JB/T 56015-2002 Reliability index and test method of electromagnetic intermediate relay
Some standard content:
ICS29.120.70
China Machinery Industry Standard JB/T56015—2002
Replace JB/T56015—1992
Reliablilty index and test method for magnetic auxiliary relay relay2002-07-16 Issued
2002-12-01 Implementation
The State Economic and Trade Commission of the People's Republic of China Issued Foreword,
2 Normative reference documents..
3 Terms and definitions, symbols,
3.1 Terms and definitions
3.2 Symbols.
4 Reliability index requirements
Test method,
Test conditions
Extraction of test samples,
Test sample testing,
Failure criteria
5.5 Test equipment,
6 Reliability verification test plan and test procedure,6.1
Reliability verification test plan
Reliability verification test procedure
7 Test record and test report.
7.1 Test record.
7 .2 Test report
Appendix A (Informative Appendix) Block diagram of recommended relay reliability test device. Figure A.1 Block diagram of recommended relay reliability test device Table 1 Name, symbol and maximum failure rate of failure rate level Table 2 Grading test and upgrade test plan
Table 3 Maintenance test plan...
Table 4 Recommended test plan for grading test
Table 5 Recommended test plan for maintenance test
JB/T56015--2002
JB/T56015--2002
This standard is compiled based on the relevant technical requirements of GB/T1772-1979 "Test method for failure rate of electronic components", GB/T5080.1-1986 "General requirements for equipment reliability test" and GB/T15510-1995 "General rules for reliability test of control electromagnetic relays". This standard replaces JB/T56015-1992.
Compared with JB/T56015--1992, the main changes of this standard are as follows: the chain test circuit is deleted, and a microcomputer automatic monitoring device is used as a relay reliability test device (5.4 of the 1992 version, 5.5 of this version);
The failure criterion adds the contact voltage drop of the connected contacts and the voltage between the disconnected contacts as the criterion for the failure of the test product (5.7.2 of the 1992 version, 5.4.1 and 5.4.2 of this version); the content of early failure is deleted (5.8.5 of the 1992 version). Appendix A of this standard is an informative appendix.
This standard is proposed by the China Machinery Industry Federation. This standard is under the jurisdiction of the National Technical Committee for Low Voltage Electrical Appliance Standardization. The drafting unit of this standard: Shanghai Electric Science Research Institute. The main drafters of this standard: Chen Xiaodong and Zhu Yunxiang. 1 Scope
Reliability index and test method of electromagnetic intermediate relay JB/T56015—2002
This standard specifies the reliability index and reliability test requirements and methods of electromagnetic intermediate relay (hereinafter referred to as relay). This standard applies to the reliability verification test of products whose relay life can be reasonably considered to obey exponential distribution: 2 Normative references
The clauses in the following documents become the clauses of this standard through reference in this standard. For all dated referenced documents, all subsequent amendments (excluding errata) or revisions are not applicable to this standard. However, the parties who reach an agreement based on this standard are encouraged to study whether the latest versions of these documents can be used. For all undated referenced documents, the latest versions are applicable to this standard. GB/T1772-1979 Test method for failure rate of electronic components GB/T2900.18-1992 Electrical terminology Low-voltage electrical appliances GB/T5080.1-1986 General requirements for equipment reliability test GB/T15510-1995 General rules for reliability test of control electromagnetic relays 3 Terms, definitions and symbols
3.1 Terms and definitions
The terms and definitions established in GB/T1772, GB/T2900.18, GB/T5080.1 and GB/T15510 apply to this standard. 3.2 Symbols
Failure rate:
Enter max
Maximum failure rate of specified failure rate level: n--number of samples:
Test deadline;
Contact voltage drop:
Voltage between disconnecting contacts:
Rated voltage (open circuit voltage) of contact circuit: Load current of contact circuit;
Power factor of AC load circuit:
Time constant of DC load circuit:
Limit value of contact voltage drop:
Limit value of voltage between disconnecting contacts:
Cumulative relevant test time:
Truncation time:
Related failure number;
Truncation failure number (re=A.+1):
Qualified judgment number (allowable failure number).
