deviation of the 5 measurement results of the parameters R, AR, W, and AW. The average value of R and W is used to calibrate the vertical magnification. The average value of AR and AW is used to calibrate the horizontal magnification. The standard deviation of these parameter values ​​is affected by the repeatability of the instrument and the homogeneity of the calibrated standard and should be part of the calculation of the measurement uncertainty) If the software measurement standard cannot be added to the measurement chain of the instrument, use the same method as above to verify the algorithm of the graphical method using the type D measurement standard defined in GB/T19067.1. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature measurement Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations in accordance with the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Perform standard calibration using a pending surface or a specific calibrated surface with the same degree of defects as the simplified calculation measuring equipment. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard;
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::2 gives guidance on the calculation of the uncertainty of the calibration results. 9 Calibration certificate for contact (stylus) instruments The calibration certificate should include the information required in GB/T19022.1 and the following: All information about the contact (stylus) instrument (manufacturer, model, factory number); the measurement standard used (identification number); the basis for the calibration method;
- a series of measurement conditions involved (i.e., measuring disc range, sliding speed, stroke length, measurement transmission bandwidth, stylus tip radius, etc.) ~ Measurement results of residual wheel using optical flat crystal GB/T19600-2004/IS012179:2000 - Measurement depth - the measurement results of the accuracy measurement standard and the spacing measurement crown standard, and the difference between them and the corresponding metrological characteristic values ​​of the measurement standard; - the P: value after removing the least squares best fit shape from the profile obtained by measuring the tilted optical flat crystal; - the measurement results of the wheel coordinate measurement disk standard, if necessary, and the Pt value after removing the least squares best fit nominal shape; ... the measurement location and environmental conditions that affect the calibration. The sources of such information include the instrument manufacturer's instructions and the provider of the measurement standard
- the expanded uncertainty of measurement and the uncertainty evaluation document compiled according to GB/T18779.2. GB/T 196002004/IS0 12179.2000 Annex A
(Normative Appendix)
Calibration of instruments for measuring graphical method parameters
This appendix describes the calibration procedures for instruments for measuring graphical method parameters. The definition of graphical parameters can be found in GB/T 18618. A. 1 Measurement standards
4.1.1 Overview
The instrument for measuring the graphical parameters R, AR, W, AW is calibrated using the C4 type surplus standard defined in GB/T 19067.1 (see Figure A.1).
Units are in millimeters
Figure A 1 Roughness and waviness measurement standard (type C4) and measurement scheme A.1.2 Surface resolution
Use the C4 type measurement standard to reproduce:
A measurement standard with a spacing of 0.25 mm, an average depth R of the roughness pattern and an average spacing AR of the roughness pattern; a measurement standard with a spacing of 0.8 mm, an average depth W of the waviness pattern and an average spacing AW of the waviness pattern. A.2 Calibration
a) Select a stylus with a tip radius of 2 μm. The tip radius of the stylus is checked by an electronic microscope: b) Set the common limit values ​​A and B of the pattern to the default values: A=0.5 mm, B=2.5 mm Make the measurement direction as parallel to the measured surface as possible and run along the long side of the measuring standard. c
Select the smallest possible measurement range.
