SJ/T 10571-1994 Detailed specification for electronic devices Precision fixed resistors RJ73 type precision metal film resistors Evaluation level E SJ/T10571-1994 standard download decompression password: www.bzxz.net

Electronic Industry Standard of the People's Republic of China
SJ/T 10571—94
Detail specification for electronic componentsFixed precision resistors
Type RJ73 metal precision resistorsAssessmentlevelE
Published on August 8, 1994
Implemented on December 1, 1994
Published by the Ministry of Electronics Industry of the People's Republic of ChinaElectronic Industry Standard of the People's Republic of China
Detail specification for electronic componentsFixed precision resistorsType RJ73 metalfilm precision resistorsAssessmentlevelE levelE
SJ/T10571-94
Replaces SJ2676--86
GB5735--85
This standard applies to RJ73 type precision metal film resistors, which are in accordance with IEC115-5-1 (1983) "Fixed resistors for electronic equipment"
GB/T5729
QC400301
Part 5: Air The standard of the IEC115-1 (1982) "Fixed resistors for electronic equipment - Part 1: General specification" and the IEC115-5 (1982) "Fixed resistors for electronic equipment - Part 5: Sectional specification: Precision fixed resistors". The standard organization of the China Electronic Components Quality Certification Committee is the China Electronics Technology Standardization Institute. Approved by the Ministry of Electronics Industry of the People's Republic of China on August 8, 1994 and implemented on December 1, 1994
SJ/T10571--94
Ministry of Electronics Industry of the People's Republic of China
Electronic components whose quality is assessed in accordance with GB/T5729 "Specified resistors for electronic equipment Part 1: General specification"
Appearance drawing:
1maxb)
Note: 1) Length of paint layer at the root of the lead.
SJ/T10571--94
-SJ5735-85
IEC115--51(1983)
QC400301
Precision fixed resistors
RJ73 precision metal film resistors
Coated insulation type
Assessment level: E
Secrecy level: 0.5%
The valid data of the components qualified according to this detailed specification are given in the list of qualified products. 1 General data
1.1 Recommended installation method
The resistors should be installed in the normal way.
SJ/T10571---94
In the vibration and shock test, the distance between the mounting point and the resistor body is 6±1mm. 1.2 Dimensions, Ratings and Characteristics
Temperature Coefficient
10-*/c
All dimensions are in millimeters.
Resistance Range\
Permitted Resistance Deviation
Climate Category
Low Pressure
Stability Grade
Resistance Temperature Coefficient α
Resistance Change Limit:
Long-term Test
Short-term Test
Limiting Voltage
(dc or ac.rms)
5110~100km
(dc or ac.peak)| |tt||±1%, ±0.5%, ±0.25%, ±0.1%55/125/56
8.5kPa(85mbar)
±25×10-/℃
±15×10-/℃
±(0.5%R+0.050)
±(0.1%R+0.010)
Note: 1) The priority value is the E series in the IEC63: priority number system for resistors and capacitors. 1.2.1 Power reduction
The resistors included in this specification shall be reduced in power according to the following curve: Percentage of rated power consumption
Maximum size
Ambient temperature℃
Note; see also 2.2.3 of the sub-specification.
1.3 Related documents
General specification: GB/T5729
Sub-specification: GB5734
Fixed resistors for electronic equipment
Part 1, General specification
Fixed resistors for electronic equipment
0,6±0.05
Part 5: Sub-specification: Precision fixed resistors. 3
1.4 Marking
SJ/T10571—94
The markings on resistors and their packaging shall comply with the requirements of Article 2.4 of GB/T5729. The minimum marking content on resistors:
Nominal resistance:
Permissible deviation of resistance;
Temperature coefficient of resistance.
Contents of marking on the package:
Nominal resistance
Permissible resistance deviation;
Temperature coefficient of resistance;
Year, month (or week) of manufacturing;
Detailed specification number:
Name and trademark of the manufacturer:
Quantity in the package;
Name or code of the packing personnel:
Seal of the inspection department;
Certification mark (only for certified products). 1.5 Ordering information
Orders for resistors of this specification shall list the following minimum contents in text or code form: a.