4 Reliability index requirements
The relay adopts failure rate as its reliability characteristic quantity, and is divided into five failure rate levels: sub-level 5, level 5, sub-level 6, level 6 and level 7 according to the value of its maximum failure rate. The names, symbols and maximum failure rates of failure rate levels are shown in Table 1. 1
JB/T56015—2002
Name of failure rate level
Sub-level V
Sub-level VI
5 Test method
5.1 Test conditions
5.1.1 Environmental conditions
Table 1 Name, symbol and maximum failure rate of failure rate level Failure rate level symbol
The test is carried out under standard atmospheric conditions:
Temperature: 15℃～35℃:
Relative humidity: 45%~75%:
Atmospheric pressure: 86kPa~106kPa:
Or under the use environment conditions specified in the standards or technical conditions of the tested product. 5.1.2 Installation conditions
The test sample should be installed in the normal use position: The test sample should be installed in a place without significant vibration and impact: Maximum failure rate Aml1/10 times
3×10-s
3×10~6
The inclination of the test sample's installation surface and the vertical surface should comply with the provisions of the product standards or technical conditions. 5.1.3 Test power supply conditions
AC power supply:
Waveform: sine wave, waveform distortion factor is not more than 5%; frequency: 50Hz, the allowable deviation is 5%. b)
5.1.3.2 The ripple component of the DC power supply should meet the following requirements: The ratio of the difference between the peak value and the valley value to the DC component is not more than 6%, that is, the peak-valley value ≤6%
DC component
5.1.3.3, during the test, when the contact is connected to the load, the fluctuation of the test power supply voltage relative to the no-load voltage should be no more than 5%. 5.1.4 Load conditions
The contact circuit of the relay is connected in series with the load and the load power supply. Unless otherwise specified in the product standard, the load power supply adopts a DC power supply. 5.1.4.2
Unless otherwise specified in the product standard, the load adopts a resistive load (LUR<1ms) 5.1.4.4
Unless otherwise specified in the product standard, the open circuit voltage U of the contact circuit during the test shall be 24V or the minimum DC rated voltage of the contact specified in the product standard.
5.1.4.5Unless otherwise specified in the product standard, the load current of the contact circuit during the test shall be 100mA or the rated working current. 5.1.5 Excitation conditions
5.1.5.1 During the test, the test piece shall be excited with the rated value of the input excitation. 5.1.5.2 During the test, the number of cycles per hour of the test piece shall not be less than the rated value specified in the product standard. In order to shorten the test time, the number of cycles per hour may be increased without affecting the normal operation of the test piece and without changing the failure mechanism of the test piece. 5.1.5.3 The load rate (load factor) shall be selected according to the product standard, or selected from the following recommended values: 15%, 25%, 40%, 60%.
5.2 Sample sampling
JB/T56015—2002
a) The test pieces shall be randomly selected from the products that are mass-produced under stable process conditions and have passed the factory inspection; the number of test pieces n shall be determined by the sampling plan (see formula (1)): b)
The number of products for sampling shall not be less than 10 times the number of test pieces. 5.3 Test of test pieces
5.3.1 Pre-test inspection
Before the test, the test sample shall be inspected to check whether the parts of the test sample have any damage, deformation, breakage, etc. caused by transportation. The damaged parts shall be eliminated and the number of test samples shall be supplemented as required. The eliminated test samples shall not be counted in the relevant failure number r. 5.3.2 Inspection during the test
Unless otherwise specified in the product standard, the contact voltage drop of the connected contacts and the voltage between the disconnected contacts shall be monitored during 40% of the "connected" period and 40% of the "disconnected" period of each cycle. Cleaning and adjustment of the test product is not allowed during the test. 5.3.3 Inspection after the test
a) Appearance inspection;
b) Action voltage:
c) Release voltage:
d) Dielectric withstand voltage.