Select the measurement range in the middle of the measurement standard. f) Set the maximum measurement length to 16 mm to ensure that the measurement starts and ends at the contour. GB/T 19600—2004/IS0 12179:2000 g) Make 5 parallel measurements on each measurement standard used for calibration. The 5 measurements are randomly distributed over a wide range of the measurement standard (if measurements are often made at one position of the measurement standard, this will cause wear of the measurement standard). Calculate the average value and standard deviation of the 5 measurement results of the parameters R, AR, W, and AW. The average value of R and W is used to calibrate the vertical magnification. The average value of AR and AW is used to calibrate the horizontal magnification. The standard deviation of these parameter values ​​is affected by the repeatability of the instrument and the homogeneity of the calibrated standard and should be part of the calculation of the measurement uncertainty) If the software measurement standard cannot be added to the measurement chain of the instrument, use the same method as above to verify the algorithm of the graphical method using the type D measurement standard defined in GB/T19067.1. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature measurement Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations in accordance with the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Perform standard calibration using a pending surface or a specific calibrated surface with the same degree of defects as the simplified calculation measuring equipment. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard;
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::2 gives guidance on the calculation of the uncertainty of the calibration results. 9 Calibration certificate for contact (stylus) instruments The calibration certificate should include the information required in GB/T19022.1 and the following: All information about the contact (stylus) instrument (manufacturer, model, factory number); the measurement standard used (identification number); the basis for the calibration method;
- a series of measurement conditions involved (i.e., measuring disc range, sliding speed, stroke length, measurement transmission bandwidth, stylus tip radius, etc.) ~ Measurement results of residual wheel using optical flat crystal GB/T19600-2004/IS012179:2000 - Measurement depth - the measurement results of the accuracy measurement standard and the spacing measurement crown standard, and the difference between them and the corresponding metrological characteristic values ​​of the measurement standard; - the P: value after removing the least squares best fit shape from the profile obtained by measuring the tilted optical flat crystal; - the measurement results of the wheel coordinate measurement disk standard, if necessary, and the Pt value after removing the least squares best fit nominal shape; ... the measurement location and environmental conditions that affect the calibration. The sources of such information include the instrument manufacturer's instructions and the provider of the measurement standard
- the expanded uncertainty of measurement and the uncertainty evaluation document compiled according to GB/T18779.2. GB/T 196002004/IS0 12179.2000 Annex A
(Normative Appendix)
Calibration of instruments for measuring graphical method parameters
This appendix describes the calibration procedures for instruments for measuring graphical method parameters. The definition of graphical parameters can be found in GB/T 18618. A. 1 Measurement standards
4.1.1 Overview
The instrument for measuring the graphical parameters R, AR, W, AW is calibrated using the C4 type surplus standard defined in GB/T 19067.1 (see Figure A.1).
Units are in millimeters
Figure A 1 Roughness and waviness measurement standard (type C4) and measurement scheme A.1.2 Surface resolution
Use the C4 type measurement standard to reproduce:
A measurement standard with a spacing of 0.25 mm, an average depth R of the roughness pattern and an average spacing AR of the roughness pattern; a measurement standard with a spacing of 0.8 mm, an average depth W of the waviness pattern and an average spacing AW of the waviness pattern. A.2 Calibration
a) Select a stylus with a tip radius of 2 μm. The tip radius of the stylus is checked by an electronic microscope: b) Set the common limit values ​​A and B of the pattern to the default values: A=0.5 mm, B=2.5 mm Make the measurement direction as parallel to the measured surface as possible and run along the long side of the measuring standard. c
Select the smallest possible measurement range.
Select the measurement range in the middle of the measurement standard. f) Set the maximum measurement length to 16 mm to ensure that the measurement starts and ends at the contour. GB/T 19600—2004/IS0 12179:2000 g) Make 5 parallel measurements on each measurement standard used for calibration. The 5 measurements are randomly distributed over a wide range of the measurement standard (if measurements are often made at one position of the measurement standard, this will cause wear of the measurement standard). Calculate the average value and standard deviation of the 5 measurement results of the parameters R, AR, W, and AW. The average value of R and W is used to calibrate the vertical magnification. The average value of AR and AW is used to calibrate the horizontal magnification. The standard deviation of these parameter values ​​is affected by the repeatability of the instrument and the homogeneity of the calibrated standard and should be part of the calculation of the measurement uncertainty) If the software measurement standard cannot be added to the measurement chain of the instrument, use the same method as above to verify the algorithm of the graphical method using the type D measurement standard defined in GB/T19067.1. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature measurement Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations in accordance with the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Perform standard calibration using a pending surface or a specific calibrated surface with the same degree of defects as the simplified calculation measuring equipment. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard; bzxz.net
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::2000 Appendix A
(Normative Appendix)
Calibration of instruments for measuring graphical method parameters
This appendix describes the calibration procedure for instruments for measuring graphical method parameters. The definition of graphical parameters is given in GB/T 18618. A. 1 Measurement standards
4.1.1 Overview
The instruments for measuring graphical method parameters R, AR, W, AW are calibrated using the C4 type measuring standard defined in GB/T 19067.1 (see Figure A.1).
