GB 17625.2-1999 Electromagnetic compatibility limits for voltage fluctuations and flicker in low voltage power supply systems for equipment with a rated current not exceeding 16A
Some standard content:
GB 17625. 2- 1999
This standard is equivalent to the international standard IEC61000-3-3: 1994 "Electromagnetic Compatibility (EMC) Part 3: Limits Part 3:
Limits of voltage fluctuations and flickers generated by equipment with a rated current not exceeding 16A in low-voltage power supply systems". This standard specifies the limits and test methods for voltage fluctuations and flickers generated by electrical and electronic equipment on low-voltage power grids. This standard is one of the national standards in the "Electromagnetic Compatibility Limits" series, which currently includes the following standards: GB17625.1-1998 Limits of harmonic currents emitted by low-voltage electrical and electronic equipment (equipment input current per phase ≤ 16A) GB17625.2-1999 Electromagnetic Compatibility Limits Limits of voltage fluctuations and flickers generated by equipment with a rated current not exceeding 16A in low-voltage power supply systems
Appendix A in this standard is the appendix to the standard. This standard was proposed by the State Bureau of Machinery Industry. This standard is under the jurisdiction of the National Joint Working Group on Electromagnetic Compatibility Standardization. The responsible drafting units of this standard are: Guangzhou Electric Science Research Institute, Shanghai Electric Tool Research Institute. The main drafters of this standard are: Yao Daiyue, Lai Jing, Li Bangxie, Yang Chunrong, Zhu Jianping, etc. This standard is entrusted to Guangzhou Electric Science Research Institute for interpretation. 143
GB17625.2—1999
IEC Foreword
1) The International Electrotechnical Commission (IEC) is a worldwide standardization organization composed of the National Electrotechnical Commissions (IEC National Committees) of all participating countries. Its purpose is to promote international consensus on all issues related to standardization in the field of electrical and electronic technology. To this end, in addition to carrying out other activities, it also publishes international standards and entrusts technical committees to formulate standards. Any IEC National Committee interested in the formulation project may participate. International organizations, governmental and non-governmental organizations that have liaison with IEC may also participate in this work. IEC and the International Organization for Standardization (ISO) work closely together under the conditions determined by negotiation between the two organizations. 2) Since each technical committee has representatives from all countries interested in the relevant formulation project, the formal decisions or agreements made by IEC on the relevant technical content are as close to the consensus of international opinions as possible. 3) The resulting documents may be published in the form of standards, technical reports or guidelines, and are recommended for international use and accepted by the National Committees in this sense.
4) In order to promote international consistency, IEC National Committees should, as far as possible, convert IEC International Standards into their national and regional standards. Any differences between the corresponding national or regional standards and IEC International Standards should be clearly stated in the standards.
International Standard IEC61000-3-3 was prepared by the following committee: IECTC77A (Electromagnetic Compatibility Low Frequency Phenomena) Sub-Technical Committee. The text of this International Standard is based on the documents in the table below. Draft International Standard
77A(CO)38
Voting Report
77A(CO)40
Full information on the voting for this standard can be found in the voting report listed in the table above. IEC61000-3-3 Edition 1 replaces IEC555-3:1982 and Amendment 1 (1990), and simultaneously abolishes IEC555-3:1982 and Amendment 1 (1990).
Appendix A is the appendix of the standard.
GB 17625.2—1999
1The EC61000 series of standards consists of the following:
Part 1: General
General considerations (overview, basic principles)
Definitions, terminology
Part 2: Environment
Description of environment
Classification of environment
Compatibility level
Part 3: Limits
Emission limits
IEC Introduction
Immunity limits (when not within the scope of responsibility of the product committee)Part 4: Test and measurement techniques
Measurement techniques
Test techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 9: Others
Each part is divided into relevant subparts, which are published as International Standards or Technical Reports. These standards and reports will be published in chronological order and with corresponding numbers. This standard is a product standard.