5.4 Failure criteria
When any of the following situations occurs, the test product is considered to have failed. The contact voltage drop U of the connected contacts exceeds the following limit value Uz: 5.4.1
When the load current is the rated working current, the contact voltage drop The limit value U is the open-circuit voltage U of the contact circuit. 5% of: a)
When the load current is 100mA, the limit value Ui of the contact voltage drop is 0.5V. b)
The voltage U between the disconnecting contacts is lower than the limit value U. Unless otherwise specified in the product standard, Ux should be 90% of the open-circuit voltage of the contact circuit: the contacts are welded or otherwise bonded. 5.4.4
The coil does not operate when energized.
The coil does not return after de-energization.
The arcing time of the contact exceeds 0.1s.
Components are destructively damaged, and connecting wires and components are loose. In the post-test inspection of the test product, the test results of any item do not meet the requirements of the product standard 5.4.8
5.5 The test device
should be adopted Use a dedicated reliability test device, which should meet the following requirements: be able to achieve successive monitoring.
When the test product fails, the test device should have the functions of automatic shutdown, recording the failed test product number and failure time (b)
number of operations when the failure occurs), judging the failure type and printing output c)
The device itself should have sufficient reliability and sufficient accuracy. The device should have self-diagnosis capabilities.
It is recommended to use a microcomputer reliability test device, and the device block diagram is shown in Appendix A of this standard. 6 Reliability verification test plan and test procedures 6.1 Reliability verification test plan
6.1.1 The reliability verification test of the relay adopts laboratory test. 6.1.2 The reliability verification test of the relay adopts timed or fixed number truncation test. 6.1 .3 The reliability verification test of relays is divided into failure rate grading test, maintenance test and upgrade test. Grading test refers to the test conducted to determine the failure rate level of the product for the first time, or the test conducted to re-determine the failure level of the product after the maintenance test or upgrade test of a certain failure rate level fails; maintenance test refers to the test conducted to prove that the failure rate level of the product is still not lower than the failure rate level determined after the grading test or upgrade test: upgrade test refers to the test conducted to prove that the failure rate level of the product is higher than the original failure rate level. The confidence level of grading test and upgrade test is 0.9, and the test plan is shown in Table 2; the confidence level of maintenance test is 0.6, and the test plan is shown in Table 3.
Failure rate level
Failure rate
Maximum maintenance
Cycle month
Procedure for reliability verification test
Grading test
Grading test is carried out according to the following procedures:
Grading test and upgrade test plan
Truncation time T.
10° times
Maintenance test plan
Truncation time T.
10° times
Select failure rate level. The first rating test should generally select failure rate level YW or W: A,=7
Select the allowable failure number A. And the truncation failure number r. (r=A+1), it is recommended to select A in the range of 2 to 5, and it is not recommended to select A. =0: According to the selected failure rate level and Ac, the truncation time T is found from Table 2. ; The test cut-off time of the selected test product shall not exceed the number of electrical life times specified in the product standard, but shall not be less than 10 times; d),
According to T., A. and tz, the number of test products n is determined by formula (1); e)
It should be noted that the number of test products n shall generally not be less than 10: In general, the allowable failure number A, cut-off time, and number of test products n listed in Table 4 can be used. Table 4 Recommended test plan for grading test
Failure rate level
Allowable failure number A
Truncation time T 10° times
Deadline time10° times
Number of samples n
Randomly select n samples according to the provisions of 5.2 of this standard and test and inspect them according to the provisions of 5.3 of this standard; judge failure according to the provisions of 5.4 of this standard; g)
Count the relevant failure number and the relevant test time (failure time) of each failed sample; count the cumulative relevant test time T:
Test result judgment.
