title>Microwave ceramic dielectric materials-Alumina ceramic substrates for microwave integrated circuits - SJ/T 10243-1991 - Chinese standardNet - bzxz.net
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Microwave ceramic dielectric materials-Alumina ceramic substrates for microwave integrated circuits

Basic Information

Standard ID: SJ/T 10243-1991

Standard Name:Microwave ceramic dielectric materials-Alumina ceramic substrates for microwave integrated circuits

Chinese Name: 微波陶瓷介质材料 微波集成电路用氧化铝陶瓷基片

Standard category:Electronic Industry Standard (SJ)

state:in force

Date of Release1991-05-28

Date of Implementation:1991-12-01

standard classification number

Standard Classification Number:General>>Standardization Management and General Provisions>>A01 Technical Management

associated standards

Publication information

other information

Introduction to standards:

SJ/T 10243-1991 Microwave ceramic dielectric materials Alumina ceramic substrates for microwave integrated circuits SJ/T10243-1991 Standard download decompression password: www.bzxz.net



Some standard content:

Industry Standard of Electronic Industry of the People's Republic of China Alumina Ceramic Substrales for Microwave Integrated Circuits
fnr microwavp integrated circrits 1 Subject and applicable scope
SJ/T10243-91
2 Standard specifies the properties, structure, technical requirements, test methods, inspection specifications and markings of microwave integrated circuit substrates.
Not applicable to acid-treated alumina substrates (hereinafter referred to as) 2 Applicable standards
GB2413
CB2828
GB2529
GK5592
GB 6591.3
G2 5594.3
GHi9531
G5/T12686
3 Structural dimensions
Agricultural surface parameters and equipment
Measurement regulations for shape and tolerance of ceramic materials
Measurement method for density of ceramic materials
Batch inspection, sample preparation and sample form
Periodic inspection, random sampling procedures and sampling forms Nomenclature of names and grades of ceramic materials for electronic parts Structural ceramic materials for electronic components
Structural ceramic materials for electronic componentsPerformance test methodMeasuring average linear expansion coefficient
Structural ceramic materials for electronic componentsPerformance test methodMeasuring tangent value of dielectric loss angleElectronic display network ceramic materialsPerformance test methodVolume resistivity test methodOxidation defect methodThermal coefficient test method
Electronic ceramicsSeasonal component unit
Performance test method for dielectric substratePerformance constant characteristics3 1 The length, width, thickness and small hole size of the substrate are listed in the table: Table 1
All dimensions of length x width
or (170×170) Www.bzxZ.net
0.2--:.0
Minimum diameter
Minimum width 6.40
3.2 The wall thickness between two holes or the distance between the edge and the hole shall not be less than 0.5mm2, approved by the Ministry of Mechanical and Electronic Industry of the People's Republic of China on May 28, 1991 rrn
Implementation on July 2, 1991
4 Technical requirements and test methods
4.1 Material properties and test methods are listed in Table 2. Specifications
Degree of resistance
Neck thickness
Distance
Thermal conductivity
High resistance
Strong rate strength
Body electric book
Full electric band number
(electricity charge)
Compound loss
Tangent value
4.2Heat resistance
Test method
SJ/T10243·97
- g/cm*
1 x jc-nm/t
4. 2.1HThe heat resistance test shows that it has no cracking effect and is not brittle. Ay5
sR. E-7. 5
6. 5 --5. 2
5.0--16.c
4.2.2 The substrate is used as a sample for the heat resistance test. The test method is in accordance with Article 3.Y of K593. 4.3 Appearance 4.31 Appearance defects Item No. 1 of No. 9531: 4.3.2 Appearance requirements and tests are listed in Section 3, test section According to G91-3 According to G5 According to 5583 Article 5-15 According to (H/1266 According to GB/T12634 Needle A glue point 4.4 Public examination No shrimp Not allowed No parts Not allowed Deep tea thickness 4.4.1 Tolerance items, numbers inline F small table SJ/T J0243 -9F
The total noise of the mosquitoes is measured under the light of 20 times
. If necessary, the measurement can be carried out first and then the day measurement. The measurement method corresponding to the tolerance is listed in Table 5, and the value shall not be less than
day: 0. : The length of the core is 04% of the size. The thickness of the thickness is 0.4%. The tolerance of the thickness is within the pressure. The base is dynamic. The width of the base is wide. The core flatness of the core is 4.5. The material is measured with the blood material. The position is less than 13. The length of the length is 0.4%. The car can ensure the quality. What is the measurement?
parallel plate method: under the action of the film itself, the good angle passes through the short adjustment time,
to verify that the film can be used to increase the rate of the final increase of the base C: e slow cell net flux
5.5.2 Use a needle-disc surface rough box cell meter to measure the single. 5.5.5.1 Substrate acceptance inspection and routine inspection 5.2 All inspections shall be conducted by the quality department of the delivery unit. If necessary, the ordering unit may conduct the inspection jointly with others. The supplier shall provide the inspection fee and the inspection shall be responsible for the cost. 5.3 The ordering unit shall submit the inspection documents according to the technical specifications. 5.4 The delivery inspection shall be in accordance with GB3828. The inspection shall be carried out by random sampling once. The inspection items and qualified quality levels are listed in Table 5. SJTC243
Technical requirements and test start
Quality level
6.5 If the delivery inspection fails, the batch of party parts must be carefully selected before re-inspection, but it must be strictly inspected. If it still fails after strict inspection, it shall not be delivered for inspection again. 5. Routine inspection according to (22829, using state-specific daily, changing sampling to case, other related items, night still period, unqualified quality record level
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