This standard specifies the test conditions, adjustment procedures and test methods for the photoelectric parameters of microchannel plate photomultiplier tubes. This standard is applicable to the test of photoelectric parameters of microchannel plate photomultiplier tubes (hereinafter referred to as photomultiplier tubes). SJ 20792-2000 Microchannel plate photomultiplier tube test method SJ20792-2000 standard download decompression password: www.bzxz.net

Military Standard of the Electronic Industry of the People's Republic of China FL5960
SJ20792--2000
Methods of measurement for
microchannel plate photomultiplier tubes2000~10-20 issued
2000-10-20 implemented
approved by the Ministry of Information Industry of the People's Republic of China 1 Scope
2 Referenced documents
3 Definition
4 General requirements
5 Detailed requirements
Method 101
Method 102
Method 103
Method 104
Method 105
Method 106
Method 107
Method 108
Method 109
Method 110
Method 111
Method 112
Method 113
Cathode illumination sensitivity
Cathode radiation sensitivity
Cathode relative spectral response characteristics
Absolute spectral response characteristics of cathode
Anode illumination sensitivity
Anode radiation sensitivity
Current gain
Dark current
Maximum voltage and maximum current
Nonlinearity of photoelectric characteristics and maximum DC linear currentAnode sensitivity uniformity
Pulse rise time
Pulse response width
Pulse fall time
Method 114
Method 115
Method 116
Method 117
Transit time
Maximum pulse linear current
Single electron amplitude resolution
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Test method for microchannel plate photomultiplier tubes of military standard for the electronics industry of the People's Republic of China
Methods Scope
t.1 Subject content
SJ 20792-2000
This standard specifies the test conditions, adjustment procedures and test methods for the photoelectric parameters of microchannel plate photomultiplier tubes. t.2 Scope of application
This standard applies to the test of photoelectric parameters of microchannel plate photomultiplier tubes (hereinafter referred to as photomultiplier tubes). 2 Reference documents
GB/T4597—1996 Vocabulary of electron tubes
GB/T7270—87 Test methods for photomultiplier tubes 3 Definitions
In addition to the relevant terms and definitions in accordance with GB/T4597 and GB/T7270, this standard also adopts the following terms and definitions:
3.1 Non-linearity of photoelectric characteristic The non-linear variation characteristic of the amount of light incident on the photocathode surface and its corresponding anode output current. 3.2 Uniformity of anode sensitivity The ratio of the difference between the maximum and minimum values ​​of the anode output current to the sum of its maximum and minimum values ​​at different positions on the cathode effective surface under working conditions. 3.3 Transit time The time interval from the moment when a function light pulse illuminates the entire photocathode to the moment when the peak point of the output pulse appears.
4 General requirements
4.1 Test equipment
In addition to meeting the requirements of this standard, the test equipment shall also meet the current regulations and safety requirements for electrical test equipment: Each test equipment shall be accompanied by:
a. Equipment acceptance certificate;
b. Equipment operating instructions;
c. Equipment circuit diagram.
The Ministry of Information Industry of the People's Republic of China promulgated on October 20, 2000 and implemented on October 20, 2000
4.2 Light Source and Radiation Source
4.2.1 Standard Light Source
SJ 20792—2000
When testing the DC performance of a photomultiplier tube, light source A or a light source with a color temperature of 2856K calibrated according to this light source is usually used.
4.2.2 Radiation Source
The monochromatic radiation source should be calibrated, and the passband should be a combination of a standard light source and a specified filter. 4.2.35 Function Light Source
When testing the time parameters of a photomultiplier tube, a light source whose duration of the light pulse is much longer (maximum 1/3) than the duration of the input pulse to be measured is usually used. 4.2.4 Light source power supply
The power supply of the light source should have a stability better than 0.1%, and its indication accuracy should be better than 0.5%. 4.3 Dark box
The test of the light output multiplier tube should be carried out in a light-proof dark box. 4.3.1 The inner wall of the entire accompanying box and all the light sources must be blackened to prevent internal light reflection. 4.3.2 The accompanying box should ensure that the tube under test is not affected by light leakage. 4.3.3 The bracket of the tube under test should be made of insulating material to prevent static electricity, and static electricity is not allowed to be generated between the tube shell and the metal material of the box.