1 Scope
National Standard of the People's Republic of China
Electromagnetic compatibility limits
Limitations of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current ≤16 A
GB 17625.2—1999
idt IEC 61000-3-3:1994
This standard deals with the limitation of voltage fluctuations and flicker generated in public low-voltage systems. This standard specifies the voltage change limits that may be generated by the equipment under test under certain conditions, and provides guidance for the assessment method. This standard applies to electrical and electronic equipment with an input current of no more than 16A per phase and intended to be connected to a public low-voltage power distribution system with a phase voltage of 220V to 250V and a frequency of 50Hz. The test of this standard is a type test. The specific test conditions are given in Appendix A. The test circuit is shown in Figure 1. Note: The limits of this standard are mainly determined based on the subjective severity of flickering of a 230V/60W spiral filament lamp due to fluctuations in the supply voltage. For power supply systems with a nominal voltage (phase-neutral) lower than 220V and (or) a frequency of 60Hz, the limits and reference circuit parameters have not been considered. Special equipment that is not widely used and cannot meet the requirements (limits) of this standard in design should be approved by the power supply department before being connected to the distribution system. The assessment guidelines for this type of equipment are given by the technical report IEC61000-3-5:1994 "Electromagnetic compatibility limits for voltage fluctuations and flickering generated by equipment with a rated current greater than 16A in low-voltage power supply systems". 2 Reference Standards
The provisions contained in the following standards constitute the provisions of this standard through reference in this standard. When this standard is published, the versions shown are valid. All standards will be revised, and parties using this standard should explore the possibility of using the latest versions of the following standards. GB/T4365--1995 Electromagnetic compatibility terminology (idtIEC60050 (161): 1990) IEC60335-2-7: 1993 Safety of household and similar electrical appliances Part 2: Particular requirements for washing machines IEC60335-2-11: 1993 Safety of household and similar electrical appliances Part 2: Particular requirements for tumble dryers IEC60725: 1981 Consideration of reference impedance for determining disturbance characteristics of household and similar electrical equipment IEC60868: 1986 and its Amendment 1 (1990) Flickermeter function and design specification IEC61000-3-5: 1994 Electromagnetic compatibility Part 3: Limits Subpart 5: Limitation of voltage fluctuations and flicker in low voltage supply systems for equipment with rated current greater than 16 A 3 Definitions
This standard adopts the following definitions.
Approved by the State Administration of Quality and Technical Supervision on September 13, 1999 146
Implemented on June 1, 2000
GB 17625.2—1999
3.1 RMS voltage shave, U(t) RMS voltage shave is the function of time evaluated by segmenting the half-cycle of the continuous fundamental voltage (see Figure 2). 3.2 Voltage change characteristic, AU(t) Voltage change characteristic, U(t) The function of the change of the RMS voltage with time between two adjacent voltages that are in steady state for at least 1 s (see 4.2.3 and Figure 2). 3.3 Maximum voltage change, △Umax The difference between the maximum and minimum RMS values of the voltage change characteristic (see Figure 2). 3.4 Steady-state voltage change, AU The voltage difference between two adjacent steady-state voltages separated by at least one voltage change characteristic (see Figure 2). Note: Definitions 3.2 to 3.4 are related to the absolute value of the phase-neutral voltage. AU(t),The ratio of AUmx and AU. to the nominal voltage value (U,) of the phase-neutral line in the reference network of Figure 1 is respectively called:
relative voltage variation characteristic d (r) (see definition 3.2); maximum relative voltage variation dmx (see definition 3.3); relative steady-state voltage variation d. (see definition 3.4). These definitions are explained in the example of Figure 3. 3.5 Voltage fluctuation voltage fluctuation series of voltage variations or a continuous variation of the effective value of voltage. 3.6 Flicker flicker
unstable visual effect caused by light stimulation whose brightness or spectrum distribution changes with time. (8.13 in GB/T4365--1995) 3.7 Short-term flicker indicator value Pst short-term flicker indicator, P. assesses the severity of flicker in a short time (several minutes); Pst-1 represents the conventional sensitivity interpretation value. 3.8 Long-term flicker indicator value Pllong-term flicker indicator, Pit assesses the severity of flicker in a long time (several hours) with continuous Ps values. 3.9 Flickermeter
Instrument used to measure flicker value. (8.14 in GB/T4365-1995) Note: \-Generally measure P and Pr.