Nominal resistance;
Permissible resistance deviation;
Detailed specification number and variety number.
1.6 Release batch certification record
Provided upon the request of the ordering party.
1.7 Additional content (not tested)
The weight of the resistor shall not exceed 0.2g.
1.8 Supplement and improvement of the severity and requirements specified in the general specification and (or) sectional specification None.
2 Inspection requirements
2.1 Procedure
2.1.1 For identification and approval, the procedure shall be in accordance with the provisions of Section 3.2 of Section GB5734. 2.1.2 For quality consistency inspection, the test list (Table 2) lists sampling, cycle, severity and requirements. Section 3.3.1 of the sectional specification specifies the composition of the inspection batch.
Note: When drying is required. Procedure 1 of Section 4.3 of the general specification GB/T5729 shall be adopted. Table 2
Note: ① Except for the resistance change requirements, which shall be selected from Tables 1 and 2 of the sectional specification, the clause numbers of the test items and performance requirements are quoted from the general specification GB/T5729.
②Inspection level and AQL are selected from IEC410: Sampling plan and procedure for inspection by attributes. ③In the table
P-period (month);
n-sample size
SJ/T10571-94
c-qualified number (allowable number of unqualified products);D-destructive;
ND-non-destructive;
IL-inspection level,
AQL-quality level
clause number and test items
(see note ①)
Group A inspection Inspection (batch by batch)
Group A1
4.4.1 Appearance inspection
Group A2
4.4.2 Dimensions
(gauge inspection)
4.5 Resistance
Group B inspection (batch by batch)
Group B1
4.7 Withstand voltage
Group B2
4.17 Solderability
4.13 Overload
4.30 mark solvent resistance
B3 group
temperature coefficient of resistance
-IEC410.
Test conditions
(See note@)
Method: V-block method
No aging
Method: IEC68--2-20
Test Ta method 1
Applied voltage: 2.5 times
rated voltage or 2 times component
limiting voltage, whichever is smaller
Duration: 3s
Appearance inspection
Solvent: See 3.1.1 of IEC68--2--45
Solvent temperature: 23±5℃Method 1
Wipe material: absorbent cotton
Recovery, not applicable
(See note②)
Ss-4
Only one cycle from 20℃~70℃~
20℃
Performance requirements
(See Note?)
According to 4.4.1
The marking is clear and complies with the provisions of 1.4 of this
According to Table 1 of this specification
According to 4.5.2
No breakdown or flashover
The solder wets the lead-out wax
and can flow freely
No visible damage, Clear marking
AR≤±(0.5%R
Clear marking
≤±25×10-*/℃
a≤±15×10-6/c
Clause number and test items
(See Note ①)
Group C inspection (cycle)
Group C1A
Half of the sample of Group C1
4.1 6 Terminal strength
4.18 Resistance to soldering heat
CIB group
The other half of the sample in C1 group
4.19 Rapid temperature change
4.21 Shock
4.22 Vibration
SJ/T10571-94
Continued Table 2
Test conditions
(See Note?)||tt ||Tensile force: 10N
Bending: half of the number of terminals
Twisting: the other half of the number of terminals
Appearance inspection
Method: IEC68-2-20
Test Tb method 1A
Immersion time: 10±1s
Appearance inspection
6A:-55℃
8g:125℃| |tt||Appearance inspection
Installation method: See Article 1.1 of this specification
Acceleration: 490m/s2
Pulse waveform, half-sine wave
Number of impacts: 3 times each in axial positive and reverse directions, 3 times in radial direction
Appearance inspection
Installation method: See Article 1.1 of this specification
Procedure: B4
Frequency range: 10~500Hz
Amplitude: 0.75mm or acceleration
98m/s (whichever is less severe)
Total duration: 6h
Sample size and
Qualified judgment number
(See note)
Performance requirements
(See note?)
No visible damage
A R<≤±(0.1%R
No visible damage, clearly marked
AR≤±(0.1%R
No visible damage
AR<±(0.1%R
No visible damage
AR≤±(0.1%R
Clause number and test items
(see Note?)