Units are in millimeters
Figure A 1 Roughness and waviness measurement standard (type C4) and measurement scheme A.1.2 Surface resolution
Use the C4 type measurement standard to reproduce:
A measurement standard with a spacing of 0.25 mm, an average depth R of the roughness pattern and an average spacing AR of the roughness pattern; a measurement standard with a spacing of 0.8 mm, an average depth W of the waviness pattern and an average spacing AW of the waviness pattern. A.2 Calibration
a) Select a stylus with a tip radius of 2 μm. The tip radius of the stylus is checked by an electronic microscope: b) Set the common limit values ​​A and B of the pattern to the default values: A=0.5 mm, B=2.5 mm Make the measurement direction as parallel to the measured surface as possible and run along the long side of the measuring standard. c
Select the smallest possible measurement range.
Select the measurement range in the middle of the measurement standard. f) Set the maximum measurement length to 16 mm to ensure that the measurement starts and ends at the contour. GB/T 19600—2004/IS0 12179:2000 g) Make 5 parallel measurements on each measurement standard used for calibration. The 5 measurements are randomly distributed over a wide range of the measurement standard (if measurements are often made at one position of the measurement standard, this will cause wear of the measurement standard). Calculate the average value and standard deviation of the 5 measurement results of the parameters R, AR, W, and AW. The average value of R and W is used to calibrate the vertical magnification. The average value of AR and AW is used to calibrate the horizontal magnification. The standard deviation of these parameter values ​​is affected by the repeatability of the instrument and the homogeneity of the calibrated standard and should be part of the calculation of the measurement uncertainty) If the software measurement standard cannot be added to the measurement chain of the instrument, use the same method as above to verify the algorithm of the graphical method using the type D measurement standard defined in GB/T19067.1. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature measurement Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations in accordance with the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Perform standard calibration using a pending surface or a specific calibrated surface with the same degree of defects as the simplified calculation measuring equipment. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard;
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::2000 Appendix A
(Normative Appendix)
Calibration of instruments for measuring graphical method parameters
This appendix describes the calibration procedure for instruments for measuring graphical method parameters. The definition of graphical parameters is given in GB/T 18618. A. 1 Measurement standards
4.1.1 Overview
The instruments for measuring graphical method parameters R, AR, W, AW are calibrated using the C4 type measuring standard defined in GB/T 19067.1 (see Figure A.1).
Units are in millimeters
Figure A 1 Roughness and waviness measurement standard (type C4) and measurement scheme A.1.2 Surface resolution
Use the C4 type measurement standard to reproduce:
A measurement standard with a spacing of 0.25 mm, an average depth R of the roughness pattern and an average spacing AR of the roughness pattern; a measurement standard with a spacing of 0.8 mm, an average depth W of the waviness pattern and an average spacing AW of the waviness pattern. A.2 Calibration
a) Select a stylus with a tip radius of 2 μm. The tip radius of the stylus is checked by an electronic microscope: b) Set the common limit values ​​A and B of the pattern to the default values: A=0.5 mm, B=2.5 mm Make the measurement direction as parallel to the measured surface as possible and run along the long side of the measuring standard. c
Select the smallest possible measurement range.