4.3.4 The box should be equipped with a movable baffle so that it can be opened or blocked when necessary. 4.3.5 The box should be able to isolate external ionizing radiation. 4.3.6 The shell of the accompanying box and the shell of the equipment should be electrically connected. 4.4 Measuring instruments and meters
4.4.1 Electrical measuring instruments and meters should have metrological verification certificates and be used within the validity period of the verification. 4.4.2 The stability of the high-voltage source should be better than 0.01%, and the ripple should be less than 20mV. 4.4.3 The rise time of the measuring oscilloscope should be less than 1/3 of the rise time of the tube. 4.4.4 The error of the instrument used to measure large or equal to 30nA current should not exceed ±5%, and the error of the instrument used to measure the current of less than 30nA should not exceed ±10%. When using pointer instruments for measurement: the pointer of the measured value reading should exceed 2/3 of the full scale of the instrument. 4.5 Voltage divider
When testing, a suitable resistor divider should be equipped. 4.5.1 The current flowing through the resistor divider should exceed 100 times the average current of the photomultiplier tube anode. 4.5.2 The resistor divider should be equipped with an inductor with appropriate capacity and withstand voltage to ensure the required potential of each electrode of the photomultiplier tube under test during the pulse duration. 4.5.3 The voltage divider ratio of the resistor divider should be adjusted according to the test requirements to obtain the optimal value of the parameter. 4.6 Test environment conditions
4.6.1 Atmospheric conditions
Temperature: 19~25°C;
Relative humidity: 45%~75%;
Air pressure: 86 kPa~106 kPa.
4.6.2 Ambient lighting
The test chamber should have appropriate light-proof conditions to avoid the influence of ambient light on the test results. 2
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4.6.3 Electromagnetic radiation
SJ20792—2000
During the test, there should be no electromagnetic radiation source around the test equipment that may affect the accuracy of the photoelectric parameters of the tube under test. 4.7 Adjustment procedure
4.7.1 Before testing, the tube shell, tube base and tube seat of the photomultiplier tube must be cleaned to prevent the hysteresis and noise effects on the surface of the tube shell.
4.7.2 The photomultiplier tube should be stored away from light for a suitable period of time before testing. 4.7.3 Install the photomultiplier tube into the test equipment, connect the wires according to the regulations, and configure a suitable resistor divider: 4.7.4 Turn on the power of the test equipment, adjust the test working state, and wait until the photomultiplier tube and the entire test equipment have established a stable working state before conducting the test work 5 Detailed requirements
For test methods, see Methods 101 to 117. - 3 -
SJ 20792—2000
Method 101
Cathode illumination sensitivity
Measure the ratio of the photocurrent generated by the photocathode to the light flux incident on the photocathode. 2 Test system diagram
The test system diagram is shown in Figure 101-—1.
Radiation source
Dimmer
K—Photocathode MCP—Microchannel plate
A—Anodewww.bzxz.net
R1—Current limiting resistor
PI—Microammeter
3 Test procedure
P2—DC voltmeter VI—Photomultiplier tube Figure 101--1
Connect the test system according to Figure 101-1 and press 4.7 adjustments. Turn off the light and measure the cathode dark current. Open the aperture, and let the standard light source enter the cathode working surface. Under the specified light flux, the cathode photocurrent. The cathode illumination sensitivity is calculated as follows: Sx
Where: Sk——cathode illumination sensitivity, uA/lmI cathode photocurrent measured after opening the aperture, μA: Ia-cathode dark current measured after closing the aperture, μA; Fk light flux, Im.