C1 Group
Samples of Groups C1A and C1B are combined
4.23 Climate sequence
—Dry heat
~Cyclic damp heat, test Db,
First cycle
One case
One low pressure
One cycle damp heat, test Db,
The remaining cycles
DC load
C2 Group Group
4.25.170℃ Durability
C3 Group
4.8 Resistance value changes with temperature
SJ/T10571—94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa(85mbar)
Appearance inspection||tt| |Insulation resistance
Duration: 1000h
At 48, 500 and 1000h
Inspection:
Appearance inspection
Inspection at 1000h:
Insulation resistance
-55℃/20℃
20℃/125
Sample size and
Number of qualified judgments||tt ||(See Note)
Performance Requirements
(See Note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
No visible damage,
AR≤±(0.5%R
R≥1Ga
±25×10-/℃
≤±15×10-*/℃
±25×10-/℃
±15×10-*/℃
Clause number and test items
(See Note ①)
Group D test (cycle)
Group D1
4.24 Steady state damp heat
Group D2||t t||4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Durability
Additional notes:
SJ/T10571—-94
Continued Table 2
Test conditions
(See Note ①)
4.24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000 hours:
Appearance inspection
Insulation resistance
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note ③)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note ①)
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
As specified in Table 1 of this specification
No visible damage
AR≤±(0.5%R18 Resistance to soldering heat
CIB group
The other half of the sample of C1 group
4.19 Rapid temperature change
4.21 Shock
4.22 Vibration
SJ/T10571-94
Continued Table 2
Test conditions
(See Note?)
Tensile force: 10N
Bending: half of the number of terminals
Torsion: the other half of the number of terminals
Appearance inspection
Method: IEC68-2-20
Test Tb Method 1A
Immersion time: 10±1s
Appearance inspection
6A:-55℃
8g: 125℃
Appearance inspection
Installation method: See 1.1 of this specification
Acceleration: 490m/s2
Pulse waveform, half-sine wave
Number of impacts: 3 times in axial positive and negative directions, 3 times in radial direction
Appearance inspection
Installation method: See 1.1 of this specification
Procedure: B4
Frequency range: 10~500Hz| |tt||Amplitude: 0.75mm or
acceleration
98m/s (whichever is less severe)
Total duration: 6h
Sample size and
Qualified judgment number
(See Note)
Performance requirements
(See Note?)
No visible damage
AR<≤±(0.1%R
No visible damage, clear markings
AR≤±(0.1%R
No visible damage
AR<±(0.1%R
No visible Damage
AR≤±(0.1%R
Clause number and test items
(See Note?)
C1 Group
Samples of Groups C1A and C1B are combined
4.23 Climate sequence
—Dry heat
~Cyclic damp heat, test Db,
First cycle
One case
One low pressure
One cycle damp heat, test Db,
The remaining cycles
DC load
C2 Group
4 .25.170℃ Durability
C3 Grouping
4.8 Change of resistance with temperature
SJ/T10571—94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa(85mbar)
Appearance inspection
Insulation resistance
Duration: 1000h
At 48, 500 and 1000h
Inspection:
Appearance inspection
Inspection at 1000h ：
Insulation resistance
-55℃/20℃
20℃/125
Sample size and
Qualified judgment number
(See note)
Performance requirements
(See note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
No visible damage,
AR≤±(0.5%R
R≥1Ga||tt ||±25×10-/℃
≤±15×10-*/℃
±25×10-/℃
±15×10-*/℃
Clause number and test items
(See Note ①)
D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10 571-94
Continued Table 2
Test conditions
(See Note ①)
4.24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note ③)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note ①)
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R18 Resistance to soldering heat
CIB group
The other half of the sample of C1 group
4.19 Rapid temperature change
4.21 Shock
4.22 Vibration
SJ/T10571-94
Continued Table 2
Test conditions
(See Note?)
