GB/T 15020-1994 Blank detail specification for quartz crystal components for electronic equipment. Resistance welded quartz crystal components. Assessment level E
Some standard content:
National Standard of the People's Republic of China
Quartz crystal units for use in electronic equipmentBlank detail specification
Resistance welded quartz crystal unitsAssessment level E
GB/T 15020-94
This blank detail specification is a supplement to the general specification and contains the requirements for the format, arrangement and minimum content of the detailed specifications. Detailed specifications that do not comply with these requirements are not considered to comply with the relevant certification system and should not be arranged in this format. The following corresponding information should be filled in the numbered positions in brackets on the first page. Identification of the detailed specification
(1) Organization authorized to draft the detailed specification: IE or national standards body. (2) IEC and/or national standard detailed specification number, publication date and further information required by the national system. (3) The number and version of the general specification of the IEC and/or national standard. (4) The number of the blank detailed specification of the IEC and/or national standard. (5) A brief description of the type of crystal element. (6) A brief description of the typical structure (when applicable). (7) An outline drawing with the main dimensions that have an important impact on interchangeability and/or a reference to national or international documents on outline drawings. Alternatively, such drawings may be given in the appendix to the detailed specification. (8) Application or application group and/or evaluation level. (9) Reference data on the most important characteristics to enable comparison between components of different types. Approved by the Guohao Technical Supervision Bureau on April 4, 1994..com Implemented on December 1, 1994
Electronic components evaluated according to GB12273
Appearance drawing (see Table 1)
GB/T 1 5020—94
(Other drawings are allowed within the given size range) GB/T15020—94
Resistance welding quartz crystal components
Frequency range:
kHz(MHz)
Assessment level: E
Performance level:
The valid data of components evaluated according to this detailed specification are given in the qualified product list (2)
1 General data
GB/T 1 5020--94
1.1 Mounting Methods for Use
The detailed specification shall specify the mounting methods to be used in normal use and for vibration, collision or shock testing. Crystal elements shall be mounted in a positive-tape manner. The design of a crystal element may require a special mounting fixture for its application. In this case, the detailed specification shall draw a mounting fixture diagram and such a mounting fixture shall be used in vibration, collision or shock test applications. 1.2 Dimensions
The dimensions shall conform to those specified in Part 3 of 1EC122--3 Quartz Crystal Elements for Frequency Control and Selection or in the detailed specification, see Table 1 for details. Table 1
Dimensional scale mark
1.3 Rated values and durability
Nominal frequency, fundamental frequency or overtone, load capacitance, resonant resistance and excitation level are shown in Table 2: Table 2
Nominal frequency
kHz MHz
Fundamental frequency or overtone
Adjustment frequency difference (25±2℃)
Temperature frequency difference:
Load capacitance
Operating temperature range and operable temperature range; parallel capacitance!
Spurious response (when applicable):
Frequency adjustability (when applicable):
Insulation resistance;
Climate category.
1.4 Reference standards
TEC 68
Basic environmental test specifications
IEC 68--2-17 Test Q: Sealing
Test T: Soldering
IEC 68-2-20
IEC 682-32 Test Et Free fall
IEC 122-1
IEC 122—3
Excitation level
Standard appearance and pin connection
Resonant resistance or load resonant resistance
Frequency control and selection of quartz crystal components Part 1 Predicted values and test conditions Frequency control and selection of quartz crystal components Part 3 Standard appearance and pin connection TFC:410 Sampling plan and procedure for counting inspection GB191 Pictorial marking for packaging, storage and transportation
GB12273 General specification for quartz crystal components
1.5 Marking
GB/T 15020-94
1.5.1 Unless otherwise specified, the marking on each quartz crystal component shall be selected from the following items, the relative importance of each item being indicated by its position in the item:
A Model,
Nominal frequency:
Manufacturer's name or trademark:
Date of manufacture:
Special characteristics.