JB/T56015—2002
When the relevant failure number r does not reach the truncated failure number r. (i.e. r≤A.), and the cumulative relevant test time T reaches or exceeds the truncated time T, the test is judged to be qualified (accepted): When the cumulative relevant test time T does not reach the truncated time T., and the relevant failure number reaches or exceeds the truncated failure number r. (i.e. r>A.), the test is judged to be unqualified (rejected). 6.2.2 Maintenance test
Products that have passed the grading test shall be subjected to maintenance test of the grade according to the maintenance cycle specified in Table 3, unless otherwise specified in the product standard. The maintenance test shall be carried out according to the following procedures:
a) Select the allowable failure number A;
According to the failure rate level of the product that has passed the test and the selected allowable failure number, find the cut-off time T from Table 3. b)
Select the test cut-off time tz of the test sample (same as 6.2.1d of this standard); c)
Determine the number of samples n (same as 6.2.1e of this standard) using formula (1)): d)
-In general, the allowable failure number A, cut-off time t, and number of samples n listed in Table 5 can be used. Table 5 Recommended test plan for maintenance test
Failure rate level
Allowable failure number A.
Select samples (same as 6.2.1f of this standard): Cut-off time T. 10° times
Deadline time10° times
Test and inspect according to the provisions of 5.3 of this standard; judge failure according to the provisions of 5.4 of this standard: Count the relevant failure number r and the relevant test time of each failed test product (same as 6.2.1h of this standard): Count the cumulative relevant test time T;
Test result judgment (same as 6.2.1j of this standard): Number of test products n
If the maintenance test is qualified, the next maintenance test should be carried out according to the prescribed maintenance cycle; if the maintenance test is unqualified, the classification test should be re-performed to determine its failure rate level: When re-determining the failure rate level, all test data of the product from the first classification test (including the data of the maintenance test failure k)
) should be accumulated, and the failure level of the product should be determined from Table 2 based on the accumulated relevant failure number and accumulated relevant test time. 6.2.3 Upgrade test
Products that have passed the classification test can continue to undergo upgrade tests. The data of the upgrade test can be obtained from the extended test of the samples in the grading test and maintenance test, as well as the test of the samples put into the upgrade test. The upgrade test is carried out according to the following procedures: Select the failure rate level to be upgraded (generally higher than the original level): a)
Select the allowable failure number A:
According to the selected failure rate level and the allowable failure number, find the cut-off time T from Table 2. According to T. Determine the time for the extended test and the number of samples put into the upgrade test and the test time; extract the samples (same as 6.2.1f of this standard); conduct tests and inspections according to the provisions of 5.3 of this standard; judge the failure according to the provisions of 5.4 of this standard: Statistic the relevant failure number r and the cumulative relevant test time T: 5
JB/T560152002
Test result judgment (same as 6.2.1j)): If the upgrade test is qualified, the maintenance test of this level shall be carried out according to the prescribed maintenance cycle: If the upgrade test is unqualified, the classification test shall be carried out again to determine its failure rate level: When re-determining the failure rate level, all test data of the product shall be accumulated, and the failure rate level of the product shall be determined from Table 2 based on the accumulated relevant failure number and the accumulated relevant test time. 7 Test records and test reports
Test records
A test record shall be established for each test product, and the test data of the failed test products shall be registered in the order of failure time. The record content:
Test product name, model, specification:
Manufacturing unit:
Test product manufacturing time:
Test date and time:
Test environment conditions:
Failed test product number, failure time and failure phenomenon; Failure analysis and judgment:
Duty (test) personnel.
2 Test report
The test report shall state the test basis and requirements, the number of failed test products, the time of failure and the cause of failure, and make a judgment on whether the test is qualified. 6
Appendix A
(Informative Appendix)
Recommended relay reliability test device frame The recommended relay reliability test device frame diagram is shown in Figure A.1. Display
External memorybZxz.net
Communication interface
Test product contact
Bus interface
Analog-to-digital conversion
Multi-way switch
Test product circuit
Recommended relay reliability test device frame diagram Figure A.1
JB/T56015—2002
Printer
Digital-to-analog conversion
Power amplifier
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