Tensile force: 10N
Bending: half of the number of terminals
Torsion: the other half of the number of terminals
Appearance inspection
Method: IEC68-2-20
Test Tb Method 1A
Immersion time: 10±1s
Appearance inspection
6A:-55℃
8g: 125℃
Appearance inspection
Installation method: See 1.1 of this specification
Acceleration: 490m/s2
Pulse waveform, half-sine wave
Number of impacts: 3 times in axial positive and negative directions, 3 times in radial direction
Appearance inspection
Installation method: See 1.1 of this specification
Procedure: B4
Frequency range: 10~500Hz| |tt||Amplitude: 0.75mm or
acceleration
98m/s (whichever is less severe)
Total duration: 6h
Sample size and
Qualified judgment number
(See Note)
Performance requirements
(See Note?)
No visible damage
AR<≤±(0.1%R
No visible damage, clear markings
AR≤±(0.1%R
No visible damage
AR<±(0.1%R
No visible Damage
AR≤±(0.1%R
Clause number and test items
(See Note?)
C1 Group
Samples of Groups C1A and C1B are combined
4.23 Climate sequence
—Dry heat
~Cyclic damp heat, test Db,
First cycle
One case
One low pressure
One cycle damp heat, test Db,
The remaining cycles
DC load
C2 Group
4 .25.170℃ Durability
C3 Grouping
4.8 Change of resistance with temperature
SJ/T10571—94
Continued Table 2
Test conditions
(See Note ①)
Appearance inspection
8.5kPa(85mbar)
Appearance inspection
Insulation resistance
Duration: 1000h
At 48, 500 and 1000h
Inspection:
Appearance inspection
Inspection at 1000h ：
Insulation resistance
-55℃/20℃
20℃/125
Sample size and
Qualified judgment number
(See note)
Performance requirements
(See note ①)
No visible damage
AR≤±(0.1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
No visible damage,
AR≤±(0.5%R
R≥1Ga||tt ||±25×10-/℃
≤±15×10-*/℃
±25×10-/℃
±15×10-*/℃
Clause number and test items
(See Note ①)
D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(Detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10 571-94
Continued Table 2
Test conditions
(See Note ①)
4.24.2.2
Group 1: 10 samples
Group 2: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Inspection at 1000h:
Insulation resistance
This standard is under the jurisdiction of the Standardization Research Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Research Institute of the Ministry of Electronics Industry. The main drafters of this standard are Liu Kuan and He Delong. Sample size and
Qualified judgment number
(see Note ③)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note ①)
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
No visible damage,
AR≤±(0.5%R
R≥1Ga
±25×10-/℃
≤±15×10-*/℃
±25×10-/℃
±15×10-*/℃
Clause number and test items
(See Note ①)|| tt||D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10571—-94
Continued Table 2bzxZ.net
Test conditions
(See Note ①)
4.24.2.2||tt| |First group: 10 samples
Second group: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Insulation resistance
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Institute of the Ministry of Electronics Industry. The main drafters of this standard ：Liu Kuan, He Delong. Sample size and
Qualified judgment number
(see Note ③)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note ①)
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R1%R
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
No visible damage,
AR≤±(0.5%R
R≥1Ga
±25×10-/℃
≤±15×10-*/℃
±25×10-/℃
±15×10-*/℃
Clause number and test items
(See Note ①)|| tt||D group test (cycle)
D1 group
4.24 Steady state damp heat
D2 group
4.4.3 Dimensions
(detailed)
4.25.3 Upper category temperature
Durability
Additional instructions:
SJ/T10571—-94
Continued Table 2
Test conditions
(See Note ①)
4.24.2.2||tt| |First group: 10 samples
Second group: 10 samples
Appearance inspection
Insulation resistance
Duration: 1000h
Inspection at 48, 500 and 1000h:
Appearance inspection
Insulation resistance
This standard is under the jurisdiction of the Standardization Institute of the Ministry of Electronics Industry. This standard was drafted by the Standardization Institute of the Ministry of Electronics Industry. The main drafters of this standard ：Liu Kuan, He Delong. Sample size and
Qualified judgment number
(see Note ③)
This standard was first issued on February 18, 1986 and revised in August 1994. 8
Performance requirements
(see Note ①)
No visible damage, clear marking
AR≤±(0.5%R
R≥100Mn
According to Table 1 of this specification
No visible damage
AR≤±(0.5%R
Tip: This standard content only shows part of the intercepted content of the complete standard. If you need the complete standard, please go to the top to download the complete standard document for free.