Note: The contents of 1.5.1, d and e, may be given in code form by model or form name according to the manufacturer or country. 1.5.2 Crystal components shall be clearly marked with the contents of 1.5.1: and other items deemed necessary as far as possible. 1.5.3 Packages containing components shall be clearly marked with all the contents listed in 1.5.1. 1.5.4 The use of any additional markings shall be based on the principle of not causing confusion. 1.6 Ordering Information
Orders for crystal components covered by this specification shall give at least the following information in plain text or in code form:
Nominal frequency,
Adjusted frequency difference:
Temperature difference:
Drive level,
Load capacitance:
Resonant resistance or load resonant frequency:
Parallel capacitance,
Operating temperature range (operable temperature range) (when required): Dimensions:
Release batch certification record (when required) +
Other.
1.7 Release batch certification record
When specified in the detailed specification and when required by the ordering party, the content required by 3.5.1 of GB12273 shall be followed. After the durability (or constant mixed heat) test, the parameters required to be changed are: resonant frequency or load resonant frequency, resonant resistance and insulation resistance. 1.8 Additional contents (not for inspection)
1.9 Additional or higher severity and requirements for the provisions of the general specification. Note: Requirements are added or raised only when necessary. 1.10 Special characteristics
2 Quality assessment procedures
2.1 Initial manufacturing stage
According to GB 12273, the initial manufacturing stage is defined as the etching or polishing process. 2.2 Qualification and approval
The procedures for qualification and approval tests shall be in accordance with Article 3.4 of GB12273. The procedures for the qualification and approval test list based on batch inspection and periodic inspection are specified in Article 2.3 of this specification. The procedures for using a fixed sample list are specified in the following Articles 2.2.1 (see Table 3) and 2.2.2. GB/T 1 5020—94
2.2-1 Approval procedure based on fixed sample size The fixed sample size approval procedure is specified in clause 3.4.2 b of GB12273. The sample should be sufficient to represent the range of crystal components for which approval is applied. The sample should be selected from the products included in the same detailed specification. The sample should consist of samples of the lowest, highest and intermediate frequencies of the fundamental frequency and the lowest and highest frequencies of each overtone, and have the widest operating temperature range, the strictest adjustment frequency difference and temperature frequency difference. The sample size for each value (see clause 3.3.1 of GB12273) is 32. Table 3 specifies the number of samples required for each group of the approval test and the number of unqualified products allowed. 2- 2-2 Tests
The quartz components included in this specification must pass a series of tests specified in Table 3 for approval. The tests in each group should be carried out in the specified order.
All samples shall pass the 0 group test and then be divided into 3 groups. The samples of the 1st group shall be divided into two parts, and after 1-2 and 3-5 tests respectively, the whole group shall be subjected to 6-10 tests. Unqualified products found in the 0th group test shall not be used in other groups. When a crystal component fails to meet all or part of the requirements of a group, it shall be counted as a unqualified product. When the number of unqualified products does not exceed the allowable number of unqualified products specified in each group and does not exceed the total number of unqualified products specified, it shall be approved for identification.
2.3 Quality consistency inspection
2.3.1 Composition of inspection batch
2.3.1.1 Group A and Group B Inspection
These tests shall be carried out on a batch-by-batch basis, with the sample size for each batch being as specified in Table 4. The manufacturer may group the products currently in production into inspection lots in accordance with the following provisions. The inspection lot shall consist of crystal elements of similar structure (see 3.3 of GB12273). 8.
The test samples for Group A shall consist of each size and each value (see 3.3.1 of GB12273) included in the inspection lot. Group b.
Sample size
At least 5 for any value.