3.10 Flicker impression time tflicker impression time, tt describes the time value of flicker impression produced by voltage change waveform. 4 Evaluation of voltage fluctuation and flicker
4.1 Evaluation of relative voltage change d
Flicker evaluation is determined based on the waveform of voltage change at the end of the test equipment, that is, the difference between any two consecutive phase voltages U(t,) and Ut?):
AU = U(t)) - U(t)
The voltage effective value U(ti) and U(t2) can be obtained by measurement or calculation. When the effective value is calculated from the oscilloscope waveform, the possible waveform distortion should be considered. The voltage change AU is caused by the change in voltage drop on the complex reference impedance Z" caused by the change in the complex fundamental input current △I" of the test equipment. △I, and AI. are the active and reactive parts of the current change △I, respectively. A* Ap - j. u=(t) - I\(t2)
11. It is positive when the current lags; it is negative when it leads. 2 If the harmonic distortion rate of the current I\(t)) and I(t2) is less than 10%, the total effective value can be used to replace the effective value of the fundamental current. 3 For single-phase and symmetrical three-phase equipment, the voltage change can be approximately expressed as: AU IAI,R+ AI-XI
Where AI,, A. --Represent the active and reactive parts of the current change AI\, respectively; R, X.-Components of the complex reference impedance Z (see Figure 1). .(2)
·（3）
The relative voltage change is given by the following formula:
4.2 Evaluation of short-term flicker value Ps
GB 17625. 2-1999
For detailed description of short-term flicker value P, please refer to IEC868 Amendment 1. AU
Table 1 gives the alternative evaluation methods of Ps according to different types of voltage fluctuations: Table 1 Evaluation method
Type of voltage fluctuation
All types of voltage fluctuations (online evaluation)
Defined as all voltage fluctuations of U(t)
According to Figure 5~Figure? Voltage variation waveform with an occurrence rate less than 1 time/s Equidistant rectangular voltage variation
4.2.1 Flicker meter
P. evaluation method
Direct measurement method
Simulation method
Direct measurement method
Analytical method
Simulation method
Direct measurement method
Using the Pr=1 curve method in Figure 4
All types of voltage fluctuations can be evaluated using the direct measurement method of the flicker meter. The flicker meter must meet the specifications required by IEC868 and be connected in accordance with the provisions of Chapter 6 of this standard. This method is the reference method used for limit values. 4.2.2 Simulation method
Under the condition that the relative voltage variation waveform d(t) is known, P. can be evaluated using computer simulation. 4.2.3 Analytical method
For voltage variation waveforms of the type shown in Figures 5 to 7, the Ps value can be evaluated using the analytical method of formulas (5) to (6). Notes
1 The P obtained by this method should be within ±10% of the value measured by the direct measurement method (reference method) used. 2 If the duration between the end of one voltage change and the beginning of the next voltage change is less than 1 s, this method is not recommended. 4.2.3.1 Description of the analytical method
Each relative voltage change waveform should be represented by a flicker impression time t(s). That is, tt = - 2.3(F.dmx)3.2
Where: dmx—expressed as a percentage of the nominal voltage; F——related to the shape of the voltage change waveform (see 4.2.3.2). (5)
The sum of the flicker impression times Zt; of all assessment periods within the total time interval T,(s) is the basis for assessing Pt. If the total time interval T is selected according to 6.5, then it is an "observation time" and: Ztt
4.2.3.2 Form factor
The form factor F is the coefficient (F·dunwx) that converts a relative voltage change waveform d(t) into a relative step voltage change waveform that produces equivalent flicker.
GB 17625.2—1999
1For step voltage changes, the form factor F is equal to 1.02. The relative voltage change waveform can be obtained by direct measurement (see Figure 1) or by calculation from the effective value current of the equipment under test (see equations (1) to (4)). The relative voltage change waveform can be obtained from a histogram with a continuous time interval of 10ms. The form factor can be derived from Figures 5 to 7 (assuming that the relative voltage change waveform matches the waveform shown in the figure). If the waveforms match, proceed as follows:
\ Find the maximum relative voltage change dmax (according to Figure 3); and - - Find the time T (ms) that is appropriate for the voltage change waveform shown in Figures 5 to 7 and use this value to determine the waveform factor F. NOTE Extrapolation beyond the range shown may result in unacceptable errors. 4.2.4 Method using the Ps = 1 curve
In the case of rectangular voltage changes of equal amplitude d separated by equal time periods, the curve in Figure 4 can be used to derive the amplitude corresponding to Pt - 1 for a specific repetition rate, which is called dim. The value of Ps corresponding to a voltage change of d is obtained by the formula Ps - d/din. 4.3 Assessment of long-term flicker value Pi
The long-term flicker value Pi is defined in Annex A2 of IEC868 and the value of N = 12 should be used (see 6.5). For equipment with a normal operating time of more than 30 minutes, Pi. is generally required to be assessed. 5 Limits
The limits of this standard apply to voltage fluctuations and flickers at the power supply terminal of the equipment under test. The limits are measured or calculated according to the test conditions specified in Chapter 6 and Appendix A and in accordance with Chapter 4. Tests to prove compliance with the limits are considered type tests. The limits of this standard are as follows:
—Ps value is not greater than 1.0;
P value is not greater than 0.65,
-relative steady-state voltage change d. not more than 3%; -maximum relative voltage change dmx not more than 4%; -during voltage change, the time when d(t) value exceeds 3% is not more than 200ms. If the voltage change is caused by a manual switch or the occurrence rate is less than once per hour, the P. and P limits do not apply. The limits of the three requirements related to voltage changes are 1.33 times the above voltage values. These limits do not apply to emergency switch operation or emergency interruption. 6 Test conditions
6.1 General guidelines
The test should not be carried out on equipment that is unlikely to produce severe voltage fluctuations or flicker. The test to confirm that the equipment complies with the limit values shall use the test circuit shown in Figure 1. The test circuit consists of the following:
-test power supply (see 6.3);
-reference impedance (see 6.4);
-equipment under test (see Appendix A);
flicker meter (if necessary) (see IEC868). The relative voltage change d(t) can be measured directly or derived from the effective current described in 4.1. To determine the Ps value of the equipment under test, any of the methods described in 4.2 can be used. In case of dispute, the Pst value should be measured using the reference method of the flicker meter. Note: If the equipment under test is a balanced multi-phase device, only one of the three phase-neutral voltages can be measured. 6.2 Measurement accuracy
Currents must be measured with an accuracy of ±1% or better. If expressed in phase angle rather than in active and reactive current, the error 149
should not exceed ±2°.