Select the measurement range in the middle of the measurement standard. f) Set the maximum measurement length to 16 mm to ensure that the measurement starts and ends at the contour. GB/T 19600—2004/IS0 12179:2000 g) Make 5 parallel measurements on each measurement standard used for calibration. The 5 measurements are randomly distributed over a wide range of the measurement standard (if measurements are often made at one position of the measurement standard, this will cause wear of the measurement standard). Calculate the average value and standard deviation of the 5 measurement results of the parameters R, AR, W, and AW. The average value of R and W is used to calibrate the vertical magnification. The average value of AR and AW is used to calibrate the horizontal magnification. The standard deviation of these parameter values ​​is affected by the repeatability of the instrument and the homogeneity of the calibrated standard and should be part of the calculation of the measurement uncertainty) If the software measurement standard cannot be added to the measurement chain of the instrument, use the same method as above to verify the algorithm of the graphical method using the type D measurement standard defined in GB/T19067.1. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature measurement Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations in accordance with the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Perform standard calibration using a pending surface or a specific calibrated surface with the same degree of defects as the simplified calculation measuring equipment. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard;
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::The D-type measurement standard defined in 1 is also used to verify the algorithm of the graphical method. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature quantity Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations according to the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Use the undetermined surface or the specific calibrated surface with the same degree of defects as the simplified calculation measurement equipment to complete the standard calibration. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard;
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::The D-type measurement standard defined in 1 is also used to verify the algorithm of the graphical method. Appendix B
(Normative Appendix)
Calibration of simplified calculation instruments for surface feature quantity Simplified calculation instruments for surface feature measurement refer to instruments that have not established standardized calculations according to the provisions of 3/T6062. Note: GB/T6062 only stipulates contact (stylus) instruments with independent guide references. Simplified calculation instruments also include another important type of contact (melting needle) instruments with guide heads.
A major feature of simplified calculation instruments is that the degree of imperfection of the measured surface is one of the sources of instrument uncertainty. Therefore, before measuring surface features with simplified calculation instruments, correction measurements must be performed using standardized calculations (instruments) to estimate the impact of measured surface defects on measurement uncertainty. There are two methods: a) Know the nature of the measured surface defects in advance to estimate its impact on measurement uncertainty. b) Use the undetermined surface or the specific calibrated surface with the same degree of defects as the simplified calculation measurement equipment to complete the standard calibration. Here, a specific surface or a specific calibrated surface has been calibrated for a specific task using an optimized standardization algorithm for surface structure measurement.
Note: ISO/TC 213 is discussing the terminology related to the algorithm and these terms are subject to modification in future standards. GB/T 19600--2004/ISO 12179:2000 Annex C
(Informative Appendix)
Roughness measurement standard parameter Ra Example
Measure the Rα value of a roughness measurement standard. According to the measurement scheme in Figure 2, 5 measurements are made at each of the 12 given positions. Table C.1 gives the measured values ​​of R.
Note: These values ​​are simulated values ​​given for the purpose of illustrating statistical techniques. Table C.1
Ra value/
value!
Value 2
Value 4
Value 5
Value 6
Count baskets?
Value 8
Value 9
Value 10
Value 11
Value 32
Average value
According to the measurement scheme (in Figure 2), the measured Rn values ​​for a roughness measurement standard (type D) are:
0,5216
.527 2
0, 534 7
0. 527 76
0, 534 0
0. 529 22
The main influences that affect the observed measurement variability are as follows: Changes in the ERa value of the roughness measurement standard;
Changes in the Ra measurement value in each measurement;
Repeatability of the contact (stylus) instrument. 3
0,532 3
0,532 7
Mean
0. 527 44
0. 531 52
0. 532 12
n. 527 36
0. 533 54
0. 528 75
It is assumed that each of the above random effects has a variance of m and is denoted by the symbols and respectively, where the subscript R denotes the roughness measurement standard (the variation in the parameter value of the roughness measurement standard), the subscript E denotes the measurement evaluation (the difference in the results of each measurement evaluation) and the subscript M denotes the repeatability of the contact (stylus) instrument. The method of variance (ANOVA) is assumed to be the appropriate analytical method. This issue is discussed thoroughly in ISO Guide 35. The method of variance (ANOVA) provides a method of calculating variance. Let X, denote the value of the th measurement. The arithmetic means S,,, and S are calculated by the following formulas: 1x
The sums of squares S., S2, S., and S. associated with these means can be calculated by the following formulas::
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