The samples for Group B1 shall include representatives of each temperature difference crystal element in the lot. 2. 3. 12 Group C Inspection
These tests shall be carried out on a periodic basis. The periodic tests shall be carried out as specified in Table 4. Samples shall be drawn from qualified products in batches. Before the C group test, samples shall be subjected to the A group test. If unqualified products are found, they can be replaced with qualified products. At this time, the unqualified products shall not be used as the basis for judging whether the C group test is qualified or not, but shall be recorded in the test record. The samples shall be representative of the products currently produced within the specified period. 2.4 Delayed delivery
When re-inspection is carried out according to the procedure of Article 3.5.2 of GB12273, re-inspection shall be carried out according to the A group and B group tests. Only when they meet the requirements can they be released. Otherwise, 100% inspection shall be carried out on the non-destructive test items of the batch of products, and delivery shall be carried out only after the unqualified products are eliminated. 3 Inspection requirements
3.1 Procedure
3.1.1 The identification and approval sequence shall be in accordance with Articles 2 and 2 of this specification. 3.1.2 The test list (Table 4) for quality and consistency inspection includes sampling, cycle, severity and performance, requirements, etc. ..comDimension
Test items
Marking and quality
Appearance quality
Sealing test A
GB/T15020-94
Table 3 List of identification and approval tests
Adjustment difference and resonant resistance
Insulation resistance
Parallel capacitance
Sealing test B
Parallel response (when applicable)
Frequency adjustability (when applicable)||tt| |Backup sample
Free connection
Weldability
Lead strength
Resistance to welding heat
High temperature
Cyclic (alternating) damp heat
(first cycle)
Test sample
Number of samples and allowed
Number of unqualified products
Performance requirements
According to the appearance drawing and Table 1
The marking is clear and firm, and according to
1.5 of this specification Strip, maximum weight according to detailed specifications. The coating is complete, without depressions, protrusions, corrosion and dirt. The lead terminals are parallel and perpendicular to the base. Insulation resistance ≥ 500M1. According to detailed specifications. According to detailed specifications. According to detailed specifications. According to detailed specifications. According to detailed specifications. According to detailed specifications. According to detailed specifications. Adjustment of questions and data. Resistance according to detailed specifications. Leads are well lubricated, the area is above No. 95 of the total area of the test, and there is no visible damage and lead wires. ||Adjust frequency difference and blocking resistance according to detailed specifications
Adjust frequency difference and blocking resistance according to detailed specifications
Test items
Group A inspection (batch by batch)
Group A1
Marking and weight
Appearance quality
Sealing test A
Adjust single
and resonant resistance
Insulation resistance
Parasitic response (when applicable)
Frequency adjustability (when applicable)
Group A2
Parallel capacitance
Group B inspection (batch by batch)
Group B1
: Temperature frequency difference
B2 Group
Weldability
Test Items
Cold (Low Temperature)
(Other Cycles)
Cycle (Alternating) Wet Heat
(Other Cycles)
Temperature Difference
Steady State (Constant) Mixed Pad
GB/T 1 5020--94
Continued Table 3
D or ND
Test Clauses
Number of Selected Products and Allowable
Number of Unqualified Products
Table 4 Test List for Quality Consistency Inspection Table D or ND
Test Clauses
Performance Requirements
Adjustment Difference and Resonance
Resistance According to the detailed group specification, and
Insulation Resistance 2500M||t t||Adjust frequency difference and resonant resistance according to detailed specifications: and insulation resistance 2500M0 according to detailed specifications
Adjust frequency difference and resonant resistance according to detailed specifications, and insulation resistance 2500Mg according to detailed specifications
Performance requirements
According to the appearance drawing and Table 1
The markings are clear and firm, and according to 1.5 of this specification Tea, maximum weight connection detailed specification
Coating layer is complete, without depression, protrusion, corrosion and dirt, the lead end is parallel and perpendicular to the base
Insulation resistance = 500M2 (LC100V+15V)
According to detailed specification
Connection detailed specification
Connection detailed specification
According to detailed specification
According to detailed specification
According to detailed specification
According to detailed specification
Lead wire is not well lubricated, the area is 95% of the total area of the test object. Test items
(Inspection (Open Period)
C1 Group
Sealing test B
Self-fall
Non-end strength
Welding heat resistance
Heat (high temperature)
Cyclic (alternating) mixed heat
First cycle)
Cold (low temperature)
Cyclic (alternating) damp heat
(Remaining cycles)
C2 Group
Steady state (constant)
C3 Group
D or ND
GB/T 1 5020—94
Continued Table 4bzxz.net
Test clauses
Note: ① Inspection level (IL) and acceptable quality level (AQL) are selected from IEC410. In this table:
Period (month):
Number of samples
Number of qualified judgments (number of unqualified products allowed); destructive
Non-destructive.