GB17625.2—1999
The measurement accuracy of the relative voltage change d should be better than the system accuracy of ±8% of the maximum value dnmax. The total circuit impedance (excluding the impedance of the equipment under test, but including the internal impedance of the power supply) should be equal to the reference impedance. The stability and tolerance of this total impedance should be sufficient to ensure that the system accuracy of ±8% is achieved throughout the assessment process. Note: The following method is not recommended in cases where the measured values are close to the limit values. When the source impedance is difficult to determine, for example, in cases where the source impedance changes unpredictably, an impedance with resistance and inductance equal to the reference impedance is connected between the terminals of the source and the equipment under test. Voltage measurements can be made at the source and equipment ends of the reference impedance. In this case, the maximum relative voltage variation dinux measured at the power supply terminal shall be less than 20% of the maximum value dtmux measured at the equipment terminal. 6.3 Test supply voltage
The test supply voltage (open circuit voltage) shall be equal to the rated voltage of the equipment. If a voltage range is specified for the equipment, the test voltage shall be 230 V for single phase or 400 V for three phase and the test voltage shall be maintained within the range of ±2% of the nominal value and the frequency shall be (50 ±0.25) Hz.
The total harmonic distortion of the supply voltage shall be less than 3%. If the value of Ps. is less than 0.4, the fluctuation of the test supply voltage may be ignored during the test. This condition shall be verified before and after each test. 6.4 Reference impedance
As specified in IEC725, the reference impedance Ze of the equipment under test shall be a conventional impedance used for calculating and measuring the relative voltage fluctuation d and the values of P and Pi.
The impedance values of the various components are given in Figure 1.
6.5 Observation time
For flicker measurement, flicker simulation, or analytical methods to assess flicker values, the observation time, T, is specified as follows: ---- For Pst, T, = 10 min;
..-- For Pl, T, 2 h.
The observation time shall include the portion of the equipment operating cycle that produces the most unfavorable voltage variation result. For P assessment, the operating cycle shall be repeated continuously, unless otherwise specified in Annex A. When the operating cycle of the equipment under test is less than the observation time and the equipment under test automatically stops at the end of the operating cycle, the minimum restart time shall be included in the observation time. For Pi assessment, when the operating cycle of the equipment under test is less than 2 h and the equipment is not normally used continuously, the operating cycle shall not be repeated, unless otherwise specified in Annex A.
Note: For example, assuming that the equipment operating cycle is 45 min, then 5 P values should be measured continuously in the total time of 50 min, but the remaining 7 P values in the 2 h observation time will be considered to be 0.
6.6 General test conditions
The test conditions for measuring voltage fluctuations and flicker are as follows. For other equipment not mentioned in Appendix A, only the control methods and procedures explained by the manufacturer in the instructions or other possible use should be used to select the control methods and procedures that produce the most unfavorable voltage variation results. For equipment not included in Appendix A, special test conditions are still under consideration. The equipment should be tested under the conditions provided by the manufacturer. Before the test, a preliminary operation of the motor drive must be carried out to ensure that the test results are consistent with normal use.