4 Regulations and details
The radiation source is a standard light source, and the light flux should be in the range of 10-5～10-2m: a.
The resistance value of the current limiting resistor is usually 1MS2:
The applied voltage is specified by the detailed specifications.
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(101--1)
SJ20792—2000
Method 102
Cathode radiation sensitivity
Measure the ratio of the photocurrent generated by the photocathode to the radiant flux incident on the photocathode. 2 Test system diagram
The test system diagram is shown in Figure 101—1
3 Test procedure
Connect the test system according to Figure 101—1 and adjust according to Article 4.7. Open the aperture, and the standard radiation source is incident on the cathode working surface. Under the specified radiant flux, measure the cathode photocurrent. The cathode radiation sensitivity is calculated according to the following formula:
Where: St——cathode radiation sensitivity, mA/w: —cathode photocurrent, mA:
—radiant flux, W.
4 Regulations and Rules
(102—1)
a, the radiation source should be a standard radiation source, and the radiation intensity in a certain direction should be calibrated, and the radiant flux should be within the range of 10-10-3w;
The resistance value of the current limiting resistor is usually 1MQ2:
The applied voltage is specified by the detailed specifications.
1 Purpose
SJ 20792—2000
Method 103
Cathode relative spectral response characteristics
Measure the relationship between the relative value of the cathode spectral sensitivity and the wavelength, usually expressed by a normalized curve of the peak value. 2 Test system diagram
The test system diagram is shown in Figure 103—1.
3 Test procedure
Receiver
Test tube
Figure 103-1
Connect the test system according to Figure 103-1 and adjust according to 4.7. Tuning amplifier
Synchronous detector
Tuning amplifier
Synchronous detector
Detection instrument
Voltmeter
First, measure the output reading of the receiver under monochromatic radiation of each wavelength. Then, measure the photocurrent of the photomultiplier tube under monochromatic radiation of the same wavelength. At each wavelength, divide the photocurrent by the output reading of the receiver to obtain a transition curve that represents the relationship between its quotient and wavelength. Normalize this curve to the peak value to obtain the cathode relative spectral response characteristic R (2).
4 Regulations and Rules
a. The luminous flux of the standard light source should be within the range of 10-5～J0-21m: b. The spectral response range of the photomultiplier tube in the visible to infrared band should be within the range of 0.1% of the relative spectral response: The spectral response range of the photomultiplier tube in the ultraviolet band should be within the range of 1% of the relative spectral response: G. The monochromator must be calibrated and provide the correction value of each wavelength. 6
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January
SJ20792—2000
Method 104
Absolute spectral response characteristics of cathode
Measure the relationship between cathode spectral sensitivity and wavelength, usually expressed by a curve. 2 Test system diagram
The test system diagram is shown in Figure 103--1.
·3 Test Procedure
3.1 Measurement Method
This method is the same as Chapter 3 of Method 103, but the output reading of the receiver needs to be calibrated according to the radiation power value. The measured transition curve is the cathode absolute spectral response characteristic. 3.2 Calculation Method
The cathode illumination sensitivity S is measured according to Method 101, and the cathode relative spectral response characteristic R (yuan) measured in Method 103 is calculated to obtain the absolute spectral response characteristic. Using the radiation distribution characteristic W (1) of the 2856K standard light source, the visual function V (2) and the optical power equivalent of 6831m/W of the monochromatic radiation with a wavelength of 555nm, the conversion factor C is calculated by the numerical integration method. \y(a)w(ada
\R(a)W(a)dz
Cathode spectral sensitivity at peak wavelength: Sp=CS
Absolute spectral response characteristics:
S(A)=SpR(A)
4 Provisions and Rules
(104—1)
(104—2)
(104--3)
In the measurement method, the radiation source is a standard radiation source with a flux of 10-7~10-3W: In the calculation method, the luminous flux of the standard light source a.
should be within the range of 10-s~10-21m; b. The output reading of the receiver needs to be calibrated according to the radiation power value. 1 Purpose
SJ 20792—-2000
Method 105
Anode illumination sensitivity
Measure the ratio of the anode input current to the light flux incident on the photocathode. 2 Test system diagram
The test system diagram is shown in Figure 105--1.