Test and measurement procedures
4. 1 Dimensions, markings and weights
Performance requirements
Leakage rate as per detailed specifications
Adjustment of epilepsy difference and harmonic resistance as per detailed specifications Adjustment of epilepsy difference and resonant resistance as per detailed specifications Visible, thumb injury and lead breakage
Adjustment of epilepsy difference and resonant resistance as per detailed specifications Adjustment of epilepsy difference and resonant resistance as per detailed specifications Adjustment of epilepsy difference and resonant resistance as per detailed specifications and insulation resistance ≥500MO
Adjustment of epilepsy difference and harmonic resistance as per detailed specifications and insulation resistance 2500MO
As per detailed specifications
Crystal element dimensions should be measured with any tool that can ensure the accuracy requirements of product drawings. Punctuation First use visual inspection to check whether the content is complete, correct and clear, and then wipe it twice with an aldehyde anhydrous ethanol cotton ball to make sure it is still clear. Weight should be measured with a scale with an accuracy of 0.1g. 4-2 Appearance quality
Use daily inspection method and it should meet the requirements of this specification. 4.3 Sealing test
4.3.1 Sealing test A
The test should be carried out according to IEC 68-2-17 test QL and the following provisions: GB/T 1 5020-94
Pressure: 400kPa, pressurization time: 10min; flooding liquid: alcohol; recovery time, blow dry at room temperature for 5min. 4.3.2 Test B
Perform the test in accordance with IEC 122-1, Section 13.9 and the following provisions: Pressure:
kPa, fill with hydrogen, reduce the pressure in the container to atmospheric conditions by blowing
kPa, immersion time
nin. The sample is taken out and the test is carried out within
min. The measurement should be completed within 30 minutes after it is taken out from the pressurized container. Note: The volume of the sample cavity should be specified.
Adjust the frequency difference and resonant resistance
Perform the test in accordance with IEC 122-1, Section 12.1 and the following provisions: Unless otherwise specified, the frequency difference and resonant resistance are measured according to the conditions in Table 5. Table 5
Frequency measurement
4.5 Insulation resistance
Excitation level
Test according to IEC 122-1, Section 12.10. 4.6 Parasitic response (where applicable)
Impedance meter
Setting function
Measured within the nominal frequency ±20% (fundamental) or ±200kHz (overtone) frequency range according to IEC 122-1, Section 12.12.1. 4.7 Frequency adjustability (where applicable)
Measured the load resonant frequency of the two specified load capacitances according to IEC 122-1, Section 12.1. 4.B Parallel capacitance
Measured according to IEC 122-1, Section 12.6. 4.9 Free fall
The test is carried out in accordance with IEC 68-2-32 Test Ed and the following provisions: drop from a height of
cm onto a 30 mm thick hardwood board, the number of drops is 4.10 Vibration
The test is carried out in accordance with IEC 122-1 Section 13.3 and the following provisions: frequency:
Hz, amplitude
mm or acceleration
Sample initial drop state: lead end facing up m/s2, number of sweep cycles:
drink. In three mutually perpendicular
directions, the test procedure is carried out in accordance with B4 in Appendix D of Test Fc. The test steps shall be carried out in accordance with Section 8.2.1 of Test Fc. 4.11 Weldability
The test is carried out in accordance with IEC 122-1 Section 13.10 and the following provisions: Test Ta, method 1. Solder bath temperature 235 + 5 ° C, immersion time: 2 ± 0.5 s. 4.12 Terminal strength
Test according to IEC 122-1 Article 13.5, 13.6 and the following provisions: Tensile force: Test Ual,
Bending: Test Ub Method 1,
N bending 90°, 2 times.
4.13 Resistance to welding heat
GB/T 1 5020-94
Test according to IEC 6B2--20 and Test Tb Method 1b and the following provisions: Solder bath temperature; 350 ± 10 ° C, immersion time: 3.5 ± 0.5 s. 4.14 High temperature
Test in accordance with IEC122-1, Section 13.12 and the following provisions: Temperature: +100°C ± 2°C; Duration: 16 h; Recovery time: 2 h under normal test atmospheric conditions. 4.15 Damp heat cyclic, first cycle
Test in accordance with IEC122-1, Section 13.13 and the following provisions: Upper limit temperature: 55°C, Type 2. Low temperature test shall be carried out immediately after this test. 4.16 Low temperature
Test in accordance with IEC122-1, Section 13.14 and the following provisions: Temperature: -65 ± 3°C; Duration: 2 h; Recovery time: 2 h under normal test atmospheric conditions. 4.17 Damp heat cyclic, remaining cycles
Test in accordance with IEC122-1, Section 13.15 and the following provisions: The remaining five cycles shall be carried out.