For motors, the locked rotor method can be used to determine the maximum effective voltage change dmax that occurs when the motor starts. When the equipment has several independent control circuits, the following conditions apply: as long as the control circuits are not designed to switch simultaneously and are intended to be used independently, each control circuit should be tested as an operating mode of the equipment;
If the control of the independent circuits is designed to switch simultaneously, these circuits can be tested as one operating mode. When the control system only regulates a part of a load, the voltage fluctuations generated by each variable part of the load should be considered separately. Detailed type test conditions for some equipment are shown in Appendix A. 150wwW.bzxz.Net
EUT equipment under test.
GB 17625. 21999
M measuring equipment.
S power supply consisting of power supply voltage generator G and reference impedance B. The reference impedance B value is determined by the following impedance values of each component under 50Hz conditions:
RA-0.24Q,jXA=0.15Q;
Ry- 0. 16Q,jXn= 0. 10Q;
These resistance values include the actual impedance value of the generator. When the power supply impedance value is difficult to determine, see 6.2. EUT
(; Power supply voltage generator that meets the requirements of 6.3. Note: In general, if the three-phase load is balanced, R and X can be ignored because there is no current in the neutral line. Figure 1 Reference network U(t)
derived from a three-phase four-wire power supply for single-phase and three-phase power supplies Figure 2 U(t) histogram evaluation
GB 17625.2-1999
Figure 3 Relative voltage change characteristics
3 The urban limit value of this area is shown in No. 5
Number of voltage changes per minute
Note: When the voltage changes 1200 times per minute, the flash frequency is 10Hz. Figure 4 Curve of equidistant rectangular voltage change Ps=1 1.0
Figure 5 Waveform factor F152 of double-step and ramp voltage characteristics
GB17625.2—1999
T(ms)-
Figure 6 Waveform factor F10.20 of rectangular and triangular voltage characteristics
Note: T,=t3-12,T;=t2—h (see Figure 3). Wave tail time
Wave front time
T,(ms)
Figure 7 Waveform factor F153 of motor starting voltage characteristics with various wave front times
A1 Test conditions for cookers
GB 17625. 2 -1999
Appendix A
(Appendix to the standard)
Application of limits for specific equipment and type test conditions No requirements are made for cookers Pi used in the home. Unless otherwise specified, Pst shall be tested under conditions where the temperature reaches a steady state. Each heater shall be tested separately according to the following requirements. A1.1 Electric stove
A standard long-handled deep pot with a lid shall be used for the electric stove test. The diameter, height and water volume requirements are as follows: Table Al
Electric stove straight Diameter, mm
Height of pot (crock), mm
About 140
About 140
About 120
The amount of water that may be lost due to evaporation must be replenished during the test. In all the following tests, the electric furnace shall comply with the limits specified in Chapter 5. Water layer·g
1000±50
1500±50
2000±50
a) Boiling temperature range: Set the control to the position where the water just boils. Carry out 5 tests and calculate the average of the test results. b) Frying temperature range: Pour 1.5 times the amount of silicone oil in the above table into the pot without a lid. Measure the temperature with a thermocouple placed in the geometric center of the oil and set the temperature control at 180℃. c) Total power setting range: The total power range should be checked continuously during the 10 min observation period. If the control switch has multiple gears, all gears should be tested, and the maximum number of tests should not exceed 20 gears. If the control switch is not divided into gears, the entire control range shall be divided into 10 equal gears. The measurement shall start from the maximum power gear. A1.2 Oven
The oven test shall be carried out under the condition of an empty oven with the door closed. For conventional ovens, adjust the controller so that the average temperature measured by the thermocouple installed in the geometric center of the box is controlled to 220°C; for hot air ovens, it is 200°C. A1.3 Oven
If the manufacturer has no other regulations, the oven test shall be carried out under the condition of an empty oven with the door closed. If the oven has a controller, it shall be set to low, medium and high positions for testing and the worst result shall be recorded. A1.4 Baking Oven
The baking oven test shall be carried out under the condition of an empty oven with the door closed. Adjust the controller so that the average temperature measured by the thermocouple installed in the geometric center of the box is 250°C, or the temperature that is most likely to be close to this value. A1.5 Microwave ovens
The microwave oven or multi-purpose oven with microwave function shall be tested at the lowest position, the middle position and the third position with the adjustable power less than or equal to 90% of the maximum power. A glass bowl containing (1000±50)g of water is placed in the microwave oven. A2 Test conditions for lighting equipment
The lighting equipment shall be tested with lamps with their rated power. If the lighting equipment has more than one lamp, all lamps shall be used. Pst and Pi shall be assessed only for lighting equipment that may produce flicker, for example, disco lighting equipment. 154
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