Standard light source
Dimmer
K—Photocathode A—Anode MCP--Microchannel Plate VI—Photomultiplier tube dark box
P1-Microgalvanometer P2-DC voltmeter R1-Current limiting resistor R 2, R3, R4—resistance of voltage divider Figure 105-—1
3 Test procedure
Connect the test system according to Figure 105-—1, and adjust Ht according to 4.7
First, close the aperture and measure the anode dark current; and turn on the light, and measure the anode output current under the specified light flux. The anode illumination sensitivity is calculated as follows: S,=
Where: S—cathode illumination sensitivity, A/lm;,-anode output current measured after opening the aperture, A; lh.—close the aperture and measure the anode dark current; lh.—close the aperture and measure the anode output current under the specified light flux. The anode dark current measured after the test, A: F light flux, Im.
4 Regulations
a: The light flux of the standard light source should be within the range of 10-10 ~ 10-61m; (105---1)
b, the applied voltage should ensure that the photomultiplier tube 1 operates within the linear range, and the anode current should be less than the maximum value specified in the detailed specifications:
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1 Purpose
SJ20792-2000
Method 106
Anode radiation sensitivity
Measure the ratio of the anode output current to the radiant flux incident on the photocathode. 2 Measurement system diagram
The test system diagram is shown in Figure 105-1, but the standard light source is the radiation source. 3
Test procedure
Connect the test system according to Figure 105-1 and adjust according to Section 4.7. First, turn off the light and measure the anode dark current: open the aperture and measure the anode output current at the specified minimum light flux. The anode radiation sensitivity is calculated as follows: Se h-la
Where: S, - anode radiation sensitivity, mA/WI - anode output current measured after opening the aperture, mA: Ia - anode dark current measured after closing the aperture, mA; - radiant flux, W.
4 Regulations and Rules
a. The radiant flux of the radiation source shall be within the range of 10-1210-\W; (105--1)
b. The applied working voltage shall ensure that the photomultiplier tube operates within the linear range, and the anode current shall be less than the maximum value specified in the detailed specification.
SJ 20792—2000
Method 107
Current gain
Measure the ratio of the anode output current to the photocathode current when the photomultiplier tube is operating normally. 2 Test system diagram
The test system diagram is shown in Figure 101-—1 and Figure 105--1. 3 Test procedure
3. 1 Method 1
Connect the test system according to Figure 101-1 and adjust it according to Article 4.7. First, close the aperture and measure the anode dark current at a certain working voltage: open the aperture and measure the corresponding anode current at a sufficiently weak light flux and the same working voltage. Then increase the light flux by M times (but do not change its spectral distribution), close and open the aperture respectively, measure the cathode dark current and tidal current, and calculate the current gain as follows:
Ia m lad
Where: G Current gain:
I—anode current measured under weak light flux, μA: In——anode dark current measured after closing the aperture, uA; —cathode current measured under strong light flux, UA: la——cathode dark current measured after closing the aperture, uA; M-.Multiple times of light flux enhancement. 3.2 Method 2 Connect the test system according to Figure 105-1 and adjust it according to 4.7. -(107-1)
First measure the anode illumination sensitivity, then measure the cathode illumination sensitivity, and calculate the current gain according to the following formula GS
Where: G——current gain:
S——anode illumination sensitivity, A/lm:
Sk——cathode illumination sensitivity, uA/lm; 4 Regulations and details
a The light flux should be strictly controlled to ensure that the anode current is within the linear range: b. When providing the G value, the corresponding working voltage should be marked; c. Other regulations and details are the same as those in Method 101 and Method 105. 10
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(107---2)
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