4.18 Temperature frequency difference
Unless otherwise specified, the measurement shall be carried out in accordance with IEC 122-1, Article 12.1, and the measurement conditions shall be the same as those in Article 4.4. Temperature interval: 5°C, extreme temperature, °C at the high temperature end.
Temperature error:
4.19 Steady damp heat
The test shall be carried out in accordance with IEC 122-1, Article 13.16 and the following provisions: Duration: 56 days; Recovery time: Wipe with cotton balls. Recover for 2 hours under normal test atmospheric conditions. 4.20 Aging
The test shall be carried out in accordance with IFC 122-1, Article 13.17 and the following provisions: Test temperature, 85 ± 2°C; Duration, 30 days; Measurement interval: Measure twice a week, and the interval between the two measurements shall not be less than 2 days and not more than 4 days. The first measurement shall be carried out at the end of the first 24 hours, and the last measurement shall be carried out at the end of the test. Frequency change and resonant resistance change are calculated according to formula (1) and formula (2) respectively. Af/f, -- (fmrfm)/f.
Where: Af/f,
Where: AR.—
ARrmin
Frequency change
The highest frequency measured within 30d;
The lowest frequency measured within 3d;
Nominal frequency.
Resonant resistance change:
The highest resonant resistance measured within 30d:
The minimum resonant resistance measured within 30d.
4.21 Package inspection
A package box and two packages therein shall be inspected according to the provisions of 5.1. 5 Packaging, storage and transportation
5.1 Packaging
Unless otherwise specified, packaging shall comply with the following requirements: 5. 1.1 Packaging is divided into inner packaging and outer packaging: the materials used for packaging boxes and boxes should be free of acid, alkali and other materials that are corrosive to the product. (1)
GB/T 1 5020-: 94
The inner packaging can be plastic bags, paper boxes or other forms of packaging. Unless otherwise specified, the label on the inner packaging box should indicate: manufacturer name and trademark;
quartz crystal element model;
nominal frequency,
quartz crystal element quantity:
detailed specification number and production license number, packaging expiration date and packer code,
5.1.3 The outer packaging can be plastic or paper boxes. The inner wall of the box is lined with moisture-proof paper or plastic film. Unless otherwise specified, a packing list is placed in the box, which should indicate:
Product name,
Nominal frequency!
Contract,
Product quantity;
Manufacturer name,
Packing date:
Inspector code:
Seal of the quality inspection department.
The weight of the packaging box containing quartz crystal components shall not exceed 20kg. The surface of each packaging box shall be marked with words or graphics such as "moisture-proof" and "handle with care" in accordance with the provisions of GB191.
5.2 Storage
Quartz crystal components should be stored in a warehouse with an ambient temperature of -10℃～40℃, a relative humidity of no more than 80%, and no acidic, alkaline or other harmful gases in the surrounding environment.
5.3 Transportation
The packaging box containing quartz crystal components can be transported by any means, but it should be avoided from direct rain and snow, strong collision and mechanical damage.
Additional remarks:
This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is under the jurisdiction of the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. This standard is drafted by the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. The main drafters of this standard are Deng Hesong, Song Peiyu, Zhang Yi and Bian Yilin.13 Resistance to welding heat
GB/T 1 5020-94
Test according to IEC 6B2--20 and test Tb method 1b and the following provisions: solder bath temperature; 350±10℃, immersion time: 3.5±0.5s. 4.14 High temperature
Test according to IEC122-1 Article 13.12 and the following provisions: temperature: +100℃±2℃; duration: 16h; recovery time: 2h under normal test atmospheric conditions. 4.15 Alternating damp heat, first cycle
Test according to IEC122-1 Article 13.13 and the following provisions: upper limit temperature; 55℃, type 2. Low temperature test should be carried out immediately after this test. 4.16 Low temperature
Test in accordance with IEC 122-1, Section 13.14 and the following provisions: Temperature: -65±3℃; Duration: 2h; Recovery time: 2h under normal test atmospheric conditions. 4.17 Alternating damp heat, the remaining cycles
Test in accordance with IEC 122-1, Section 13.15 and the following provisions: The remaining five cycles should be carried out.
