SJ/T 11041-1996 Test method for impact strength of electronic glass SJ/T11041-1996 Standard download decompression password: www.bzxz.net

National Standard of the People's Republic of China
Test method for impact resistance strength of electronic glass
This standard is applicable to the test of the impact resistance strength of electronic glass. 1 Method Summary
GB9622.7-88
Reduced to SJ/T11041-96
When glass is broken by impact, the work consumed per unit cross-sectional area is the impact resistance of the glass. This standard stipulates that the test is carried out using a pendulum impact tester, and the consumed work is read from the instrument dial. 2 Testing instrument
2.1 Pendulum impact tester, impact range 01N·m, jaw span 50mm. 2.2 Micrometer.
3 Preparation of specimens
3.1 Select a glass rod specimen without defects such as stones, bubbles and streaks. The diameter is 7.5~8.0mm, the length is 80mm, and the stress is eliminated by annealing. Use a micrometer to measure the diameter of the two ends and the middle of the specimen. The diameter difference between any two points should not exceed 0.2mm. Take the average value. 3.2 Each group of specimens shall not be less than 20.
4 Test steps
4.1 Raise the pendulum chain of the specimen machine and align the pointer with the zero point. 4.2 Place the specimens at equal distances at the jaws of the impact test machine. 4.3 Move the handle, the pendulum falls to impact the specimen, and record the reading on the dial. 5 Calculation
5.1 Use formula (1) to calculate the impact strength of the specimen. A/S
Where: a——impact strength of the sample, N/m; A——work consumed by impacting the sample, N·mS-—cross-sectional area of ​​the sample, m
6Test results
In order to ensure the accuracy of the test results, each batch of samples shall not be less than 20, and the average value of each measurement data shall be taken as the test result. Additional notes:
This standard was drafted by the 773 Guanghe 774 Factory of the Ministry of Electronics Industry. The main drafters of this standard: Su, Tang Yingxiang, Bai Yixiang, Pang Shuqin, Liu Chengjun. Approved by the Ministry of Electronics Industry of the People's Republic of China on March 21, 1988TTTKKAcawwW.bzxz.Net
Implementation on February 1, 1989
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