4.18 Temperature frequency difference
Unless otherwise specified, measure in accordance with IEC 122-1, Section 12.1, and the measurement conditions are the same as those in Section 4.4. Temperature interval: 5℃, extreme temperature℃, high temperature end℃.
Degree error: low temperature end is
4.19 Constant damp heat
Test according to IEC122-1 Article 13.16 and the following provisions: Duration: 56d; Recovery time: wipe with cotton ball. Recover for 2h under normal test atmospheric conditions. 4.20 Aging
Test according to IFC122-1 Article 13.17 and the following provisions: Test temperature, 85±2°C; Duration, 30d; Measurement interval 2 measurements per week, the interval between 2 measurements is not less than 2d and not more than 4d. At the end of the first 24h, the first measurement is made, and at the end of the test, the last measurement is made. The frequency change and the resonant resistance change are calculated according to formula (1) and formula (2) respectively. Af/f, -- (fmrfm)/f.
Where: Af/f,
Where AR.—
ARrmin
frequency change
highest frequency measured within 30d;
lowest frequency measured within 3d;
nominal frequency.
resonance resistance change:
highest resonant resistance measured within 30d:
lowest resonant resistance measured within 30d.
4.21 Packaging inspection
A packaging box and two packages thereof shall be inspected in accordance with the provisions of 5.1. 5 Packaging, storage and transportation
5.1 Packaging
Unless otherwise specified, packaging shall comply with the following requirements: 5.1.1 Packaging is divided into inner packaging and outer packaging: the materials used for packaging boxes and boxes shall be free of acid, alkali and other materials corrosive to the product. (1)
GB/T 1 5020-: 94
The inner packaging can be plastic bags, cartons or other forms of packaging. Unless otherwise specified, the inner packaging box label should indicate: manufacturer name and trademark;
quartz crystal component model;
nominal frequency,
quartz crystal component quantity:
detailed specification number and production license number, packaging expiration date and packer code,
5.1.3 The outer packaging can be plastic or carton packaging. The inner wall of the box is lined with moisture-proof paper or plastic film. Unless otherwise specified, a packing list is placed in the box, which should indicate:
product name,
nominal frequency!
Contract,
Product quantity;
Manufacturer name,
Packing date:
Inspector code:
Seal of quality inspection department.
The weight of the packaging box containing quartz crystal components shall not exceed 20kg. The surface of each packaging box shall be marked with words or graphics such as "moisture-proof" and "handle with care" in accordance with the provisions of GB191.
5.2 Storage
Quartz crystal components should be stored in a warehouse with an ambient temperature of -10℃～40℃, a relative humidity of no more than 80%, and no acidic, alkaline or other harmful gases in the surrounding environment.
5.3 Transportation
The packaging box containing quartz crystal components can be transported by any means, but it should be avoided from direct rain and snow, strong collision and mechanical damage.
Additional remarks:
This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is under the jurisdiction of the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. This standard is drafted by the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. The main drafters of this standard are Deng Hesong, Song Peiyu, Zhang Yi and Bian Yilin.13 Resistance to welding heat
GB/T 1 5020-94
Test according to IEC 6B2--20 and test Tb method 1b and the following provisions: solder bath temperature; 350±10℃, immersion time: 3.5±0.5s. 4.14 High temperature
Test according to IEC122-1 Article 13.12 and the following provisions: temperature: +100℃±2℃; duration: 16h; recovery time: 2h under normal test atmospheric conditions. 4.15 Alternating damp heat, first cycle
Test according to IEC122-1 Article 13.13 and the following provisions: upper limit temperature; 55℃, type 2. Low temperature test should be carried out immediately after this test. 4.16 Low temperature
Test in accordance with IEC 122-1, Section 13.14 and the following provisions: Temperature: -65±3℃; Duration: 2h; Recovery time: 2h under normal test atmospheric conditions. 4.17 Alternating damp heat, the remaining cycles
Test in accordance with IEC 122-1, Section 13.15 and the following provisions: The remaining five cycles should be carried out.
4.18 Temperature frequency difference
Unless otherwise specified, measure in accordance with IEC 122-1, Section 12.1, and the measurement conditions are the same as those in Section 4.4. Temperature interval: 5℃, extreme temperature℃, high temperature end℃.
Degree error: low temperature end is
4.19 Constant damp heat
Test according to IEC122-1 Article 13.16 and the following provisions: Duration: 56d; Recovery time: wipe with cotton ball. Recover for 2h under normal test atmospheric conditions. 4.20 Aging
Test according to IFC122-1 Article 13.17 and the following provisions: Test temperature, 85±2°C; Duration, 30d; Measurement interval 2 measurements per week, the interval between 2 measurements is not less than 2d and not more than 4d. At the end of the first 24h, the first measurement is made, and at the end of the test, the last measurement is made. The frequency change and the resonant resistance change are calculated according to formula (1) and formula (2) respectively. Af/f, -- (fmrfm)/f.
Where: Af/f,
Where AR.—
ARrmin
frequency change
highest frequency measured within 30d;
lowest frequency measured within 3d;
nominal frequency.
resonance resistance change:
highest resonant resistance measured within 30d:
lowest resonant resistance measured within 30d.
4.21 Packaging inspection
A packaging box and two packages thereof shall be inspected in accordance with the provisions of 5.1. 5 Packaging, storage and transportation
5.1 Packaging
Unless otherwise specified, packaging shall comply with the following requirements: 5.1.1 Packaging is divided into inner packaging and outer packaging: the materials used for packaging boxes and boxes shall be free of acid, alkali and other materials corrosive to the product. (1)
GB/T 1 5020-: 94
The inner packaging can be plastic bags, cartons or other forms of packaging. Unless otherwise specified, the inner packaging box label should indicate: manufacturer name and trademark;
quartz crystal component model;
nominal frequency,
quartz crystal component quantity:
detailed specification number and production license number, packaging expiration date and packer code,
5.1.3 The outer packaging can be plastic or carton packaging. The inner wall of the box is lined with moisture-proof paper or plastic film. Unless otherwise specified, a packing list is placed in the box, which should indicate:
product name,
nominal frequency!
Contract,
Product quantity;
Manufacturer name,
Packing date:
Inspector code:
Seal of quality inspection department.
The weight of the packaging box containing quartz crystal components shall not exceed 20kg. The surface of each packaging box shall be marked with words or graphics such as "moisture-proof" and "handle with care" in accordance with the provisions of GB191.
5.2 Storage
Quartz crystal components should be stored in a warehouse with an ambient temperature of -10℃～40℃, a relative humidity of no more than 80%, and no acidic, alkaline or other harmful gases in the surrounding environment.
5.3 Transportation
The packaging box containing quartz crystal components can be transported by any means, but it should be avoided from direct rain and snow, strong collision and mechanical damage.
Additional remarks:
This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is under the jurisdiction of the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. This standard is drafted by the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. The main drafters of this standard are Deng Hesong, Song Peiyu, Zhang Yi and Bian Yilin.2 Storage
Quartz crystal components should be stored in a warehouse with an ambient temperature of -10℃～40℃, relative humidity not more than 80%, and no acidic, alkaline or other harmful gases in the surrounding environment.
5.3 Transportation
The packaging box containing quartz crystal components can be transported by any means, but should avoid direct rain and snow, strong collision and mechanical damage.
Additional remarks:
This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is under the jurisdiction of the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. This standard is drafted by the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. The main drafters of this standard are Deng Hesong, Song Peiyu, Zhang Yi and Bian Yilin.2 Storage
Quartz crystal components should be stored in a warehouse with an ambient temperature of -10℃～40℃, relative humidity not more than 80%, and no acidic, alkaline or other harmful gases in the surrounding environment.
5.3 Transportation
The packaging box containing quartz crystal components can be transported by any means, but should avoid direct rain and snow, strong collision and mechanical damage.
Additional remarks:
This standard is proposed by the Ministry of Machinery and Electronics Industry of the People's Republic of China. This standard is under the jurisdiction of the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. This standard is drafted by the Electronic Standardization Research Institute of the Ministry of Machinery and Electronics Industry. The main drafters of this standard are Deng Hesong, Song Peiyu, Zhang Yi and Bian Yilin.
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